JP5704841B2 - 光源装置及びこれを用いた撮像装置 - Google Patents
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- JP5704841B2 JP5704841B2 JP2010133293A JP2010133293A JP5704841B2 JP 5704841 B2 JP5704841 B2 JP 5704841B2 JP 2010133293 A JP2010133293 A JP 2010133293A JP 2010133293 A JP2010133293 A JP 2010133293A JP 5704841 B2 JP5704841 B2 JP 5704841B2
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- G01B9/02027—Two or more interferometric channels or interferometers
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- H01S5/00—Semiconductor lasers
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- H01S5/00—Semiconductor lasers
- H01S5/10—Construction or shape of the optical resonator, e.g. extended or external cavity, coupled cavities, bent-guide, varying width, thickness or composition of the active region
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- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
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- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/05—Construction or shape of optical resonators; Accommodation of active medium therein; Shape of active medium
- H01S3/08—Construction or shape of optical resonators or components thereof
- H01S3/081—Construction or shape of optical resonators or components thereof comprising three or more reflectors
- H01S3/083—Ring lasers
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- H—ELECTRICITY
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- H01S3/00—Lasers, i.e. devices using stimulated emission of electromagnetic radiation in the infrared, visible or ultraviolet wave range
- H01S3/10—Controlling the intensity, frequency, phase, polarisation or direction of the emitted radiation, e.g. switching, gating, modulating or demodulating
- H01S3/10038—Amplitude control
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
- H01S5/0085—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping for modulating the output, i.e. the laser beam is modulated outside the laser cavity
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- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/065—Mode locking; Mode suppression; Mode selection ; Self pulsating
- H01S5/0657—Mode locking, i.e. generation of pulses at a frequency corresponding to a roundtrip in the cavity
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/06—Arrangements for controlling the laser output parameters, e.g. by operating on the active medium
- H01S5/068—Stabilisation of laser output parameters
- H01S5/0683—Stabilisation of laser output parameters by monitoring the optical output parameters
- H01S5/06835—Stabilising during pulse modulation or generation
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
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- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4012—Beam combining, e.g. by the use of fibres, gratings, polarisers, prisms
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- H—ELECTRICITY
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- H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
- H01S5/00—Semiconductor lasers
- H01S5/40—Arrangement of two or more semiconductor lasers, not provided for in groups H01S5/02 - H01S5/30
- H01S5/4025—Array arrangements, e.g. constituted by discrete laser diodes or laser bar
- H01S5/4087—Array arrangements, e.g. constituted by discrete laser diodes or laser bar emitting more than one wavelength
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- Condensed Matter Physics & Semiconductors (AREA)
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- Optics & Photonics (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
- Radiology & Medical Imaging (AREA)
- Lasers (AREA)
- Semiconductor Lasers (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
- Eye Examination Apparatus (AREA)
Description
マスターレーザからパルスの繰り返し周波数f0で光パルスを各スレーブに注入する。
マスターレーザからパルスの繰り返し周波数f0で光パルスを各スレーブレーザに注入する。本形態では、この状況で各スレーブレーザには夫々能動モード同期が掛かるものとする。
上述したパルスを間引く手法の他に、光回路をスイッチングして光パルスを別の導波路に送り込む手法も採用できる。
マスターレーザのパルス発生の繰り返し周波数f0を掃引する際の方式として、図6に示すようにT毎(時間毎)に繰り返し掃引を連続的に行うのではなく、図7に示すようにスレーブの数Nに応じて、N周期に一回の掃引を行う方式も採用可能である。図7ではN=3として、3回に1回の割合で波長掃引がなされる。
本発明の第1の共振器を備えたレーザ発振器は、パルス光を生ずるレーザ光源を採用することができる。
VgT(スレーブ150A内のパルス光の発振波長における群速度をVg、マスターレーザの繰り返し周波数の掃引周期をTとして)だけ長くし、同様の関係を合波導波路937Bと合波導波路937Cに対してももたせる。
150A 150B 150C 第2の共振器
103A 103B 103C 光増幅媒体
106A 106B 106C 光取出し部
109 合波部
123A 123B 123C 屈折率分散を有する光学部材
Claims (12)
- 第1の光共振器を備えたレーザ発振器と、該第1の光共振器に入力部が互いに並列に接続された複数の第2の光共振器と、該第2の光共振器の出力部を介して光を取出す光取出し部と、該光取出し部を経由した光を合波する合波部と、を備え、前記複数の第2の光共振器を経由した光を前記合波部より出射する光源装置であって、
前記複数の第2の光共振器内にはそれぞれ、屈折率分散を有する光学部材と、光増幅媒体と、が配されており、該光増幅媒体が、互いに異なる最大利得波長を有し、
前記第1の光共振器を備えたレーザ発振器よりパルス光が複数の前記第2の光共振器に導入され、前記パルス光の繰り返し周波数を変化させることで、前記第2の光共振器内のモード同期状態が変化し、前記複数の第2の共振器のうちいずれか一つの共振器のみからレーザ発振することで、前記光源装置から出射される光の波長が時間とともに掃引されることを特徴とする光源装置。 - 前記パルス光の導入により前記光増幅媒体を相互利得変調することを特徴とする請求項1に記載の光源装置。
- 前記パルス光の波長は、前記第2の光共振器内に配された前記光増幅媒体が有する増幅帯域内の波長かもしくはそれよりも短いことを特徴とする請求項1または2に記載の光源装置。
- 前記複数の光増幅媒体は、互いに利得帯域の一部が重複することを特徴とする請求項1乃至3のいずれか一項に記載の光源装置。
- 前記複数の第2の光共振器の有する自由スペクトル間隔が互いに等しいことを特徴とする請求項1乃至4のいずれか一項に記載の光源装置。
- 前記光増幅媒体が半導体光増幅器であることを特徴とする請求項1乃至6のいずれか一項に記載の光源装置。
- 前記第2の共振器の各々について、前記レーザ発振器から前記光増幅媒体までの光学的距離と、該光増幅媒体から前記合波部までの光学的距離と、の和が等しいことを特徴とする請求項1乃至7のいずれか一項に記載の光源装置。
- 前記レーザ発振器から前記光増幅媒体までの光学的距離と、該光増幅媒体から合波部までの光学的距離と、の和が各共振器で、VgTずつ異なることを特徴とする請求項1乃至8のいずれか一項に記載の光源装置(但し、Vgは共振器内のパルス光の発振波長における群速度、Tはレーザ発振器の繰り返し周波数の掃引周期を示す)。
- 前記複数の第2の光共振器内で発生したパルス光を前記合波部より順次出射することを特徴とする請求項1乃至9のいずれか一項に記載の光源装置。
- 前記合波部を複数備え、該複数の合波部より複数の光ビームを出射することを特徴とする請求項1乃至10のいずれか一項に記載の光源装置。
- 請求項1ないし11の何れかに記載の光源装置を用いた光源部と、
前記光源部からの光を検体に照射し、検体からの反射光を伝達させる検体測定部と、
前記光源部からの光を参照ミラーに照射し、該参照ミラーからの反射光を伝達させる参照部と、
前記検体測定部からの反射光と前記参照部からの反射光とを干渉させる干渉部と、
前記干渉部からの干渉光を検出する光検出部と、
前記光検出部で検出された光に基づいて、前記検体の断層像を得る画像処理部と、
を有することを特徴とする光断層撮像装置。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010133293A JP5704841B2 (ja) | 2010-06-10 | 2010-06-10 | 光源装置及びこれを用いた撮像装置 |
| US13/154,127 US8964803B2 (en) | 2010-06-10 | 2011-06-06 | Wavelength sweeping light source and imaging apparatus using the same |
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| Application Number | Priority Date | Filing Date | Title |
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| JP2010133293A JP5704841B2 (ja) | 2010-06-10 | 2010-06-10 | 光源装置及びこれを用いた撮像装置 |
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| Publication Number | Publication Date |
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| JP2011258828A JP2011258828A (ja) | 2011-12-22 |
| JP5704841B2 true JP5704841B2 (ja) | 2015-04-22 |
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Families Citing this family (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2012093654A1 (ja) * | 2011-01-05 | 2012-07-12 | 日本電信電話株式会社 | 波長掃引光源 |
| WO2013069106A1 (ja) * | 2011-11-09 | 2013-05-16 | キヤノン株式会社 | 光源装置及びこれを用いた撮像装置 |
| JP2013152223A (ja) * | 2011-12-28 | 2013-08-08 | Canon Inc | 光干渉断層撮像装置及び光干渉断層撮像方法 |
| PL2797492T3 (pl) * | 2011-12-30 | 2018-03-30 | Wavelight Gmbh | Zintegrowane urządzenie dla okulistyki |
| JP5905318B2 (ja) * | 2012-04-05 | 2016-04-20 | 浜松ホトニクス株式会社 | 円偏光光源システム及び円二色性測定システム |
| CN103427334B (zh) * | 2012-05-14 | 2018-09-25 | 三星电子株式会社 | 用于发射波长扫描光的方法和设备 |
| CN104620094B (zh) * | 2012-09-24 | 2017-10-31 | 株式会社爱德万测试 | 光测定装置、方法、程序、记录介质 |
