JP5707082B2 - 液体の表面を浮遊する試料の走査電子顕微鏡観察方法 - Google Patents
液体の表面を浮遊する試料の走査電子顕微鏡観察方法 Download PDFInfo
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/2202—Preparing specimens therefor
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
- G01N23/2251—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion using incident electron beams, e.g. scanning electron microscopy [SEM]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/225—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material using electron or ion
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
- H01J37/28—Electron or ion microscopes; Electron or ion diffraction tubes with scanning beams
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N1/00—Sampling; Preparing specimens for investigation
- G01N1/28—Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
- G01N1/2813—Producing thin layers of samples on a substrate, e.g. smearing, spinning-on
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
- H01J2237/2002—Controlling environment of sample
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/26—Electron or ion microscopes
- H01J2237/2602—Details
- H01J2237/2605—Details operating at elevated pressures, e.g. atmosphere
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- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Sampling And Sample Adjustment (AREA)
- Analysing Materials By The Use Of Radiation (AREA)
Description
2 試料
3 電子ビーム
4 反射電子信号
5 反射電子検出器
6 二次電子信号
7 二次電子検出器
8 シリコンウェハー
9 イオン液体
10 電子顕微鏡用試料台
11 不純物
12 ヒカリモの細胞体
13 ヒカリモの柄部
14 ヒカリモを含む培養液
15 ヒカリモを含む培養液を滴下するための器具
16 ヒカリモを含む培養液とイオン液体の混合液
17 イオン液体水溶液を滴下するための器具
18 塩類の結晶
19 イオン液体水溶液
20 花粉
21 一部だけが親水性化されている疎水性試料の疎水性部
22 一部だけが親水性化されている疎水性試料の親水性部
23 親水性のイオン液体の水溶液
24 疎水性のイオン液体
Claims (10)
- 疎水性の標本を、親水性のイオン液体の表面に浮かべて、標本の表面からイオン液体を除去しつつ、標本がイオン液体の表面で自由に凝集、分散、または整列できるようにし、走査型電子顕微鏡により観察する標本の観察方法。
- 親水性の標本を、疎水性のイオン液体の表面に浮かべて、標本の表面からイオン液体を除去しつつ、標本がイオン液体の表面で自由に凝集、分散、または整列できるようにし、走査型電子顕微鏡により観察する標本の観察方法。
- 疎水性の部位と親水性の部位を含む標本を、疎水性のイオン液体の表面に浮かべることで、標本の表面からイオン液体を除去しつつ、疎水性の部位を走査電子顕微鏡の検出器の方向に向け、走査型電子顕微鏡により観察する標本の観察方法。
- 親水性の部位と疎水性の部位を含む標本を、親水性のイオン液体の表面に浮かべることで、標本の表面からイオン液体を除去しつつ、疎水性の部位を走査電子顕微鏡の検出器の方向に向け、走査型電子顕微鏡により観察する標本の観察方法。
- 請求項1、又は4のいずれかに記載の標本の観察方法であって、
前記イオン液体が蒸留水で希釈されていることを特徴とする標本の観察方法。 - 請求項1〜5のいずれかに記載の標本の観察方法であって、
前記イオン液体を電子顕微鏡用試料台の上に塗布した後に、前記標本を前記イオン液体上に振りかけることを特徴とする標本の観察方法。 - 請求項1〜6のいずれかに記載の標本の観察方法であって、
前記イオン液体と、標本を含む懸濁液を混ぜ合わせることを特徴とする標本の観察方法。 - 請求項5〜7のいずれかに記載の標本の観察方法であって、
前記標本を前記イオン液体の表面で自由に運動させた後に、前記イオン液体を乾燥させ、水分を除去することでイオン液体の粘性を高くし、当該イオン液体に前記標本を固定した後に、走査型電子顕微鏡により観察することを特徴とする標本の観察方法。 - 請求項1〜8のいずれかに記載の標本の観察方法であって、
前記イオン液体よりも比重が重い不純物を前記イオン液体の底に沈め、標本から不純物を分離することを特徴とする標本の観察方法。 - 請求項1〜8のいずれかに記載の標本の観察方法であって、
前記標本が、陰イオンと塩基由来の陽イオンとがイオン結合した化合物である塩を含み、前記イオン液体に塩を溶け込ませるか、または前記イオン液体中に塩を結晶化させることで、標本から塩を分離することを特徴とする標本の観察方法。
Priority Applications (6)
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JP2010228064A JP5707082B2 (ja) | 2010-10-08 | 2010-10-08 | 液体の表面を浮遊する試料の走査電子顕微鏡観察方法 |
US13/877,710 US8698079B2 (en) | 2010-10-08 | 2011-09-16 | Method for scanning electron microscope observation of sample floating on liquid surface |
KR1020137008741A KR20130072248A (ko) | 2010-10-08 | 2011-09-16 | 액체의 표면을 부유하는 시료의 주사 전자 현미경 관찰 방법 |
DE112011103384.2T DE112011103384B4 (de) | 2010-10-08 | 2011-09-16 | Verfahren zur Präparation und zum Betrachten einer auf einer Flüssigkeitsoberfläche schwimmenden Probe im Rasterelektronenmikroskop |
CN201180048642.3A CN103168221B (zh) | 2010-10-08 | 2011-09-16 | 漂浮于液体表面的试样的扫描电子显微镜观察方法 |
PCT/JP2011/005234 WO2012046396A1 (ja) | 2010-10-08 | 2011-09-16 | 液体の表面を浮遊する試料の走査電子顕微鏡観察方法 |
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JP2010228064A JP5707082B2 (ja) | 2010-10-08 | 2010-10-08 | 液体の表面を浮遊する試料の走査電子顕微鏡観察方法 |
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JP2012083146A JP2012083146A (ja) | 2012-04-26 |
JP2012083146A5 JP2012083146A5 (ja) | 2013-04-04 |
JP5707082B2 true JP5707082B2 (ja) | 2015-04-22 |
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US (1) | US8698079B2 (ja) |
JP (1) | JP5707082B2 (ja) |
KR (1) | KR20130072248A (ja) |
CN (1) | CN103168221B (ja) |
DE (1) | DE112011103384B4 (ja) |
WO (1) | WO2012046396A1 (ja) |
Families Citing this family (14)
Publication number | Priority date | Publication date | Assignee | Title |
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JP5707082B2 (ja) * | 2010-10-08 | 2015-04-22 | 株式会社日立ハイテクノロジーズ | 液体の表面を浮遊する試料の走査電子顕微鏡観察方法 |
JP5951223B2 (ja) * | 2011-11-02 | 2016-07-13 | 株式会社日立ハイテクノロジーズ | 電子顕微法、電子顕微鏡および観察標体作製装置 |
JP5723801B2 (ja) | 2012-02-06 | 2015-05-27 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置および配線方法 |
JP6239246B2 (ja) | 2013-03-13 | 2017-11-29 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材 |
CN103217446A (zh) * | 2013-04-16 | 2013-07-24 | 内蒙古包钢钢联股份有限公司 | 镶嵌交截法 |
JP2015125087A (ja) * | 2013-12-27 | 2015-07-06 | 株式会社日立ハイテクノロジーズ | 試料加工方法および試料加工装置 |
WO2016125924A1 (ko) * | 2015-02-03 | 2016-08-11 | 한국기초과학지원연구원 | 광학현미경과 전자현미경의 연계형 이미지 검출을 위한 시료 냉각장치 및 시료 냉각방법 |
JP6357583B2 (ja) * | 2015-04-24 | 2018-07-11 | 株式会社日立ハイテクノロジーズ | イオン液体を用いた試料の観察方法及び標本の生産方法 |
CN109075002B (zh) * | 2016-04-22 | 2020-09-29 | 株式会社日立高新技术 | 带电粒子显微镜以及试样拍摄方法 |
