JP5496525B2 - 半導体レーザの試験方法およびレーザ試験装置 - Google Patents

半導体レーザの試験方法およびレーザ試験装置 Download PDF

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JP5496525B2
JP5496525B2 JP2009064863A JP2009064863A JP5496525B2 JP 5496525 B2 JP5496525 B2 JP 5496525B2 JP 2009064863 A JP2009064863 A JP 2009064863A JP 2009064863 A JP2009064863 A JP 2009064863A JP 5496525 B2 JP5496525 B2 JP 5496525B2
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Prior art keywords
optical fiber
wavelength
length
laser
unit
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JP2009064863A
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Japanese (ja)
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JP2010219333A5 (enExample
JP2010219333A (ja
Inventor
晴義 小野
功 馬場
誠 杉山
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Sumitomo Electric Device Innovations Inc
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Sumitomo Electric Device Innovations Inc
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Priority to JP2009064863A priority Critical patent/JP5496525B2/ja
Priority to US12/726,015 priority patent/US8248587B2/en
Publication of JP2010219333A publication Critical patent/JP2010219333A/ja
Publication of JP2010219333A5 publication Critical patent/JP2010219333A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/0014—Measuring characteristics or properties thereof
    • H01S5/0021—Degradation or life time measurements
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04B—TRANSMISSION
    • H04B10/00—Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • H04B10/073—Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems using an out-of-service signal
    • H04B10/0731—Testing or characterisation of optical devices, e.g. amplifiers
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/005—Optical components external to the laser cavity, specially adapted therefor, e.g. for homogenisation or merging of the beams or for manipulating laser pulses, e.g. pulse shaping
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01S—DEVICES USING THE PROCESS OF LIGHT AMPLIFICATION BY STIMULATED EMISSION OF RADIATION [LASER] TO AMPLIFY OR GENERATE LIGHT; DEVICES USING STIMULATED EMISSION OF ELECTROMAGNETIC RADIATION IN WAVE RANGES OTHER THAN OPTICAL
    • H01S5/00—Semiconductor lasers
    • H01S5/04—Processes or apparatus for excitation, e.g. pumping, e.g. by electron beams
    • H01S5/042—Electrical excitation ; Circuits therefor
    • H01S5/0428—Electrical excitation ; Circuits therefor for applying pulses to the laser

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Semiconductor Lasers (AREA)
  • Optical Communication System (AREA)
JP2009064863A 2009-03-17 2009-03-17 半導体レーザの試験方法およびレーザ試験装置 Active JP5496525B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009064863A JP5496525B2 (ja) 2009-03-17 2009-03-17 半導体レーザの試験方法およびレーザ試験装置
US12/726,015 US8248587B2 (en) 2009-03-17 2010-03-17 Testing method of semiconductor laser and laser testing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009064863A JP5496525B2 (ja) 2009-03-17 2009-03-17 半導体レーザの試験方法およびレーザ試験装置

Publications (3)

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JP2010219333A JP2010219333A (ja) 2010-09-30
JP2010219333A5 JP2010219333A5 (enExample) 2012-05-10
JP5496525B2 true JP5496525B2 (ja) 2014-05-21

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US (1) US8248587B2 (enExample)
JP (1) JP5496525B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN103576068A (zh) * 2013-11-05 2014-02-12 吉林大学 通用半导体激光器电导数测试仪
CN112649795A (zh) * 2020-11-19 2021-04-13 中国电子科技集团公司第十一研究所 一种用于评估激光测距机性能的距离模拟方法及系统
CN119602865B (zh) * 2024-11-08 2025-10-21 中国科学院西安光学精密机械研究所 一种具有多波长自环测试功能的空间激光通信收发系统及方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61243340A (ja) * 1985-04-19 1986-10-29 Sumitomo Electric Ind Ltd 可変分散フアイバ装置
JPH01204491A (ja) 1988-02-09 1989-08-17 Hitachi Ltd 光伝送システムおよび半導体レーザの選別方法
JPH0823513B2 (ja) * 1989-10-20 1996-03-06 株式会社東芝 分布型光ファイバセンサ
JPH0566430A (ja) * 1991-09-06 1993-03-19 Ando Electric Co Ltd 高出力光パルス発生器
JP3177361B2 (ja) * 1993-11-17 2001-06-18 松下電器産業株式会社 光送信装置
US5552881A (en) * 1994-03-17 1996-09-03 Teradyne, Inc. Method and apparatus for scanning a fiber optic network
JPH09167995A (ja) * 1995-12-15 1997-06-24 Kokusai Denshin Denwa Co Ltd <Kdd> 光伝送路補償装置および光波長多重伝送システム
JPH10300629A (ja) * 1997-04-30 1998-11-13 Anritsu Corp 光伝送特性測定器及びそれを用いた校正方法
JP2001308788A (ja) * 2000-04-21 2001-11-02 Nec Corp 光通信用光源の選別方法及び選別装置
JP2002111632A (ja) * 2000-10-02 2002-04-12 Sony Corp 光信号送受方法及び装置
JP2004020721A (ja) * 2002-06-13 2004-01-22 Furukawa Electric Co Ltd:The 光ファイバ、光ファイバの製造方法および光伝送路
WO2004084440A1 (ja) * 2003-03-18 2004-09-30 Fujitsu Limited 伝送特性評価システムおよびその擬似伝送路装置
JP2007173969A (ja) * 2005-12-19 2007-07-05 Fujitsu Ltd 光パワー調整方法、光送信装置、及び光受信装置
KR20080064316A (ko) * 2007-01-04 2008-07-09 삼성전자주식회사 광섬유 링크 감시 장치
JP2008228002A (ja) * 2007-03-14 2008-09-25 Fujitsu Ltd 光伝送装置における光伝送ユニット増設時の分散補償量設定方法及び光伝送装置

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US8248587B2 (en) 2012-08-21
JP2010219333A (ja) 2010-09-30
US20100238426A1 (en) 2010-09-23

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