JP5384896B2 - 照明された試料の光学的捕捉のための方法および装置 - Google Patents

照明された試料の光学的捕捉のための方法および装置 Download PDF

Info

Publication number
JP5384896B2
JP5384896B2 JP2008250580A JP2008250580A JP5384896B2 JP 5384896 B2 JP5384896 B2 JP 5384896B2 JP 2008250580 A JP2008250580 A JP 2008250580A JP 2008250580 A JP2008250580 A JP 2008250580A JP 5384896 B2 JP5384896 B2 JP 5384896B2
Authority
JP
Japan
Prior art keywords
sample
light
image
pattern
illumination
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008250580A
Other languages
English (en)
Japanese (ja)
Other versions
JP2009086669A5 (enExample
JP2009086669A (ja
Inventor
ヴォレシェンスキー ラルフ
ケンペ ミハエル
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Carl Zeiss Microscopy GmbH
Original Assignee
Carl Zeiss Microscopy GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Carl Zeiss Microscopy GmbH filed Critical Carl Zeiss Microscopy GmbH
Publication of JP2009086669A publication Critical patent/JP2009086669A/ja
Publication of JP2009086669A5 publication Critical patent/JP2009086669A5/ja
Application granted granted Critical
Publication of JP5384896B2 publication Critical patent/JP5384896B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0048—Scanning details, e.g. scanning stages scanning mirrors, e.g. rotating or galvanomirrors, MEMS mirrors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0036—Scanning details, e.g. scanning stages
    • G02B21/0044—Scanning details, e.g. scanning stages moving apertures, e.g. Nipkow disks, rotating lens arrays
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/0052—Optical details of the image generation
    • G02B21/0068—Optical details of the image generation arrangements using polarisation
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/002—Scanning microscopes
    • G02B21/0024—Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders
    • G02B21/008—Details of detection or image processing, including general computer control

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • General Engineering & Computer Science (AREA)
  • Microscoopes, Condenser (AREA)
JP2008250580A 2007-09-28 2008-09-29 照明された試料の光学的捕捉のための方法および装置 Expired - Fee Related JP5384896B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102007047465.4 2007-09-28
DE200710047465 DE102007047465A1 (de) 2007-09-28 2007-09-28 Verfahren und Anordnung zur optischen Erfassung einer beleuchteten Probe

Publications (3)

Publication Number Publication Date
JP2009086669A JP2009086669A (ja) 2009-04-23
JP2009086669A5 JP2009086669A5 (enExample) 2013-01-31
JP5384896B2 true JP5384896B2 (ja) 2014-01-08

Family

ID=39938200

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008250580A Expired - Fee Related JP5384896B2 (ja) 2007-09-28 2008-09-29 照明された試料の光学的捕捉のための方法および装置

Country Status (3)

Country Link
EP (1) EP2042906B1 (enExample)
JP (1) JP5384896B2 (enExample)
DE (1) DE102007047465A1 (enExample)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101799860B1 (ko) 2010-10-14 2017-11-23 엘지전자 주식회사 위상 시프터 패턴이 형성된 공간 필터를 구비하는 마스크리스 노광장치 및 노광방법
DE102011114500B4 (de) * 2011-09-29 2022-05-05 Fei Company Mikroskopvorrichtung
KR101356706B1 (ko) 2012-04-13 2014-02-05 (주)가하 광량 변조와 스캐닝 시스템 기반의 구조 조명 현미경
DE102012020877A1 (de) * 2012-10-17 2014-04-17 Carl Zeiss Microscopy Gmbh Optikanordnung und Lichtmikroskop
FR3068780B1 (fr) * 2017-07-06 2021-05-14 Centre Nat Etd Spatiales Spectrophotometre hyperspectral large bande

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3826317C1 (enExample) 1988-08-03 1989-07-06 Ernst Leitz Wetzlar Gmbh, 6330 Wetzlar, De
JP3816632B2 (ja) 1997-05-14 2006-08-30 オリンパス株式会社 走査型顕微鏡
DE19923822A1 (de) * 1999-05-19 2000-11-23 Zeiss Carl Jena Gmbh Scannende Anordnung, vorzugsweise zur Erfassung von Fluoreszenzlicht
ATE493683T1 (de) * 2001-04-07 2011-01-15 Zeiss Carl Microimaging Gmbh Verfahren und anordnung zur tiefenaufgelösten optischen erfassung einer probe
DE10155002A1 (de) 2001-11-08 2003-05-22 Zeiss Carl Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
US6888148B2 (en) * 2001-12-10 2005-05-03 Carl Zeiss Jena Gmbh Arrangement for the optical capture of excited and /or back scattered light beam in a sample
JP3731073B2 (ja) * 2002-09-17 2006-01-05 独立行政法人理化学研究所 顕微鏡装置
DE10254139A1 (de) * 2002-11-15 2004-05-27 Carl Zeiss Jena Gmbh Verfahren und Anordnung zur tiefenaufgelösten optischen Erfassung einer Probe
US7339148B2 (en) * 2002-12-16 2008-03-04 Olympus America Inc. Confocal microscope
JP4844137B2 (ja) * 2006-01-30 2011-12-28 株式会社ニコン 顕微鏡装置
JP2007199572A (ja) * 2006-01-30 2007-08-09 Nikon Corp 顕微鏡装置

Also Published As

Publication number Publication date
EP2042906B1 (de) 2014-03-05
EP2042906A1 (de) 2009-04-01
DE102007047465A1 (de) 2009-04-02
JP2009086669A (ja) 2009-04-23

Similar Documents

Publication Publication Date Title
US8280131B2 (en) Method and configuration for optically detecting an illuminated specimen
JP6023147B2 (ja) 照明された試料を光学的に捕捉するための方法および装置
US9927226B2 (en) Method and configuration for depth resolved optical detection of an illuminated specimen
US7339148B2 (en) Confocal microscope
US12105271B2 (en) Microscope and method for microscopic image recording with variable illumination
EP2053442B1 (en) Scanning laser microscope
JP3816632B2 (ja) 走査型顕微鏡
CN107580677B (zh) 用于二维点阵列倾斜入射扫描的系统和方法
JP5897563B2 (ja) ライン走査式顕微鏡における同期用システム
EP1852724B1 (en) Laser confocal scanning microscope and method of improving image quality in such microscope
JP2006011446A (ja) 複数焦点スタック画像を形成する方法及び装置
CN105911680A (zh) 具有连续片光源的spim显微镜
JP2003167197A5 (enExample)
JP5384896B2 (ja) 照明された試料の光学的捕捉のための方法および装置
CA3065917A1 (en) Super-resolution line scanning confocal microscopy with pupil filtering
US10746657B2 (en) Method for accelerated high-resolution scanning microscopy
EP1586931A2 (en) Slit confocal microscope and method
CN108885336A (zh) 用于研究样品的方法和显微镜
JP2022511677A (ja) 高スループット光トモグラフィイメージング方法及びイメージングシステム
JP2009086669A5 (enExample)
US7385165B2 (en) Multibeam type scanning microscope
CN120359447A (zh) 显微镜
US11536953B2 (en) Multi-spot scanning device, system and method
JP7330960B2 (ja) 試料を走査するための方法および装置
US20240385421A1 (en) Method and apparatus for high resolution microscopy

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110803

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20120119

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121212

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20130410

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20130416

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20130708

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20130711

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20130814

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130903

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20131003

R150 Certificate of patent or registration of utility model

Ref document number: 5384896

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees