JP5278510B2 - Inspection system and inspection method - Google Patents

Abstract

The present invention enables a liquid to be inspected to be stored in a measurement region of an absorbance measurement tank during measurement and enables the absorbance of the liquid to be accurately measured. An inspection object acceptor (1) is provided with an absorbance measurement tank (7), the absorbance measurement tank (7) comprises a passage region (8) which has a second depth (D2) in the direction perpendicular to a flow path forming surface and through which a liquid to be inspected (EL) passes, a measurement region (10) which has a first depth (D1) shallower than the second depth in the perpendicular direction and through which measurement light passes in order to measure the absorbance of the liquid to be inspected (EL), and a bottom surface (9B) which connects both the regions (8, 10) such that the liquid to be inspected (EL) flows from the passage region (8) into the measurement region (10), the flow path forming surface (2A) is parallel to the direction of gravity force (GF), the bottom surface (9B) of the passage region (8) is located on the downstream side in a rotation direction (93) from the bottom surface (10A) of the measurement region (10), and the inspection object acceptor has an outer wall surface (2B) that fits in a holder (47R) of an inspection device (30) so as to be mounted in the holder (47R).

Description

  The present invention relates to an inspection system having a configuration in which a liquid to be inspected can be held in an absorbance measurement tank by inertial force and optical analysis can be performed, and an inspection method using the inspection system.

  The microchip corresponding to the inspection object receiver has a substrate surface as a flow path forming surface on which a flow path for the liquid to be inspected is formed, and is housed in a chip holder that can rotate around the main axis of the inspection apparatus. The In the inspection apparatus disclosed in Patent Document 1, the microchip is stored in the chip holder so that the flow path forming surface is perpendicular to the main axis. From this microchip storage configuration, the inspection apparatus disclosed in Patent Document 1 is an inspection apparatus that mounts a microchip so that the flow path forming surface is parallel to the rotation plane of the chip holder, a so-called horizontal inspection apparatus. Belonging to.

  The inspection apparatus includes a light source for measuring absorbance, a detector as a light receiving unit, a rotational drive source for applying a centrifugal force to a liquid in the microchip in a desired direction, and a control unit. Since the light source is fixed to the inspection device, when the measurement light is emitted from the light source toward the chip holder, the measurement light is surely applied to the measurement region as the absorptiometry unit for a sufficient time that can be measured. The rotation drive source is controlled by an instruction from the control unit, and the chip holder is stopped. When the tip holder is stopped during the absorbance measurement, the liquid cannot be retained in the measurement region by centrifugal force.

  As the microchip, for example, the microchip disclosed in Patent Document 2 is used. The blood in the microchip of Patent Document 2 is separated into a plasma component and a blood cell component by applying a centrifugal force in an arbitrary direction, and then mixed with a reagent. It is accommodated in a measurement area as an incident detector.

JP 2008-8875 A JP 2009-128229 A

  In addition to the horizontal inspection apparatus, an inspection apparatus for placing a microchip so that the flow path forming surface is perpendicular to the rotation plane of the chip holder, a so-called vertical inspection apparatus, is conceivable. The vertical inspection apparatus can arrange the measurement area on the gravity direction side (lower side), and can cause the liquid to flow to the measurement area and keep it by gravity.

  Generally, by providing air holes in the flow path, it becomes easier to move the liquid between the flow paths. However, if air holes are provided in the measurement region, the liquid to be inspected in the measurement region flows outside the microchip, and therefore, air holes cannot be provided in the measurement region. When no air hole is provided in the measurement region, the measurement region is located on the end side of the flow path, so that air tends to accumulate in the measurement region. Since air accumulates in the measurement area, if the force to flow the liquid to be inspected to the measurement area is weak, the liquid to be inspected flowing from the flow path stays in the area upstream of the measurement area, and the liquid is in the measurement area. It may not flow.

  Furthermore, the shape of the measurement region is shallower in the incident direction of the measurement light than the other regions so that the absorbance can be measured even if the position where the measurement light strikes the limited amount of liquid to be inspected. In addition, it is desirable that the surface is wider in the plane orthogonal to the incident direction of the measurement light. In this case, the measurement area, which is a relatively shallow area, has a small cross-sectional area at the connection portion with the other area, and therefore the air escape path from the measurement area to the other area is limited. For this reason, when the force of flowing the liquid to be inspected to the measurement region is weak compared to other regions, air tends to remain in the measurement region as liquid bubbles.

For the above reasons, when measuring the absorbance, there is a problem that a sufficient amount of liquid to be inspected is not filled depending on the position where the measurement light hits the measurement area, and the liquid absorbance cannot be measured accurately. was there.

  The present invention has been made in view of the above problems, and more liquid to be inspected can be retained in the measurement region of the absorbance measurement tank during measurement, and the absorbance of the liquid can be accurately measured. An object is to provide an inspection system and an inspection method.

  In order to achieve the above object, the inspection system according to claim 1 has a flow path forming surface in which a recessed flow path capable of flowing the liquid to be inspected is formed, and the liquid to be inspected. A measurement region having a first depth in a direction perpendicular to the flow path formation surface, and a liquid to be inspected from the flow channel toward the measurement region. An absorbance measurement tank that is a recess having a passage region that passes through and gradually becomes shallower from the second depth deeper than the first depth toward the measurement region in a direction perpendicular to the flow path forming surface. An inspection object receiver, a holder for detachably storing the inspection object receiver, a rotation drive source for rotating the holder about a main shaft extending along the direction of gravity, and rotating the holder in the rotation direction. Of the holder A rotation control unit that controls the rotational drive source to accelerate or decelerate the speed, an angle change source that changes the angle of the holder around an axis that intersects the flow path forming surface, and an angle of the holder An angle setting unit that controls the angle changing source, a light source that causes the measurement light to enter the measurement region of the inspection object receiver housed in the holder, and a measurement light that has passed through the measurement region A mounting position in which the flow path forming surface is along the direction of gravity, and the bottom surface of the measurement region is downstream of the bottom surface of the passage region in the rotation direction. The inspection object receptacle is accommodated, and the angle setting unit reduces the angular velocity of the holder to stop the measurement region in the holder at a position where measurement light emitted from the light source is incident. In addition, As serial measurement region is positioned below the passage area in the direction of gravity, and sets the angle of the holder.

  The rotation control unit of the inspection system according to claim 2, wherein the holder is accelerated at a first angular acceleration from when the rotation is stopped until reaching a predetermined angular velocity in the rotation direction, and from the predetermined angular velocity to the rotation direction. The measurement area in the holder is decelerated at the second angular acceleration until it stops at the position where the measurement light emitted from the light source enters, and the second angular acceleration is equal to or larger than the first angular acceleration. The rotational drive source is controlled as described above.

  The inspection system according to claim 3, wherein the holder includes first and second holders that respectively accommodate a plurality of inspection object receptacles, and the rotation control unit is accommodated in the first holder. The direction of rotation when guiding the measurement area of the inspection object receiver to the position where the measurement light emitted from the light source enters, and the measurement area of the inspection object receiver housed in the second holder from the light source The rotational drive source is controlled so that the direction of rotation when guiding the emitted measurement light to the incident position is the same as the rotational direction.

  The inspection system according to claim 4 is characterized in that the surface roughness of the bottom surface of the measurement region is an average roughness Ra value of 70 nm or less.

  The inspection system according to claim 5 is characterized in that the surface roughness of the side wall surface of the measurement region is larger than the surface roughness of the bottom surface of the measurement region.

  The inspection system according to claim 6, further comprising: posture restriction means for restricting a posture in which the inspection subject receiver is attached to the holder to the attachment posture, and the posture restriction means is provided on the outer wall surface. Features.

  The inspection system according to claim 7 is characterized in that the posture regulating means is a notch provided in the outer wall surface.

  The inspection method according to claim 8 includes a flow path forming surface in which a concave flow path through which a liquid to be inspected can flow is formed, and is used for measuring the absorbance of the liquid to be inspected. A measurement region that transmits measurement light and has a first depth in a direction perpendicular to the flow channel formation surface, and a liquid to be inspected passes from the flow channel toward the measurement region, and the flow channel formation surface A test object receiver comprising an absorbance measurement tank that is a recess having a passage region that gradually becomes shallower from a second depth deeper than the first depth in a direction perpendicular to the first depth to the measurement region; A holder for detachably storing the test object receptacle, a rotational drive source for rotating the holder about a main axis extending in the direction of gravity, a rotation of the holder in the rotational direction, and an angular velocity of the holder To accelerate or decelerate A rotation control unit that controls the rotation drive source; an angle change source that changes an angle of the holder around an axis that intersects the flow path forming surface; and an angle change source that sets the angle of the holder. An angle setting unit for controlling, a light source for allowing measurement light to be incident on the measurement region of the inspection object receiver housed in the holder, and a light receiving unit for receiving the measurement light transmitted through the measurement region. The measurement region in the holder is emitted from the light source in a state where the inspection target receptacle is stored in the holder so that the flow path forming surface extends in a direction along the direction of gravity. A rotation step in which the rotation control unit rotates the rotation drive source so that the bottom surface of the measurement region is downstream of the bottom surface of the passage region in the rotation direction in order to guide the measurement light to the position where the measurement light is incident. When the rotation control unit decelerates the angular velocity of the holder to stop the measurement area in the holder at a position where measurement light emitted from the light source is incident, the measurement area is in the direction of gravity. An angle setting step in which the angle setting unit controls the angle change source so that the angle setting unit is positioned below the passage region, and the measurement light is emitted from the light source to the measurement region of the inspection object receiver housed in the holder And a measurement step of receiving the measurement light transmitted through the measurement region.

