JP5707408B2 - 顕微鏡画像を形成するための方法および顕微鏡 - Google Patents

顕微鏡画像を形成するための方法および顕微鏡 Download PDF

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Publication number
JP5707408B2
JP5707408B2 JP2012531254A JP2012531254A JP5707408B2 JP 5707408 B2 JP5707408 B2 JP 5707408B2 JP 2012531254 A JP2012531254 A JP 2012531254A JP 2012531254 A JP2012531254 A JP 2012531254A JP 5707408 B2 JP5707408 B2 JP 5707408B2
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Prior art keywords
image
illumination
sample
microscope
tirf
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JP2013506163A6 (ja
JP2013506163A (ja
JP2013506163A5 (enExample
Inventor
クレッペ、インゴ
ノヴィカウ、ヤウヘニ
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Carl Zeiss Microscopy GmbH
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Carl Zeiss Microscopy GmbH
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64Fluorescence; Phosphorescence
    • G01N21/645Specially adapted constructive features of fluorimeters
    • G01N21/6456Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458Fluorescence microscopy
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/06Means for illuminating specimens
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00Microscopes
    • G02B21/36Microscopes arranged for photographic purposes or projection purposes or digital imaging or video purposes including associated control and data processing arrangements
    • G02B21/365Control or image processing arrangements for digital or video microscopes
    • G02B21/367Control or image processing arrangements for digital or video microscopes providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/56Optics using evanescent waves, i.e. inhomogeneous waves
    • GPHYSICS
    • G02OPTICS
    • G02BOPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B27/00Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
    • G02B27/58Optics for apodization or superresolution; Optical synthetic aperture systems
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10FINORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10Integrated devices
    • H10F39/12Image sensors

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Multimedia (AREA)
  • Engineering & Computer Science (AREA)
  • Pathology (AREA)
  • Immunology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Microscoopes, Condenser (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
JP2012531254A 2009-09-30 2010-09-29 顕微鏡画像を形成するための方法および顕微鏡 Expired - Fee Related JP5707408B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102009043747A DE102009043747A1 (de) 2009-09-30 2009-09-30 Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop
DE102009043747.9 2009-09-30
PCT/EP2010/005295 WO2011038817A1 (de) 2009-09-30 2010-08-28 Verfahren zur erzeugung eines mikroskopbildes und mikroskop

Publications (4)

Publication Number Publication Date
JP2013506163A JP2013506163A (ja) 2013-02-21
JP2013506163A6 JP2013506163A6 (ja) 2013-05-02
JP2013506163A5 JP2013506163A5 (enExample) 2013-10-10
JP5707408B2 true JP5707408B2 (ja) 2015-04-30

Family

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JP2012531254A Expired - Fee Related JP5707408B2 (ja) 2009-09-30 2010-09-29 顕微鏡画像を形成するための方法および顕微鏡

Country Status (5)

Country Link
US (1) US9588045B2 (enExample)
EP (1) EP2483732B1 (enExample)
JP (1) JP5707408B2 (enExample)
DE (1) DE102009043747A1 (enExample)
WO (1) WO2011038817A1 (enExample)

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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102009043747A1 (de) 2009-09-30 2011-03-31 Carl Zeiss Microlmaging Gmbh Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop
DE102010026205A1 (de) * 2010-07-06 2012-01-12 Carl Zeiss Microlmaging Gmbh Mikroskop, insbesondere Fluoreszenzmikroskop, dichroitischer Strahlteiler und dessen Verwendung
DE102011077269A1 (de) * 2011-06-09 2012-12-13 Carl Zeiss Microimaging Gmbh Hochauflösende Lumineszenzmikroskopie
WO2014017067A1 (ja) * 2012-07-27 2014-01-30 株式会社ニコン 構造化照明装置及び構造化照明顕微鏡
GB201215771D0 (en) * 2012-09-04 2012-10-17 Univ Nottingham Monitoring and/or characterising biological or chemicl material
EP2801854B1 (en) * 2013-05-10 2017-07-19 Ruprecht-Karls-Universität Heidelberg Method and apparatus for combination of localization microscopy and structured illumination microscopy
WO2015164378A1 (en) 2014-04-22 2015-10-29 Q-State Biosciences, Inc. Analysis of compounds for pain and sensory disorders
JP2016181643A (ja) * 2015-03-25 2016-10-13 株式会社アマダホールディングス 半導体レーザ発振器
US10288863B2 (en) 2015-05-21 2019-05-14 Q-State Biosciences, Inc. Optogenetics microscope
KR20170042432A (ko) * 2015-10-08 2017-04-19 삼성전자주식회사 포토레지스트 패턴의 검사 방법
JP7389487B2 (ja) * 2017-09-18 2023-11-30 アポロ メディカル オプティクス,エルティーディー. 干渉撮像装置およびその用途
DE102018108657B4 (de) * 2018-04-12 2024-03-28 Jenoptik Optical Systems Gmbh Vorrichtung zur Aufnahme wenigstens eines mikroskopischen Bildes und Verfahren zur Aufnahme eines mikroskopischen Bildes
US10901202B2 (en) * 2018-09-19 2021-01-26 Illumina, Inc. Structured illumination of a sample
FR3096146B1 (fr) 2019-05-16 2022-07-29 Univ Grenoble Alpes Dispositif de creation d’un champ evanescent a motifs sur une surface et procede associe
GB201907953D0 (en) 2019-06-04 2019-07-17 Smi Drug Discovery Ltd An optical microscope
DE102019118003B3 (de) * 2019-07-03 2020-10-22 Leibniz-Institut für Photonische Technologien e. V. Mikroskopieanordnung und Mikroskopieverfahren für eine großflächige, hochauflösende chirale Bildgebung sowie deren Verwendung
KR102258893B1 (ko) * 2019-11-28 2021-05-31 재단법인대구경북과학기술원 내시현미경의 수직 분해능 최적화 장치, 최적화 광학 시스템 및 최적화 방법
CN112326665B (zh) * 2020-09-28 2023-12-19 之江实验室 一种基于空间分步式移频照明的缺陷检测系统
US20230314327A1 (en) * 2022-04-04 2023-10-05 10X Genomics, Inc. Systems and methods for nearly isotropic optical resolution using tilted structured illumination microscopy

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5867604A (en) 1995-08-03 1999-02-02 Ben-Levy; Meir Imaging measurement system
DE19758745C5 (de) 1997-01-27 2008-09-25 Carl Zeiss Jena Gmbh Laser-Scanning-Mikroskop
DE19908883A1 (de) 1999-03-02 2000-09-07 Rainer Heintzmann Verfahren zur Erhöhung der Auflösung optischer Abbildung
US6255642B1 (en) * 1999-06-23 2001-07-03 Massachusetts Institute Of Technology Standing wave total internal reflection imaging
JP4414722B2 (ja) * 2003-10-15 2010-02-10 オリンパス株式会社 レーザー顕微鏡
EP1741485A1 (en) * 2004-03-27 2007-01-10 Niigata Technology Licensing Organization Photoreactive thin film processing method and photoreactive thin film processing apparatus
DE102004034998A1 (de) * 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop mit bewegter Lochscheibe und Verwendung
DE102004034983A1 (de) 2004-07-16 2006-02-02 Carl Zeiss Jena Gmbh Lichtrastermikroskop
EP2453239B1 (en) 2005-05-23 2017-04-26 Harald F. Hess Optical microscopy with transformable optical labels
US7485875B2 (en) * 2005-07-22 2009-02-03 Carl Zeiss Microimaging Gmbh Resolution-enhanced luminescence microscopy
GB0707433D0 (en) * 2007-04-18 2007-05-23 Stfc Science & Technology Fluorescence measurement
DE102008009216A1 (de) * 2008-02-13 2009-08-20 Carl Zeiss Microimaging Gmbh Vorrichtung und Verfahren zum räumlich hochauflösenden Abbilden einer Struktur einer Probe
WO2009142758A1 (en) * 2008-05-23 2009-11-26 Spectral Image, Inc. Systems and methods for hyperspectral medical imaging
US8019136B2 (en) * 2008-12-03 2011-09-13 Academia Sinica Optical sectioning microscopy
DE102009043747A1 (de) 2009-09-30 2011-03-31 Carl Zeiss Microlmaging Gmbh Verfahren zur Erzeugung eines Mikroskopbildes und Mikroskop

Also Published As

Publication number Publication date
WO2011038817A1 (de) 2011-04-07
JP2013506163A (ja) 2013-02-21
EP2483732B1 (de) 2023-06-21
US20130068967A1 (en) 2013-03-21
US9588045B2 (en) 2017-03-07
DE102009043747A1 (de) 2011-03-31
EP2483732A1 (de) 2012-08-08

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