JP5669290B2 - 試験及び測定機器並びに信号データ識別方法 - Google Patents
試験及び測定機器並びに信号データ識別方法 Download PDFInfo
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- JP5669290B2 JP5669290B2 JP2008260110A JP2008260110A JP5669290B2 JP 5669290 B2 JP5669290 B2 JP 5669290B2 JP 2008260110 A JP2008260110 A JP 2008260110A JP 2008260110 A JP2008260110 A JP 2008260110A JP 5669290 B2 JP5669290 B2 JP 5669290B2
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- 238000012360 testing method Methods 0.000 title claims description 35
- 238000005259 measurement Methods 0.000 title claims description 10
- 238000000034 method Methods 0.000 title description 10
- 238000012805 post-processing Methods 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- 238000004458 analytical method Methods 0.000 description 4
- 238000001514 detection method Methods 0.000 description 4
- 238000010586 diagram Methods 0.000 description 4
- 239000003550 marker Substances 0.000 description 4
- 239000011159 matrix material Substances 0.000 description 4
- 238000001228 spectrum Methods 0.000 description 4
- 230000010363 phase shift Effects 0.000 description 3
- 230000004044 response Effects 0.000 description 3
- 238000004891 communication Methods 0.000 description 2
- 238000010223 real-time analysis Methods 0.000 description 2
- 238000009825 accumulation Methods 0.000 description 1
- 238000013459 approach Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000002085 persistent effect Effects 0.000 description 1
- 238000005070 sampling Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R13/00—Arrangements for displaying electric variables or waveforms
- G01R13/02—Arrangements for displaying electric variables or waveforms for displaying measured electric variables in digital form
- G01R13/0218—Circuits therefor
- G01R13/0254—Circuits therefor for triggering, synchronisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/16—Spectrum analysis; Fourier analysis
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- General Physics & Mathematics (AREA)
- Mathematical Physics (AREA)
- Digital Transmission Methods That Use Modulated Carrier Waves (AREA)
- Radar Systems Or Details Thereof (AREA)
Description
また、本発明は、変調トリガにマッチングする信号データを識別する方法であって;被試験信号のマグニチュード値又は位相値を得るステップ(52又は62の動作:810又は910)と;マグニチュード値又は位相値を変調シグネチャと比較するステップ(58の動作:820/920)と;被試験信号の一部が変調シグネチャとマッチングしたことを示すステップ(60の動作:830/930)とを具えている。
y=Hθ+e
二乗したエラーを最小とするため、最小二乗フィットにより、パラメータ・ベクトルθを見積もることができる。推定量θは、
20 入力プロセッサ
22 フィルタ
24 ミキサ
26 局部発振器
28 バンドパス・フィルタ
30 A/D変換器
31 直交プロセッサ
32 プロセッサ
34 表示器
36 取込みメモリ
40 トリガ発生器
52 マグニチュード・プロセッサ(信号入力手段)
54 シフト・レジスタ
56、80 マグニチュード・シグネチャ
58 検出器
60 比較器
62 位相プロセッサ(信号入力手段)
66 位相シグネチャ
Claims (2)
- 被試験信号に対応する複数の位相値を得る信号入力手段と、
複数の上記位相値と位相シグネチャとの差分に上記位相シグネチャに対応するマグニチュード・シグナチャに基づく重み付けを適用して比較する検出器と、
該検出器の出力がしきい値以内の時にトリガ信号を発生する比較器と
を具える試験及び測定機器。 - 被試験信号に対応する複数の位相値を得るステップと、
複数の上記位相値と位相シグネチャとの差分に上記位相シグネチャに対応するマグニチュード・シグナチャに基づく重み付けを適用して比較するステップと、
上記比較ステップにおける比較結果がしきい値以内の時にトリガ信号を発生するステップと
を具える信号データ識別方法。
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/869,637 | 2007-10-09 | ||
US11/869,637 US7816904B2 (en) | 2007-10-09 | 2007-10-09 | Modulation signature trigger |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2009092660A JP2009092660A (ja) | 2009-04-30 |
JP5669290B2 true JP5669290B2 (ja) | 2015-02-12 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2008260110A Active JP5669290B2 (ja) | 2007-10-09 | 2008-10-06 | 試験及び測定機器並びに信号データ識別方法 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7816904B2 (ja) |
EP (1) | EP2048509B1 (ja) |
JP (1) | JP5669290B2 (ja) |
CN (1) | CN101419252B (ja) |
Families Citing this family (10)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5037598B2 (ja) | 2009-12-18 | 2012-09-26 | テクトロニクス・インターナショナル・セールス・ゲーエムベーハー | 信号分析装置用トリガ生成装置及び方法 |
US8452571B2 (en) * | 2010-03-16 | 2013-05-28 | Tektronix, Inc | Trigger figure-of-merit indicator |
US8452559B2 (en) * | 2010-05-12 | 2013-05-28 | Tektronix, Inc. | Density trace measurement |
US9297834B2 (en) * | 2010-08-13 | 2016-03-29 | Tektronix, Inc. | Time-domain searching in a test and measurement instrument |
US8649989B2 (en) * | 2010-08-13 | 2014-02-11 | Tektronix, Inc. | Time-domain triggering in a test and measurement instrument |
EP2520941B1 (en) * | 2011-04-27 | 2015-03-04 | Tektronix, Inc. | Trigger figure-of-merit indicator |
CN102957643B (zh) * | 2011-08-26 | 2015-10-21 | 上海创远仪器技术股份有限公司 | 一种宽带信号的触发捕获方法及装置 |
CN102735924B (zh) * | 2012-06-14 | 2015-05-20 | 中国电子科技集团公司第四十一研究所 | 一种超外差式微波分析仪器中的频率瞬变特征检测装置及方法 |
EP3502712B1 (en) * | 2017-12-22 | 2024-04-24 | Rohde & Schwarz GmbH & Co. KG | Signal post-processing method, signal post-processing circuit and oscilloscope |
CN115460048B (zh) * | 2022-09-19 | 2024-04-02 | 四川九洲电器集团有限责任公司 | 一种基于码元速率的msk调制识别方法、介质及装置 |
Family Cites Families (20)
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US4686655A (en) * | 1970-12-28 | 1987-08-11 | Hyatt Gilbert P | Filtering system for processing signature signals |
US4491930A (en) * | 1970-12-28 | 1985-01-01 | Hyatt Gilbert P | Memory system using filterable signals |
US4096397A (en) * | 1977-03-29 | 1978-06-20 | Honeywell Inc. | Oscillographic apparatus |
DE2818768C2 (de) * | 1978-04-28 | 1986-07-24 | Hewlett-Packard GmbH, 7030 Böblingen | Verfahren und Vorrichtung zum Messen der Frequenz bzw. der Periodendauer der Grundschwingung eines annähernd periodischen Eingangssignales |
JPS6193962A (ja) | 1984-10-15 | 1986-05-12 | Anritsu Corp | パタ−ントリガ付オシロスコ−プ |
JPH02138877A (ja) * | 1988-11-18 | 1990-05-28 | Yokogawa Electric Corp | 波形記憶装置 |
US4914418A (en) * | 1989-01-03 | 1990-04-03 | Emerson Electric Co. | Outbound detector system and method |
US5341435A (en) * | 1992-03-17 | 1994-08-23 | Corbett Technology Company, Inc. | System for detection and recognition of an object by video imaging means |
JP3016114B2 (ja) * | 1993-07-07 | 2000-03-06 | テクトロニクス・インコーポレイテッド | オシロスコープ及び測定機器 |
JP3548338B2 (ja) * | 1996-05-15 | 2004-07-28 | 日置電機株式会社 | 波形データ記録装置 |
US7286755B1 (en) * | 2003-03-11 | 2007-10-23 | Nortel Networks Limited | Method and apparatus for testing an optical component |
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AU2004262052B2 (en) * | 2003-08-04 | 2009-06-04 | Locata Corporation Pty Ltd | A system and method for determining attitude using spatial shift key (SSK) modulation signatures |
US7349457B2 (en) * | 2004-03-29 | 2008-03-25 | Aeroflex Powel, Inc. | Broadband frequency agile signal characterization |
US7765086B2 (en) * | 2004-12-09 | 2010-07-27 | Tektronix, Inc. | Modulation domain trigger |
US7471652B2 (en) * | 2004-12-16 | 2008-12-30 | Tektronix, Inc. | Real-time RF/IF signature trigger |
US7285946B2 (en) | 2005-02-07 | 2007-10-23 | Lecroy Corporation | Pattern trigger in a coherent timebase |
US7734464B2 (en) | 2005-05-20 | 2010-06-08 | Tektronix, Inc. | RF autocorrelation signal trigger generator |
US20070200550A1 (en) | 2006-02-28 | 2007-08-30 | Corredoura Paul L | Trigger architecture, measurement system and method of use |
GB2455052A (en) | 2007-09-21 | 2009-06-03 | Agilent Technologies Inc | Trigger event detection apparatus and method therefore |
-
2007
- 2007-10-09 US US11/869,637 patent/US7816904B2/en active Active
-
2008
- 2008-10-06 JP JP2008260110A patent/JP5669290B2/ja active Active
- 2008-10-08 EP EP08166128.2A patent/EP2048509B1/en active Active
- 2008-10-09 CN CN2008101769881A patent/CN101419252B/zh active Active
Also Published As
Publication number | Publication date |
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JP2009092660A (ja) | 2009-04-30 |
US7816904B2 (en) | 2010-10-19 |
EP2048509A1 (en) | 2009-04-15 |
EP2048509B1 (en) | 2013-12-11 |
CN101419252B (zh) | 2013-07-17 |
CN101419252A (zh) | 2009-04-29 |
US20090094495A1 (en) | 2009-04-09 |
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