| WO2014077413A1 (en) * | 2012-11-16 | 2014-05-22 | Canon Kabushiki Kaisha | Oct apparatus, ss-oct apparatus, and method of acquiring ss-oct image |
| JP2014149242A (ja) * | 2013-02-01 | 2014-08-21 | Canon Inc | 波長可変光源装置とその駆動方法、及び該波長可変光源装置を備える光断層画像取得装置と光断層画像取得方法 |
| CA2905537C (en) * | 2013-03-15 | 2021-09-14 | Praevium Research, Inc. | Widely tunable swept source |
| JP2015017966A (ja) * | 2013-06-13 | 2015-01-29 | キヤノン株式会社 | 撮像装置および撮像方法 |
| CN106207726A (zh) * | 2016-10-08 | 2016-12-07 | 山东海富光子科技股份有限公司 | 一种基于非相干合束的高能量纳秒脉冲全光纤激光器 |
| JP6943566B2 (ja) | 2016-12-16 | 2021-10-06 | 浜松ホトニクス株式会社 | レーザ装置及び波形制御方法 |
| JP7007667B2 (ja) * | 2018-03-12 | 2022-02-10 | 国立研究開発法人理化学研究所 | パルス電磁波発生装置および計測装置 |
| US11804694B2 (en) * | 2019-03-27 | 2023-10-31 | Samsung Electronics Co., Ltd. | Laser device and method of transforming laser spectrum |
| US12350013B2 (en) * | 2019-10-25 | 2025-07-08 | Samsung Electronics Co., Ltd. | Spectrometer including tunable on-chip laser and spectrum measurement method |
| DE102019133797A1 (de) * | 2019-12-10 | 2021-06-10 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Laser-lichtquelle und lidar-system mit der laser-lichtquelle |
| EP4147312A1 (en) * | 2020-05-08 | 2023-03-15 | Universiteit Gent | Semiconductor mode-locked laser dual comb system |
| US11791902B2 (en) * | 2020-12-16 | 2023-10-17 | Mellanox Technologies, Ltd. | Heterogeneous integration of frequency comb generators for high-speed transceivers |
| JP7441780B2 (ja) * | 2020-12-21 | 2024-03-01 | 浜松ホトニクス株式会社 | 光パルス生成装置及び光パルス生成方法 |
| US12368277B1 (en) * | 2021-01-24 | 2025-07-22 | Cable Television Laboratories, Inc. | Systems and methods for free space optical injection locking |
| US12301289B1 (en) | 2021-01-24 | 2025-05-13 | Cable Television Laboratories, Inc. | Systems and methods for free space optical injection locking |
| WO2024100723A1 (ja) * | 2022-11-07 | 2024-05-16 | 三菱電機株式会社 | ガスセンサ |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5727087A (en) * | 1980-07-25 | 1982-02-13 | Toshiba Corp | Wavelength sweeping laser |
| KR0150486B1 (ko) | 1994-12-07 | 1998-12-01 | 양승택 | 단일 펌프 광원을 이용한 파장가변형 다파장 광섬유 레이저 구도 |
| JPH08182697A (ja) * | 1994-12-28 | 1996-07-16 | Hiroki Kanekura | 電気掃除機を用いる動物の診療方法及びその装置 |
| US6028881A (en) * | 1997-11-10 | 2000-02-22 | Lucent Technologies Inc. | Wavelength selectable laser source |
| US6587484B1 (en) * | 2000-10-10 | 2003-07-01 | Spectrasensor, Inc,. | Method and apparatus for determining transmission wavelengths for lasers in a dense wavelength division multiplexer |
| JP2006047264A (ja) * | 2004-07-09 | 2006-02-16 | Nippon Telegr & Teleph Corp <Ntt> | オプティカル・コヒーレント・トモグラフィー装置及びこれに用いる可変波長光発生装置並びに可変波長発光光源 |
| US7477665B2 (en) * | 2005-02-16 | 2009-01-13 | Polaronyx., Inc. | Electronically tuned self-starting polarization shaping mode locked fiber laser |
| US7443903B2 (en) * | 2006-04-19 | 2008-10-28 | Mobius Photonics, Inc. | Laser apparatus having multiple synchronous amplifiers tied to one master oscillator |
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2010
- 2010-06-10 JP JP2010133293A patent/JP5704841B2/ja not_active Expired - Fee Related
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2011
- 2011-06-06 US US13/154,127 patent/US8964803B2/en not_active Expired - Fee Related
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| Publication number | Publication date |
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| JP2011258828A (ja) | 2011-12-22 |
| US8964803B2 (en) | 2015-02-24 |
| US20110304853A1 (en) | 2011-12-15 |
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