JP5733908B2 - Ｘ線撮像装置 - Google Patents

Ｘ線撮像装置 Download PDF

Info

Publication number
JP5733908B2
JP5733908B2 JP2010102527A JP2010102527A JP5733908B2 JP 5733908 B2 JP5733908 B2 JP 5733908B2 JP 2010102527 A JP2010102527 A JP 2010102527A JP 2010102527 A JP2010102527 A JP 2010102527A JP 5733908 B2 JP5733908 B2 JP 5733908B2
Authority
JP
Japan
Prior art keywords
ray
energy
measured
rays
detector
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2010102527A
Other languages
English (en)
Japanese (ja)
Other versions
JP2011232163A (ja
JP2011232163A5 (https=
Inventor
一徳 福田
一徳 福田
高田　一広
一広 高田
向出　大平
大平 向出
渡邉　壮俊
壮俊 渡邉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Original Assignee
Canon Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc filed Critical Canon Inc
Priority to JP2010102527A priority Critical patent/JP5733908B2/ja
Priority to US13/643,260 priority patent/US9042517B2/en
Priority to PCT/JP2011/060009 priority patent/WO2011136157A1/en
Publication of JP2011232163A publication Critical patent/JP2011232163A/ja
Publication of JP2011232163A5 publication Critical patent/JP2011232163A5/ja
Application granted granted Critical
Publication of JP5733908B2 publication Critical patent/JP5733908B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/40—Imaging
    • G01N2223/419—Imaging computed tomograph

Landscapes

  • Health & Medical Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Pulmonology (AREA)
  • Radiology & Medical Imaging (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2010102527A 2010-04-27 2010-04-27 Ｘ線撮像装置 Expired - Fee Related JP5733908B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2010102527A JP5733908B2 (ja) 2010-04-27 2010-04-27 Ｘ線撮像装置
US13/643,260 US9042517B2 (en) 2010-04-27 2011-04-19 X-ray imaging apparatus
PCT/JP2011/060009 WO2011136157A1 (en) 2010-04-27 2011-04-19 X-ray imaging apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010102527A JP5733908B2 (ja) 2010-04-27 2010-04-27 Ｘ線撮像装置

Publications (3)

Publication Number Publication Date
JP2011232163A JP2011232163A (ja) 2011-11-17
JP2011232163A5 JP2011232163A5 (https=) 2013-06-20
JP5733908B2 true JP5733908B2 (ja) 2015-06-10

Family

ID=44861457

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2010102527A Expired - Fee Related JP5733908B2 (ja) 2010-04-27 2010-04-27 Ｘ線撮像装置

Country Status (3)

Country Link
US (1) US9042517B2 (https=)
JP (1) JP5733908B2 (https=)
WO (1) WO2011136157A1 (https=)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10692184B2 (en) 2018-07-05 2020-06-23 SVXR, Inc. Super-resolution X-ray imaging method and apparatus
CN119688759B (zh) * 2025-02-21 2025-04-25 中国科学院上海高等研究院 一种软硬x射线共聚焦的宽能区光电子能谱系统

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5533084A (en) 1991-02-13 1996-07-02 Lunar Corporation Bone densitometer with improved vertebral characterization
JP2001099790A (ja) 1999-09-30 2001-04-13 Ishikawajima Harima Heavy Ind Co Ltd Ｘ線検査装置
JP2004008460A (ja) * 2002-06-06 2004-01-15 Kawasaki Heavy Ind Ltd Ｘ線エネルギー分析イメージング装置
JP2005278880A (ja) 2004-03-29 2005-10-13 Toshiba Corp Ｘ線コンピュータ断層撮像装置およびｘ線コンピュータ断層撮像方法
DE102004017149A1 (de) * 2004-04-02 2005-10-20 Fraunhofer Ges Forschung Verfahren und Vorrichtung zur Bestimmung eines Objektmaterials
JP2007271468A (ja) * 2006-03-31 2007-10-18 National Univ Corp Shizuoka Univ 低被爆ｘ線検査方法及び装置
GB2441578A (en) * 2006-09-08 2008-03-12 Ucl Business Plc Phase Contrast X-Ray Imaging
US8005284B2 (en) * 2006-12-07 2011-08-23 Kabushiki Kaisha Toshiba Three dimensional image processing apparatus and x-ray diagnosis apparatus
JP5297087B2 (ja) * 2008-01-17 2013-09-25 アンリツ産機システム株式会社 Ｘ線異物検出装置
JP4512660B2 (ja) * 2008-03-12 2010-07-28 キヤノン株式会社 Ｘ線撮像装置、ｘ線撮像方法、ｘ線撮像装置の制御方法
JP2009258102A (ja) * 2008-03-26 2009-11-05 Panasonic Electric Works Co Ltd Ｘ線強度調整体及びそれを用いたｘ線異物検査方法並びにｘ線異物検査装置
JP4847568B2 (ja) * 2008-10-24 2011-12-28 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
WO2010082687A2 (en) * 2009-01-15 2010-07-22 Canon Kabushiki Kaisha X-ray imaging apparatus and method of x-ray imaging
CN102272860B (zh) * 2009-01-15 2014-07-30 佳能株式会社 X射线成像装置和x射线成像方法
JP5675169B2 (ja) * 2009-06-18 2015-02-25 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法
JP5697370B2 (ja) * 2009-07-24 2015-04-08 キヤノン株式会社 Ｘ線撮像装置
JP5213923B2 (ja) * 2010-01-29 2013-06-19 キヤノン株式会社 Ｘ線撮像装置およびｘ線撮像方法

Also Published As

Publication number Publication date
WO2011136157A1 (en) 2011-11-03
US9042517B2 (en) 2015-05-26
US20130039466A1 (en) 2013-02-14
JP2011232163A (ja) 2011-11-17

Similar Documents

Publication Publication Date Title
US9234856B2 (en) X-ray apparatus and X-ray measuring method
US10074451B2 (en) X-ray interferometer
JP5127249B2 (ja) Ｘ線装置の焦点‐検出器装置のｘ線光学透過格子
CN101011257B (zh) 产生投影或断层造影相位对比图像的焦点-检测器装置
CN102187207B (zh) X射线成像装置和x射线成像方法
KR101414707B1 (ko) Ｘ선 촬상장치 및 ｘ선 촬상방법
US9103923B2 (en) X-ray imaging apparatus and X-ray imaging method
EP3069659A1 (en) Apparatus and method for x-ray grating phase-contrast imaging
JP2011224329A (ja) 放射線撮影システム及び方法
KR20190015531A (ko) 엑스선 현미경 관찰을 위한 방법 및 장치
JP2012090945A (ja) 放射線検出装置、放射線撮影装置、放射線撮影システム
US20140286477A1 (en) Radiation photographing apparatus
CN1860997B (zh) X射线摄影装置
JP5733908B2 (ja) Ｘ線撮像装置
CN105142524A (zh) 处于高能量的x射线相衬成像和ct的大视场光栅干涉仪
JP2014155509A (ja) 放射線撮影システム
US20150153290A1 (en) X-ray apparatus and method of measuring x-rays
WO2019171920A1 (ja) 放射線位相撮像装置
JP2013150780A (ja) 放射線撮影装置及び放射線撮影方法
JP2014223091A (ja) 放射線撮影装置及び画像処理方法
WO2018087195A1 (en) Grating-based phase contrast imaging
JP5256352B2 (ja) Ｘ線撮像装置及びｘ線撮像方法
Zhang et al. Investigation of a simple coded-aperture based multi-narrow beam x-ray luminescence computed tomography system
Takano et al. Simple Scanning Phase-Contrast X-ray Tomography Using Intensity Detectors
JP2012170645A (ja) Ｘ線撮像装置およびｘ線撮像方法

Legal Events

Date Code Title Description
A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130426

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20130426

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20140415

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20140616

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20141111

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20150113

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20150317

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20150414

LAPS Cancellation because of no payment of annual fees