JP5698652B2 - 同軸マイクロ波支援堆積及びエッチングシステム - Google Patents
同軸マイクロ波支援堆積及びエッチングシステム Download PDFInfo
- Publication number
- JP5698652B2 JP5698652B2 JP2011500841A JP2011500841A JP5698652B2 JP 5698652 B2 JP5698652 B2 JP 5698652B2 JP 2011500841 A JP2011500841 A JP 2011500841A JP 2011500841 A JP2011500841 A JP 2011500841A JP 5698652 B2 JP5698652 B2 JP 5698652B2
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- Prior art keywords
- microwave
- substrate
- plasma
- source
- deposition
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Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3435—Applying energy to the substrate during sputtering
- C23C14/345—Applying energy to the substrate during sputtering using substrate bias
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
- C23C14/3485—Sputtering using pulsed power to the target
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/511—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using microwave discharges
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/50—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges
- C23C16/515—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating using electric discharges using pulsed discharges
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/321—Radio frequency generated discharge the radio frequency energy being inductively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32192—Microwave generated discharge
- H01J37/32211—Means for coupling power to the plasma
- H01J37/3222—Antennas
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/34—Gas-filled discharge tubes operating with cathodic sputtering
- H01J37/3402—Gas-filled discharge tubes operating with cathodic sputtering using supplementary magnetic fields
- H01J37/3405—Magnetron sputtering
- H01J37/3408—Planar magnetron sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Mechanical Engineering (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Analytical Chemistry (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US12/050,373 US20090238998A1 (en) | 2008-03-18 | 2008-03-18 | Coaxial microwave assisted deposition and etch systems |
| US12/050,373 | 2008-03-18 | ||
| PCT/US2009/035325 WO2009117229A2 (en) | 2008-03-18 | 2009-02-26 | Coaxial microwave assisted deposition and etch systems |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2011515582A JP2011515582A (ja) | 2011-05-19 |
| JP2011515582A5 JP2011515582A5 (enExample) | 2013-06-13 |
| JP5698652B2 true JP5698652B2 (ja) | 2015-04-08 |
Family
ID=41089193
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2011500841A Expired - Fee Related JP5698652B2 (ja) | 2008-03-18 | 2009-02-26 | 同軸マイクロ波支援堆積及びエッチングシステム |
Country Status (6)
| Country | Link |
|---|---|
| US (1) | US20090238998A1 (enExample) |
| JP (1) | JP5698652B2 (enExample) |
| KR (1) | KR101617860B1 (enExample) |
| CN (1) | CN101978095B (enExample) |
| TW (1) | TWI485279B (enExample) |
| WO (1) | WO2009117229A2 (enExample) |
Families Citing this family (29)
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| CN103270578B (zh) * | 2010-12-30 | 2016-10-26 | 应用材料公司 | 使用微波等离子体的薄膜沉积 |
| WO2012148621A2 (en) * | 2011-04-25 | 2012-11-01 | Applied Materials, Inc. | Apparatus and methods for microwave processing of semiconductor substrates |
| US20120302070A1 (en) * | 2011-05-26 | 2012-11-29 | Nanya Technology Corporation | Method and system for performing pulse-etching in a semiconductor device |
