JP6028624B2 - Inspection chip and inspection system - Google Patents

Description

  The present invention relates to a test chip and a test system in which a sample or a reagent is quantified in a quantification unit.

  Conventionally, a test chip in which a sample or a reagent is quantified in a quantification unit is known. For example, the microchip described in Patent Document 1 includes a liquid reagent holding unit and a liquid reagent measuring unit. The liquid reagent holding unit holds a liquid reagent. The liquid reagent in the liquid reagent holding unit is supplied to the liquid reagent measuring unit and measured by the liquid reagent measuring unit. An inlet is located at the end of the flow path for supplying the liquid reagent in the liquid reagent holding section to the liquid reagent measuring section on the reagent measuring section side. The inlet is smaller in size than the liquid reagent metering section.

JP 2009-121912 A

  For example, the smaller the amount of liquid reagent to be quantified, the smaller the liquid reagent metering unit is formed. On the other hand, since the injection port is formed smaller than the liquid reagent measuring unit, there is a case where the injection port cannot be formed with a mold or the like if the injection port is further reduced. Therefore, the inlet cannot be made sufficiently small with respect to the liquid reagent measuring unit. Therefore, when the liquid reagent metering is reduced, the size of the injection port approaches the size of the liquid reagent metering unit. In this case, for example, when the liquid reagent spreads by connecting the wall surface forming the injection port, the liquid reagent easily covers the entire opening of the liquid reagent measuring unit. If the liquid reagent covers the entire opening of the liquid reagent metering unit, the air present in the liquid reagent metering unit cannot be removed, and the liquid reagent metering accuracy in the liquid reagent metering unit may be reduced.

  An object of the present invention is to provide a test chip and a test system that improve the quantitative accuracy of a specimen or a reagent.

The test chip according to the first aspect of the present invention includes a quantification unit for quantifying a sample or a reagent, a supply unit for supplying the sample or the reagent to the quantification unit, and a first end of the quantification unit. Connected to the end, connected to the first guide part to which the sample or the reagent quantified in the quantification part moves, and to the second end which is the other end of the quantification part, overflowed from the quantification part The second guide part to which the specimen or the reagent moves and the end part of the second guide part opposite to the quantification part side are connected to house the specimen or the reagent that has moved the second guide part. A surplus portion, a first wall surface on the supply portion side in the first guide portion, a wall surface on the first guide portion side in the supply portion, the second wall surface facing the first wall surface, and the first The end of the first wall surface in a fixed direction from one end to the second end A third wall surface that connects a third end portion and a fourth end portion that is an end portion of the second wall surface in the quantitative direction, and a wall surface provided on the quantitative direction side facing the third wall surface A vertical imaginary line drawn in a direction perpendicular to the second wall surface from the third end portion is provided with a fourth wall surface positioned on the quantitative direction side with respect to the second end portion. Or an inspection chip that intersects with the first guide part, and when used in an inspection device that applies centrifugal force to the inspection chip by rotating the inspection chip around a predetermined axis, Centrifugal force is applied in a direction perpendicular to the two wall surfaces .

  In this case, the fourth wall surface is located on the quantitative direction side with respect to the second end portion. For this reason, a 3rd wall surface and a 4th wall surface are spaced apart compared with the case where a 4th wall surface is provided in the direction opposite to a fixed direction rather than a 2nd edge part. Therefore, when the sample or reagent is supplied from the supply unit to the quantification unit, the sample or reagent passing between the third wall surface and the fourth wall surface is difficult to contact the fourth wall surface. Therefore, it is possible to reduce the possibility that the specimen or reagent supplied from the supply unit to the quantification unit spreads through the fourth wall surface or the wall surface connected to the end of the fourth wall surface on the quantification unit side. For this reason, it is possible to prevent the specimen or reagent from spreading and covering the quantification unit so that air existing in the quantification unit cannot be removed. Therefore, the quantitative accuracy of the specimen or reagent is improved.

  In the test chip, a width in the quantitative direction between the third wall surface and the fourth wall surface may be larger than a width in the quantitative direction between the first end portion and the second end portion. .

  In the inspection chip, of the angles formed by the second wall surface and the third wall surface, the angle on the first wall surface side is an obtuse angle, and among the angles formed by the first wall surface and the third wall surface, The angle on the second wall surface side may be an acute angle.

  In the test chip, the third wall surface may be inclined so as to be positioned on the quantitative direction side as being closer to the quantitative unit.

  The test chip is an opposite wall surface that is located on the opposite side of the quantitative portion with the second guide portion in a direction perpendicular to the quantitative surface connecting the first end portion and the second end portion. The extending direction which extended the said opposite wall surface may cross | intersect said 2nd wall surface.

  The test chip includes a connection wall surface that is a wall surface connected to a connection end portion that is an end portion on the opposite direction side of the fixed direction in the opposite wall surface, in a direction perpendicular to the second wall surface from the connection end portion. The drawn end virtual line may be located on the opposite side of the quantitative direction from the third end.

  The inspection chip is provided between the third wall surface and the quantitative unit, and is a depth that is perpendicular to the quantitative direction and parallel to a quantitative surface that connects the first end and the second end. An inclined surface that decreases as the width of the channel in the vertical direction decreases toward the metering unit, and a portion of the tilted surface that extends from the second end toward the metering direction side, and at least of the second supply unit An extension part that forms a part, and an end part on the surplus part side in the extension part, and a flow path than a width in the depth direction of the end part on the surplus part side in the extension part. The surplus part side wall surface which is a wall surface with a large width | variety is provided, An acute angle may be sufficient as the angle which the said extending | stretching site | part and the said surplus part side wall surface make.

  The inspection chip is provided between the third wall surface and the quantitative unit, and is a depth that is perpendicular to the quantitative direction and parallel to a quantitative surface that connects the first end and the second end. The depth of the end of the inclined direction side of the inclined surface is connected to an inclined surface that decreases as the width of the channel in the vertical direction becomes closer to the fixed portion, and the end of the inclined surface on the fixed direction side. You may provide the level | step difference wall surface which is a wall surface whose width | variety of a flow path is larger than the width | variety of the flow path of a direction.

  A test system according to a second aspect of the present invention includes a test chip including a quantification unit for quantifying a sample or a reagent, and centrifugal force applied to the test chip by rotating the test chip around a predetermined first axis. And an inspection system configured to change the direction of the centrifugal force by rotating the inspection chip around a second axis different from the first axis, the inspection system The chip is connected to the quantification unit, a supply unit that supplies the sample or the reagent to the quantification unit, and a first end that is one end of the quantification unit, and the sample or quantified in the quantification unit A first guide part for moving the reagent; a second guide part connected to a second end part which is the other end part of the quantifying part; and a second guide part for moving the sample or the reagent overflowing from the quantifying part; The quantitative unit of the two guide units A surplus part that is connected to the opposite end and accommodates the specimen or the reagent moved through the second guide part, a first wall surface on the supply part side in the first guide part, and the supply part A second wall surface on the first guide portion side in the second wall surface facing the first wall surface, and an end portion of the first wall surface in a quantitative direction from the first end portion toward the second end portion. A third wall surface that connects a third end portion and a fourth end portion that is an end portion of the second wall surface in the quantitative direction, and a wall surface provided on the quantitative direction side facing the third wall surface A vertical imaginary line drawn in a direction perpendicular to the second wall surface from the third end portion is provided with a fourth wall surface positioned on the quantitative direction side with respect to the second end portion. Or the first guide part, the inspection device is directed in a direction opposite to the quantitative direction. First action means for applying the centrifugal force to the inspection chip, and after the centrifugal force is applied by the first action means, the centrifugal force acts on the inspection chip in a direction perpendicular to the second wall surface. A first rotating means for rotating the inspection chip around the second axis, and the first end and the second end after the inspection chip is rotated by the first rotating means. A second action means for applying the centrifugal force to the inspection chip in a direction perpendicular to a quantitative surface that connects, and after the centrifugal force is applied by the second action means, in a direction opposite to the quantitative direction A second rotating means for rotating the inspection chip around the second axis in a posture in which the centrifugal force acts on the inspection chip toward the first, the first rotating means rotating the inspection chip first The rotation speed is the second rotation The means may be slower than a second rotation speed for rotating the inspection chip.

