JP5703396B2 - 減数された測定点による公差評価 - Google Patents
減数された測定点による公差評価 Download PDFInfo
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- JP5703396B2 JP5703396B2 JP2013553602A JP2013553602A JP5703396B2 JP 5703396 B2 JP5703396 B2 JP 5703396B2 JP 2013553602 A JP2013553602 A JP 2013553602A JP 2013553602 A JP2013553602 A JP 2013553602A JP 5703396 B2 JP5703396 B2 JP 5703396B2
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- 238000005259 measurement Methods 0.000 title claims description 58
- 238000011156 evaluation Methods 0.000 title description 11
- 238000000034 method Methods 0.000 claims description 46
- 238000004458 analytical method Methods 0.000 claims description 8
- 238000004519 manufacturing process Methods 0.000 claims description 3
- 238000001914 filtration Methods 0.000 claims 2
- 239000013598 vector Substances 0.000 description 9
- 238000012545 processing Methods 0.000 description 8
- 238000000691 measurement method Methods 0.000 description 7
- 238000012935 Averaging Methods 0.000 description 6
- 238000012795 verification Methods 0.000 description 3
- 238000004364 calculation method Methods 0.000 description 2
- 238000009877 rendering Methods 0.000 description 2
- 230000011218 segmentation Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000002591 computed tomography Methods 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000018109 developmental process Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000012804 iterative process Methods 0.000 description 1
- 238000013507 mapping Methods 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 238000003908 quality control method Methods 0.000 description 1
- 239000000523 sample Substances 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
- 238000012800 visualization Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
- G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
- G06T7/0006—Industrial image inspection using a design-rule based approach
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10028—Range image; Depth image; 3D point clouds
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30164—Workpiece; Machine component
Description
Claims (9)
- 部品が公差基準を満たしているか否かを判定する方法であって、
上記部品の複数の測定を行い、各測定において上記部品の測定点を同定する工程と、
上記測定点の数を、すべての測定点を包囲する境界を定めるいくつかの境界点の数まで減じる減縮工程と、
上記境界を名目表面の公差限界と比較し、上記部品が公差に適合しているか否かを判定する工程と、
を備え、
上記減縮工程が、上記測定点を、複数組の、空間的に隣接する測定点部分集合にグループ化する工程と、各測定点部分集合内の測定点の数を減縮された部分集合まで減らす工程とを備え、
上記測定点部分集合ごとに、トップ境界面とボトム境界面とを作成する工程をさらに備え、このトップ境界面とボトム境界面は、上記公差限界を定める表面に名目上平行であり、上記減縮された部分集合内のすべての測定点を包囲することを特徴とする方法。 - 上記減縮された部分集合ごとに側壁を作成する工程をさらに備え、これら側壁が、上記公差限界を定める上記表面に垂直をなし、上記集合内のすべての測定値を包囲することを特徴とする、請求項1に記載の方法。
- 上記複数の測定値のフィルタリング工程をさらに備えたことを特徴とする、請求項1に記載の方法。
- 上記フィルタリングがノイズ除去と外れ値の除去を含むことを特徴とする、請求項3に記載の方法。
- 上記減数されたデータ点を用いてベストフィット分析を行う工程をさらに備えたことを特徴とする、請求項1に記載の方法。
- 上記トップ境界面と上記ボトム境界面と上記側壁により、箱形状が画成され、上記比較工程が、上記箱形状の角の座標を、上記公差限界を定義する名目表面と比較することを特徴とする、請求項2に記載の方法。
- 上記部品が上記公差に適合しているか否かの判定結果を表示する工程をさらに備えたことを特徴とする、請求項1に記載の方法。
- 上記表示工程が、上記製造部品の描写と上記部品の上記名目表面の描写とを表示する工程を含むことを特徴とする、請求項7に記載の方法。
- 上記製造部品の描写が、上記境界点の少なくとも1つと、上記境界点によって同定される表面のうちの一方の描写を含むことを特徴とする、請求項8に記載の方法。
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
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US13/025,385 | 2011-02-11 | ||
US13/025,385 US8447549B2 (en) | 2011-02-11 | 2011-02-11 | Tolerance evaluation with reduced measured points |
PCT/US2012/024686 WO2012148520A2 (en) | 2011-02-11 | 2012-02-10 | Tolerance evaluation with reduced measured points |
Publications (2)
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JP2014508928A JP2014508928A (ja) | 2014-04-10 |
JP5703396B2 true JP5703396B2 (ja) | 2015-04-15 |
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JP2013553602A Active JP5703396B2 (ja) | 2011-02-11 | 2012-02-10 | 減数された測定点による公差評価 |
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Country | Link |
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US (1) | US8447549B2 (ja) |
EP (2) | EP2824415B1 (ja) |
JP (1) | JP5703396B2 (ja) |
WO (1) | WO2012148520A2 (ja) |
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- 2012-02-10 WO PCT/US2012/024686 patent/WO2012148520A2/en active Application Filing
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WO2012148520A2 (en) | 2012-11-01 |
EP2824415A1 (en) | 2015-01-14 |
JP2014508928A (ja) | 2014-04-10 |
WO2012148520A3 (en) | 2013-01-17 |
EP2673589B1 (en) | 2014-10-08 |
US8447549B2 (en) | 2013-05-21 |
EP2673589A4 (en) | 2013-12-18 |
US20120209553A1 (en) | 2012-08-16 |
EP2824415B1 (en) | 2015-07-01 |
EP2673589A2 (en) | 2013-12-18 |
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