  The inspection system according to claim 1 is mounted on the holder in a mounting posture in which the flow path forming surface is along the direction of gravity and the bottom surface of the passage region is downstream of the bottom surface of the measurement region in the rotational direction. It has an outer wall surface that fits into the holder. In the inspection target receptacle attached to the vertical inspection apparatus, the liquid to be inspected that has flowed into the passage region of the absorbance measurement tank through the flow path is held in the passage region and does not easily flow into the measurement region. . In this state, when the angular velocity of the holder is decelerated, the inertial force generated by the deceleration acts on the liquid to be inspected in the passage region. Since the inertial force acts on the liquid to be inspected in the passage region, the liquid to be inspected easily flows from the passage region to the measurement region on the downstream side in the direction in which the inertial force acts. In addition, when the inertial force acts on the liquid to be inspected, the liquid to be inspected flows vigorously to the measurement area, and the air in the measurement area can be positively moved to the passing area side. As a result, more liquid to be inspected remains in the measurement region during measurement, and the absorbance of the liquid can be accurately measured. Further, the bottom surface of the passage region becomes shallower in the direction perpendicular to the flow path forming surface as it goes downward in the direction of gravity. When the inertial force is applied, the liquid in the passage region easily moves to the measurement region along the continuously shallow bottom surface of the passage region. As a result, more liquid to be inspected remains in the measurement region during measurement, and the absorbance of the liquid can be accurately measured.

  The first angular acceleration of the inspection system according to claim 2 is smaller than the second angular acceleration. Thereby, as compared with the case where the first angular acceleration is larger than the second angular acceleration, the inertial force can be more strongly applied to the liquid to be inspected in the passage region when decelerating at the second angular acceleration. As a result, the liquid to be inspected in the passage area can easily enter the measurement area. Further, as compared with the case where the first angular acceleration is larger than the second angular acceleration, the inertial force applied to the liquid to be inspected in the measurement region can be further reduced when accelerating at the first angular acceleration. As a result, the liquid to be inspected in the measurement region is evenly distributed and is difficult to return to the passage region. As a result, more liquid to be inspected remains in the measurement region during measurement, and the absorbance of the liquid can be accurately measured.

  According to the inspection system of the third aspect, the rotation direction for the first holder guidance and the rotation direction for the second holder guidance are the same as the rotation direction during deceleration. Since the direction of rotation for rotating the first holder is the same as the direction of rotation, the inertial force is inspected in the direction of rotation in the direction of rotation when the first holder is decelerated for the measurement of the test object receptacle. Applied to the target liquid. As a result, the liquid to be inspected in the passage area easily enters the measurement area. Since the direction of rotation for rotating the second holder is the same as the direction of rotation, the second holder passes through an inertial force on the opposite side of the rotation direction during deceleration for measurement of the receiving object to be inspected. An inertial force is again applied in the rotation direction to the liquid to be inspected returned to the region. As a result, the liquid to be inspected in the passage area easily enters the measurement area.

  In the inspection system according to claim 4, the surface roughness of the bottom surface of the measurement region is 70 nm or less in terms of an average roughness Ra value. Thereby, when the measurement light enters the measurement region, it is possible to prevent the measurement light from being scattered and the transmitted light from being accurately received by the light receiving unit.

  In the inspection system according to claim 5, the surface roughness of the side wall surface of the measurement region is larger than the surface roughness of the bottom surface of the measurement region. Since the surface roughness of the sidewall surface of the measurement region is large, the liquid to be inspected in the measurement region is supplemented by the sidewall surface of the measurement region. As a result, the liquid to be inspected can be prevented from returning to the passage region due to the influence of the surface tension of the side wall surface of the measurement region.

  The inspection system according to claim 6 has posture regulation means. The posture regulation means regulates the mounting posture so that the inertial force acts on the measurement region side, and the liquid to be inspected easily flows into the measurement region. As a result, more liquid to be inspected remains in the measurement region during measurement, and the absorbance of the liquid can be accurately measured.

  The inspection system according to claim 7 has a notch that fits into the protrusion of the holder. Compared with the case where the inspection object receptacle has a protrusion and the holder has a notch, the volume of the inspection object receptacle can be reduced. As a result, the inspection object receiver can be made compact and the cost can be further reduced.

  The inspection method according to claim 8, wherein a bottom surface of the measurement region is rotated from a bottom surface of the passage region in order to guide the measurement region in the holder to a position where measurement light emitted from the light source is incident. A rotation step that rotates to the downstream side of the direction, and when the angular velocity of the holder is decelerated to stop the measurement region in the holder at a position where measurement light emitted from the light source enters. An angle setting step of setting an angle of the holder so that the measurement region is positioned below the passage region in the direction of gravity. Since the measurement area is located below the passage area in the direction of gravity, when the rotation of the inspection apparatus is stopped, the liquid to be inspected in the passage area easily flows into the measurement area due to gravity. In addition, the holder accommodates the test object receiver with the bottom surface of the passing area located downstream of the bottom surface of the measuring area, so that the inertial force is applied to the liquid during deceleration and the liquid is measured from the passing area. It becomes easy to flow into the area. The absorbance of the liquid can be accurately measured by the gravity and inertial force.

The perspective view which shows the microchip 1 in embodiment of this invention. The top view of the microchip 1. FIG. Sectional drawing of the microchip 1 according to an AA line. The front view of the test | inspection apparatus 30 with which the microchip 1 and 101 were mounted | worn. The front view of the test | inspection apparatus 30 which shows a mode that the microchips 1 and 101 are mounted | worn with the holders 47L and 47R. The perspective view which shows a mode that the microchip 1 is mounted | worn with the holder 47R. FIG. 3 is a top view of the inspection apparatus 30. Sectional drawing according to the AA line of the microchip 1 in which the measurement light 92 is permeate | transmitted. FIG. 2 is a block diagram showing an electrical configuration of a control device 200. The flowchart which shows the process sequence according to the test | inspection program 205a of the test | inspection apparatus 30. The flowchart which shows the process sequence according to liquid mixing program S20 which changes the angle (alpha) of the holders 47L and 47R, and provides the microchips 1 and 101 with the centrifugal force CF of a different direction. The flowchart which shows the process sequence according to measurement program S30 in which the holders 47L and 47R are alternately guide | induced to the optical path 92 over multiple times, the measurement light 92 is emitted from the light source 90, and the transmitted light is received by the light-receiving part 91. FIG. The flowchart which shows the process sequence according to guidance program S304 which guides the holder 47R on the optical path 92. FIG. The front view which shows the mode of the microchip 1 at the time of the process according to liquid mixing program S20. Sectional drawing according to the AA line of the microchip 1 at the time of the process according to guidance program S304 and S305.

(Embodiment)
Hereinafter, an inspection system including a microchip 1 according to an embodiment of the present invention, a microchip 101 having the same shape as the microchip 1, and an inspection apparatus 30 to which both the microchips 1 and 101 are detachably mounted. Will be described.

  The direction of the inspection apparatus 30 will be specifically described with reference to FIGS. The up-down direction, the left-right direction, and the front-rear direction in FIG. 5 represent directions in a state where the microchip 1 is mounted on the inspection apparatus 30 and is in a predetermined initial rotation position. The inspection device 30 includes a main shaft 57, a T-shaped plate 48, and holders 47L and 47R. The T-shaped plate 48 has a groove 80. The extending direction of the main shaft 57 parallel to the direction of gravity is defined as the vertical direction. The extending direction of the groove 80 is defined as the left-right direction. A direction perpendicular to the up-down direction and the left-right direction is taken as the front-rear direction. As shown in FIG. 4, the holders 47 </ b> L and 47 </ b> R of the inspection apparatus 30 rotate about the main shaft 57 as an axis. By this rotation, centrifugal force CF is applied to both holders 47L and 47R. The holder 47L existing on the left side of FIG. 4 is angle-changed in the first rotation direction LD with the axis 46L extending in the front-rear direction as an axis. Similarly, the holder 47R present on the right side in FIG. 4 is angle-changed to a second rotation direction RD that is the opposite direction of the first rotation direction LD, with a shaft 46R extending in the front-rear direction as an axis.

  FIG. 1 is a perspective view showing a microchip 1 used in an inspection system. A detailed configuration of the microchip 1 according to the present embodiment will be described with reference to FIGS. The microchip 1 is mounted on the holders 47L and 47R of the inspection apparatus 30 and changed to various angles. The directions of the three arrows shown in FIG. 1 indicate that the microchip 1 is mounted on the inspection apparatus 30 in FIG. The up-down direction, the left-right direction, and the front-rear direction of the inspection apparatus 30 in a state at a predetermined initial rotation position shown are shown.

(Detailed configuration of microchip 1)
The structure of the microchip 1 will be described with reference to FIG. As shown in FIG. 1, the microchip 1 includes a plate member 2 and a cover member 20.

  The plate member 2 is, for example, a transparent plate that is covered with a plurality of outer wall surfaces and has a substantially square shape when viewed from the front. The thickness which is the dimension of the front-back direction of the board member 2 is about 1-10 mm. The plate member 2 has a vertical width that is a vertical dimension and a horizontal width that is a horizontal dimension of about 10 to 100 mm. The plate member 2 is formed from, for example, a synthetic resin. The plate member 2 is manufactured by, for example, injection molding. The plate member 2 has a flow path forming surface 2A.

  A predetermined flow path having a depth in the front-rear direction which is the thickness direction of the plate member 2 is formed on the flow path forming surface 2A. The predetermined flow path is formed in a concave shape for flowing a liquid to be examined (hereinafter referred to as a specimen) and a reagent.

  The cover member 20 is, for example, a square flexible film as viewed from the front. The cover member 20 has a thickness of about 0.1 to 0.5 mm. The cover member 20 has an area that can cover a predetermined flow path formed in the plate member 2. The cover member 20 is stuck so as to cover the flow path forming surface 2A. The cover member 20 has a vertical width and a horizontal width of about 10 to 100 mm, respectively. The adhesive layer of the cover member 20 is provided on the surface of the cover member 20 so that it can adhere to the flow path forming surface 2A. The cover member 20 is made of, for example, a synthetic resin. The cover member 20 has a sample insertion port 3H that is an opening for loading a sample, and a reagent loading port 4H that is an opening for loading a reagent. The sample inlet 3H and the reagent inlet 4H are provided in the cover member 20 in advance. The cover member 20 is bonded to the plate member 2 so that the sample insertion port 3H and the reagent insertion port 4H are positioned in the formation region of the sample insertion portion 3 and the reagent insertion portion 4 of the plate member 2 described later. 1, 2, 6, and 14, the flow path of the plate member 2 inside the cover member 20 is represented by a solid line.

  The microchip 1 includes a lower surface 2B. The lower surface 2 </ b> B is a surface that is parallel to the front-rear direction and the left-right direction and is below the microchip 1. The notch 11 is provided at the right corner of the lower surface 2 </ b> B of the microchip 1.

  FIG. 2 is a plan view of the microchip 1. FIG. 3 is a cross-sectional view of the microchip 1 taken along line AA shown in FIG. The internal structure of the microchip 1 will be described with reference to FIGS. A predetermined flow path is formed on the flow path forming surface 2 </ b> A of the plate member 2. The predetermined flow path includes a specimen input section 3, a reagent input section 4, a sample supply path 5, a reagent supply path 6, an absorbance measurement tank 7, a centrifuge tank 12, a first flow path 13, and a reservoir. A tank 14 and a second flow path 15 are provided.

  The sample loading unit 3 is a tank into which a sample is loaded through the sample loading port 3H. The sample insertion unit 3 has a volume capable of accommodating a predetermined amount of sample. The predetermined amount of specimen is about 0.01 to 1 ml of specimen. The specimen is blood, for example. The sample supply path 5 is connected to the lower end of the sample input unit 3.

  The sample supply path 5 is a flow path that extends downward from the lower end of the sample input section 3, and in this embodiment, the extending direction of the sample supply path 5 is parallel to the vertical direction. The width in the left-right direction of the sample supply path 5 is set narrower than the width in the left-right direction of the sample input unit 3 so that the sample in the sample input unit 3 does not flow out to the centrifuge tank 12 due to downward gravity. Is done. The width in the left-right direction of the sample supply path 5 is, for example, about 0.1 mm. The centrifuge tank 12 is provided at the lower end of the sample supply path 5.

  The centrifuge tank 12 is provided at the lower end of the sample supply path 5. The centrifuge tank 12 extends from the lower end of the sample supply path 5 to the lower right. The centrifuge tank 12 is a tank that is supplied from the sample supply path 5 and separates the specific gravity by applying a centrifugal force to the stored specimen. The first component having a relatively low specific gravity and the second component having a relatively high specific gravity. And a tank that is centrifuged. The first component is, for example, plasma. The second component is, for example, a blood cell. The first flow path 13 is connected to the upper left side of the centrifugal separation tank 12 when viewed from the front. The second flow path 15 is connected to the upper right side of the centrifuge tank 12 as viewed from the front.

  The first flow path 13 is connected to the upper left end of the storage tank 14. The first flow path 13 is a flow path for introducing the excess liquid flowing out from the centrifugal separation tank 12 into the storage tank 14. The first flow path 13 is provided to extend from the upper left end of the centrifuge tank 12 to the lower left so that the excess liquid from the centrifuge tank 12 can easily flow into the storage tank 14 by centrifugal force.

  The storage tank 14 has a quadrangular shape. The storage tank 14 is configured to prevent the excess liquid from flowing back from the storage tank 14 to the centrifuge tank 12 when flowing the liquid centrifuged in the centrifuge tank 12 to the second flow path 15. It is arranged on the right side from the lower end and has a volume enough to store the excess liquid flowing in from the first flow path 13.

  The second flow path 15 is connected to the upper left end of the absorbance measurement tank 7. The second flow path 15 is a flow path for introducing the first component separated in the centrifuge tank 12 into the absorbance measurement tank 7. The upstream side of the second flow path 15 extends to the upper right so that the specimen does not flow into the absorbance measurement tank 7 when centrifugal force is applied to flow from the specimen supply path 5 to the centrifugal separation tank 12. Further, the downstream side of the second flow path 15 is located on the lower right side so that the sample can easily flow into the absorbance measurement tank 7 when a centrifugal force is applied to flow the sample from the centrifuge tank 12 to the absorbance measurement tank 7. It extends.

  The reagent loading unit 4 is a tank into which a reagent is loaded through the reagent loading port 4H. The reagent loading unit 4 has a volume capable of accommodating a predetermined amount of reagent. The predetermined amount of reagent is about 0.01 to 1 ml of reagent. When the microchip 1 is viewed from the front with respect to the sample loading unit 3 and the reagent loading unit 4, the sample loading unit 3 is formed on the left side and the reagent loading unit 4 is formed on the right side. The reagent supply path 6 is connected to the lower end of the reagent charging unit 4.

  The reagent supply path 6 is a flow path extending downward from the lower end of the reagent charging unit 4. The passage region 8 of the absorbance measurement tank 7 is connected to the lower end of the reagent supply path 6. The width in the left-right direction of the reagent supply path 6 is compared with the width in the left-right direction of the reagent supply unit 4 to the extent that the reagent in the reagent supply unit 4 does not flow out to the passage region 8 of the absorbance measurement tank 7 due to downward gravity. And set narrower. The lateral width of the reagent supply path 6 is, for example, about 0.1 mm.

  The absorbance measurement tank 7 is a tank for measuring the absorbance of the liquid. The absorbance measurement tank 7 has a rectangular shape that is long in the left-right direction. The absorbance measurement tank 7 has a volume capable of retaining a predetermined amount of the sample supplied from the second flow path 15 and the reagent supplied from the reagent supply path 6. The absorbance measurement tank 7 includes a passage region 8 and a measurement region 10.

  The measurement region 10 is a region through which measurement light is transmitted in order to measure the absorbance of the specimen and the reagent. As shown in FIG. 3, the measurement region 10 has a first depth D1 in the front-rear direction, which is a direction perpendicular to the flow path forming surface 2A. The first depth D1 is, for example, 1 mm. The measurement region 10 is a region surrounded by the bottom surface 10A, the side wall surfaces 10B, 10C, and 10D and the cover member 20. The bottom surface 10A is a surface in the direction along the flow path forming surface 2A of the measurement region 10. The side wall surfaces 10B, 10C, and 10D are surfaces perpendicular to the flow path forming surface 2A of the measurement region 10. The bottom surface 10A is formed in a mirror surface to such an extent that the measurement light emitted from the light source of the inspection apparatus is received by the light receiving unit of the inspection apparatus. The mirror surface is, for example, a surface roughness having an average roughness Ra value of 70 nm or less. The surface roughness of the side wall surfaces 10B, 10C, and 10D is rougher than the surface roughness of the bottom surface 10A.

  The passage region 8 is a region where the specimen is supplied from the second flow path 15 and the reagent is supplied from the reagent supply path 6. The supplied specimen and reagent pass through the passage area 8 and go to the measurement area 10. As shown in FIG. 3, the passage region 8 is a region surrounded by the bottom surfaces 9 </ b> A and 9 </ b> B, the side wall surface, and the cover member 20. The bottom surface 9A of the passage region 8 has a second depth D2 in the front-rear direction, which is a direction perpendicular to the flow path forming surface 2A. The second depth D2 is 3 mm, for example. The second depth D2 is deeper than the first depth D1. The bottom surface 9 </ b> B is provided so that the depth becomes shallower as it approaches the measurement region 10. The bottom surface 9 </ b> B connects both regions so that the specimen and the reagent flow from the passage region 8 to the measurement region 10. The bottom surface 9B is provided so that the depth gradually decreases from the predetermined location 8T having the second depth D2 of the passage region 8 to the predetermined location 10T having the first depth D1. The predetermined place 8T is a place located in the middle of the passage area 8. The predetermined location 10T is a location located at the upper end of the measurement region 10. The side wall surface is a surface perpendicular to the flow path forming surface 2 </ b> A of the passage region 8.

  The notch portion 11 is formed so that the microchip 1 and the holders 47L and 47R are mounted in a predetermined posture so that inertial force is applied to the front side during rotation deceleration. The predetermined posture is that the flow path forming surface 2A is along the direction of gravity, the measurement region 10 is positioned below the passage region 8 in the direction of gravity, and the bottom surface 10A of the measurement region 10 is holder 47R from the bottom surface 9B of the passage region 8. It is in the state which exists in the downstream of the rotation direction. The notch portion 11 is formed on the lower surface 2B of the microchip 1 so as to fit into a protruding portion 48R of a bottom surface 47RB of the holder 47R described later. The notch 11 is formed in the lower right corner of the microchip 1 in FIG. The notch 11 is formed in a square shape when viewed from the front.

(Detailed configuration of the inspection apparatus 30)
FIG. 4 is a front view of the inspection apparatus 30 to which the microchips 1 and 101 according to the present embodiment are mounted. The inspection device 30 will be described with reference to FIG. Note that the directions of the three arrows shown in FIG. 4 represent directions corresponding to the up-down direction, the left-right direction, and the front-rear direction shown in FIG.

  The inspection device 30 includes a turntable 33, holders 47L and 47R, and a control device 200. The microchips 1 and 101 configured as described above are mounted with the flow path forming surface 2A along the gravity. The inspection device 30 applies the centrifugal force CF to the microchips 1 and 101 by rotating the turntable 33 with the holders 47L and 47R being held at a predetermined angle under the control of the control device 200.

  The turntable 33 is rotatably provided with a main shaft 57 extending along the gravity as an axis. The turntable 33 is formed in a disk shape.

  As shown in FIG. 4, the holders 47L and 47R are configured such that the angle α can be set from 0 ° to 90 °. The holders 47L and 47R are fixed on the turntable 33. When the turntable 33 is rotated, the holders 47L and 47R fixed to the turntable 33 are rotated.

  The holder 47R is provided on the right side when viewed from the front. The holder 47R is a box-shaped member that is formed one size larger than the microchip 1 and is surrounded by an upper surface 47RC, a side surface, and a bottom surface 47RB as a lid.

  The holder 47L is provided on the left side as viewed from the front. Similar to the holder 47R, the holder 47L is a box-shaped member that is formed one size larger than the microchip 101 and is surrounded by a top surface, a side surface, and a bottom surface 47LB as a lid.

  The holders 47 </ b> R and 47 </ b> L hold the microchips 1 and 101 in a state where the flow path forming surface 2 </ b> A of the microchip 1 and the flow path forming surface 102 </ b> A of the microchip 101 are orthogonal to the upper surface of the turntable 33. When the turntable 33 is rotated, centrifugal force CF is applied in directions parallel to the flow path forming surfaces 2A and 102A of the microchips 1 and 101 in the holders 47R and 47L, respectively.

  The control device 200 is connected to a spindle motor 35, a stepping motor 51, and the like, which will be described later, via a cable 96. The control device 200 includes a CPU 207, a RAM 206, a ROM 205, and the like which will be described later. The ROM 205 stores an inspection program 205a shown in FIG. The control device 200 controls the rotation of the turntable 33 and the angle change of the holders 47L and 47R to a predetermined angle according to the inspection program 205a.

(Rotation mechanism of inspection device 30)
The rotation mechanism of the inspection apparatus 30 will be described with reference to FIG. The rotation mechanism of the inspection device 30 includes a main shaft motor 35, a rotational force transmission mechanism 31, and a turntable 33.

  The main shaft motor 35 is a drive source for rotating the turntable 33 and holders 47L and 47R fixed to the turntable 33 around a main shaft 57 extending along the direction of gravity. The spindle motor 35 is fixed inside the frame 52 of the inspection apparatus 30. The main shaft motor 35 includes a rotatable shaft 36.

  The frame 52 has a rectangular parallelepiped shape. The frame 52 is provided so that driving components for driving the spindle motor 35, the stepping motor 51, and the like can be fixed. The interior of the frame 52 has a volume that can accommodate the drive components.

  The rotational force transmission mechanism 31 includes a motor pulley 37, a main shaft pulley 38, a belt 39, and a main shaft 57. The rotational force transmission mechanism 31 is fixed and arranged inside the frame 52.

  The motor pulley 37 is fixed to the shaft 36. The belt 39 is stretched between the motor pulley 37 and the main shaft pulley 38. The main shaft pulley 38 is fixed to the main shaft 57.

  The main shaft 57 is rotatably supported by the frame 52 of the inspection apparatus 30, extends upward, and is provided so as to penetrate the center portion of the upper plate 32 of the frame 52. The main shaft 57 is connected to the turntable 33. The turntable 33 is provided to be rotatable about the main shaft 57.

  The operation of the rotation mechanism of the inspection device 30 will be described. When the shaft 36 of the main shaft motor 35 is rotated, the driving force is transmitted to the main shaft 57 via the motor pulley 37, the belt 39 and the main shaft pulley 38, and the turntable 33 rotates. When the turntable 33 rotates, centrifugal force CF is applied to the holders 47L and 47R fixed to the turntable 33.

(An angle changing mechanism of the inspection device 30)
The angle changing mechanism of the inspection apparatus 30 will be described with reference to FIG. The angle changing mechanism of the inspection device 30 includes a stepping motor 51, a first power transmission mechanism 62, a second power transmission mechanism 63, and holders 47L and 47R.

  The stepping motor 51 is a drive source for changing the angle of the holders 47L and 47R around the shafts 46L and 46R. The stepping motor 51 is fixed to the frame 52. The stepping motor 51 includes a rotatable shaft 58.

  The first power transmission mechanism 62 includes a cam plate 59, a protrusion 70, a T-shaped plate 48, a guide rail 56, a bearing 41, and a second shaft 40. The first power transmission mechanism 62 is fixed and arranged inside the frame 52.

  The cam plate 59 has a disk shape when viewed from the front. The cam plate 59 is fixed to the shaft 58. The cam plate 59 includes a protrusion 70 protruding forward. The protrusion 70 has a circular shape when viewed from the front.

  The guide rail 56 extends in the vertical direction and is fixed to the frame 52. The T-shaped plate 48 is formed to be movable in the vertical direction along the guide rail 56. The T-shaped plate 48 includes a groove 80. The groove part 80 is a groove | channel extended in the left-right direction, and is formed so that the protrusion 70 may fit. The state shown in FIG. 4 is a state in which the T-shaped plate 48 is lowered to the bottom. The state shown in FIG. 5 is a state where the T-shaped plate 48 is raised to the top.

  The bearing 41 is connected to the T-shaped plate 48. The bearing 41 is provided at the lower end of the second shaft 40. The bearing 41 holds the second shaft 40 in a rotatable manner.

  The inside of the main shaft 57 is hollow. The second shaft 40 is provided inside the main shaft 57 as an inner shaft. The second shaft 40 is connected to the rack gear 43.

  The second power transmission mechanism 63 includes a rack gear 43, a guide member 42, an upper plate 61, a pinion gear 44, an L-shaped plate 60, a gear 45, and shafts 46L and 46R. The second power transmission mechanism 63 is disposed outside the frame 52.

  The rack gear 43 is a plate-like member that extends in the vertical direction. Gears are respectively carved on the left and right side ends of the rack gear 43. The gears at both end portions of the rack gear 43 mesh with a pair of pinion gears 44.

  The guide member 42 slidably holds the rack gear 43. The guide member 42 is provided extending in the vertical direction from the central opening of the upper plate 61. Therefore, when the rack gear 43 is raised, the guide member 42 protrudes from the upper plate 61.

  The pair of L-shaped plates 60 includes a pair of gears 45. The pair of gears 45 includes a pair of shafts 46L and 46R.

  The pair of shafts 46L and 46R extend in the front-rear direction. When the microchips 1 and 101 are stored in the holders 47R and 47L, the extending direction of the pair of shafts 46L and 46R and the flow path forming surfaces 2A and 102A are orthogonal to each other. The pair of gears 45 mesh with both pinion gears 44, respectively. The pair of gears 45 is provided on the L-shaped plate 60 so that the angle can be changed around a pair of shafts 46L and 46R.

  The holders 47L and 47R are fixed to shafts 46L and 46R of both gears 45, respectively.

  The operation of the angle changing mechanism of the inspection device 30 will be described. When the shaft 58 of the stepping motor 51 rotates, the cam plate 59 rotates. When the cam plate 59 rotates, the protrusion 70 provided on the cam plate 59 rotates about the shaft 58. When the protrusion 70 rotates about the shaft 58, the protrusion 70 moves in the vertical direction while sliding in the groove 80 in the horizontal direction. When the protrusion 70 moves in the vertical direction, the T-shaped plate 48 moves in the vertical direction along the guide rail 56. When the T-shaped plate 48 moves in the vertical direction, the second shaft 40 supported by the bearing 41 moves up and down. When the second shaft 40 moves up and down, the rack gear 43 moves up and down. When the rack gear 43 moves up and down, both pinion gears 44 rotate. When both pinion gears 44 rotate, both gears 45 rotate. When both the gears 45 are rotated, the holders 47L and 47R fixed to the both gears 45 change the angle around the shafts 46L and 46R of the both gears 45.

  The angle of the holders 47L and 47R will be specifically described with reference to FIG. The holder 47L rotates from the angle α0 = 0 ° to α1 = 90 ° around the shaft 46L of the left gear 45. The shaft 46L is orthogonal to the flow path forming surface 102A of the microchip 101 held by the holder 47L. The angle changing direction from the angle α = 0 ° to α = 90 ° of the holder 47L is defined as a first rotation direction LD. Similarly, the holder 47R rotates from the angle α = 0 ° to α = 90 ° around the shaft 46R of the right gear 45. The shaft 46R is orthogonal to the flow path forming surface 2A of the microchip 1 held by the holder 47R. The angle changing direction from the angle α0 = 0 ° to α1 = 90 ° of the holder 47R is defined as a second rotation direction RD.

  Furthermore, the holders 47L and 47R rotate at the same angle. In the state where the angle α0 = 0 °, the bottom surface 47LB of the holder 47L is directed to the left side of the inspection apparatus 30, as shown in FIG. FIG. 5 is a front view of the inspection apparatus 30 showing how the microchips 1 and 101 according to the present embodiment are mounted on the holders 47R and 47L. Similarly, in a state where the angle α0 = 0 °, the bottom surface 47RB of the holder 47R is directed to the right side of the inspection apparatus 30 that is opposite to the bottom surface 47LB of the holder 47L. In the state where the angle α1 = 90 °, the bottom surface 47LB of the holder 47L and the bottom surface 47RB of the holder 47R are directed to the lower side of the inspection apparatus 30, as shown in FIG.

(Mounting method of the microchips 1 and 101 to the holders 47R and 47L)
FIG. 5 is a front view showing a state when the microchips 1 and 101 are attached to the holders 47R and 47L. FIG. 6 is a perspective view showing how the microchip 1 is mounted on the holder 47R. A method for attaching the microchips 1 and 101 to the holders 47R and 47L will be described with reference to FIGS. Note that in the microchips 1 and 101 of FIGS. 5 and 6, the specimen and the reagent are input in advance, and the cover member 20 is attached in advance.

  As shown in FIG. 6, the insertion state of the microchip 1 is such that the flow path forming surface 2A faces the front side of the holder 47R and the lower surface 2B of the microchip 1 and the bottom surface 47RB of the holder 47R are opposed to each other. The protrusion 48R is provided to extend upward from the bottom surface 47RB in the front-rear direction. Then, the microchip 1 is inserted downward into the holder 47R so that the lower surface 2B of the microchip 1 and the bottom surface 47RB of the holder 47R are close to each other, and the notch 11 of the lower surface 2B and the protruding portion 48R of the bottom surface 47RB are fitted. To do. Thereafter, the lid 47RC of the holder 47R is closed. In this way, the microchip 1 is mounted on the holder 47R.

  Similarly, in the inserted state of the microchip 101, the flow path forming surface 102A of the microchip 101 faces the rear side of the holder 47L in FIG. 5, and the lower side of the microchip 101 and the bottom surface 47LB of the holder 47L in FIG. Let the state be Then, the microchip 101 is inserted into the holder 47L in a downward direction in FIG. 5 so that the lower side of the microchip 101 and the bottom surface 47LB of the holder 47L in FIG. 5 approach each other, and the lid of the holder 47L is closed. In this way, the microchip 101 is mounted on the holder 47L.

  FIG. 7 is a top view of the inspection apparatus 30. FIG. 8 shows the microchip 1 through which the measurement light 92 is transmitted, and is a cross-sectional view of the microchip 1 taken along the line AA as in FIG. The light source 90 and the light receiving unit 91 of the inspection apparatus 30 will be described with reference to FIGS. 7 and 8. As shown in FIG. 7, the inspection apparatus 30 includes a light source 90 and a light receiving unit 91.

  The light source 90 emits the measurement light 92 on the optical path 92R. The measurement light 92 is red light having a wavelength of about 650 nm, for example. The light source 90 is, for example, a laser diode.

  The light receiving unit 91 is provided on the optical path 92R of the measurement light 92 emitted from the light source 90. Specifically, the light source 90 and the light receiving unit 91 are arranged in the front-rear direction in which the incident direction of the measurement light 92 is a direction perpendicular to the flow path forming surface 2A of the microchip 1. The light receiving unit 91 receives the measurement light 92. The light receiving unit 91 is, for example, a photodiode.

  As shown in FIGS. 7 and 8, the turntable 33 rotates in the rotation direction 93. The rotation direction 93 is such that the bottom surface 9B of the microchip 1 is located downstream of the bottom surface 10A in the rotation direction 93. The centrifugal force CF is applied to the microchips 1 and 101 by the rotation.

  As shown in FIG. 8, the microchip 1 is regulated to a predetermined mounting posture by fitting the notch portion 11 and the protruding portion 48R. The predetermined mounting posture is that the flow path forming surface 2A is along the direction of gravity GF, the measurement region 10 is positioned below the passage region 8 in the direction of gravity GF, and the bottom surface 10A of the measurement region 10 is the passage region 8 when measuring absorbance. The microchip 1 is arranged in such a manner that it is on the downstream side in the rotation direction 93 of the holder 47R from the bottom surface 9B.

  As shown in FIGS. 7 and 8, the holder 47 </ b> R is driven to change the angle so that the measurement region 10 of the microchip 1 transmits on the optical path 92 </ b> R of the measurement light 92. Specifically, when measuring transmitted light, the holder 47R is driven to change the angle so that the angle α1 = 90 °. The same applies to the holder 47L.

(Electrical configuration of the control device 200)
FIG. 9 is a block diagram showing an electrical configuration of the control device 200. With reference to FIG. 9, the electrical configuration of the control device 200 will be described. The control device 200 includes, as components, a light source control unit 201, a rotation control unit 203, an angle setting unit 204, a ROM 205, a RAM 206, a CPU 207, an HDD 208, a display unit 209, an operation unit 210, and a system. A bus 211. The system bus 211 is connected to each component of the control device 200. The CPU 207 constitutes a computer together with the ROM 205 and the RAM 206. The control device 200 is a personal computer, for example. The control device 200 is connected to the inspection device 30 via the cable 96. The cable 96 is a USB cable, for example.

  The light source control unit 201 is connected to the light source 90. In response to a command from the CPU 207, the light source control unit 201 outputs a light emission signal to the light source 90 so that the measurement light 92 is emitted toward the light receiving unit 91.

  The rotation control unit 203 is connected to the spindle motor 35. The rotation control unit 203 outputs an angular velocity control signal to the spindle motor 35 so that the turntable 33 is rotated in the rotation direction 93 at a predetermined angular velocity in response to a command from the CPU 207 that operates according to the inspection program 205 a stored in the ROM 205. .

  The angle setting unit 204 is connected to the stepping motor 51. The angle setting unit 204 outputs an angle control signal to the stepping motor 51 so that the holders 47L and 47R are rotated to a predetermined angle α according to a command from the CPU 207 that operates according to the inspection program 205a stored in the ROM 205.

  The ROM 205 stores an inspection program 205a for realizing processing according to a flowchart described below. The inspection program 205a is executed by the CPU 207 using the RAM 206.

  The RAM 206 functions as a temporary storage area for storing various variables that are referred to when the CPU 207 executes a program stored in the ROM 205.

  The HDD 208 is a hard disk device that stores various data and programs. The various data is, for example, the concentration of the substance to be examined.

  The display unit 209 displays the concentration of the target substance, which is a test result, with reference to various data stored in the HDD 208 according to a command from the CPU 207 that operates according to the test program 205 a stored in the ROM 205. The display unit 209 is a liquid crystal display, for example.

  The operation unit 210 is a device that supplies an operation signal corresponding to a user operation to the control device 200. The operation unit 210 is, for example, a keyboard. The user operation is, for example, an operation for starting execution of the inspection program 205a.

(Processing according to inspection program 205a)
FIG. 10 is a flowchart showing a processing procedure according to the inspection program 205a of the inspection apparatus 30. The inspection program 205a executed by the CPU 207 of the inspection apparatus 30 according to the present embodiment will be described with reference to the flowchart shown in FIG. The inspection program 205a includes a liquid mixing program S20 and a measurement program S30 as subroutines.

  When the operation unit 210 is operated, the CPU 207 of the inspection apparatus 30 reads the inspection program 205a stored in the ROM 205 of the inspection apparatus 30 and starts executing it (S10).

  The CPU 207 executes a liquid mixing program S20 described later. Specifically, the holders 47L and 47R are held at a predetermined angle α, the turntable 33 is rotated at a predetermined angular velocity, and centrifugal force CF is applied to the holders 47L and 47R (S20). As a result, the mixed liquid in which the specimen and the reagent are mixed is held in the measurement region 10 of the microchip 1.

  The CPU 207 executes a measurement program S30 described later. Specifically, the holders 47L and 47R are alternately guided onto the optical path 92R over a plurality of times, the measurement light 92 is emitted from the light source 90, and the transmitted light is received by the light receiving unit 91 (S30). From the transmitted light, the concentration of the liquid to be inspected is calculated.

  The CPU 207 displays the concentration of the target substance of the specimen injected into the microchips 1 and 101 on the display unit 209 of the control device 200 (S40).

  The CPU 207 ends the inspection program 205a (S50).

(Detailed flowchart of the liquid mixing program S20)
FIG. 11 is a flowchart showing a processing procedure in accordance with the liquid mixing program S20 that applies the centrifugal force CF in different directions to the microchips 1 and 101 by changing the angle α of the holders 47L and 47R. FIG. 14 is a front view showing a state of the microchip 1 during processing according to the liquid mixing program S20. The liquid mixing program S20 will be described with reference to FIGS.

  The directions of the three arrows shown in FIG. 14 represent the up-down direction, the left-right direction, and the front-rear direction when the microchips 1 and 101 are mounted on the inspection apparatus 30 and are in the predetermined initial rotation position shown in FIG.

  When the microchips 1 and 101 are mounted on the holders 47R and 47L and the operation unit 210 is operated, the execution of the liquid mixing program S20 is started (S201).

  In S202, the holder 47R of the inspection apparatus 30 is set to the angle α1. The microchip 1 and the inspection apparatus 30 in the state of the angle α1 will be described with reference to FIG. FIG. 14A is a plan view of the microchip 1 in a state where the inspection apparatus 30 is at a predetermined initial rotation position (α1 = 90 °) before the centrifugal force CF is applied. As shown in FIG. 14A, the widths of the specimen supply path 5 and the reagent supply path 6 are set so narrow that the specimen EL and the reagent M1 do not flow due to the downward gravity GF. In the state before the centrifugal force CF is applied, the sample EL in the sample loading unit 3 and the reagent M1 in the reagent loading unit 4 do not flow through the sample supply channel 5 and the reagent supply channel 6 (S202).

  The microchip 1 and the inspection apparatus 30 in a state where the angle α1 is changed to the angle α0 will be described. The CPU 207 outputs an angle control signal from the angle setting unit 204 to the stepping motor 35 so that the holder 47R is rotated to the angle α0 so as to be in the state of the inspection apparatus 30 shown in FIG. 4 (α0 = 0 °). The stepping motor 51 is driven so that the holder 47R rotates to the angle α0 according to the angle control signal (S203).

  FIG. 14B is a plan view of the microchip 1 in a state where the angle α is α0 = 0 °. By this process S203, as shown in FIG. 14B, the sample EL input from the sample input unit 3 moves in the sample input unit 3 by gravity GF. Similarly, as shown in FIG. 14B, the reagent M1 loaded from the reagent loading unit 4 moves in the sample loading unit 3 by gravity GF.

The microchip 1 and the inspection apparatus 30 in a state where application of the centrifugal force CF is started will be described. The CPU 207 controls the angular velocity from the rotation control unit 203 to the spindle motor 35 so that the centrifugal acceleration of the centrifugal force CF to the microchip 1 becomes 500 G [m / s ² ] (gravity acceleration G = 9.8 m / s ² ). Output a signal. The spindle motor 35 is driven to rotate the turntable 33 according to the angular velocity control signal (S204).

  FIG. 14C is a plan view of the microchip 1 in a state where the angle α with respect to the direction of the centrifugal force CF is α0 = 0 °. By this processing S204, as shown in FIG. 14C, the specimen EL flows from the specimen supply path 5 to the centrifugal separation tank 12 by the centrifugal force CF. When the flowing sample EL exceeds the volume of the centrifuge tank 12, the excess liquid of the sample EL flows and accumulates in the storage tank 14 via the first flow path 13. The specimen EL in the centrifuge tank 12 is separated into the first component EL1 and the second component EL2 as the centrifugal force CF continues to be applied. The reagent M1 flows from the reagent supply path 6 to the absorbance measurement tank 7.

  The microchip 1 and the inspection device 30 in a state where the angle α0 is changed to the angle α1 with the centrifugal force CF applied will be described. The CPU 207 causes the angle setting unit 204 to output an angle control signal to the stepping motor 35 so that the holder 47R is rotated at an angle α1 = 90 °. The stepping motor 51 drives the holder 47R to rotate at an angle α1 = 90 ° according to the angle control signal (S205). In the present embodiment, the angle α1 is changed to 90 °. However, if the measurement region 10 is located below the passage region 8 in the direction of the gravity GF, another angle, for example, 80 ° is used. Also good.

  FIG. 14D is a plan view of the microchip 1 in a state where the angle α with respect to the direction of the centrifugal force CF is α1 = 90 °. As a result of this processing S205, as shown in FIG. 14 (d), the first component EL1 flows from the centrifuge tank 12 to the absorbance measurement tank 7 via the second flow path 15, and accumulates in the absorbance measurement tank 7. Mixed with M1. The mixed liquid B1 of the first component EL1 of the sample EL and the reagent M1 is drawn in the direction of the centrifugal force CF of the absorbance measurement tank 7 by the centrifugal force CF. Since the centrifuge tank 12 extends to the second flow path 15 side (lower right side when the microchip 1 is viewed from the front), the second specific component EL2 having a high specific gravity stays in the centrifuge tank 12. Since the storage tank 14 has a volume enough to store the excess liquid flowing from the first flow path 13 on the right side from the lower end of the first flow path 13, the excess liquid in the storage tank 14 flows back to the centrifuge tank 12. Never do.

  The microchip 1 and the inspection apparatus 30 in a state where the angular velocity is decelerated will be described. The CPU 207 outputs an angular velocity control signal from the rotation control unit 203 to the spindle motor 35 so as to decelerate the angular velocity of the turntable 33. The spindle motor 35 is driven to reduce the angular velocity of the turntable 33 according to the angular velocity control signal (S206).

  FIG. 14E is a plan view of the microchip 1 in which the angular velocity of the turntable 33 is reduced and the angle α is α1 = 90 °, and a cross-sectional view taken along the line AA. By this processing S206, as shown in FIG. 14E, the mixed liquid B1 on the reagent loading unit 4 side of the absorbance measuring tank 7 is the cover member 20 side (front side) due to the angular velocity of the turntable 33 being reduced. Due to the inertial force 94 and the gravity GF toward the measurement region 10 side (downside), it is drawn toward the measurement region 10 side through the bottom surface 9B.

  The microchip 1 and the inspection apparatus 30 in a state where the application of the centrifugal force CF has been completed will be described. The CPU 207 outputs an angular velocity control signal from the rotation control unit 203 to the spindle motor 35 so as to stop the rotation of the turntable 33. The spindle motor 35 is driven to stop the angular velocity of the turntable 33 according to the angular velocity control signal (S207).

  FIG. 14F is a plan view of the microchip 1 in which the turntable 33 stops rotating and the angle α is in the state of α1 = 90 °. By this process S207, the mixed liquid B1 is further drawn to the measurement region 10 through the bottom surface 9B by the inertial force 94 and gravity GF. Soon after the rotation stops, as shown in FIG. 14 (f), all the mixed liquid B1 accumulates on the measurement region 10 side.

  The CPU 207 ends the execution of the liquid mixing program S20 (S208).

(Detailed flowchart of measurement program S30)
FIG. 12 shows a processing procedure according to the measurement program S30 in which the holders 47R and 47L are alternately guided onto the optical path 92R over a plurality of times, the measurement light 92 is emitted from the light source 90, and the transmitted light is received by the light receiving unit 91. It is a flowchart. The measurement program S30 will be described with reference to FIG.

  When the above-described liquid mixing program S20 ends, the CPU 207 starts the measurement program S30 (S301).

  The CPU 207 substitutes 1 as an initial value for the algebra N. The algebra N is a value indicating how many times the transmitted light of the microchips 1 and 101 is measured (S302). The algebra N is stored in the RAM 206 of the control device 200.

  The CPU 207 determines whether or not the algebra N is equal to or less than the required number Nmax of transmitted light measurement (S303). The required number of measurements Nmax is stored in the ROM 205 of the control device 200 in advance. The required number of measurements Nmax is a number of about 1 to 20, for example. When the algebra N is equal to or less than the required number Nmax of transmitted light measurement (Yes), the process proceeds to S304. When the algebra N is larger than the required number Nmax of transmitted light measurement (No), the process proceeds to S309.

  The CPU 207 controls the rotation control unit 203 so that the measurement region 10 of the microchip 1 in the holder 47R is positioned on the optical path 92R of the measurement light 92 emitted from the light source 90 of the inspection apparatus 30 according to a guidance program S304 described later. An angular velocity control signal is output to the spindle motor 35. The spindle motor 35 is driven to rotate the turntable 33 in the rotation direction 93 in accordance with the angular velocity control signal (S304).

  The CPU 207 causes the light source control unit 201 to output a light emission signal to the light source 90 so that the measurement light 92 is emitted from the light source 90 to the mixed liquid B1 in the measurement region 10 of the microchip 1 positioned on the optical path 92R. The light source 90 emits measurement light 92 according to the light emission signal. The light receiving unit 91 receives the transmitted light that has passed through the measurement region 10. The RAM 206 of the control device 200 stores the intensity of transmitted light received by the light receiving unit 91 (S305).

  Similar to the guidance program S304, the CPU 207 moves the spindle from the rotation control unit 203 so that the measurement region of the microchip 101 in the holder 47L is positioned on the optical path 92R of the measurement light 92 emitted from the light source 90 of the inspection apparatus 30. An angular velocity control signal is output to the motor 35. The spindle motor 35 is driven so that the turntable 33 rotates by an angle of 180 degrees in the rotation direction 93 according to the angular velocity control signal (S306).

  Similar to the microchip 1, the CPU 207 emits light from the light source control unit 201 to the light source 90 so that the measurement light 92 is emitted from the light source 90 to the mixed liquid in the measurement region of the microchip 101 located on the optical path 92R. Output a signal. The light source 90 emits measurement light 92 according to the light emission signal. The light receiving unit 91 receives the transmitted light that has passed through the measurement region. The RAM 206 of the control device 200 stores the intensity of transmitted light received by the light receiving unit 91 (S307).

  The CPU 207 adds 1 to the algebra N (S308). After S308, the process returns to S303.

  The CPU 207 calculates the absorbance from the value of the transmitted light stored in the RAM 206 of the control device 200, measures the absorbance of a plurality of test solutions having known concentrations, and uses a calibration curve between the concentration of the target substance and the absorbance. Then, the concentration of the target substance is calculated (S309).

  The CPU 207 ends the execution of the measurement program S30 (S310).

(Detailed flowchart of guidance program S304)
FIG. 13 is a flowchart showing a processing procedure according to the guidance programs S304 and S305 for guiding the holder 47R onto the optical path 92R. FIG. 15 shows the microchip 1 at the time of processing according to the guidance program S304, and is a cross-sectional view of the microchip 1 according to the line AA as in FIG. The guidance program S304 will be described with reference to FIGS.

  When the above-described measurement program S30 S303 ends, the CPU 207 starts the guidance program S304 (S3041). FIG. 15A is a cross-sectional view showing a state immediately after starting the guidance of the microchip 1 to the optical path 92R according to the process of S304. As shown in FIG. 15A, since the measurement region 10 is located below the passage region 8 in the direction of gravity GF, the mixed liquid B1 stays in the measurement region 10.

The CPU 207 controls the spindle motor 35 from the rotation control unit 203 so that the rotation of the turntable 33 is accelerated in the rotation direction 93 at the angular acceleration β1 [rad / s ² ] until the predetermined maximum angular velocity ω from when the rotation is stopped. An angular velocity control signal is output. The spindle motor 35 is driven to accelerate the rotation of the turntable 33 in the rotation direction 93 with the angular acceleration β1 until the maximum angular velocity ω is reached in accordance with the angular velocity control signal (S3042). FIG. 15B is a cross-sectional view showing the state of the microchip 1 during acceleration. As shown in FIG. 15B, the mixed liquid B <b> 1 is drawn toward the bottom surface 9 </ b> A side of the passage region 8 through the bottom surface 9 </ b> B by the inertia force 94 a upstream in the rotation direction 93.

  The CPU 207 outputs an angular velocity control signal from the rotation control unit 203 to the spindle motor 35 so that the turntable 33 is maintained at the maximum angular velocity ω [rad / s]. The spindle motor 35 is driven so as to maintain the rotation of the turntable 33 in the rotation direction 93 at the maximum angular velocity ω in accordance with the angular velocity control signal (S3043). FIG. 15C is a cross-sectional view showing a state of the microchip 1 rotating at the maximum angular velocity ω. As shown in FIG. 15C, the mixed liquid B1 is temporarily drawn toward the passage region 8 side.

The CPU 207 outputs an angular velocity control signal from the rotation control unit 203 to the spindle motor 35 so that the rotation of the turntable 33 is decelerated in the rotation direction 93 at the angular acceleration β2 [rad / s ² ] from the maximum angular velocity ω to the stop of rotation. Let The spindle motor 35 is driven to reduce the rotation of the turntable 33 in the rotation direction 93 at the angular acceleration β2 from the maximum angular velocity ω to the stoppage of rotation in accordance with the angular velocity control signal (S3044). FIG. 15D is a cross-sectional view showing the state of the microchip 1 during deceleration. As shown in FIG. 15 (d), the mixed liquid B 1 moves from the bottom surface 9 A to the bottom surface 9 B of the passage region 8 by gravity GF from the passage region 8 to the measurement region 10 and inertia force 94 b downstream in the rotation direction 93. Passing through, it is drawn to the measurement area 10 vigorously.

  The CPU 207 ends the execution of the guidance program S304 (S3045). FIG. 15E is a cross-sectional view showing the state of S3045 of the stopped microchip 1. As shown in FIG. 15 (e), the mixed liquid B <b> 1 stays on the bottom surface 9 </ b> B of the passage region 8 and the measurement region 10 soon after the execution of the guidance program S <b> 304 is finished.

  FIG. 15F is a cross-sectional view illustrating a state of the microchip 1 from which the measurement light 92 is emitted. As shown in FIG. 15 (f), the measurement light 92 is emitted from the light source 90 to the mixed liquid B1 in the measurement region 10 of the microchip 1, and the transmitted light is received by the light receiving unit 91 (S305).

  As described above, the liquid mixture B1 can be accumulated in the measurement region 10 of the microchip 1 when measuring the transmitted light by the inertial force 94b downstream in the rotation direction 93. As a result, the absorbance of the mixed liquid B1 can be accurately measured.

(Modified example of microchip channel and tank)
In the present embodiment, the sample has been described as blood, but is not limited thereto. Specifically, the specimen may be a reagent such as serum, plasma, or drug, or a mixed liquid of reagent and blood, and can be appropriately selected by a user according to a desired test.

  In the present embodiment, the absorbance measurement tank 7 has a rectangular shape that is long in the left-right direction, but is not limited thereto, and may be a curved shape such as a polygonal shape or a circle.

  In the present embodiment, the bottom surface 9 </ b> B of the passage area 8 is provided from the predetermined place 8 </ b> T to the predetermined place 10 </ b> T located in the intermediate portion of the passage area 8. 10T may be provided. That is, the entire depth of the passing region 8 may be provided so as to become shallower as the measuring region 10 is approached. Further, the bottom surface 9B of the passing region 8 linearly becomes shallower in the front-rear direction as it approaches the measurement region 10, that is, the lower side. However, the present invention is not limited to this, and when the liquid flows from the passage region 8 toward the measurement region 10 by applying an inertial force, the liquid is continuously shallow in the front-rear direction so as not to remain in the passage region 8. Other shapes may be used as long as they are.

  In the present embodiment, the surface roughness of each surface of the measurement region 10 is defined, but the surface roughness of each surface of the measurement region 10 may be in a range in which liquid flows into the measurement region 10 due to inertial force. .

  In the present embodiment, the measurement region 10 includes the side wall surfaces 10B, 10C, and 10D that are perpendicular to the flow path forming surface 2A. However, the measurement region 10 may be an intersecting surface instead of a perpendicular surface. In particular, if the taper is formed from the bottom surface 10A in the direction along the flow path forming surface 2A of the measurement region 10 toward the flow path forming surface 2A, the surface roughness of the surfaces 10B, 10C, and 10D can be increased during injection molding. Rough and easy to process.

  In the present embodiment, the cutout portion 11 is provided at the right corner of the bottom surface 2B of the microchip 1. However, as long as it is a posture regulating means capable of regulating the orientation of the microchip 1 to a predetermined posture, it is in another form. There may be. For example, a protrusion may be provided on the outer wall surface of the microchip, and a notch may be provided on the inner wall surface on the holder side. Further, there may be two or more notches. Moreover, the notch part may be extended and provided upward from the lower end of one side surface among the side surfaces perpendicular to the flow path forming surface 2A of the microchip.

  In the microchip 1 according to the present embodiment, the reagent supply path 6 and the passage area 8 are directly connected, but a measuring unit and a surplus tank are provided between the reagent supply path 6 and the passage area 8. May be. The measuring unit is a tank for measuring a predetermined amount of reagent. The measuring unit has a volume capable of measuring a predetermined amount of the reagent. The surplus tank is a tank for storing the surplus liquid measured by the measuring unit. The surplus tank has a volume capable of storing a predetermined amount of surplus liquid flowing out by measuring a predetermined amount by the measuring unit. By providing a measuring section and a surplus tank between the reagent supply path 6 and the passage area 8, the amount of the reagent mixed with the sample can be measured. As a result, even if the reagent to be injected into the microchips 1 and 101 is not measured in advance, the sample and the reagent can be mixed in an appropriate amount by simply rotating the holder at a predetermined angle.

  In the microchip 1 according to the present embodiment, the second flow path 15 and the reagent supply path 6 are connected to the upper end of the passage region 8. However, the second flow path and the reagent supply path need only be connected to one of the end portions of the passage region.

  In the microchip 1 according to the present embodiment, the sample loading unit 3 is provided on the left side and the reagent loading unit 4 is provided on the right side as viewed from the front, but the sample loading unit 3 on the right side and the reagent loading unit 4 on the left side, You may arrange | position a flow path and a tank in the position opposite to this embodiment.

  In the present embodiment, the thicknesses of the sample loading unit 3 and the reagent loading unit 4 are constant, but the sample loading unit 3 and the reagent loading unit 4 are close to the sample supply path 5 and the reagent supply path 6. Accordingly, it may be formed in a shape in which the thickness in the front-rear direction is reduced. By reducing the thickness of the sample supply path 5 and the reagent supply path 6 in the front-rear direction, it is possible to accurately measure a smaller amount of sample and reagent.

  In the present embodiment, both the microchips 1 and 101 have one sample input portion for the sample EL. However, there may be two or more sample input portions in each of the microchips 1 and 101. In the present embodiment, the specimen EL of the microchip 101 is mixed with one reagent M1, but may be mixed with a plurality of reagents.

(Modifications other than microchip channel and tank)
In the present embodiment, the material of the plate member 2 and the cover member 20 is not particularly limited, and polyethylene terephthalate (PET), polybutylene terephthalate (PBT), polymethyl methacrylate (PMMA), polycarbonate (PC), polystyrene (PS) , Polypropylene (PP), polyethylene (PE), polyethylene naphthalate (PEN), polyarylate resin (PAR), acrylonitrile / butadiene / styrene resin (ABS), vinyl chloride resin (PVC), polymethylpentene resin (PMP), Organic materials such as polybutadiene resin (PBD), biodegradable polymer (BP), cycloolefin polymer (COP), and polydimethylsiloxane (PDMS) can be used. In addition, an inorganic material such as silicon, glass, or quartz may be used.

  In the present embodiment, the plate member 2 was a substantially square transparent plate, but if it has an area that can form a flow path on the flow path forming surface, a polygon such as an octagon, Alternatively, the shape may be chamfered such as a circle or an ellipse. The holders 47L and 47R may be formed so as to be accommodated in accordance with the shapes of the various plate members. The plate member 2 may not be transparent as long as it is a member that can transmit measurement light.

  In the present embodiment, the cover member 20 may be not only a flexible film but also a sheet-like substance having higher rigidity than the film. Moreover, the board | substrate which has the hardness comparable as the board member 2 and consists of a homogeneous material may be sufficient. The substrate is known, for example, described in JP-A-2006-234600.

  In the present embodiment, the plate member 2 is manufactured by injection molding, but may be manufactured by other various resin molding methods such as vacuum molding, or mechanical cutting.

(Modification of inspection device)
In the present embodiment, after the liquid mixing program S20 is completed, step S304 for guiding the holder 47R onto the optical path 92R in the rotation direction 93 is performed. However, a motor that can control the rotation stop position, which is different from the spindle motor 35, is used. Thus, at the end of the liquid mixing program S20, the holder 47R may be controlled to stop on the optical path 92R. At this time, it is desirable that the angular acceleration at the start of the liquid mixing program S20 is smaller than the angular acceleration at the end of the liquid mixing program S20. Thereby, inertia force can be given comparatively strongly downstream in the direction of rotation.

  In the present embodiment, the light source 90 is a laser diode, but any light source capable of emitting directional light such as an LED may be used.

  In the present embodiment, the control device 200 is provided as a separate configuration connected to the drive mechanism of the inspection device 30 via the cable 96, but is incorporated into the drive mechanism and provided integrally therewith. Also good.

  In the present embodiment, the holder 47 includes the holder 47L and the holder 47R. However, the holder 47 may be one, or three or more.

  In the present embodiment, the angular acceleration β1 is smaller than the angular acceleration β2. However, if the bottom surface 10A is downstream of the bottom surface 9B in the rotation direction 93 and the inertial force that can flow out to the measurement region 10 through the bottom surface 9B can be applied to the mixed liquid, the angular acceleration β1 is It may be larger than the angular acceleration β2.

  In the present embodiment, the measurement light emitted from the light source is arranged so that the incident direction of the measurement light is perpendicular to the flow path forming surface, but the flow path forming surface is limited to the arrangement perpendicular to the incident direction. Absent. For example, if the light source enters measurement liquid into the liquid mixture in the measurement region and the light receiving unit can receive transmitted light, the angle formed between the flow path forming surface and the incident direction is an acute angle or an obtuse angle. May be.

  In the present embodiment, the turntable 33 has a disk shape, but may have various shapes such as a polygonal shape as long as the turntable 33 is provided to be rotatable about the vertical direction.

  In the present embodiment, the extending direction of the pair of shafts 46L and 46R and the flow path forming surfaces 2A and 102A are orthogonal to each other, but the flow path forming surface is limited to an arrangement orthogonal to the rotation axis. There is no. For example, if the direction of the centrifugal force CF can be switched to a desired direction when the angle is changed to a predetermined angle around the pair of shafts 46L, 46R, the flow path forming surfaces 2A, 102A and the pair of shafts 46L, The angle formed by the extending direction of 46R may be an acute angle or an obtuse angle.

  In the present embodiment, the centrifugal force CF is applied in a direction parallel to the flow path forming surfaces 2A and 102A of the microchips 1 and 101 in the holders 47L and 47R, but the flow path forming surface is in the direction of the centrifugal force CF. It is not limited to arrangement | positioning parallel to. For example, if the liquid in the microchip can be made to flow in a desired direction in various flow paths and tanks by applying the centrifugal force CF, the flow path forming surface intersects with the direction of the centrifugal force CF. May be arranged.

In the present embodiment, the centrifugal acceleration of the inspection apparatus 30 is 500 G [m / s ² ], but may be any centrifugal acceleration that allows the specimen or the mixed liquid to move through a predetermined flow path or tank. Moreover, the centrifugal acceleration of the centrifugal force CF may be a value of about 100 G to 5000 G [m / s ² ], for example.

  In the above description, the embodiment and the modification have been described as separate examples, but the present invention is not limited to this. That is, as a configuration in which the components are combined, the embodiment and some of the modifications may be combined as appropriate.

  Finally, the above-described embodiment is an example of the present invention, and the present invention is not limited to the above-described embodiment. For this reason, it is a matter of course that various modifications can be made as needed within the scope not departing from the technical idea of the present invention other than the embodiment described above.

(Correspondence between Invention and Embodiment)
The flow path forming surfaces 2A and 102A in the present embodiment are examples of the flow path forming surfaces in the present invention. The predetermined channel in the present embodiment is an example of the channel in the present invention. The microchips 1 and 101 in the present embodiment are an example of a test object receptacle in the present invention. The specimen EL, the reagent M1, or the mixed liquid B1 in the present embodiment is an example of a liquid to be inspected in the present invention. The absorbance measurement tank 7 in the present embodiment is an example of the absorbance measurement tank in the present invention. The first depth D1 and the second depth D2 in the present embodiment are examples of the first depth and the second depth in the present invention in order. The passage region 8 and the measurement region 10 in this embodiment are examples of the passage region and the measurement region in the present invention in order. The rotation direction 93 in the present embodiment is an example of the rotation direction in the present invention. The front-rear direction in the present embodiment is an example of a direction perpendicular to the flow path forming surface in the present invention. The optical path 92R in the present embodiment is an example of the position where the measurement light in the present invention is incident. The main shaft 57 in the present embodiment is an example of the main shaft in the present invention.

  The notch portion 11 in the present embodiment is an example of the notch portion and the posture regulating means in the present invention.

  The side wall surfaces 10B, 10C, and 10D of the measurement region 10 in the present embodiment are examples of the side wall surfaces of the measurement region in the present invention. The bottom surface 9 </ b> B and the bottom surface 10 </ b> A in this embodiment are examples of the bottom surface of the passing region and the bottom surface of the measurement region in the present invention in order.

  The measurement light 92, the light source 90, the light receiving unit 91, and the inspection device 30 in this embodiment are examples of the measurement light, the light source, the light receiving unit, and the inspection device in this order. The holders 47L and 47R in the present embodiment are examples of the holder in the present invention. The spindle motor 35, the rotation control unit 203, the stepping motor 51, and the angle setting unit 204 in the present embodiment are examples of the rotation drive source, the rotation control unit, the angle change source, and the angle setting unit in the present invention in order. The angle α in the present embodiment is an example of the angle in the present invention. The axes of the shafts 46L and 46R in the present embodiment are examples of the axes in the present invention.

  The angular acceleration β1, the maximum angular velocity ω, and the angular acceleration β2 in the present embodiment are examples of the first angular acceleration, the predetermined angular velocity, and the second angular acceleration in the present invention in order.

  The holder 47R and the holder 47L in this embodiment are an example of a first holder and a second holder in the present invention in order.

  S3042 in this embodiment is an example of a rotation step in the present invention. S3044 in this embodiment is an example of an angle setting step in the present invention. S305 in the present embodiment is an example of a measurement step in the present invention.

DESCRIPTION OF SYMBOLS 1 Microchip 2 Plate member 2A Flow path formation surface 3 Reagent input part 4 Sample input part 5 Reagent supply path 6 Sample supply path 8 Passage area 10 Measurement area 11 Notch part EL Sample M1 Reagent B1 Mixed liquid 20 Cover member 30 Inspection apparatus 35 Spindle motor 51 Stepping motor 90 Light source 91 Light receiver

Claims (8)

While having a flow path forming surface formed with a concave flow path through which the liquid to be inspected can flow,
A measurement region that transmits the measurement light to measure the absorbance of the liquid to be inspected and has a first depth in a direction perpendicular to the flow path forming surface;
As the liquid to be inspected passes from the flow path toward the measurement area and gradually moves from the second depth deeper than the first depth to the measurement area in a direction perpendicular to the flow path forming surface, the liquid gradually increases. A receptor to be inspected comprising an absorbance measurement tank that is a recess having a shallow passage region;
A holder for detachably storing the test object receptacle;
A rotational drive source for rotating the holder around a main axis extending along the direction of gravity;
A rotation control unit that rotates the holder in a rotation direction and controls the rotation drive source to accelerate or decelerate an angular velocity of the holder;
An angle changing source for changing the angle of the holder around an axis intersecting the flow path forming surface;
An angle setting unit that controls the angle change source to set the angle of the holder,
A light source for allowing measurement light to enter the measurement region of the inspection object receiver housed in the holder;
A light receiving portion for receiving the measurement light transmitted through the measurement region,
The holder is
While the flow path forming surface is along the direction of gravity,
In the mounting posture in which the bottom surface of the measurement region is located downstream of the bottom surface of the passage region in the rotation direction, the inspection object receptacle is stored,
The angle setting unit includes:
When the angular velocity of the holder is decelerated to stop the measurement area in the holder at a position where measurement light emitted from the light source is incident, the measurement area is positioned below the passage area in the direction of gravity. The inspection system is characterized in that the angle of the holder is set. The rotation control unit
Measurement in which the holder is accelerated at the first angular acceleration from when the rotation is stopped until reaching a predetermined angular velocity in the rotational direction, and the measurement region in the holder is emitted from the light source in the rotational direction from the predetermined angular velocity. It is decelerated at the second angular acceleration until it stops at the position where light enters,
The inspection system according to claim 1, wherein the rotation drive source is controlled so that the second angular acceleration is equal to or greater than the first angular acceleration. The holder includes first and second holders that respectively accommodate a plurality of test target receptacles,
The rotation control unit
The direction of rotation when guiding the measurement region of the test object receptacle stored in the first holder to the position where the measurement light emitted from the light source is incident;
The direction of rotation when guiding the measurement region of the test object receiver stored in the second holder to the position where the measurement light emitted from the light source is incident;
The inspection system according to claim 1, wherein the rotation drive source is controlled so that the rotation direction is the same as the rotation direction.   The inspection system according to claim 1, wherein the bottom surface of the measurement region has an average roughness Ra value of 70 nm or less.   The inspection system according to claim 4, wherein the surface roughness of the side wall surface of the measurement region is larger than the surface roughness of the bottom surface of the measurement region.   The said inspection object receptacle is provided with the attitude | position control means which regulates the attitude | position with which the said inspection object receptacle is mounted | worn to the said holder to the said predetermined mounting attitude | position. Inspection system.   The inspection system according to claim 6, wherein the posture regulating means is a notch. While having a flow path forming surface formed with a concave flow path through which the liquid to be inspected can flow,
A measurement region that transmits the measurement light to measure the absorbance of the liquid to be inspected and has a first depth in a direction perpendicular to the flow path forming surface;
As the liquid to be inspected passes from the flow path toward the measurement area and gradually moves from the second depth deeper than the first depth to the measurement area in a direction perpendicular to the flow path forming surface, the liquid gradually increases. A receptor to be inspected comprising an absorbance measurement tank that is a recess having a shallow passage region;
A holder for detachably storing the test object receptacle;
A rotational drive source for rotating the holder around a main axis extending along the direction of gravity;
A rotation control unit that rotates the holder in a rotation direction and controls the rotation drive source to accelerate or decelerate an angular velocity of the holder;
An angle changing source for changing the angle of the holder around an axis intersecting the flow path forming surface;
An angle setting unit that controls the angle change source to set the angle of the holder,
A light source for allowing measurement light to enter the measurement region of the inspection object receiver housed in the holder;
Using an inspection system including a light receiving unit that receives measurement light transmitted through the measurement region,
A position where measurement light emitted from the light source enters the measurement region in the holder in a state where the inspection target receptacle is housed in the holder so that the flow path forming surface extends in a direction along the direction of gravity. The rotation control unit rotates the rotation drive source so that the bottom surface of the measurement region is downstream of the bottom surface of the passage region in the rotation direction;
When the rotation control unit decelerates the angular velocity of the holder to stop the measurement region in the holder at a position where measurement light emitted from the light source is incident, the measurement region passes in the direction of gravity. An angle setting step in which the angle setting unit controls the angle change source so as to be positioned below an area; and
A measurement step of emitting measurement light from the light source to the measurement region of the inspection object receiver housed in the holder, and receiving the measurement light transmitted through the measurement region;
The inspection method characterized by performing.

Images