  In this case, the first rotation speed at which the first rotation means rotates the inspection chip is slower than the second rotation speed at which the second rotation means rotates the inspection chip. Therefore, compared to the case where the first rotation speed is equal to or higher than the second rotation speed, the amount of the specimen or reagent flowing from the supply unit to the quantification unit side per unit time is reduced. Therefore, the width of the specimen or reagent flowing from the supply unit to the quantification unit side becomes narrow. Therefore, it is possible to reduce the possibility that the specimen or reagent covers the quantitative unit as compared with the case where the specimen or reagent becomes wider. Therefore, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part cannot escape, and the fixed_quantity | quantitative_assay precision of a test substance or a reagent improves.

  In the inspection system, the inspection apparatus makes the centrifugal force that acts on the inspection chip when the first rotation unit rotates the inspection chip larger than the centrifugal force that is applied by the first operation unit. Accelerating means may be provided.

It is a figure which shows the structure of the test | inspection system 3 containing the test | inspection apparatus 1 and the control apparatus 90. FIG. It is a perspective view of the test | inspection chip 2. FIG. It is a front view of the test | inspection chip 2 before a centrifugation process. FIG. 4 is an enlarged view of a sample quantitative flow path 11 of the test chip 2 shown in FIG. 3. FIG. 4 is a partial cross-sectional view taken along line AA in FIG. 3. FIG. 4 is a partial cross-sectional view in the direction of arrows BB in FIG. 3. It is a CC sectional view taken on the line in FIG. It is a DD sectional view partial sectional view of FIG. It is the figure which showed the change with the rotational speed of revolution in the centrifugation process, and the angle of rotation. It is a flowchart of a centrifugation process. It is a state transition diagram of the test | inspection chip 2 in a centrifugation process. 4 is a partial front view of the test chip 2 in a state where the liquid 16 flows from the supply unit 112 to the fixed amount unit 114. FIG. It is a figure which shows the sample fixed_quantity | assay flow path 11 of the test | inspection chip 102 of 2nd embodiment.

  Embodiments of the present invention will be described with reference to the drawings. FIG. 1 shows a plane of the inspection apparatus 1 constituting the inspection system 3 and functional blocks inside the control apparatus 90.

<1. Schematic structure of inspection system 3>
A first embodiment of the present invention will be described. A schematic structure of the inspection system 3 will be described with reference to FIG. The inspection system 3 of the present embodiment includes an inspection chip 2 that can store a sample and a reagent that are liquids, and an inspection apparatus 1 that performs an inspection using the inspection chip 2. When the inspection device 1 rotates the inspection chip 2 around the vertical axis A <b> 1 separated from the inspection chip 2, centrifugal force acts on the inspection chip 2. When the inspection apparatus 1 rotates the inspection chip 2 around the horizontal axis A2, the centrifugal direction, which is the direction of the centrifugal force acting on the inspection chip 2, is switched. In addition, since the inspection system 3 and the inspection apparatus 1 of this embodiment have a known structure as described in JP 2012-78107 A, in the following description, an outline of the structure of the inspection apparatus 1 will be described. To do.

<2. Structure of the inspection apparatus 1>
The structure of the inspection apparatus 1 will be described with reference to FIG. In the following description, the upper, lower, right, left, front side, and back side of FIG. 1 are defined as the front, rear, right, left, upper, and lower sides of the inspection apparatus 1, respectively. . In the present embodiment, the direction of the vertical axis A1 is the vertical direction of the inspection apparatus 1, and the direction of the horizontal axis A2 is the direction of the speed when the inspection chip 2 is rotated about the vertical axis A1. FIG. 1 shows a state where the top plate of the upper housing 30 of the inspection apparatus 1 is removed.

  As shown in FIG. 1, the inspection apparatus 1 includes an upper housing 30, a lower housing 31, an upper plate 32, a turntable 33, an angle changing mechanism 34, and a control device 90. The turntable 33 is a disk rotatably provided on the upper side of an upper plate 32 described later. The inspection chip 2 is held above the turntable 33. The angle changing mechanism 34 is a drive mechanism provided on the turntable 33. The angle changing mechanism 34 rotates the inspection chip 2 around the horizontal axis A2. The upper housing 30 is fixed to an upper plate 32 described later, and a measurement unit 7 that performs optical measurement on the inspection chip 2 is provided inside. The control device 90 is a controller that controls various processes of the inspection device 1.

  A schematic structure of the lower housing 31 will be described. The lower housing 31 has a box-shaped frame structure in which frame members are combined. An upper plate 32 that is a rectangular plate material is provided on the upper surface of the lower housing 31. A drive mechanism that rotates the turntable 33 around the vertical axis A1 is provided in the lower housing 31 as follows.

  A spindle motor 35 that supplies a driving force for rotating the turntable 33 is installed on the left side in the lower housing 31. A shaft 36 of the main shaft motor 35 protrudes upward, and a pulley 37 is fixed. A vertical main shaft 57 extending upward from the inside of the lower housing 31 is provided at the center of the lower housing 31. The main shaft 57 passes through the upper plate 32 and protrudes above the lower housing 31. The upper end portion of the main shaft 57 is connected to the center portion of the turntable 33.

  The main shaft 57 is rotatably held by a support member (not shown) provided immediately below the upper plate 32. A pulley 38 is fixed to the main shaft 57 below the support member. A belt 39 is stretched over the pulley 37 and the pulley 38. When the main shaft motor 35 rotates the shaft 36, the driving force is transmitted to the main shaft 57 via the pulley 37, the belt 39, and the pulley 38. At this time, the turntable 33 rotates around the main shaft 57 in conjunction with the rotation of the main shaft 57.

  A guide rail (not shown) extending in the vertical direction inside the lower housing 31 is provided on the right side in the lower housing 31. A T-shaped plate (not shown) is movable in the vertical direction in the lower housing 31 along the guide rail.

  The aforementioned main shaft 57 is a cylindrical body having a hollow inside. An inner shaft (not shown) is a shaft that can move in the vertical direction inside the main shaft 57. The upper end portion of the inner shaft passes through the main shaft 57 and is connected to the rack gear 43. A bearing (not shown) is provided at the left end of the T-shaped plate. Inside the bearing, the lower end portion of the inner shaft is rotatably held.

  A stepping motor 51 for moving the T-shaped plate up and down is fixed in front of the T-shaped plate. The shaft 58 of the stepping motor 51 protrudes rearward, that is, downward in FIG. A disc-shaped cam plate (not shown) is fixed to the tip of the shaft 58. A cylindrical projection (not shown) is provided on the rear surface of the cam plate. The tip of the protrusion is inserted into a groove (not shown). The protrusion can slide in the groove. When the stepping motor 51 rotates the shaft 58, the protrusion moves up and down in conjunction with the rotation of the cam plate. At this time, the T-shaped plate moves up and down along the guide rail in conjunction with the protrusion inserted in the groove.

  The detailed structure of the angle changing mechanism 34 will be described. The angle changing mechanism 34 has a pair of L-shaped plates 60 fixed to the upper surface of the turntable 33. Each L-shaped plate 60 extends upward from a base portion fixed in the vicinity of the center of the turntable 33, and its upper end portion extends outward in the radial direction of the turntable 33. A rack gear 43 (not shown) fixed to the inner shaft is provided between the pair of L-shaped plates 60. The rack gear 43 is a metal plate-like member that is long in the vertical direction, and gears are respectively carved on both end faces.

  On the front end side in the extending direction of each L-shaped plate 60, a horizontal support shaft 46 having a gear 45 is rotatably supported. The support shaft 46 is fixed to the inspection chip 2 via a mounting holder (not shown). For this reason, the inspection chip 2 also rotates around the support shaft 46 in conjunction with the rotation of the gear 45. Between the gear 45 and the rack gear 43, a pinion gear 44 supported by an L-shaped plate 60 so as to be rotatable about a horizontal axis (not shown) is interposed. The pinion gear 44 meshes with the gear 45 and the rack gear 43, respectively. In conjunction with the vertical movement of the rack gear 43, the pinion gear 44 and the gear 45 are driven to rotate, and the inspection chip 2 rotates about the support shaft 46.

  In the present embodiment, as the main shaft motor 35 rotationally drives the turntable 33, the inspection chip 2 rotates around the main shaft 57 that is a vertical axis, and a centrifugal force acts on the inspection chip 2. The rotation around the vertical axis A1 of the inspection chip 2 is referred to as revolution. On the other hand, as the stepping motor 51 moves the inner shaft up and down, the inspection chip 2 rotates about the support shaft 46 which is a horizontal axis, and the direction of the centrifugal force acting on the inspection chip 2 changes relatively. The rotation around the horizontal axis A2 of the inspection chip 2 is called autorotation.

  In a state where the T-shaped plate is lowered to the lowermost end of the movable range, the rack gear 43 is also lowered to the lowermost end of the movable range. At this time, the inspection chip 2 is in a steady state where the rotation angle is 0 degree. Further, in the state where the T-shaped plate is raised to the uppermost end of the movable range, the rack gear 43 is also raised to the uppermost end of the movable range. At this time, the test | inspection chip 2 will be in the state rotated 180 degree | times centering on the horizontal axis line A2 from the steady state. That is, in this embodiment, the angle width that the test chip 2 can rotate is the rotation angle of 0 degrees to 180 degrees.

  The detailed structure of the upper housing 30 will be described. As shown in FIG. 1, the upper housing 30 has a box-like frame structure in which frame members are combined, and is installed on the upper left side of the upper plate 32. More specifically, the upper housing 30 is provided outside the range in which the inspection chip 2 is rotated as viewed from the main shaft 57 at the rotation center of the turntable 33.

  The measurement unit 7 provided inside the upper housing 30 includes a light source 71 that emits measurement light, and an optical sensor 72 that detects the measurement light emitted from the light source 71. The light source 71 and the optical sensor 72 are disposed on both the front and rear sides of the turntable 33 outside the rotation range of the inspection chip 2. In the present embodiment, the position on the left side of the main shaft 57 in the reciprocable range of the inspection chip 2 is the measurement position at which the inspection chip 2 is irradiated with the measurement light. When the inspection chip 2 is at the measurement position, the measurement light connecting the light source 71 and the optical sensor 72 intersects the front surface and the rear surface of the inspection chip 2 substantially perpendicularly.

<3. Electrical configuration of control device 90>
The electrical configuration of the control device 90 will be described with reference to FIG. The control device 90 includes a CPU 91 that performs main control of the inspection device 1, a RAM 92 that temporarily stores various data, and a ROM 93 that stores a control program. Connected to the CPU 91 are an operation unit 94 for a user to input instructions to the control device 90, a hard disk device 95 for storing various data and programs, and a display 96 for displaying various information. As the control device 90, a personal computer may be used, or a dedicated control device may be used.

  Further, a revolution controller 97, a rotation controller 98, and a measurement controller 99 are connected to the CPU 91. The revolution controller 97 controls the revolution of the inspection chip 2 by transmitting a control signal for rotating the spindle motor 35 to the spindle motor 35. The rotation controller 98 controls the rotation of the inspection chip 2 by transmitting a control signal for rotating the stepping motor 51 to the stepping motor 51. The measurement controller 99 performs the optical measurement of the inspection chip 2 by driving the measurement unit 7. Specifically, the measurement controller 99 transmits a control signal for executing light emission of the light source 71 and light detection of the optical sensor 72 to the light source 71 and the optical sensor 72. The CPU 91 controls the revolution controller 97, the rotation controller 98, and the measurement controller 99.

<4. Structure of inspection chip 2>
The detailed structure of the test chip 2 according to the present embodiment will be described with reference to FIGS. In the following description, the upper, lower, lower right, upper left, lower left, and upper right in FIG. 2 are the upper, lower, front, rear, left, and right sides of the test chip 2, respectively.

  As shown in FIGS. 2 and 3, the inspection chip 2 has a square shape when viewed from the front as an example, and mainly includes a transparent synthetic resin plate 20 having a predetermined thickness. The front surface of the plate member 20 is sealed with a sheet 291 made of a transparent synthetic resin thin plate. Between the plate member 20 and the sheet 291, a liquid channel 25 is formed through which the liquid sealed in the inspection chip 2 can flow. The liquid flow path 25 is a recess formed at a predetermined depth on the front side of the plate member 20 and extends in a direction orthogonal to the front-rear direction, which is the thickness direction of the plate member 20. The sheet 291 seals the flow path forming surface of the plate material 20. The illustration of the sheet 291 is omitted except for FIGS. 2, 3, 4, and 13. The liquid flow path 25 may be formed on the surface of the plate member 20 or may be formed on both the front surface and the back surface.

  The liquid channel 25 includes the sample quantitative channel 11, the reagent quantitative channels 13 and 15, the measurement unit 80, and the like. The sample quantitative flow path 11 is provided in the upper left part of the test chip 2. The reagent quantitative channel 13 is provided on the right side of the sample quantitative channel 11. The reagent quantitative channel 15 is provided on the right side of the reagent quantitative channel 13 and on the upper right part of the test chip 2. The measurement unit 80 is provided in the lower right part of the inspection chip 2.

  A configuration common to the sample quantitative flow path 11 and the reagent quantitative flow paths 13 and 15 will be described. 2 and 3, the reference numerals common to the sample quantitative channel 11 and the reagent quantitative channels 13 and 15 are described only in the sample quantitative channel 11, and the reference numerals in the reagent quantitative channels 13 and 15 are omitted. . Even in the case of a common configuration, they may be described in each of the sample quantitative flow channel 11 and the reagent quantitative flow channels 13 and 15. The same applies to FIGS. 11 and 12 described later.

  The sample quantification channel 11 and the reagent quantification channels 13 and 15 include a holding unit 111, a supply unit 112, a quantification unit 114, a first guide unit 115, a second guide unit 117, and a surplus unit 116, respectively. The holding part 111 is a recessed part that opens upward. The holding unit 111 is a part where the specimen 17, the first reagent 18, or the second reagent 19 shown in FIG. 3 is injected and stored. The specimen 17 is a liquid containing components such as blood, plasma, blood cells, bone marrow, urine, vaginal tissue, epithelial tissue, tumor, semen, saliva, or food. In the following description, the specimen 17, the first reagent 18, and the second reagent 19 are collectively referred to as “liquid 16” or when any of them is not specified.

  The supply unit 112 is a flow path that extends downward from the upper right portion of the holding unit 111. A quantitative unit 114 is provided below the supply unit 112. The quantification unit 114 is a part in which the liquid 16 is quantified, and is a concave part recessed in the lower left.

  The right end part which is one end part of the fixed_quantity | quantitative_assay part 114 is called the 1st end part 121. FIG. The left end portion which is the other end portion of the quantification unit 114 is referred to as a second end portion 122. A surface connecting the first end 121 and the second end 122 is a quantitative surface 126 shown in FIG. The fixed amount surface 126 is a virtual surface that is the position of the upper surface of the liquid 16 when the liquid 16 is quantified by the fixed amount unit 114.

  From the upper part of the fixed amount unit 114, the first guide unit 115 extends in the right direction, and the second guide unit 117 extends in the left direction. The first guide part 115 is connected to the first end part 121, and the second guide part 117 is connected to the second end part 122. The second guide part 117 is a flow path through which the liquid 16 overflowing from the fixed quantity part 114 moves. The second guide portion 117 extends leftward from the second end portion 122 and then extends downward. A surplus part 116 is provided at the lower left of the quantification part 114. The surplus part 116 is connected to a lower end part that is an end part of the second guide part 117 opposite to the fixed amount part 114 side. The surplus part 116 is a part in which the liquid 16 moved through the second guide part 117 is accommodated, and is a concave part provided in the right direction from the lower end part of the second guide part 117.

  The first guide part 115 is a flow path through which the liquid 16 quantified in the quantification part 114 moves. The first guide portion 115 extends in the right direction and then extends downward. The lower end of the first guide part 115 is connected to a measurement part 80 provided in the lower right part of the inspection chip 2. The measurement unit 80 is a recess that is recessed downward. When optical measurement to be described later is performed, measurement light is transmitted through the measurement unit 80.

  In the following description, the left direction that is the direction from the first end 121 to the second end 122 may be referred to as a fixed direction. As shown in FIG. 4, the supply unit 112 and the first guide unit 115 are separated by a wall 170. The wall 170 forms part of the supply unit 112 and the first guide unit 115. The wall 170 extends from the lower right part of the supply part 112 to the lower left. The wall portion 170 includes a first wall surface 171, a second wall surface 172, and a third wall surface 173. The first wall surface 171 faces the first guide portion 115, that is, the wall surface on the supply portion 112 side in the first guide portion 115. The second wall surface 172 faces the supply unit 112, that is, the wall surface on the first guide unit 115 side in the supply unit 112. The second wall surface 172 faces the first wall surface 171. The left end that is the end of the first wall surface 171 in the fixed direction is referred to as a third end 175. The left end that is the end of the second wall surface 172 in the fixed direction is referred to as a fourth end 176. The third wall surface 173 is a wall surface that connects the third end 175 and the fourth end 176. The third wall surface 173 forms the left end portion of the wall portion 170.

  Of the angles formed by the second wall surface 172 and the third wall surface 173, the angle R1 on the first wall surface 171 side is an obtuse angle. Of the angles formed by the first wall surface 171 and the third wall surface 173, the angle R2 on the second wall surface 172 side is an acute angle. The third wall surface 173 is inclined so as to be positioned on the quantitative direction side as it is closer to the quantitative unit 114. In other words, the third wall surface 173 is inclined to the left from the vertical direction, which is a direction perpendicular to the fixed surface 126, as it goes downward.

  A vertical imaginary line 751 drawn from the third end portion 175 in a direction perpendicular to the second wall surface 172 intersects the first guide portion 115. More specifically, the vertical imaginary line 751 intersects the left part of the opposing wall surface 178. The opposing wall surface 178 is a lower wall surface of the first guide portion 115. That is, the opposing wall surface 178 is a wall surface facing the first wall surface 171. The left end portion of the opposing wall surface 178 is connected to the first end portion 121. The opposing wall surface 178 extends obliquely upward to the right. The angle formed by the left-right direction (quantitative direction) connecting the first end 121 and the second end 122 and the opposing wall surface 178 is larger than the angle formed by the left-right direction and the second wall surface 172.

  The wall surface provided on the quantitative direction side facing the third wall surface 173 is referred to as a fourth wall surface 174. The fourth wall surface 174 is located on the quantitative direction side from the second end portion 122 in the left-right direction. In the present embodiment, the fourth wall surface 174 is a wall surface that forms the left portion of the second guide portion 117. As shown in FIG. 4, the fixed direction width L <b> 1 between the third wall surface 173 and the fourth wall surface 174 is larger than the fixed direction width L <b> 2 of the first end portion 121 and the second end portion 122.

  As shown in FIG. 3, the holding part 111 is formed by a holding wall part 180. The holding wall portion 180 extends from the upper left part of each of the sample quantitative flow channel 11 and the reagent quantitative flow channels 13 and 15 to the lower right and extends to the upper right at the right end. The holding wall 180 is located on the upper left side of the wall 170. The holding wall portion 180 includes an opposite wall surface 181 and a connection wall surface 182. The opposite wall surface 181 is a wall surface located on the opposite side of the fixed amount portion 114 with the second guide portion 117 in between in the vertical direction perpendicular to the fixed amount surface 126. An extending direction 185 that extends the opposite wall surface 181 to the right intersects the second wall surface 172. That is, the opposite wall surface 181 extends to the lower right.

  The end on the right side that is the opposite direction side of the fixed direction in the opposite wall surface 181 is referred to as a connection end 183. The connection wall surface 182 is a wall surface connected to the connection end 183 and extends from the connection end 183 to the upper right. An end imaginary line 184 that is an imaginary line drawn from the connection end 183 in the direction perpendicular to the second wall surface 172 is located on the right side, which is the opposite side of the quantitative direction from the third end 175 in the left-right direction. The end virtual line 184 intersects the second wall surface 172.

  Different configurations of the sample quantification channel 11 and the reagent quantification channels 13 and 15 will be described. In the following description, the quantification units 114 of the sample quantification channel 11, the reagent quantification channel 13, and the reagent quantification channel 15 are referred to as a quantification unit 114A, a quantification unit 114B, and a quantification unit 114C. The front-rear direction that is orthogonal to the fixed amount direction and parallel to the fixed surface 126 is referred to as a “depth direction”. The depth direction is the depth direction in the front-rear direction of the sample quantitative channel 11 and the reagent quantitative channels 13 and 15. As shown in FIG. 2, the width in the depth direction of the quantitative unit 114B and the quantitative unit 114C is smaller than the width in the depth direction of the quantitative unit 114A.

  The configuration of the reagent fixed amount flow channel 13 will be described. As shown in FIGS. 2 and 3, an inclined surface 201 is provided between the third wall surface 173 and the quantitative unit 114 </ b> B in the reagent quantitative channel 13. As shown in FIG. 5, the width of the flow path of the inclined surface 201 in the depth direction becomes smaller toward the quantitative unit 114B. In other words, the inclined surface 201 is inclined so as to be positioned on the front side as it goes downward. As shown in FIG. 3, the inclined surface 201 includes an extending portion 202. The extending portion 202 extends from the second end portion 122 toward the fixed amount direction in the left-right direction. The extending portion 202 forms part of the second guide portion 117.

  As shown in FIG. 6, the end portion on the surplus portion 116 side shown in FIG. An excessive portion side wall surface 204 is connected to the end portion 203. The surplus portion side wall surface 204 extends rearward from the end portion 203. By providing the surplus portion side wall surface 204, the width L4 in the depth direction of the flow path below the end portion 203 is larger than the width L3 in the depth direction of the flow path at the end portion 203. An angle R3 formed by the extending portion 202 and the surplus portion side wall surface 204 is an acute angle.

  The configuration of the reagent fixed amount flow channel 15 will be described. As shown in FIGS. 2 and 3, an inclined surface 211 is provided between the third wall surface 173 and the quantitative unit 114 </ b> C in the reagent quantitative channel 15. As shown in FIG. 7, the width of the flow path of the inclined surface 211 in the depth direction becomes smaller toward the quantification unit 114C. In other words, the inclined surface 211 is inclined so as to be positioned on the front side as it goes downward. As shown in FIG. 3, the position of the end portion 212 on the inclined surface 211 on the quantitative direction side is the same position as the second end portion 122 of the quantitative portion 114C in the left-right direction. As shown in FIGS. 2 and 8, a step wall surface 213 is connected to the end portion 212. As shown in FIG. 8, the step wall surface 213 extends rearward from the end portion 212. By providing the step wall surface 213, the width L6 in the depth direction of the flow path on the left side of the end portion 212 is larger than the width L5 in the depth direction of the flow path at the end portion 212.

<5. Other structures of inspection chip 2>
As shown in FIG. 1, the support shaft 46 extending from the L-shaped plate 60 is vertically connected to the center of the rear surface of the plate member 20 via a mounting holder (not shown). As the support shaft 46 rotates, the inspection chip 2 rotates around the support shaft 46. When the inspection chip 2 is in the steady state shown in FIGS. 2 and 3, the upper side 21 and the lower side 24 are orthogonal to the direction of gravity G, the right side 22 and the left side 23 are parallel to the direction of gravity G, and The left side portion 23 is disposed closer to the main shaft 57 than the right side portion 22. In a state where the inspection chip 2 in the steady state is arranged at the measurement position, the inspection apparatus 1 performs inspection by optical measurement by allowing the measurement light connecting the light source 71 and the optical sensor 72 to pass through the measurement unit 80.

<6. Example of inspection method>
An inspection method using the inspection apparatus 1 and the inspection chip 2 will be described. As shown in FIG. 3, the sample 17 is disposed in the holding unit 111 of the sample fixed amount flow channel 11. The first reagent 18 is disposed in the holding part 111 of the reagent fixed amount flow path 13. The second reagent 19 is arranged in the holding part 111 of the reagent fixed amount flow path 15. The arrangement method of the first reagent 18, the second reagent 19, and the specimen 17 is not limited. For example, a hole is opened at a position corresponding to the holding unit 111 in the sheet 291, and the user injects the specimen 17, the first reagent 18, and the second reagent 19 from the hole, and further seals and seals Also good. In addition, the first reagent 18 and the second reagent 19 may be arranged in advance in the respective holding portions 111 of the reagent quantitative channels 13 and 15 and sealed with the sheet 291. In this case, a hole may be opened in the sheet 291 at a position corresponding to the holding unit 111 of the sample fixed amount flow channel 11, and the user may inject the sample 17 from the hole, and further seal and seal. Moreover, the site | part above the holding | maintenance part 111 in the upper side part 21 is opening, and a user may inject | pour the 1st reagent 18, the 2nd reagent 19, and the sample 17 from an opening, and may seal an opening.

  The control of the revolution speed and the rotation angle of the test chip 2 shown in FIG. 9 is controlled by whether or not the times T1 to T10 have elapsed. Information on the times T1 to T10 and the revolution speed and rotation angle at each time is stored in advance in the HDD 95 of the control device 90. The user attaches the inspection chip 2 to the spindle 46 and inputs a process start command from the operation unit 94. As a result, the CPU 91 executes the centrifugal process shown in FIG. 10 based on the control program stored in the ROM 93. The time when the processing start command is input is time T0 in the timing chart shown in FIG. Note that the inspection apparatus 1 can inspect two inspection chips 2 at the same time, but the procedure for inspecting one inspection chip 2 will be described below for convenience of explanation. In the following description, the steady state of the inspection chip 2 shown in FIG. 3 is referred to as a rotation angle of 0 degree, and the state rotated 68 degrees counterclockwise from the steady state is referred to as a rotation angle of 68 degrees. A state rotated 90 degrees counterclockwise from the steady state is referred to as a rotation angle of 90 degrees.

  As shown in FIG. 10, the CPU 91 reads motor driving information stored in advance in the HDD 95, sets driving information of the spindle motor 35 in the revolution controller 97, and sets driving information of the stepping motor 51 in the rotation controller 98. (S1). At this time, the test chip 2 is in a steady state and has a rotation angle of 0 degrees as shown in FIG. Next, from time T0, the CPU 91 shown in FIG. 1 controls the revolution controller 97 to start driving the spindle motor 35 (S2). As a result, the inspection chip 2 having a rotation angle of 0 degrees revolves. The spindle motor 35 increases the rotation speed of the turntable 33 to 3000 rpm based on an instruction from the revolution controller 97. As shown in FIGS. 9 and 10, the CPU 91 keeps the rotational speed of the spindle motor 35 at 3000 rpm during time T1 to T2 (S3). The rotation speed is not limited to 3000 rpm, and may be another rotation speed. At time T <b> 1 to T <b> 2, as shown in FIG. 11A, centrifugal force X acts on the test chip 2 from the left side 23 toward the right side 22. The liquid 16 moves from the holding unit 111 to the supply unit 112 by the action of the centrifugal force X.

  At time T2 to T3, the CPU 91 controls the revolution controller 97 to accelerate the rotational speed of the spindle motor 35 to 5000 rpm (S4). From time T3 to T6, the CPU 91 holds the rotational speed of the spindle motor 35 at 5000 rpm. The CPU 91 increases the rotational speed of the revolution of the inspection chip 2 in S4, whereby the centrifugal force X applied to the inspection chip 2 when rotating the inspection chip 2 in S5 described later, and the centrifugal force X applied by S3. Make it bigger.

  From time T3 to T4, the CPU 91 controls the rotation controller 98 to drive the stepping motor 51. Then, the CPU 91 rotates the inspection chip 2 up to a rotation angle of 68 degrees shown in FIG. 11B (S5). As shown in FIG. 11B, the rotation angle of 68 degrees is an angle at which the centrifugal force X acts in a direction perpendicular to the second wall surface 172. That is, in S <b> 5, the test chip 2 is rotated in a posture in which the centrifugal force X acts on the test chip 2 in a direction perpendicular to the second wall surface 172. As shown in FIG. 11B, the liquid 16 flows from the supply unit 112 to the fixed amount unit 114. As shown in FIG. 11B, the liquid 16 has a total amount of the volume of the fixed amount portion 114 and the amount overflowing beyond the first end portion 121 on the first guide portion 115 side.

  The first rotation speed at which the CPU 91 rotates the inspection chip 2 in S5 is slower than the second rotation speed at which the CPU 91 rotates the inspection chip 2 in S9 described later. For this reason, as shown in FIG. 9, the time between T3 and T4 in which the CPU 91 rotates the test chip 2 in S5 is longer than the time between T7 and T8 in which the CPU 91 rotates the test chip 2 in S9.

  The flow of the liquid 16 in the process of changing the posture of the test chip 2 from the state shown in FIG. 11A to the state shown in FIG. FIG. 12 shows the flow of the liquid 16 when the centrifugal force X is applied in a direction perpendicular to the second wall surface 172. When the centrifugal force X is applied in a direction perpendicular to the second wall surface 172, the liquid 16 flows along the second wall surface 172 to the quantitative direction side, and then flows through the third wall surface 173 to the quantitative unit 114 side. At this time, the liquid 16 flows toward the quantitative unit 114 in parallel with the vertical imaginary line 751. The liquid 16 overflowing in the fixed amount unit 114 flows to the surplus part 116 via the second guide part 117.

  As shown in FIGS. 9 and 10, the CPU 91 controls the rotation controller 98 to drive the stepping motor 51 during the time T4 to T5. Then, the CPU 91 rotates the inspection chip 2 to a rotation angle of 90 degrees shown in FIG. 11C (S6). In S6, the rotation speed at which the CPU 91 rotates the inspection chip 2 is faster than the first rotation speed in S5.

  At time T5 to T6, the centrifugal force X at the rotational speed of 5000 rpm acts on the test chip 2 from the upper side 21 toward the lower side 24 (S7). That is, the revolution at a rotational speed of 5000 rpm is continued. As shown in FIG. 11C, the centrifugal force X acts in a direction perpendicular to the fixed surface 126. In FIG. 11B, the liquid 16 overflowing beyond the first end portion 121 flows to the surplus portion 116 via the second guide portion 117. For this reason, the sample 17, the first reagent 18, and the second reagent 19 for the respective volumes of the quantification units 114A, 114B, and 114C are quantified.

  In time T6 to T7, the CPU 91 controls the revolution controller 97 to reduce the rotational speed of the spindle motor 35 to 3000 rpm (S8). In time T7 to T8, the CPU 91 controls the rotation controller 98 to drive the stepping motor 51. And CPU91 rotates the test | inspection chip 2 to the autorotation angle 0 degree shown in FIG.11 (D) (S9). The sample 17, the first reagent 18, and the second reagent 19 quantified by the quantification unit 114 are placed on the right side of the test chip 2, that is, above the measurement unit 80 and the measurement unit 80 via the first guide unit 115. Moving.

  From time T8 to T9, the centrifugal force X at 3000 rpm acts on the test chip 2 from the left side 23 toward the right side 22 (S10). That is, the revolution at a rotational speed of 3000 rpm is continued. As shown in FIG. 11D, the centrifugal force X at 3000 rpm acts on the test chip 2 from the left side portion 23 toward the right side portion 22. The specimen 17, the first reagent 18, and the second reagent 19 are mixed by the action of the centrifugal force X, and a mixed liquid 26 is generated.

  At time T9 to T10, the CPU 91 controls the rotation controller 98 to drive the stepping motor 51. And CPU91 rotates the test | inspection chip 2 to the autorotation angle of 90 degree | times shown to FIG.11 (E) (S11). Due to the action of the centrifugal force X, the liquid mixture 26 moves to the measuring unit 80.

  Although not shown in FIG. 9, after S <b> 11 is executed, the CPU 91 controls the rotation controller 98 to drive the stepping motor 51. The CPU 91 rotates the inspection chip 2 until the rotation angle is 0 degree (S12). Further, the CPU 91 controls the revolution controller 97 to stop the rotation of the spindle motor 35 (S12). Therefore, the revolution of the inspection chip 2 is completed. Centrifugation is terminated.

  After execution of the centrifugal process, the CPU 91 controls the revolution controller 97 to rotate and move the inspection chip 2 to the angle of the measurement position. When the measurement controller 99 shown in FIG. 1 causes the light source 71 to emit light, the measurement light passes through the mixed liquid 26 stored in the measurement unit 80. The CPU 91 performs optical measurement of the liquid mixture 26 based on the change amount of the measurement light received by the optical sensor 72 and acquires measurement data. CPU91 calculates the measurement result of the liquid mixture 26 based on the acquired measurement data. The test result of the mixed liquid 26 based on the measurement result is displayed on the display 96 shown in FIG. In addition, the measuring method of the liquid mixture 26 is not restricted to an optical measurement, Other methods may be used.

<7. Main actions and effects of this embodiment>
As described above, the measurement in the present embodiment is performed. As shown in FIG. 3, the fourth wall surface 174 is located on the quantitative direction side of the second end 122 in the left-right direction. For this reason, the third wall surface 173 and the fourth wall surface 174 are separated from each other as compared with the case where the fourth wall surface 174 is provided on the right side, which is the direction opposite to the fixed direction, from the second end portion 122. Yes. Therefore, when the liquid 16 is supplied from the supply unit 112 to the determination unit 114, the liquid 16 passing between the third wall surface 173 and the fourth wall surface 174 is less likely to contact the fourth wall surface 174. In the example shown in FIG. 12, the liquid 16 is not in contact with the fourth wall surface 174. Therefore, the possibility that the liquid 16 supplied from the supply unit 112 to the fixed amount unit 114 spreads over the fourth wall surface 174 can be reduced. For this reason, for example, it is possible to prevent the liquid 16 from spreading and covering the quantifying unit 114 and preventing air existing in the quantifying unit 114 from being removed. Therefore, the quantitative accuracy of the liquid 16 is improved.

  Further, as shown in FIG. 4, the width L <b> 1 in the quantitative direction between the third wall surface 173 and the fourth wall surface 174 is larger than the width L <b> 2 in the quantitative direction between the first end portion 121 and the second end portion 122. large. In this case, the third wall surface 173 and the fourth wall surface 174 are separated from each other as compared with the case where the width L1 is smaller than the width L2. Therefore, when the liquid 16 is supplied from the supply unit 112 to the fixed amount unit 114 as shown in FIG. 12, the liquid 16 passing between the third wall surface 173 and the fourth wall surface 174 further contacts the fourth wall surface 174. It becomes difficult. Therefore, it is possible to further reduce the possibility that the liquid 16 supplied from the supply unit 112 to the fixed amount unit 114 spreads over the fourth wall surface 174. For this reason, for example, it is possible to prevent the liquid 16 from spreading and covering the quantifying unit 114 and preventing air existing in the quantifying unit 114 from being removed. Therefore, the quantitative accuracy of the liquid 16 is further improved.

  The angle R1 formed by the second wall surface 172 and the third wall surface 173 is an obtuse angle. Therefore, as shown in FIG. 12, when the centrifugal force X is applied in a direction perpendicular to the second wall surface 172, the third wall surface 173 is inclined with respect to the centrifugal force X. Therefore, the liquid 16 moving toward the quantitative direction along the second wall surface 172 moves obliquely with respect to the centrifugal force X along the third wall surface 173 and then moves toward the quantitative unit 114. Since the liquid 16 moves obliquely with respect to the centrifugal force X along the third wall surface 173 and then moves to the quantification unit 114 side, the liquid 16 is difficult to spread in the quantification direction side. On the other hand, for example, when the angle R <b> 1 is a right angle or an acute angle, the liquid 16 that moves in the fixed direction from the second wall surface 172 hardly moves obliquely with respect to the centrifugal force X along the third wall surface 173. Therefore, the liquid 16 tends to spread in the fixed amount direction due to the momentum of moving along the second wall surface 172 in the fixed direction. That is, the test | inspection chip 2 of this embodiment can reduce possibility that the liquid 16 will spread in the fixed quantity direction side compared with the case where the angle R1 is a right angle or an acute angle. Since the possibility that the liquid 16 spreads can be reduced, for example, it is possible to prevent the air existing in the quantification unit 114 from being lost, and the quantification accuracy of the liquid 16 is improved.

  Further, for example, when the angle R1 is an acute angle, the liquid 16 flowing from the second wall surface 172 to the quantification unit 114 is likely to spread to the right side that is the direction opposite to the quantification direction through the third wall surface 173. In the present embodiment, as described above, the liquid 16 moves obliquely with respect to the centrifugal force X along the third wall surface 173 and then moves to the quantification unit 114 side. For this reason, it is possible to reduce the possibility that the liquid 16 spreads on the third wall surface 173 and spreads in the direction opposite to the quantitative direction. Since the possibility that the liquid 16 spreads can be reduced, for example, it is possible to prevent the air existing in the quantification unit 114 from being lost, and the quantification accuracy of the liquid 16 is improved.

  Further, the third wall surface 173 is inclined so as to be positioned in the quantitative direction as it is closer to the quantitative unit 114. In this case, the angle R1 is larger than when the third wall surface 173 is not inclined. Therefore, as compared with the case where the third wall surface 173 is not tilted, the third wall surface 173 moves more obliquely with respect to the centrifugal force along the third wall surface 173 and moves to the quantification unit 114 side. Therefore, it is possible to further reduce the possibility that the liquid 16 spreads in the quantitative direction side. Since possibility that the liquid 16 spreads can be reduced, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part 114 cannot escape, and the fixed_quantity | quantitative_assay precision of the liquid 16 improves.

  In addition, since the angle R2 formed by the first wall surface 171 and the third wall surface 173 is an acute angle, the third end 175 is sharper than when the angle R2 is a right angle or an obtuse angle. Therefore, compared with the case where the angle R <b> 2 is a right angle or an obtuse angle, the liquid 16 at the third end portion 175 is more easily drained. Therefore, the possibility that the liquid 16 spreads over the first wall surface 171 can be reduced. Since possibility that the liquid 16 spreads can be reduced, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part 114 cannot escape, and the fixed_quantity | quantitative_assay precision of the liquid 16 improves.

  Further, as described above, the third wall surface 173 is inclined so as to be positioned in the quantitative direction as it is closer to the quantitative unit 114. For this reason, the angle R2 is smaller than when the third wall surface 173 is not inclined. That is, the third end 175 is further sharpened. Therefore, the liquid breakage at the third end 175 is further improved. Therefore, the possibility that the liquid 16 spreads across the first wall surface 171 can be further reduced. Since possibility that the liquid 16 spreads can be reduced, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part 114 cannot escape, and the fixed_quantity | quantitative_assay precision of the liquid 16 improves.

  As described above, when the centrifugal force X is applied in a direction perpendicular to the second wall surface 172, the liquid 16 moves to the quantitative direction side along the second wall surface 172 and then quantifies through the third wall surface 173. It flows to the part 114 side. As shown in FIG. 12, when the centrifugal force X is applied in a direction perpendicular to the second wall surface 172, the centrifugal force X acts toward the lower right of the test chip 2. An extending direction 185 that extends the opposite wall surface 181 to the right intersects the second wall surface 172. In this case, the opposite wall surface 181 is inclined upward as it goes from the connection end 183 in the fixed direction. In other words, the opposite wall surface 181 is inclined obliquely upward and leftward from the connection end 183. For this reason, the opposite wall surface 181 is inclined in the opposite direction to the centrifugal force X acting obliquely downward to the right with respect to the inspection chip 2. Therefore, if the liquid 16 that moves to the quantitative direction side along the second wall surface 172 contacts the opposite wall surface 181, it is difficult for the liquid 16 to plug the opposite wall surface 181. Therefore, the liquid 16 is prevented from spreading across the opposite wall surface 181. Therefore, it is possible to prevent the air existing in the quantification unit 114 from being lost, and the quantification accuracy of the liquid 16 is improved.