| US10319872B2 (en) * | 2012-05-10 | 2019-06-11 | International Business Machines Corporation | Cost-efficient high power PECVD deposition for solar cells |
| US9018108B2 (en) | 2013-01-25 | 2015-04-28 | Applied Materials, Inc. | Low shrinkage dielectric films |
| CN103114278B (zh) * | 2013-02-06 | 2014-12-24 | 上海君威新能源装备有限公司 | 平面磁控ecr-pecvd等离子源装置 |
| CN104233235B (zh) * | 2013-06-06 | 2018-08-07 | 惠州欧博莱光电技术有限公司 | 在工件上形成光学膜的方法及其设备 |
| US9831074B2 (en) * | 2013-10-24 | 2017-11-28 | Applied Materials, Inc. | Bipolar collimator utilized in a physical vapor deposition chamber |
| TWI501455B (zh) * | 2013-10-28 | 2015-09-21 | Inst Nuclear Energy Res Atomic Energy Council | 高功率密度液流電池用之電極製造方法 |
| WO2015138091A1 (en) * | 2014-03-14 | 2015-09-17 | Applied Materials, Inc. | Smart chamber and smart chamber components |
| US9530621B2 (en) * | 2014-05-28 | 2016-12-27 | Tokyo Electron Limited | Integrated induction coil and microwave antenna as an all-planar source |
| JP6240042B2 (ja) * | 2014-08-05 | 2017-11-29 | 東芝メモリ株式会社 | 半導体製造装置および半導体装置の製造方法 |
| US10858727B2 (en) | 2016-08-19 | 2020-12-08 | Applied Materials, Inc. | High density, low stress amorphous carbon film, and process and equipment for its deposition |
| CN107653450B (zh) * | 2017-08-03 | 2019-08-27 | 深圳市科益实业有限公司 | 彩色膜片的制备方法 |
| US12224156B2 (en) | 2018-03-01 | 2025-02-11 | Applied Materials, Inc. | Microwave plasma source for spatial plasma enhanced atomic layer deposition (PE-ALD) processing tool |
| TWI826925B (zh) | 2018-03-01 | 2023-12-21 | 美商應用材料股份有限公司 | 電漿源組件和氣體分配組件 |
| GB2576546A (en) * | 2018-08-23 | 2020-02-26 | Dyson Technology Ltd | An apparatus |
| CN109554690A (zh) * | 2019-01-04 | 2019-04-02 | 朱广智 | 一种微波等离子真空镀膜设备及使用方法 |
| KR102194147B1 (ko) * | 2019-03-29 | 2020-12-22 | 신재철 | 매엽식 건식 식각 챔버 |
| NL2023642B1 (en) | 2019-08-14 | 2021-02-24 | Leydenjar Tech B V | Silicon composition material for use as battery anode |
| GB2599392B (en) * | 2020-09-30 | 2024-01-03 | Dyson Technology Ltd | Sputter deposition apparatus and method |
| CN112133165B (zh) * | 2020-10-15 | 2024-06-25 | 大连理工大学 | 一种直线等离子体实验装置 |
| CN112967920B (zh) * | 2021-02-01 | 2022-07-19 | 湖南红太阳光电科技有限公司 | 一种微波等离子体刻蚀装置及方法 |
| NL2030360B1 (en) * | 2021-12-30 | 2023-07-06 | Leydenjar Tech B V | Plasma-enhanced Chemical Vapour Deposition Apparatus |
| CN118028760B (zh) * | 2023-07-27 | 2024-11-15 | 上海超导科技股份有限公司 | 用于离子束辅助沉积镀膜装置的离子源调整系统 |
| CN119581306B (zh) * | 2024-11-22 | 2025-10-28 | 成都奋羽电子科技有限公司 | 基于微波ecr与射频等离子体耦合的高效刻蚀方法与设备 |
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2008
- 2008-03-18 US US12/050,373 patent/US20090238998A1/en not_active Abandoned
-
2009
- 2009-02-26 WO PCT/US2009/035325 patent/WO2009117229A2/en not_active Ceased
- 2009-02-26 JP JP2011500841A patent/JP5698652B2/ja not_active Expired - Fee Related
- 2009-02-26 CN CN200980109687.XA patent/CN101978095B/zh not_active Expired - Fee Related
- 2009-02-26 KR KR1020107023133A patent/KR101617860B1/ko not_active Expired - Fee Related
- 2009-03-12 TW TW098108081A patent/TWI485279B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| KR20110004388A (ko) | 2011-01-13 |
| CN101978095A (zh) | 2011-02-16 |
| CN101978095B (zh) | 2013-04-03 |
| JP2011515582A (ja) | 2011-05-19 |
| WO2009117229A2 (en) | 2009-09-24 |
| TW200949000A (en) | 2009-12-01 |
| KR101617860B1 (ko) | 2016-05-03 |
| TWI485279B (zh) | 2015-05-21 |
| WO2009117229A3 (en) | 2009-11-12 |
| US20090238998A1 (en) | 2009-09-24 |
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