JP5223015B2 - 極端紫外光源装置 - Google Patents
極端紫外光源装置 Download PDFInfo
- Publication number
- JP5223015B2 JP5223015B2 JP2012030228A JP2012030228A JP5223015B2 JP 5223015 B2 JP5223015 B2 JP 5223015B2 JP 2012030228 A JP2012030228 A JP 2012030228A JP 2012030228 A JP2012030228 A JP 2012030228A JP 5223015 B2 JP5223015 B2 JP 5223015B2
- Authority
- JP
- Japan
- Prior art keywords
- laser
- light
- component
- extreme ultraviolet
- target
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
- 230000003287 optical effect Effects 0.000 claims description 77
- 230000010287 polarization Effects 0.000 claims description 26
- 238000000926 separation method Methods 0.000 claims description 17
- 230000007246 mechanism Effects 0.000 claims description 13
- 239000011248 coating agent Substances 0.000 claims description 11
- 238000000576 coating method Methods 0.000 claims description 11
- 230000001678 irradiating effect Effects 0.000 claims description 6
- 238000010586 diagram Methods 0.000 description 20
- UGFAIRIUMAVXCW-UHFFFAOYSA-N Carbon monoxide Chemical compound [O+]#[C-] UGFAIRIUMAVXCW-UHFFFAOYSA-N 0.000 description 11
- 229910002091 carbon monoxide Inorganic materials 0.000 description 11
- 230000009467 reduction Effects 0.000 description 11
- 239000013077 target material Substances 0.000 description 10
- 238000002474 experimental method Methods 0.000 description 8
- 230000005284 excitation Effects 0.000 description 7
- 230000010355 oscillation Effects 0.000 description 6
- 238000013459 approach Methods 0.000 description 5
- 238000006243 chemical reaction Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000010409 thin film Substances 0.000 description 5
- 230000003321 amplification Effects 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 239000010408 film Substances 0.000 description 4
- 238000003199 nucleic acid amplification method Methods 0.000 description 4
- ATJFFYVFTNAWJD-UHFFFAOYSA-N Tin Chemical compound [Sn] ATJFFYVFTNAWJD-UHFFFAOYSA-N 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000007935 neutral effect Effects 0.000 description 3
- 238000013041 optical simulation Methods 0.000 description 3
- 239000002245 particle Substances 0.000 description 3
- 238000012545 processing Methods 0.000 description 3
- 239000007787 solid Substances 0.000 description 3
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- ZOKXTWBITQBERF-UHFFFAOYSA-N Molybdenum Chemical compound [Mo] ZOKXTWBITQBERF-UHFFFAOYSA-N 0.000 description 2
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 2
- 238000000151 deposition Methods 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 229910052750 molybdenum Inorganic materials 0.000 description 2
- 239000011733 molybdenum Substances 0.000 description 2
- 238000011084 recovery Methods 0.000 description 2
- 229910052710 silicon Inorganic materials 0.000 description 2
- 239000010703 silicon Substances 0.000 description 2
- 238000004544 sputter deposition Methods 0.000 description 2
- 230000005469 synchrotron radiation Effects 0.000 description 2
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 1
- 230000005457 Black-body radiation Effects 0.000 description 1
- WHXSMMKQMYFTQS-UHFFFAOYSA-N Lithium Chemical compound [Li] WHXSMMKQMYFTQS-UHFFFAOYSA-N 0.000 description 1
- QCWXUUIWCKQGHC-UHFFFAOYSA-N Zirconium Chemical compound [Zr] QCWXUUIWCKQGHC-UHFFFAOYSA-N 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 239000000470 constituent Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000009826 distribution Methods 0.000 description 1
- 238000001900 extreme ultraviolet lithography Methods 0.000 description 1
- 239000005357 flat glass Substances 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 239000001307 helium Substances 0.000 description 1
- 229910052734 helium Inorganic materials 0.000 description 1
- SWQJXJOGLNCZEY-UHFFFAOYSA-N helium atom Chemical compound [He] SWQJXJOGLNCZEY-UHFFFAOYSA-N 0.000 description 1
- 239000001257 hydrogen Substances 0.000 description 1
- 229910052739 hydrogen Inorganic materials 0.000 description 1
- 125000004435 hydrogen atom Chemical class [H]* 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 230000031700 light absorption Effects 0.000 description 1
- 229910052744 lithium Inorganic materials 0.000 description 1
- 230000005499 meniscus Effects 0.000 description 1
- 238000012544 monitoring process Methods 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 230000003252 repetitive effect Effects 0.000 description 1
- VSZWPYCFIRKVQL-UHFFFAOYSA-N selanylidenegallium;selenium Chemical compound [Se].[Se]=[Ga].[Se]=[Ga] VSZWPYCFIRKVQL-UHFFFAOYSA-N 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004904 shortening Methods 0.000 description 1