  In addition, the possibility that the liquid 16 that moves to the quantitative direction side along the second wall surface 172 contacts the opposite wall surface 181 is high, for example, when the amount of the liquid 16 is larger than the amount illustrated in FIG. It is. Alternatively, the distance between the opposite wall surface 181 and the second wall surface 172 is shorter than the inspection chip 2 shown in FIG. In these cases, as indicated by an arrow 186 in FIG. 12, the liquid 16 flows toward the opposite wall surface 181, and the liquid 16 easily comes into contact with the opposite wall surface 181.

  Further, the end virtual line 184 intersects the second wall surface 172. That is, the end virtual line 184 is parallel to the centrifugal force X perpendicular to the second wall surface 172 shown in FIG. In the case where the liquid 16 is supplied from the supply unit 112 to the quantification unit 114 side, when the liquid 16 comes into contact with the connection wall surface 182, the liquid 16 is connected to the connection wall surface 182 in a direction parallel to the end virtual line 184 by the centrifugal force X. Get away from. At this time, the end virtual line 184 is located on the opposite side of the quantitative direction from the third end 175, so that the liquid 16 flows from the third end 175 toward the opposite side of the quantitative direction. For this reason, the liquid 16 flows toward the third wall surface 173 or the second wall surface 172. As shown in FIG. 12, when the liquid 16 comes into contact with the connection wall surface 182, the liquid 16 flows in the region 187 from the connection wall surface 182 toward the second wall surface 172. In this case, compared with the case where the liquid 16 that is separated from the connection wall surface 182 by the centrifugal force X flows directly to the quantification unit 114, the possibility that the liquid 16 spreads can be reduced. Therefore, it is possible to prevent the air existing in the quantification unit 114 from being lost, and the quantification accuracy of the liquid 16 is improved.

  In addition, as shown in FIG. 12, the reagent fixed amount flow path 13 is provided with an inclined surface 201. When the width of the flow path in the depth direction is reduced by the inclined surface 201, the liquid 16 may be easily spread. In the present embodiment, as shown in FIG. 6, the width of the flow path in the depth direction is increased by the surplus portion side wall surface 204. For this reason, as shown by the arrow 205, the liquid 16 flowing downward is improved in the liquid 16 at the end 203. Therefore, the liquid 16 efficiently flows downward. Therefore, even when the width in the depth direction is reduced by the inclined surface 201, the liquid 16 is difficult to spread. Therefore, the possibility that the liquid 16 covers the fixed amount portion 114 can be reduced. Further, since the angle R3 formed by the stretched portion 202 and the surplus portion side wall surface 204 is an acute angle, the liquid breakage is further improved as compared with the case where the angle R3 is an obtuse angle. Therefore, the possibility that the liquid 16 covers the fixed amount portion 114 can be further reduced. Therefore, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part 114 cannot escape, and the fixed_quantity | quantitative_assay precision of the liquid 16 improves.

  Further, as shown in FIG. 12, a stepped wall surface 213 is provided on the inclined surface 211 of the reagent fixed amount flow channel 15. If a large amount of liquid 16 flows from the supply unit 112 to the quantitative unit 114, the liquid 16 may easily spread in the quantitative direction. As shown in FIG. 8, the width of the flow path in the depth direction is increased by the stepped wall surface 213. Therefore, even if a large amount of liquid 16 flows from the supply unit 112 to the fixed amount unit 114 side, the liquid 16 is guided to the surplus portion 116 side by the step wall surface 213 as indicated by an arrow 215 in FIG. That is, it becomes difficult for the liquid 16 to move to the quantification unit 114 side. Therefore, the liquid 16 supplied to the fixed amount unit 114 is difficult to spread. Therefore, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part 114 cannot escape, and the fixed_quantity | quantitative_assay precision of the liquid 16 improves.

  Further, the first rotation speed at which the CPU 91 rotates the inspection chip 2 in S5 shown in FIG. 10 is slower than the second rotation speed at which the CPU 91 rotates the inspection chip 2 in S9 described later. Therefore, the amount of the liquid 16 flowing from the supply unit 112 to the metering unit 114 side per unit time is smaller than when the first rotation speed is equal to or higher than the second rotation speed. Since the posture of the inspection chip 2 shown in FIG. 11A changes to the posture of the inspection chip 2 shown in FIG. 12, the liquid 16 is rotated at a slow speed. It is because it does not flow to the 114 side. Therefore, the width of the liquid 16 flowing from the supply unit 112 shown in FIG. 12 to the quantitative unit 114 side is narrower than in the case where the first rotation speed is equal to or higher than the second rotation speed. Therefore, compared with the case where the width | variety of the liquid 16 becomes thick, the possibility that the liquid 16 covers the fixed_quantity | quantitative_assay part 114 can be reduced. Therefore, it is possible to prevent the air existing in the quantification unit 114 from being lost, and the quantification accuracy of the specimen or reagent is improved.

  Further, the CPU 91 increases the rotational speed of the revolution of the inspection chip 2 in S4, whereby the centrifugal force X applied to the inspection chip 2 when the inspection chip 2 rotates in 5 is changed to the centrifugal force X applied by S3. Make it bigger. That is, when the posture of the test chip 2 shown in FIG. 11A changes to the posture shown in the test chip 2 shown in FIG. 12, the centrifugal force X acting on the test chip 2 increases. If the centrifugal force X increases, the liquid 16 is moved from the supply unit 112 to the determination unit 114 by a stronger force. Therefore, the centrifugal force X applied to the test chip 2 when the test chip 2 rotates in S5 flows from the supply unit 112 to the quantification unit 114 side as compared with the case where the centrifugal force X applied by S3 is less than or equal to the centrifugal force X. The liquid 16 becomes difficult to spread. Therefore, the width of the liquid 16 flowing from the supply unit 112 to the fixed amount unit 114 side shown in FIG. Therefore, the possibility that the liquid 16 covers the quantitative unit 114 can be reduced. Therefore, it can prevent that the air which existed in the fixed_quantity | quantitative_assay part 114 cannot escape, and the fixed_quantity | quantitative_assay precision of the liquid 16 improves.

  In the above embodiment, the CPU 91 that performs the process of S3 in FIG. 8 corresponds to the “first action means” of the present invention. The CPU 91 that performs the process of S5 corresponds to the “first rotating means” of the present invention. The CPU 91 that performs the process of S7 corresponds to the “second action means” of the present invention. The CPU 91 that performs the process of S9 corresponds to the “second rotating means” of the present invention. The CPU 91 that performs the process of S4 corresponds to the “acceleration unit” of the present invention. The main shaft 57 corresponds to the “first shaft” of the present invention. The support shaft 46 corresponds to the “second shaft” of the present invention.

  In addition, this invention is not limited to said embodiment, A various change is possible. For example, as illustrated in FIGS. 3 and 4, the end virtual line 184 intersects the second wall surface 172, but is not limited thereto. For example, the end virtual line 184 may intersect with the third wall surface 173. Further, although the angle R1 is an obtuse angle, it may be a right angle or an acute angle. Further, although the angle R2 is an acute angle, it may be a right angle or an obtuse angle. The third wall surface 173 is inclined so as to be positioned in the quantitative direction as it is closer to the quantitative unit 114, but is not limited thereto. For example, the third wall surface 173 may be parallel to the vertical direction perpendicular to the fixed surface 126. Further, the third wall surface 173 may be inclined so as to be positioned in the right direction, which is the direction opposite to the quantitative direction, as it is closer to the quantitative unit 114.

  Further, although the vertical imaginary line 751 intersects the first guide part 115, the present invention is not limited to this. For example, the vertical virtual line 751 may intersect with the quantitative unit 114. Even in this case, the liquid 16 flows toward the quantification unit 114 in parallel with the vertical imaginary line 751, so that the liquid 16 is supplied to the quantification unit 114. Moreover, although the sample fixed amount channel 11, the reagent fixed amount channel 13, and the reagent fixed amount channel 15 have different configurations such as the inclined surfaces 201 and 211, they are not limited to this. For example, the specimen quantitative channel 11, the reagent quantitative channel 13, and the reagent quantitative channel 15 may have the same configuration.

  Moreover, although the 4th wall surface 174 was a wall surface which forms the left part of the 2nd guide part 117, it is not limited to this. For example, in the test chip 102 according to the second embodiment illustrated in FIG. 13, the fourth wall surface 191 is the right surface of the wall portion 190. The wall part 190 protrudes diagonally downward to the right from the wall surface forming the left part of the second guide part 117. The fourth wall surface 191 is provided on the quantitative direction side facing the third wall surface 173. The fourth wall surface 191 is located on the quantitative direction side of the second end portion 122 in the left-right direction. Further, the width L7 in the quantitative direction between the third wall surface 173 and the fourth wall surface 191 is larger than the width L2 in the quantitative direction between the first end 121 and the second end 122. Even in this case, the possibility that the liquid 16 supplied from the supply unit 112 to the fixed amount unit 114 spreads through the fourth wall surface 191 can be reduced. Further, it is possible to reduce the possibility that the liquid 16 spreads across the wall surface 192 connected to the end portion 193 of the fourth wall surface 191 on the quantitative determination unit 114 side.

  In addition, the 4th wall surface 174 in 1st embodiment and the 4th wall surface 191 in 2nd embodiment should just be located in the fixed direction side from the 2nd edge part 122 in the left-right direction. For example, the width L1 shown in FIG. 4 may be equal to or smaller than the width L2. The width L7 shown in FIG. 13 may be equal to or smaller than the width L2. The fourth wall surface 174 and the third wall surface 173 shown in FIG. 3 may be parallel to each other or may extend in different directions. The fourth wall surface 191 and the third wall surface 173 shown in FIG. 13 may be parallel to each other or may extend in different directions.

2,102 Inspection chip 3 Inspection system 16 Liquid 112 Supply part 114, 114A, 114B, 114C Determination part 115 First guide part 116 Surplus part 117 Second guide part 121 First end part 122 Second end part 126 Determination surface 171 First One wall surface 172 Second wall surface 173 Third wall surface 174,191 Fourth wall surface 175 Third end portion 176 Fourth end portion 181 Opposite wall surface 182 Connection wall surface 183 Connection end portion 184 End virtual line 201, 211 Inclined surface 202 Stretched portion 204 Excess portion side wall surface 213 Step wall surface 751 Vertical imaginary line

Claims (10)

A quantification unit for quantifying the specimen or reagent;
A supply unit for supplying the specimen or the reagent to the quantitative unit;
A first guide part connected to a first end part which is one end part of the quantification part, to which the specimen or the reagent quantified in the quantification part moves;
A second guide part connected to a second end part which is the other end part of the quantification part, and the specimen or the reagent overflowing from the quantification part;
A surplus part that is connected to the end of the second guide part opposite to the quantification part side and houses the sample or the reagent that has moved the second guide part;
A first wall surface on the supply section side in the first guide section;
A wall surface on the first guide section side in the supply section, the second wall surface facing the first wall surface;
A third end that is an end of the first wall surface in a quantitative direction from the first end to the second end, and a fourth end that is an end of the second wall surface in the quantitative direction. A third wall surface to be connected;
A wall surface provided on the quantitative direction side facing the third wall surface, and comprising a fourth wall surface located on the quantitative direction side with respect to the second end,
Wherein the third end portion, the vertical imaginary line drawn in the direction perpendicular to the second wall, wherein a inspection chip you intersects the quantitative portion or the first guide portion,
When used in an inspection apparatus that applies centrifugal force to the inspection chip by rotating the inspection chip around a predetermined axis, centrifugal force is applied in a direction perpendicular to the second wall surface. Inspection chip characterized by   The width in the quantitative direction between the third wall surface and the fourth wall surface is larger than the width in the quantitative direction between the first end portion and the second end portion. Inspection chip as described in. Of the angles formed by the second wall surface and the third wall surface, the angle on the first wall surface side is an obtuse angle,
The inspection chip according to claim 1 or 2, wherein an angle on the second wall surface side among the angles formed by the first wall surface and the third wall surface is an acute angle.   4. The inspection chip according to claim 1, wherein the third wall surface is inclined so as to be positioned on the quantitative direction side as being closer to the quantitative unit. 5. In the direction orthogonal to the quantitative surface connecting the first end portion and the second end portion, an opposite wall surface is provided on the opposite side of the quantitative portion with the second guide portion interposed therebetween,
5. The inspection chip according to claim 1, wherein an extending direction in which the opposite wall surface is extended intersects with the second wall surface. 6. A connection wall surface that is a wall surface connected to a connection end portion that is an end portion on the opposite direction side of the fixed direction in the opposite wall surface;
The end imaginary line drawn in the direction perpendicular to the second wall surface from the connection end is located on the opposite side of the quantitative direction from the third end. Inspection chip. A flow path in the depth direction, which is provided between the third wall surface and the quantitative portion, and is parallel to a quantitative surface that is orthogonal to the quantitative direction and connects the first end and the second end. An inclined surface that decreases as the width of
A portion of the inclined surface extending from the second end portion toward the quantitative direction side, and an extending portion forming at least a part of the second supply portion;
The surplus part side that is connected to the end part on the surplus part side in the extension part and is a wall surface whose width of the channel is larger than the width of the channel in the depth direction at the end part on the surplus part side in the extension part With walls,
The inspection chip according to any one of claims 1 to 6, wherein an angle formed by the extending portion and the surplus portion side wall surface is an acute angle. A flow path in the depth direction, which is provided between the third wall surface and the quantitative portion, and is parallel to a quantitative surface that is orthogonal to the quantitative direction and connects the first end and the second end. An inclined surface that decreases as the width of
A stepped wall surface that is connected to an end portion on the quantitative direction side of the inclined surface and is a wall surface having a channel width larger than the width of the channel in the depth direction at the end portion on the quantitative direction side of the inclined surface; The inspection chip according to claim 1, further comprising: A test chip having a quantification unit for quantifying a sample or a reagent, and a centrifugal force is applied to the test chip by rotating the test chip around a predetermined first axis, which is different from the first axis. An inspection system comprising an inspection device that changes the direction of the centrifugal force by rotating the inspection chip around a second axis,
The inspection chip is
The quantitative unit;
A supply unit for supplying the specimen or the reagent to the quantitative unit;
A first guide part connected to a first end part which is one end part of the quantification part, to which the specimen or the reagent quantified in the quantification part moves;
A second guide part connected to a second end part which is the other end part of the quantification part, and the specimen or the reagent overflowing from the quantification part;
A surplus part that is connected to the end of the second guide part opposite to the quantification part side and houses the sample or the reagent that has moved the second guide part;
A first wall surface on the supply section side in the first guide section;
A second wall surface on the first guide portion side in the supply unit, the second wall surface facing the first wall surface;
A third end that is an end of the first wall surface in a quantitative direction from the first end to the second end, and a fourth end that is an end of the second wall surface in the quantitative direction. A third wall surface to be connected;
A wall surface provided on the quantitative direction side facing the third wall surface, and comprising a fourth wall surface located on the quantitative direction side with respect to the second end,
A vertical imaginary line drawn in a direction perpendicular to the second wall surface from the third end portion intersects the fixed amount portion or the first guide portion,
The inspection device includes:
First action means for causing the centrifugal force to act on the test chip in a direction opposite to the quantitative direction;
After the centrifugal force is applied by the first action means, the inspection chip is moved around the second axis in a posture in which the centrifugal force acts on the inspection chip in a direction perpendicular to the second wall surface. First rotating means for rotating;
After the test chip is rotated by the first rotation means, the second force is applied to the test chip in the direction perpendicular to the fixed surface connecting the first end and the second end. Means of action;
After the centrifugal force is applied by the second action means, the test chip is rotated around the second axis in a posture in which the centrifugal force acts on the test chip in a direction opposite to the fixed direction. Second rotating means for causing
The inspection system, wherein a first rotation speed at which the first rotation means rotates the inspection chip is slower than a second rotation speed at which the second rotation means rotates the inspection chip.   The inspection apparatus includes an accelerating unit that causes the centrifugal force that acts on the inspection chip when the first rotation unit rotates the inspection chip to be larger than the centrifugal force that is applied by the first operation unit. The inspection system according to claim 9.

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