JP6330074B2 (ja) * | 2017-03-21 | 2018-05-23 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置、試料観察方法、試料台、観察システム、および発光部材 |
EP3502654A1 (en) * | 2017-12-22 | 2019-06-26 | Universiteit Maastricht | Method for applying liquids to a substrate |
JP6500143B2 (ja) * | 2018-03-23 | 2019-04-10 | 株式会社日立ハイテクノロジーズ | 試料観察方法 |
US11435302B2 (en) * | 2018-11-13 | 2022-09-06 | The Trustees Of Princeton University | X-ray assisted electron microscopy staining procedure |
CN109916942B (zh) * | 2019-04-18 | 2021-09-21 | 攀钢集团攀枝花钢铁研究院有限公司 | 捕收剂的电子显微镜表征方法 |
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TW200526587A (en) * | 2003-09-05 | 2005-08-16 | Univ Alabama | Ionic liquids containing secondary hydroxyl-groups and a method for their preparation |
US7880144B2 (en) | 2006-01-20 | 2011-02-01 | Juridical Foundation Osaka Industrial Promotion Organization c/o Mydome Osaka | Liquid medium for preventing charge-up in electron microscope and method of observing sample using the same |
JP2007203205A (ja) * | 2006-02-02 | 2007-08-16 | Nippon Steel Chem Co Ltd | 分離方法及び装置 |
JP5092862B2 (ja) * | 2008-04-14 | 2012-12-05 | 株式会社島津製作所 | 液体マトリックスを用いたmaldi質量分析法 |
JP5226378B2 (ja) * | 2008-04-28 | 2013-07-03 | 株式会社日立ハイテクノロジーズ | 透過型電子顕微鏡、及び試料観察方法 |
JP2010025656A (ja) * | 2008-07-17 | 2010-02-04 | Jeol Ltd | イオン液体を用いた試料の処理方法及び処理システム |
KR20100040671A (ko) | 2008-10-10 | 2010-04-20 | 톰슨 라이센싱 | 적어도 하나의 기준에 따라 네트워크를 선택함으로써 피어들 사이에서 데이터를 송신하는 방법, 연관된 관리 디바이스, 및 통신 장비 |
JP5205234B2 (ja) * | 2008-12-02 | 2013-06-05 | 株式会社日立ハイテクノロジーズ | 微小試料採取装置,検査解析システム、および検査解析方法 |
JP5442417B2 (ja) | 2009-12-14 | 2014-03-12 | 株式会社日立ハイテクノロジーズ | 荷電粒子線装置及び試料観察方法 |
JP4940383B2 (ja) * | 2010-04-28 | 2012-05-30 | オリンパスメディカルシステムズ株式会社 | 顕微鏡用液浸溶液 |
JP5707082B2 (ja) * | 2010-10-08 | 2015-04-22 | 株式会社日立ハイテクノロジーズ | 液体の表面を浮遊する試料の走査電子顕微鏡観察方法 |
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- 2011-09-16 KR KR1020137008741A patent/KR20130072248A/ko not_active Application Discontinuation
- 2011-09-16 CN CN201180048642.3A patent/CN103168221B/zh active Active
- 2011-09-16 WO PCT/JP2011/005234 patent/WO2012046396A1/ja active Application Filing
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Publication number | Publication date |
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DE112011103384B4 (de) | 2022-12-29 |
DE112011103384T5 (de) | 2013-08-14 |
US20130221217A1 (en) | 2013-08-29 |
KR20130072248A (ko) | 2013-07-01 |
CN103168221A (zh) | 2013-06-19 |
JP2012083146A (ja) | 2012-04-26 |
CN103168221B (zh) | 2016-07-06 |
WO2012046396A1 (ja) | 2012-04-12 |
US8698079B2 (en) | 2014-04-15 |
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