- 238000003860 storage Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 229910052726 zirconium Inorganic materials 0.000 description 1
Images
Landscapes
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- X-Ray Techniques (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012030228A JP5223015B2 (ja) | 2012-02-15 | 2012-02-15 | 極端紫外光源装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2012030228A JP5223015B2 (ja) | 2012-02-15 | 2012-02-15 | 極端紫外光源装置 |
Related Parent Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2007127777A Division JP4932592B2 (ja) | 2007-05-14 | 2007-05-14 | 極端紫外光源装置 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012095210A Division JP5511882B2 (ja) | 2012-04-19 | 2012-04-19 | 極端紫外光源装置 |
Publications (3)
Publication Number | Publication Date |
---|---|
JP2012104861A JP2012104861A (ja) | 2012-05-31 |
JP2012104861A5 JP2012104861A5 (enrdf_load_stackoverflow) | 2012-07-12 |
JP5223015B2 true JP5223015B2 (ja) | 2013-06-26 |
Family
ID=46394825
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2012030228A Active JP5223015B2 (ja) | 2012-02-15 | 2012-02-15 | 極端紫外光源装置 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP5223015B2 (enrdf_load_stackoverflow) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6252358B2 (ja) * | 2014-05-27 | 2017-12-27 | ウシオ電機株式会社 | 極端紫外光光源装置 |
JP7426299B2 (ja) | 2020-06-26 | 2024-02-01 | ギガフォトン株式会社 | 極端紫外光生成システム及び電子デバイスの製造方法 |
JP7657877B1 (ja) | 2023-09-25 | 2025-04-07 | レーザーテック株式会社 | 光源装置、検査装置、露光装置、光源制御方法、検査方法及び露光方法 |
JP7657878B1 (ja) | 2023-09-25 | 2025-04-07 | レーザーテック株式会社 | 光源装置、検査装置、露光装置、光源制御方法、検査方法及び露光方法 |
Family Cites Families (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3363835B2 (ja) * | 1999-06-07 | 2003-01-08 | 住友重機械工業株式会社 | 戻り光除去方法と装置 |
JP2000357835A (ja) * | 1999-06-15 | 2000-12-26 | Amada Eng Center Co Ltd | レーザ発振器 |
JP2002280322A (ja) * | 2001-03-15 | 2002-09-27 | Ishikawajima Harima Heavy Ind Co Ltd | レーザ照射装置及びレーザ照射方法 |
JP4875879B2 (ja) * | 2005-10-12 | 2012-02-15 | 株式会社小松製作所 | 極端紫外光源装置の初期アライメント方法 |
-
2012
- 2012-02-15 JP JP2012030228A patent/JP5223015B2/ja active Active
Also Published As
Publication number | Publication date |
---|---|
JP2012104861A (ja) | 2012-05-31 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
JP4932592B2 (ja) | 極端紫外光源装置 | |
JP5511882B2 (ja) | 極端紫外光源装置 | |
US8242472B2 (en) | Extreme ultraviolet light source device and control method for extreme ultraviolet light source device | |
JP5952274B2 (ja) | 光源焦点のアラインメント | |
US7842937B2 (en) | Extreme ultra violet light source apparatus | |
US9128391B2 (en) | Optical device including wavefront correction parts and beam direction parts, laser apparatus including the optical device, and extreme ultraviolet light generation system including the laser apparatus | |
TWI601451B (zh) | 產生極紫外光的系統和方法 | |
US9713240B2 (en) | Stabilizing EUV light power in an extreme ultraviolet light source | |
US20130315272A1 (en) | Regenerative amplifier, laser apparatus, and extreme ultraviolet light generation system | |
JP2012182434A (ja) | レーザ装置、極端紫外光生成システム、レーザ装置の制御方法、および極端紫外光生成方法 | |
KR20180038543A (ko) | 극자외 광원 내에서의 타겟 팽창 속도 제어 방법 | |
US10606096B2 (en) | Reducing an optical power of a reflected light beam | |
JP4800145B2 (ja) | 極端紫外光源装置用ドライバーレーザ | |
US20170048957A1 (en) | Target Expansion Rate Control in an Extreme Ultraviolet Light Source | |
JP5223015B2 (ja) | 極端紫外光源装置 | |
JPWO2014119199A1 (ja) | レーザ装置及び極端紫外光生成装置 | |
JP5711326B2 (ja) | 極端紫外光生成装置 | |
US9685756B2 (en) | Laser amplifier, laser apparatus, and extreme ultraviolet light generating system | |
US20170127505A1 (en) | Extreme ultraviolet light generation system and extreme ultraviolet light generation method | |
JP6285450B2 (ja) | レーザ装置、及び極端紫外光生成システム | |
WO2018154771A1 (ja) | レーザ装置、及びeuv光生成システム | |
JP7434096B2 (ja) | 極端紫外光生成システム、及び電子デバイスの製造方法 | |
JPWO2015045102A1 (ja) | レーザ装置及び極端紫外光生成システム | |
JP2013214708A (ja) | レーザ装置、レーザシステムおよび極端紫外光生成装置 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20120315 |
|
A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120412 |
|
A711 | Notification of change in applicant |
Free format text: JAPANESE INTERMEDIATE CODE: A711 Effective date: 20120713 |
|
TRDD | Decision of grant or rejection written | ||
A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20130305 |
|
A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20130311 |
|
FPAY | Renewal fee payment (event date is renewal date of database) |
Free format text: PAYMENT UNTIL: 20160315 Year of fee payment: 3 |
|
R150 | Certificate of patent or registration of utility model |
Ref document number: 5223015 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |