JP5438327B2 - テラヘルツ波を用いる測定装置 - Google Patents

テラヘルツ波を用いる測定装置 Download PDF

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Publication number
JP5438327B2
JP5438327B2 JP2009012454A JP2009012454A JP5438327B2 JP 5438327 B2 JP5438327 B2 JP 5438327B2 JP 2009012454 A JP2009012454 A JP 2009012454A JP 2009012454 A JP2009012454 A JP 2009012454A JP 5438327 B2 JP5438327 B2 JP 5438327B2
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Japan
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unit
integration
frequency
time
signal
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JP2009012454A
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Japanese (ja)
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JP2010169541A (ja
JP2010169541A5 (enExample
Inventor
健明 井辻
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Canon Inc
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Canon Inc
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Priority to JP2009012454A priority Critical patent/JP5438327B2/ja
Priority to US12/642,427 priority patent/US7906764B2/en
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Publication of JP2010169541A5 publication Critical patent/JP2010169541A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
    • G01J3/28—Investigating the spectrum
    • G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry

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  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • General Physics & Mathematics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP2009012454A 2009-01-23 2009-01-23 テラヘルツ波を用いる測定装置 Expired - Fee Related JP5438327B2 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2009012454A JP5438327B2 (ja) 2009-01-23 2009-01-23 テラヘルツ波を用いる測定装置
US12/642,427 US7906764B2 (en) 2009-01-23 2009-12-18 Measuring apparatus using terahertz wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2009012454A JP5438327B2 (ja) 2009-01-23 2009-01-23 テラヘルツ波を用いる測定装置

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JP2010169541A JP2010169541A (ja) 2010-08-05
JP2010169541A5 JP2010169541A5 (enExample) 2012-03-01
JP5438327B2 true JP5438327B2 (ja) 2014-03-12

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JP2009012454A Expired - Fee Related JP5438327B2 (ja) 2009-01-23 2009-01-23 テラヘルツ波を用いる測定装置

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US (1) US7906764B2 (enExample)
JP (1) JP5438327B2 (enExample)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5669629B2 (ja) * 2010-05-18 2015-02-12 キヤノン株式会社 テラヘルツ波の測定装置及び測定方法
CN104330160B (zh) * 2014-10-16 2017-01-18 中国电子科技集团公司第五十研究所 一种太赫兹频谱分析仪
CN106248616B (zh) * 2016-09-27 2017-10-24 深圳市太赫兹科技创新研究院有限公司 太赫兹全偏振态检测光谱仪

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5952818A (en) * 1996-05-31 1999-09-14 Rensselaer Polytechnic Institute Electro-optical sensing apparatus and method for characterizing free-space electromagnetic radiation
US6957099B1 (en) * 1999-02-23 2005-10-18 Teraview Limited Method and apparatus for terahertz imaging
FR2876465B1 (fr) * 2004-10-08 2007-01-19 Commissariat Energie Atomique Porte optique terahertz
JP2006145372A (ja) * 2004-11-19 2006-06-08 Matsushita Electric Ind Co Ltd テラヘルツ電磁波発生装置
JP2006266908A (ja) * 2005-03-24 2006-10-05 Tochigi Nikon Corp テラヘルツパルス光測定装置および測定方法
US7291856B2 (en) * 2005-04-28 2007-11-06 Honeywell International Inc. Sensor and methods for measuring select components in moving sheet products
JP4654996B2 (ja) * 2006-07-12 2011-03-23 株式会社島津製作所 テラヘルツ波応答測定装置

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JP2010169541A (ja) 2010-08-05
US7906764B2 (en) 2011-03-15
US20100187420A1 (en) 2010-07-29

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