JP5206144B2 - LIGHT EMITTING DEVICE AND ELECTRONIC DEVICE - Google Patents

Description

  The present invention relates to a technical field of a light emitting device and an electronic apparatus including the light emitting device. In particular, the present invention relates to a protection circuit for a light emitting device.

  The light emitting device includes a plurality of scanning lines, a plurality of data lines, a light emitting element provided in accordance with the intersection of the plurality of scanning lines and the plurality of data lines, and a current supply line for supplying a current to the light emitting element. And a driving transistor that is provided in a current path from the current supply line to the light emitting element and controls the current to the light emitting element. A plurality of unit circuits including at least a light emitting element and a driving transistor are formed in a row or in a matrix, and the light emitting elements emit light according to a selection signal from the scanning line and a data signal from the data line.

  In such a light emitting device, a part or all of a driving circuit such as a scanning line driving circuit that supplies a selection signal to the scanning line and a data line driving circuit that supplies a data signal to the data line is a substrate provided with a light emitting element. It is built in as a built-in circuit, or it is retrofitted to the substrate as an external IC circuit. As a cause of deterioration or destruction of the scanning line driving circuit or the data line driving circuit, there is destruction due to stress of electrostatic discharge, which is a problem particularly during manufacture or transportation of the light emitting device, that is, electrostatic breakdown.

  In addition, at least one of the scanning line driving circuit and the data line driving circuit is built in the substrate, and a driving power supply circuit and a timing control circuit for supplying power to these are configured as an external IC circuit. In some cases, an external IC circuit is connected to at least one of the scanning line driving circuit or the data line driving circuit. In such a case, static electricity flows into at least one of the scanning line driving circuit or the data line driving circuit formed on the substrate in the manufacturing process for connecting the substrate and the external IC circuit, and these circuits are connected. There is a risk of destroying. In such a case, a connection terminal for connecting at least one of the scanning line driving circuit or the data line driving circuit of the substrate and the external IC circuit is provided on the substrate, and static electricity is emitted from the light emitting device through the connection terminal. There is a risk of inflow. When such static electricity is applied to the wiring connected to the drive circuit, the drive circuit may be deteriorated or destroyed.

  In order to prevent such deterioration or destruction of the drive circuit due to static electricity, a protection circuit is provided in a signal path related to signal input / output of the drive circuit (see, for example, Patent Documents 1 and 2). More specifically, the protection circuit is provided as an input protection circuit for an input terminal to which various signals such as a clock signal, an inverted clock signal, and a start pulse are input from the outside of the drive circuit, for example. Alternatively, an output protection circuit is provided for an output terminal from which various signals such as scanning signals and end pulses are output to the outside of the driving circuit.

  In addition, a technique for preventing destruction of elements due to static electricity by effectively discharging static electricity accumulated in a floating circuit portion inside an insulated gate transistor circuit device has been proposed (for example, Patent Documents). 3).

  Furthermore, the present invention is not limited to the technology described above, and many technologies for protecting various display devices from static electricity have been proposed (see, for example, Patent Documents 4 to 7).

JP-A-10-294383 JP 2003-308050 A JP 2000-98338 A Japanese Patent Laid-Open No. 9-80469 JP-A-10-39325 JP-A-11-72806 JP 2000-89685 A

  As described above, the light emitting device includes, for example, a plurality of scanning lines, a plurality of data lines, a light emitting element provided in accordance with the intersection of the plurality of scanning lines and the plurality of data lines, and a light emitting element. A current supply line that supplies current and a drive transistor that is provided in a current path from the current supply line to the light emitting element and controls the current to the light emitting element. In particular, since the current supply line supplies current to the light emitting element, the current supply line is thicker than other wirings, and the current supply source and the light emitting element are connected with low resistance. In particular, the unit circuit is composed of at least a light emitting element and a driving transistor, and in the case where a plurality of unit circuits are formed in a row or in a matrix, in order to uniformly emit such a plurality of unit circuits, The current supply line needs to have a low resistance.

  However, since the current supply line has a low resistance as described above, static electricity reaches the unit circuit through the current supply line, and the unit circuit may be deteriorated or destroyed due to electrostatic breakdown. In particular, when a unit circuit is provided with an element using two conductive layers and a dielectric film between them, the dielectric film causes dielectric breakdown, and the unit circuit is deteriorated or destroyed. Examples of the element using the two conductive layers and the dielectric film between them include a MOS field effect transistor and a capacitive element.

  In addition, a unit circuit has been proposed in which a current is supplied from a current supply line to a data line so that a predetermined potential is written to the gate of the driving transistor and a current corresponding to this voltage is supplied to the light emitting element. Such a method is called a current program method. At this time, a method of writing a predetermined potential to the gate of the driving transistor by flowing a current through the driving transistor of the unit circuit and a current flowing through a mirror transistor formed in a mirror shape with respect to the driving transistor There is a method of writing a predetermined potential to the gate of the driving transistor. In such a current programming method, the current supply line needs to have a low resistance, and the data line also needs to have a low resistance in order to accurately write a predetermined potential. In such a case, static electricity may reach the unit circuit via the data line.

  In particular, the current supply circuit for supplying current to the current supply line and the data line driving circuit may be configured as an external IC circuit, and the light emitting element on the substrate may be connected to the external IC circuit. There is a possibility that static electricity may reach the unit circuit from the connection terminal connecting the light emitting element of the substrate and the external IC circuit.

  As described above, various transistors included in the unit circuit may be electrostatically damaged due to an unexpected voltage caused by static electricity generated in the current supply line and the data line, which causes a decrease in yield in the manufacturing process of the light emitting device. Become. In particular, since the organic EL element is a current-driven light-emitting element, an unexpected voltage caused by static electricity generated in the current supply line and the data line while securing a path for supplying a drive current and a data signal to the unit circuit. It is important to suppress that is applied to the unit circuit.

  As described above, the light emitting device improves the yield of the light emitting device in the manufacturing process by reducing the electrostatic breakdown of the elements included in the unit circuit due to static electricity, and outputs the driving current and the data signal to the unit circuit. Although it is difficult to achieve both of the two points of securing a current path for supplying a high-quality image and performing high-quality image display, Patent Documents 1 to 7 described above relate to a current-driven light-emitting device. There are no recognized descriptions of both of the above two points.

  Therefore, the present invention has been made in view of the above problems, and an object of the present invention is to provide a light emitting device provided with a protection circuit that protects against electrostatic breakdown.

  In order to solve the above problems, a light emitting device according to the present invention includes a light emitting element having a first electrode and a second electrode in each of a plurality of unit circuits arranged in an element formation region on a substrate, and the light emitting element. A plurality of power lines that are connected to a peripheral region located around the element formation region and supply power of different potentials, and from the peripheral region to the element formation region. And a current supply line electrically connected to the first electrode through the transistor in the unit circuit, wherein the current supply line and the plurality of current supply lines are provided in the peripheral region. And a current supply line protection circuit including a protection element connected to the power supply line.

  According to the light emitting device of the present invention, the current supply line is provided with a protection circuit for the current supply line for discharging static electricity generated in the current supply line and its connection terminal, for example, during manufacture, transportation, etc. The static electricity generated in the current supply line and its connection terminal can be discharged to the plurality of power supply lines by the current supply line protection protection circuit. Therefore, it is possible to prevent an unexpected voltage due to static electricity generated in the current supply line and its connection terminal from being applied to the unit circuit. Further, the current supply line in the element formation region limits the area where the light emitting element emits light in the unit circuit, that is, the aperture ratio, and the plurality of power supply lines formed in the peripheral region are different from the current supply line. Low resistance. Therefore, static electricity generated in the current supply line and its connection terminal can be discharged to the plurality of power supply lines.

  In order to solve the above problems, a light emitting device according to the present invention includes a light emitting element having a first electrode and a second electrode in each of a plurality of unit circuits arranged in an element formation region on a substrate, and the light emission. A transistor for controlling a current flowing in the element, and a plurality of power supply lines that are wired in a peripheral region located around the element formation region and supply power of different potentials; and the element formation from the peripheral region A current supply line electrically connected to the first electrode via the transistor in the unit circuit, and a wiring extending from the peripheral region to the element formation region, the data being sent to the unit circuit. A data line for supplying a signal, and a protection element connected between the data line and the plurality of power supply lines in the peripheral region Characterized in that it has a protection circuit for Ranaru data lines.

  According to the light emitting device of the present invention, the data line is provided with a data line protection circuit for discharging static electricity generated at the data line and its connection terminal, for example, during manufacture, transportation, or operation. Static electricity generated in the data line and its connection terminal can be discharged to a plurality of power supply lines by the data line protection protection circuit. Therefore, it is possible to prevent an unexpected voltage due to static electricity generated at the data line and its connection terminal from being applied to the unit circuit. Further, the data line in the element formation region is a region where the light emitting element emits light in the unit circuit, that is, the aperture ratio is limited, and the plurality of power supply lines formed in the peripheral region have resistance compared to the data line. Low. Therefore, static electricity generated at the data line and its connection terminal can be discharged to a plurality of power supply lines.

  In particular, the present invention is preferably applied to a current-programmed light-emitting device in which a predetermined potential is written to the gate of the driving transistor by flowing a current from the current supply line to the data line, and a current corresponding to this voltage is supplied to the light-emitting element. In the current-programmed light emitting device, the unit circuit and the data line are connected with a low resistance, and static electricity generated at the connection portion between the data line driving circuit that supplies the data signal and the data line may reach the unit circuit. However, by providing the data line protection circuit, it is possible to prevent such static electricity from reaching the unit circuit.

  The light-emitting device of the present invention is the light-emitting device described above, further comprising a scanning line that is wired from the peripheral region to the element formation region and that supplies a scanning signal to the unit circuit. In the region, a scanning line protection circuit including a protection element connected between the scanning line and the plurality of power supply lines is provided.

  According to this aspect, the scanning line protection circuit can discharge static electricity generated in the scanning line and its connection terminal to the plurality of power supply lines. Further, the scanning line protection circuit is provided in the peripheral region of the element formation region, and an excessive current can be prevented from flowing into the element formation region. Therefore, it is possible to prevent an excessive current from flowing into the element formation region through the scanning line as well as the current supply line and the data line. The unit circuit can be protected more reliably as compared with the case where the supply line and the data line are provided.

  In the light emitting device according to the present invention, a protection circuit such as a current supply line protection circuit, a data line protection circuit protection circuit, and a scanning line protection circuit is provided between a plurality of power supply lines and current supply lines or data lines. It is preferable that the protective element is provided. This protection element is composed of a diode. When the light emitting device emits light, the power supply line to be used and the potential of the power supply line and the potential of the current supply line or data line applied at the time of light emission are set low on the two terminals of the diode. A power supply line to which a potential is applied and a power supply line to which a high potential is applied are connected. In this way, the electrical resistance of the current supply line and the data line is not increased as compared with the case where the protective resistance is provided for the current supply line and the data line. Therefore, since the current supply line protection circuit and the data line protection circuit do not hinder the drive current from being supplied to the unit circuit, a required drive current is supplied to each unit circuit of the light emitting device during the operation of the light emitting device. Can be supplied. As described above, even when the current supply line protection circuit is provided in the middle of the current supply line or the data line protection circuit is provided in the middle of the data line, the current supply line protection circuit and the data line protection circuit are provided. Since the protection circuit does not function as a resistance element with respect to the driving current, a driving current necessary for light emission of the light emitting element can be supplied from the current supply line or the data line, and light emission of the light emitting device is not reduced.

  As a result, according to the light emitting device of the present invention, an unexpected voltage caused by static electricity generated in the current supply line or the data line and its connection terminal can be generated without degrading the image quality of the current driven light emitting element. Application to the element formation region can be suppressed. As a result, it is possible to simultaneously solve the two problems required for the light-emitting device, namely, suppression of a decrease in yield in the manufacturing process and high-quality light emission.

  Here, the “plurality of power lines” according to the present invention are wires for supplying power to various elements for driving the light emitting elements, and are normally provided in the light emitting device. Various elements for driving a light emitting element refer to each element included in a scanning line driving circuit, a data line driving circuit, a unit circuit, and the like. Therefore, a current path for discharging static electricity can be secured without greatly changing the wiring specifications of the light emitting device. Further, for example, when the plurality of power supply lines are provided so as to surround the element formation region, static electricity can be discharged from the current supply line and the data line extending to each unit circuit. Therefore, it is possible to prevent an unexpected voltage from being applied to each unit circuit, and it is possible to protect the entire element formation region from electrostatic breakdown. In addition, it is desirable that the plurality of power supply lines be provided so as to surround the element formation region, but the current supply line is wired from the peripheral region to the element formation region, and the power supply supplies current in a region excluding the element formation region. The current supply line protection circuit may be provided at least between the current supply line and the power supply in the peripheral region of the element formation region. Here, the region excluding the element formation region refers to a region around the element formation region or an external IC. Similarly, the data line protection circuit or the scanning line driving circuit is provided between the data line formed in the element formation region and the data line driving circuit or between the scanning line and the scanning line driving circuit formed in the element formation region. It suffices to be provided at least between the two.

  The light-emitting device of the present invention is the light-emitting device described above, and in the peripheral region, a scanning line driving circuit that supplies a scanning signal to the unit circuit via a scanning line, or a data line to the unit circuit A data line driving circuit for supplying a data signal through the scanning line, the scanning line driving circuit or the data line driving circuit is composed of complementary transistors, and the plurality of power supply lines are the scanning line driving circuit or the data A plurality of power supply lines for supplying power to the line driving circuit.

  According to the light emitting device of the present invention, a scanning line driving circuit or a data line driving circuit is provided in the peripheral region, and a plurality of power supply lines for supplying power to the scanning line driving circuit or the data line driving circuit are used. Therefore, it is not necessary to separately wire a plurality of power supply lines. In particular, the scanning line driving circuit or the data line driving circuit is connected to the scanning line or the data line formed in the element formation region, and is provided close to the element formation region. Therefore, it is easy to connect a plurality of power supply lines for supplying power to the scanning line driving circuit or the data line driving circuit to the protection circuit. Further, it is desirable to further provide a protection circuit between the scan line driver circuit or the data line driver circuit and the plurality of power supply lines.

  Further, the light emitting device of the present invention is the light emitting device described above, and in the peripheral region, between the data line and the data line driving circuit, or between the scanning line and the scanning line driving circuit, A resistance element is provided.

  According to this aspect, the resistance element can suppress an excessive current from flowing into the unit circuit via the data line and the scanning line, and can protect the unit circuit from electrostatic breakdown.

  In another aspect of the light emitting device according to the present invention, the data line protection circuit is a plurality of diodes connected in series to each other, and the plurality of diodes intersect the current supply line and the data line. It arrange | positions so that the area | region which carries out may be pinched | interposed.

  According to this aspect, static electricity is likely to accumulate in a region where the current supply line and the data line intersect, and a plurality of diodes that are used as data line protection circuits are arranged so as to sandwich the region where the current supply line and the data line intersect. By doing so, static electricity accumulated in this region can be intensively discharged to the power supply line. Therefore, it is possible to prevent an excessive current caused by static electricity accumulated in a region where the current supply line and the data line intersect from flowing into the unit circuit.

  In another aspect of the light emitting device according to the present invention, the scanning line protection circuit is a plurality of diodes connected in series with each other, and the plurality of diodes includes one of the plurality of power supply lines and the scanning line. It arrange | positions so that the area | region which may intersect may be pinched | interposed.

  According to this aspect, static electricity is likely to accumulate in a region where one of the plurality of power supply lines and the scanning line intersect, and the plurality of diodes serving as a scanning line protection circuit are connected to one of the plurality of power supply lines and the scanning line. By arranging so as to sandwich the region where the two cross each other, static electricity accumulated in this region can be intensively discharged to the power supply line. Therefore, for example, it is possible to suppress an excessive current caused by static electricity accumulated in a region where one of the plurality of power supply lines and the scanning line intersects the dummy unit circuit or the unit circuit.

  In another aspect of the light emitting device according to the present invention, the light emitting device further includes a second electrode wiring electrically connected to the second electrode side of the light emitting element, and at least one of the current supply line and the data line. Is further provided with a current path for discharging the static electricity generated in step 2 to the second electrode wiring.

  According to this aspect, the static electricity generated in at least one of the current supply line and the data line is discharged to the second electrode wiring through the second electrode wiring electrically connected to the second electrode side of the light emitting element. can do. The second electrode wiring is a wiring provided for driving the light emitting element, and can discharge static electricity without providing a separate wiring for discharging static electricity.

  In another aspect of the light emitting device according to the present invention, in the peripheral region, the current supply line extends from the main line so as to surround the element forming region, and extends from the main line into the element forming region. The plurality of branch lines are electrically connected to each other within the element formation region.

  In this aspect, for example, a plurality of unit circuits are arranged in one column or matrix in the element formation region, and the light emitting element included in each unit circuit is driven by active control. According to this aspect, the main line of the current supply line is extended so as to surround the element formation region in the peripheral region of the element formation region, and a plurality of branch lines electrically connected to each other in the element formation region are provided. Is provided. Therefore, static electricity generated in any branch line in the element formation region can be discharged to the outside of the element formation region through these branch lines and the main line via branch lines electrically connected to each other in the element formation region. . Thereby, the whole element formation region can be protected from electrostatic breakdown.

  In order to solve the above problems, in the light emitting device according to the present invention, the element formation region on the substrate includes a light emitting region and a non-light emitting region formed around the light emitting region, and is arranged in the light emitting region. Each of the plurality of unit circuits includes a light emitting element having a first electrode and a second electrode, and a first transistor for controlling a current flowing through the light emitting element, and the plurality of unit circuits provided in the non-light emitting region. Each of the dummy unit circuits includes a second transistor, which is wired from the peripheral region to the element formation region, and is electrically connected to the first electrode through the first transistor in the unit circuit. A light emitting device having a current supply line, wherein the current supply line is connected to the dummy unit circuit.

  According to the light emitting device of the present invention, it is possible to prevent static electricity from reaching the unit circuit and damaging the unit circuit, and to prevent light emission or leakage current from flowing in the dummy unit circuit when the light emitting device emits light. can do.

  In order to solve the above problems, in the light emitting device according to the present invention, the element formation region on the substrate includes a light emitting region and a non-light emitting region formed around the light emitting region, and is arranged in the light emitting region. Each of the plurality of unit circuits includes a light emitting element having a first electrode and a second electrode, and a first transistor for controlling a current flowing through the light emitting element, and the plurality of unit circuits provided in the non-light emitting region. Each of the dummy unit circuits includes a second transistor, and a plurality of power supplies that are wired in a peripheral region located around the element formation region and supply power of different potentials to the unit circuit And a current supply line that is wired from the peripheral region to the element formation region and is electrically connected to the first electrode through the first transistor in the unit circuit. A light emitting device, the dummy unit circuit, characterized in that any one of the power supply line among the plurality of power supply lines are connected.

  According to the light emitting device of the present invention, it is possible to prevent static electricity from reaching the unit circuit and damaging the unit circuit, and to prevent light emission or leakage current from flowing in the dummy unit circuit when the light emitting device emits light. can do.

  In another aspect of the light emitting device according to the present invention, a dummy unit circuit protection circuit comprising a protection element provided between the dummy unit circuit and any one of the plurality of power supply lines is further provided. It is characterized by having.

  According to this aspect, static electricity generated in the dummy unit circuit can be discharged to any one of the plurality of power supply lines. Since the static electricity generated in the unit circuit is discharged to the power supply line through the dummy unit circuit protection circuit, the unit circuit can be prevented from being electrostatically destroyed. Since the dummy unit circuit is not driven, there is no problem in driving the unit circuit even if static electricity is discharged to the power supply line that supplies the low potential power among the plurality of power supply lines during the operation of the light emitting device. Absent.

  In order to solve the above problems, a light emitting device according to the present invention includes a light emitting element having a first electrode and a second electrode in each of a plurality of unit circuits arranged in an element formation region on a substrate, and a light emitting element. A first current supply line that is wired from a peripheral region of the element formation region to the element formation region, and is electrically connected to the first electrode through the transistor. And a second current supply wiring electrically connected to the second electrode, and a wiring extending from the peripheral region to the element formation region, the unit circuit being wired from the peripheral region to the element formation region. A data line for supplying a data signal to the light emitting device, wherein the second electrode is provided in common to the plurality of unit circuits, and in the peripheral region, A data line protection circuit comprising a first protection element connected between a data line and the first current supply line, and a second protection element connected to the data line and the second current supply line It is characterized by having.

  According to the light emitting device of the present invention, the data line protection circuit provided in the middle of the data line discharges static electricity generated in the data line and its connection terminal to the first current supply line or the second current supply line. Can do. Therefore, static electricity can be discharged more reliably, and electrostatic breakdown of the unit circuit can be more effectively suppressed.

The present invention is also a light emitting device having unit circuits arranged in a light emitting region and a dummy unit circuit arranged outside the light emitting region and simulating the unit circuit, wherein the unit circuit is a first circuit. A light-emitting element having an electrode and a second electrode, a first transistor for supplying current to the light-emitting element, and a second transistor to which a data signal for controlling the first transistor is supplied The dummy unit circuit is a circuit that protects the unit circuit from static electricity, and includes a third transistor corresponding to the first transistor and a fourth transistor corresponding to the second transistor. The same potential is supplied to the source of the third transistor and the source of the fourth transistor.
The light emitting device includes a unit circuit arranged in the light emitting region and a dummy unit circuit arranged outside the light emitting region and simulating the unit circuit. The unit circuit includes a first electrode and a second electrode. A light emitting element having an electrode, a first transistor for supplying current to the light emitting element, and a second transistor for supplying a data signal for controlling the first transistor from a data line. The dummy unit circuit is a circuit that protects the unit circuit from static electricity, is provided adjacent to the unit circuit, and corresponds to the third transistor corresponding to the first transistor and the second transistor. And a source of the fourth transistor is electrically connected to the data line.
A light emitting device having a unit circuit arranged in a light emitting region and a dummy unit circuit arranged outside the light emitting region and simulating the unit circuit, wherein the unit circuit includes a first electrode and a second electrode. A first transistor for supplying a current supplied from a current supply line to the light emitting element, a second transistor to which a data signal for controlling the first transistor is supplied, The dummy unit circuit is a circuit that protects the unit circuit from static electricity, and is provided adjacent to the unit circuit, and includes a third transistor that corresponds to the first transistor, and the second transistor And a source of the third transistor is electrically connected to the current supply line.
And the electronic device concerning this invention comprises the light-emitting device mentioned above in order to solve the said subject .

  According to the electronic device according to the present invention, since the above-described light emitting device of the present invention is provided, it is possible to improve resistance to static electricity, so that the yield in manufacturing electronic devices can be improved, Device failure can be prevented. Further, a required driving current can be supplied to the light emitting element, and image quality is not deteriorated by ensuring sufficient light emission of the light emitting element. In addition, high yield, low breakdown, high-quality display, such as mobile phones, electronic notebooks, word processors, viewfinder type or monitor direct-view type video tape recorders, workstations, videophones, POS terminals, touch panels, etc. Various electronic devices can be realized.

  Such an operation and other advantages of the present invention will become apparent from the embodiments described below.

  Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. In the following embodiments, a light emitting device using an active matrix driving organic EL device will be described as an example of the light emitting device according to the present invention.

[First Embodiment]
(Configuration of organic EL device)
FIG. 1 is a diagram schematically showing a configuration of an organic EL device 1 according to this embodiment.

  In FIG. 1, the organic EL device 1 includes an organic EL panel 10 that is an example of an “electro-optical panel” according to the present invention, and a protection circuit 11 that protects the organic EL panel 10. In this embodiment, in particular, the organic EL panel 10 is a drive circuit built-in type, and a data line drive circuit 12a (also referred to as an X driver) and a scan line drive circuit 12b (also referred to as a Y driver) are provided on the element substrate SUB. ) And a protection circuit 11 are also provided. The data line driving circuit 12a, the scanning line driving circuit 12b, and the protection circuit 11 are preferably combined with a semiconductor element such as a transistor (hereinafter referred to as TFT) included in each unit circuit formed in the element forming region 14. It is built in the peripheral area of the element substrate. Alternatively, some or all of the driving circuits such as the data line driving circuit 12a and the scanning line driving circuit 12b are constructed as external ICs and are externally attached or retrofitted to the element substrate. In such a case, a drive circuit connection terminal (not shown) for connecting the external IC and the organic EL panel is provided.

  The organic EL panel 10 includes a scanning line drive circuit 12b, a data line drive circuit 12a, a precharge circuit 15, two logic power supply lines 16 and 17 extending around the element formation region 14, a first power supply line 18R, A first power supply wiring 18 and a first power supply wiring 19 configured to include 18G and 18B are provided. Further, the organic EL panel 10 includes the unit circuit 20 shown in FIG. 2, the current supply line L2, and the data line L1 which is an example of the “data line” of the present invention.

  The first power supply wiring 18 includes first power supply wirings 18R, 18G, and 18B that are electrically connected to the first electrode (anode) of the organic EL element that emits light of each color. One first electrode power line among the first electrode power lines 18 corresponds to the current supply line L2 illustrated in FIG. 2, and supplies a drive current to the organic EL element 29. Each unit circuit 20 included in the organic EL panel 10 includes an organic EL element that is an example of a light emitting element that emits light of wavelengths of R (red), G (green), and B (blue), The organic EL device 1 is a light emitting device capable of emitting color light. In FIG. 2, only one current supply line L2 corresponding to the organic EL elements of these colors is shown for the sake of simplicity.

  The second power supply wiring 19 is an example of the “second electrode wiring” according to the present invention, and is electrically connected to the second electrode side of the organic EL element 29 provided in each unit circuit 20.

  The protection circuits 11 are provided in the organic EL panel 10 so as to surround the element formation region 14, and a pair of protection circuits 11 are provided so as to sandwich the element formation region 14 in a peripheral region located around the rectangular element formation region 14. X-side protection circuit 11a and Y-side protection circuit 11b. One X-side protection circuit 11 a is between the data line driving circuit 12 a and the element formation region 14, and one Y-side protection circuit 11 b extends between the scanning line driving circuit 12 b and the element formation region 14. To do. The X-side protection circuit 11 a and the Y-side protection circuit 11 b are electrically connected to logic power supply wirings 16 and 17 extending so as to surround the element formation region 14 in the peripheral region of the element formation region 14. The X-side protection circuit 11a and the Y-side protection circuit 11b suppress the electrostatic breakdown of various elements included in the unit circuit 20 due to static electricity generated in the current supply line L2.

  1 and 2, the scanning line driving circuit 12b is a circuit that supplies a write selection signal S1 as an example of a scanning signal to the write selection signal line L6. The write selection signal S1 is a signal for switching the switching TFT 22 to an active state or an inactive state, and is supplied to the gate of the switching TFT 22 described later.

  The data line driving circuit 12a includes a sampling circuit that samples the image signal sent from the image signal generation circuit 71 at a predetermined timing, and a circuit that supplies the data signal I1 corresponding to the image signal to the data line L1, and is used for switching. A data signal I1 is supplied to the data line L1 in accordance with the conduction state of the TFT22.

  The operation of the scanning line driving circuit 12b and the operation of the data line driving circuit 12a are synchronized with each other by a synchronizing signal such as a clock signal supplied from the control circuit 72, and light emission by an active matrix method is performed.

  Next, the unit circuit 20 will be described in detail with reference to FIG. FIG. 2 is an enlarged plan view showing a part of the four corners of the organic EL panel 10 shown in FIG. 1, and the configuration of the protection circuit 11, the unit circuit 20, and the dummy unit circuit 28 in the organic EL panel 10. It is the shown top view.

  In FIG. 2, a unit circuit 20 and a plurality of dummy unit circuits 28 are provided in the element formation region 14. A plurality of unit circuits 20 are arranged in a matrix in the element formation region 14, and the dummy unit circuits 28 are provided on the periphery of the element formation region 14. Here, a region where the unit circuit 20 is formed is referred to as a light emitting region, and a region where the dummy unit circuit is formed is referred to as a non-light emitting region. In FIG. 2, only the region A including one unit circuit 20 provided at a part of the four corners of the organic EL panel 10 is shown.

  The unit circuit 20 in this embodiment includes a switching TFT 22, a driving TFT 23, a storage capacitor 24, and an organic EL element 29 which is an example of the “light emitting element” according to the present invention.

  The gate of the driving TFT 23 is electrically connected to one end of the storage capacitor 24 and is also electrically connected to the drain of the switching TFT 22. The source of the driving TFT 23 is connected to the current supply line L 2, and the drain is connected to the first electrode (anode) of the organic EL element 29. The switching TFT 22 has a gate connected to the write selection signal line L6 and a source connected to the data line L1.

  The write selection signal line L6, which is an example of the “scan line” according to the present invention, supplies the write selection signal S1 supplied from the scan line driving circuit 12b to the gate of the switching TFT 22, and the switching TFT 22 is in an inactive state. Switch from to active state. Here, the active state means a state in which the source and drain of the switching TFT 22 can be conducted. The switching TFT 22 switched to the active state causes the data signal I1 supplied from the data line L1 to flow between the source and drain of the switching TFT, and accumulates charges in the storage capacitor 24. A data voltage is applied to the gate of the drive TFT 23 by the electric charge accumulated in the storage capacitor 24, and the drive TFT 23 enters an operation state corresponding to the data voltage applied to the gate. The drive TFT 23 supplies a drive current corresponding to the data potential from the current supply line L2 to the organic EL element 29, and causes the organic EL element 29 to emit light with a predetermined luminance. The organic EL device 1 can display an image by synchronizing the data line driving circuit 12a and the scanning line driving circuit 12b and causing the organic EL element 29 included in each unit circuit 20 to emit light.

  The organic EL device of the present invention may include a precharge circuit 15. The precharge circuit 15 charges or discharges the data line to prevent insufficient writing of the data signal, and brings the potential of the data line L1 close to the data signal potential in advance. Therefore, the lack of the ability to write the data signal to the data line L1 hardly poses any problem in practice. High-quality image display can be performed by a data signal written with a relatively sufficient writing capability.

  The organic EL panel 10 may include an X-side inspection circuit 5a and a Y-side inspection 5b. The X side inspection circuit 5a and the Y side inspection 5b are used for inspecting whether or not static electricity is accumulated in the organic EL panel in the manufacturing process.

(Configuration of protection circuit)
Next, the protection circuit 11 will be described in detail with reference to FIG.

  The logic power supply wirings 16 and 17 are examples of the “plurality of power supply lines” according to the present invention, and are arranged in the X direction and the Y direction so as to surround the element forming region 14 in the peripheral region located around the element forming region 14. Each is extended. The logic power supply wirings 16 and 17 are formed so as to surround the element forming region 14, but may be formed on at least one side of the element forming region 14. In addition, if it is formed so as to surround the element formation region 14, it is easy to prevent static electricity from reaching the unit circuit.

  As shown in FIG. 11, the logic power supply lines 16 and 17 are elements for driving the organic EL elements 29 included in each unit circuit 20, more specifically, the data line driving circuit 12a and the scanning line driving circuit 12b. The power is supplied to the elements included in the circuit for supplying various signals to the unit circuit 20. Here, the logic power supply wiring 16 supplies the high potential side power supply V2 to the organic EL panel 10, the logic power supply wiring 17 supplies the low potential side power supply V3 to the organic EL panel 10, and the logic power supply wiring 16a A power supply V4 having an intermediate potential lower than V2 and higher than the power supply V3 is supplied to the organic EL panel 10. FIG. 11 is a diagram illustrating the scanning line driving circuit 12b, the Y-side protection circuit 11b, and the element formation region 14. The scanning line driving circuit 12b includes, for example, a shift transfer circuit 121b that transfers a shift pulse according to a clock signal, a level shift circuit 122b that uses an output from the shift transfer circuit as a predetermined voltage, and a buffer circuit 123b. Elements used for these are provided between a logic power supply wiring 16 that supplies a high-potential-side power supply V2 and a logic power supply wiring 17 that supplies a low-potential-side power supply V3, such as an inverter or a clocked inverter. Switching elements. This switching element is generally composed of a complementary switching element. As shown in FIG. 11, logic power supply wirings 16, 16a, and 17 are wired along the element formation region 14 in the scanning line driving circuit 12b, and the scanning line driving circuit 12b formed for each scanning line L6. Each unit circuit is supplied with power. The shift transfer circuit 121b is supplied with the intermediate potential power supply V4 and the low potential power supply V3 from the logic power supply wirings 16a and 17, and the level shift circuit 122b and the buffer circuit 123b are supplied with the logic power supply wirings 17 and 16. A low potential side power source V3 and a high potential side power source V2 are supplied. Similarly, in the Y-side protection circuit 11b, the high-potential-side power supply V2 and the low-potential-side power supply V3 are supplied by the logic power supply wirings 16 and 17. The power supply connected to the Y-side protection circuit 11b is selected from the power supply V2 on the high potential side and the power supply V3 on the low potential side, but the power supply with the highest potential and the power supply with the lowest potential are selected from the power supplies V2, V3, and V4. Select the power source for the connection. Further, in the scanning line driving circuit 12b and the Y-side protection circuit 11b, the logic power supply wirings 16 and 17 are respectively wired, but it is preferable from the viewpoint of layout that the wirings are shared. Furthermore, although the scanning line driving circuit 12b and the Y-side protection circuit 11b are described in FIG. 11, the same applies to the data line driving circuit 12a and the X-side protection circuit 11a. The data line drive circuit 12a includes, for example, a shift transfer circuit, a level shift circuit, a buffer circuit, and a sampling circuit, and the logic power supply lines 16 and 17 are the same in the data line drive circuit 12a and the X-side protection circuit 11a. Connected to.

  The X-side protection circuit 11a is provided in the middle of the current supply line L2 and electrically connected to the logic power supply wirings 16 and 17, and is provided in the middle of the data line L1 and is connected to the logic power supply wirings 16 and 17. An electrically connected electrostatic protection circuit ESD1 is provided. The current supply line L <b> 2 is a wiring that supplies a drive current to the organic EL element 29 included in the unit circuit 20, and is connected to the source of the drive TFT 23 included in the unit circuit 20. The data line L1 is a data line that supplies a data signal to the unit circuit 20 and is connected to the source of the switching TFT 22 included in the unit circuit 20.

  The electrostatic protection circuit ESD2 provided in the middle of the current supply line L2 is an example of the “current supply line protection circuit” according to the present invention, and includes a logic power supply wiring 17 for supplying a low potential power supply V3 and a high potential supply circuit. It is electrically connected to the logic power supply wiring 16 that supplies the power supply V2. The electrostatic protection circuit ESD2 includes, for example, two diodes Da and Db connected in series. The anode of the diode Da is connected to a logic power supply wiring 17 that supplies a low potential power supply V3, and the cathode of the diode Db is connected to a logic power supply wiring 16 that supplies a high potential power supply V2. The cathode of the diode Da and the anode of the diode Db are connected to a current supply line L2 extending in the peripheral region of the element formation region 14.

  When static electricity having a high potential is generated in the current supply line L2 from the logic power wiring 16 having a high potential, the static electricity is discharged to the logic power wiring 16 having a high potential through the diode Db and from the logic power wiring 17 having a low potential. When low potential static electricity is generated in the current supply line L2, static electricity is discharged to the low potential logic power supply wiring 17 via the diode Da. Therefore, the electrostatic protection circuit ESD2 can suppress an unexpected voltage caused by static electricity generated in the current supply line L2 from being applied to the driving TFT 23, and reduce the electrostatic breakdown of the driving TFT 23. be able to.

  The electrostatic protection circuit ESD2 is provided in the middle of a path for supplying a drive current from the current supply line L2 to the organic EL element 29. However, the electrostatic protection circuit ESD2 does not function as an electric resistance with respect to the drive current. And the image quality of the organic EL device 1 is not deteriorated.

  The electrostatic protection circuit ESD1 provided in the middle of the data line L1 is an example of the “data line protection circuit” according to the present invention. The electrostatic protection circuit ESD1 is connected to the two logic power supply wires 16 and 17 in the same manner as the electrostatic protection circuit ESD2. The electrostatic protection circuit ESD1 includes two diodes connected in series similarly to the electrostatic protection circuit ESD2 provided on the current supply line L2, and this static electricity is supplied to the logic power supply in accordance with the electrostatic potential generated on the data line L1. Release to one of the wirings 16 or 17. That is, the electrostatic protection circuit ESD1 can discharge static electricity that is difficult to be discharged by the electrostatic protection circuit ESD2 provided in the current supply line L2. Therefore, the electrostatic protection circuit ESD1 can suppress an unexpected voltage caused by static electricity from being applied to the switching TFT 22 connected to the data line L1, and the switching TFT 22 can be prevented from being electrostatically damaged. Can be reduced.

  In the present embodiment, the resistance element R11 is provided in the middle of the data line L1, and the unit circuit 20 can be more reliably protected from static electricity.

  Thus, according to the electrostatic protection circuits ESD1 and ESD2, the unit from the static electricity generated in the current supply line L2 and the data line L1 without hindering the flow of various currents necessary for causing the organic EL element 29 to emit light. The circuit 20 can be protected and the image quality of the organic EL panel 10 is not deteriorated. Therefore, according to the electrostatic protection circuits ESD1 and ESD2, it is possible to both reduce the electrostatic breakdown of the unit circuit 20 and not to deteriorate the image quality of the organic EL device 1.

  The Y-side protection circuit 11b includes an electrostatic protection circuit ESD6 provided in the middle of the write selection signal line L6, which is an example of the “scan line” according to the present invention, and electrically connected to the logic power supply wirings 16 and 17. An electrostatic protection circuit ESD5 provided in the middle of L5 is provided.

  The electrostatic protection circuit ESD6 is an example of the “scanning line protection circuit” according to the present invention, and includes two diodes connected in series like the electrostatic protection circuits ESD1 and ESD2 described above. The electrostatic protection circuit ESD6 discharges the static electricity to one of the logic power supply wirings 16 or 17 in accordance with the static electricity potential generated in the write selection signal line L6. Therefore, the electrostatic protection circuit ESD6 reduces the electrostatic breakdown of the switching TFT 22 from static electricity generated in the write selection signal line L6. In the present embodiment, resistance elements R61 and R62 are provided in the middle of the write selection signal line L6, so that the unit circuit 20 can be more reliably protected from static electricity.

  As described above, according to the protection circuit 11 according to the present embodiment, the unit circuit 20 can be protected from static electricity generated in the current supply line L2, the data line L1, and the write selection signal line L6. It is possible to suppress electrostatic breakdown of elements such as the switching transistor 22 and the drive transistor 23 included in. Further, static electricity generated in the current supply line L2, the data line L1, and the write selection signal line L6 is included in the data line driving circuit 12a and the scanning line driving circuit 12b, and is driven to drive the organic EL element 29, for example. Since it is discharged to the logic power supply wirings 16 and 17 for supplying power to the various elements, no additional wiring for discharging static electricity is provided.

  Therefore, according to the protection circuit 11 of the organic panel 10 according to the present embodiment, it is possible to increase the resistance of the organic panel 10 to static electricity without greatly changing the design, and to improve the yield of the organic EL panel 10 in the manufacturing process. It is possible. Furthermore, since the image quality of the organic EL device 1 is not lowered, it is possible to provide a high-quality organic EL device 1 that can achieve both improvement in yield in the manufacturing process and reduction in image quality.

(Dummy unit circuit configuration)
The dummy unit circuit 28 includes elements similar to the various elements included in the unit circuit 20 except that no organic EL element is provided, and the connection of these elements is the same as the connection of the various elements in the unit circuit 20. The TFT 33 included in the dummy unit circuit 28 corresponds to the drive TFT 23 included in the unit circuit 20, and the source of the TFT 33 is connected to a wiring L4 connected to a power supply that supplies a drive current to the current supply line L2. The source of the TFT 32 included in the dummy unit circuit 28 is connected to the wiring L3. The dummy unit circuit 28 may include an organic EL element that is not connected to the dummy unit circuit 28. The organic EL element formed in the dummy unit circuit 28 is provided in order to avoid manufacturing defects in the periphery of the element formation region in the organic EL element manufacturing.

  Further, the dummy unit circuit 28 may be connected to the organic EL element in the same manner as the unit circuit 20. By doing so, the unit circuit 20 can be protected from static electricity.

  In the protection circuit 11 in the peripheral region of the element formation region 14, electrostatic protection circuits ESD3 and ESD4 are provided in the middle of the wirings L3 and L4, respectively. The electrostatic protection circuits ESD3 and ESD4 are connected to the logic power supply wirings 16 and 17, discharge static electricity generated in the wirings L3 and L4 to the logic power supply wiring 16 or 17, and are included in the dummy unit circuit 28 and the unit circuit 20. Each element is prevented from being electrostatically damaged by static electricity. In the present embodiment, the resistance elements R31, R32, and R41 are provided on the wirings L3 and L4, respectively, so that the dummy unit circuit 28 can be more reliably protected from static electricity.

  In the protection circuit 11 in the peripheral region of the element formation region 14, the electrostatic protection circuit ESD5 is an example of the “dummy unit circuit protection circuit” according to the present invention, and has the same configuration as the electrostatic protection circuits ESD1 and ESD2 described above. And is provided in the middle of the wiring L5 in a peripheral region located around the element forming region 14. The electrostatic protection circuit ESD5 receives the static electricity generated in the dummy unit circuit 28 via the wiring L5, and discharges the static electricity to one of the logic power supply wirings 16 and 17. Therefore, the electrostatic protection circuit ESD5 can discharge the static electricity generated in the dummy unit circuit 28 to the outside of the element forming region 14, and can suppress the dummy unit circuit 28 from being electrostatically destroyed. In the present embodiment, resistance elements R51 and R52 are provided in the middle of the wiring L5, so that the dummy unit circuit 28 can be more reliably protected from static electricity.

  The wiring L5 supplies a low-potential power supply V3 to the dummy unit circuit 28. The wiring L5 extends in the dummy unit circuit 28 in parallel with the write selection signal line L6. This prevents static electricity from reaching the unit circuit 20 and damaging the unit circuit, and prevents the dummy unit circuit from emitting light or leaking current when the organic EL device 1 emits light. can do. The same potential is supplied to the wirings L3 and L4. Here, the power supply V1 is connected together. In FIG. 2, the current supply line L2, the wiring L3, and the wiring L4 are respectively supplied with a common power source V1. Since the current supply line L2 and the wiring L3 are at the same potential, power consumption is not consumed by the transistor 33, the transistor 32, and the like. It is possible to prevent static electricity from reaching the unit circuit 20 and damaging the unit circuit, and to prevent the dummy unit circuit from emitting light or leak current when the organic EL device 1 emits light.

[Second Embodiment]
Next, another embodiment will be described. In addition, you may combine each aspect illustrated below suitably. Moreover, about the element similar to each part of 1st Embodiment among the following aspects, the code | symbol same as 1 and FIG. 2 is attached | subjected, and the description is abbreviate | omitted suitably. FIG. 12 is a diagram schematically showing the configuration of the organic EL device 1 according to the second embodiment.

  In FIG. 12, the organic EL device 1 includes a data line driving circuit 12a, a scanning line driving circuit 12b, a protection circuit 11, and an element formation region 14 in which a unit circuit 20 is formed.

  The scanning line driving circuit 12b is a circuit that supplies a writing selection signal S1 as an example of a scanning signal to the writing selection signal line L6. The write selection signal S1 is a signal for switching the switching TFT 22 to an active state or an inactive state, and is supplied to the gate of the switching TFT 22 described later.

  The data line driving circuit 12a includes a sampling circuit that samples the image signal sent from the image signal generation circuit 71 at a predetermined timing, and a circuit that supplies the data signal I1 corresponding to the image signal to the data line L1, and is used for switching. A data signal I1 is supplied to the data line L1 in accordance with the conduction state of the TFT22.

  The operation of the scanning line driving circuit 12b and the operation of the data line driving circuit 12a are synchronized with each other by a synchronizing signal such as a clock signal supplied from the control circuit 72, and light emission by an active matrix method is performed. The logic power supply lines 16 and 17 supply power from the drive power supply circuit 73 to the data line drive circuit 12a and the scanning line drive circuit 12b. Here, the logic power supply wiring 16 supplies the high potential side power supply V2, and the logic power supply wiring 17 supplies the low potential side power supply V3. The logic power supply wirings 16 and 17 are connected to the protection circuit 11.

  Similar to FIG. 2, the unit circuit 20 includes a switching TFT 22, a driving TFT 23, a storage capacitor 24, and an organic EL element 29 which is an example of the “light emitting element” according to the present invention. The data line driving circuit 12a and each unit circuit 20 are connected by a data line L1, and the scanning line driving circuit 12b and each unit circuit 20 are connected by a write selection signal line L6.

  Here, the organic EL element 29 includes a first electrode, a second electrode, and a light emitting layer sandwiched between the first electrode and the second electrode. The first electrode corresponds to the unit circuit 20. The second electrode is provided in common to the plurality of unit circuits 20 provided in a matrix. Each first electrode provided in the unit circuit 20 is connected to the light-emitting power supply circuit 74 by the first power supply wiring connection terminal 200 via the current supply line L2 and the first power supply wiring 18. The second electrode provided in the element formation region 14 is connected to the light emitting power supply circuit 74 through the second power supply wiring 19 through the second power supply wiring connection terminal 201. The light emission power supply circuit 74 supplies power between the first power supply wiring connection terminal 200 and the second power supply wiring connection terminal 201. Here, as in FIG. 2, the first power supply wiring 18 is connected to the first electrode (anode) of the organic EL element that emits light of each color, and is connected to the first power supply wiring 18R, 18G, and 18B. In order to simplify the description, only one current supply line L2 corresponding to the organic EL elements of these colors is shown.

  The protection circuit 11 according to the second embodiment includes an electrostatic protection circuit ESD2 as an example of a “current supply line protection circuit” according to the current supply line L2. The electrostatic protection circuit ESD <b> 2 is provided between the first power supply wiring 18 and the current supply line L <b> 2 formed in the element formation region 14.

  Thus, according to the electrostatic protection circuit ESD2, it is possible to protect the unit circuit 20 from static electricity generated in the current supply line L2 or the first power supply wiring connection terminal, and for switching included in the unit circuit 20 Electrostatic breakdown of elements such as the transistor 22 and the driving transistor 23 can be suppressed. Further, the protection circuit 11 is connected to the logic power supply wirings 16 and 17 through the electrostatic protection circuit, similarly to the electrostatic protection circuit ESD2 of FIG. Since it is discharged to the logic power supply wirings 16 and 17 included in the data line driving circuit 12a and the scanning line driving circuit 12b, no additional wiring for discharging static electricity is provided.

  Similarly to FIG. 2, an electrostatic protection circuit (not shown) may be provided in the middle of the data line L1. This is an example of the “data line protection circuit” according to the present invention. By doing so, the unit circuit 20 can be protected from static electricity flowing from the data line L1 through the switching TFT 22, and electrostatic breakdown can be prevented from occurring in the drive TFT 23 and the storage capacitor 24. can do.

[Modification 1 of the second embodiment]
Next, a modification of the second embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the second embodiment are denoted by the same reference numerals as those in FIG. FIG. 13 is a diagram schematically illustrating the configuration of the organic EL device 1 according to Modification 1 of the second embodiment.

  Similar to FIG. 2, the unit circuit 20 includes a switching TFT 22, a driving TFT 23, a storage capacitor 24, and an organic EL element 29 which is an example of the “light emitting element” according to the present invention. The data line driving circuit 12a and each unit circuit 20 are connected by a data line L1, and the scanning line driving circuit 12b and each unit circuit 20 are connected by a write selection signal line L6.

  Here, the organic EL element 29 includes a first electrode, a second electrode, and a light emitting layer sandwiched between the first electrode and the second electrode. The first electrode corresponds to the unit circuit 20. The second electrode is provided in common to the plurality of unit circuits 20 provided in a matrix. Each first electrode provided in the unit circuit 20 is connected to the light-emitting power supply circuit 74 by the first power supply wiring connection terminal 200 via the current supply line L2 and the first power supply wiring 18. The second electrode provided in the element formation region 14 is connected to the light-emitting power supply circuit 74 by the second power supply wiring connection terminal 201 through the wiring L7 and the second power supply wiring 19. The second electrode and the wiring L7 are connected to the unit circuit in the element formation region. The light emission power supply circuit 74 supplies power between the first power supply wiring connection terminal 200 and the second power supply wiring connection terminal 201. Here, as in FIG. 2, the first power supply wiring 18 is connected to the first electrode (anode) of the organic EL element that emits light of each color, and is connected to the first power supply wiring 18R, 18G, and 18B. In order to simplify the description, only one current supply line L2 corresponding to the organic EL elements of these colors is shown.

  The protection circuit 11 according to a modification of the second embodiment includes an electrostatic protection circuit ESD7 provided between the first power supply wiring 18 and the current supply line L2 formed in the element formation region 14. The electrostatic protection circuit ESD <b> 7 includes a protection element provided between the first power supply wiring 18 and the second power supply wiring 19. The protection element is formed of a diode, for example, like the electrostatic protection circuit ESD2. The first electrode is an anode and the second electrode is a cathode, and when performing a light emitting operation with such a light emitting element, the wiring 7 and the second power supply wiring 19 are connected to the current supply line L2 and the first power supply wiring 18. Therefore, the electrostatic protection circuit ESD7 includes a diode whose input terminal is connected to the current supply line L2 and whose output terminal is connected to the wiring L7. When the first electrode is a cathode and the second electrode is an anode, the input terminal and the output terminal of the diode are connected in reverse.

  According to the protection circuit 11, static electricity generated in the current supply line L 2 or the first power supply wiring connection terminal can be discharged to the second power supply wiring 19. Therefore, it is possible to suppress electrostatic breakdown of elements such as TFTs included in the unit circuit 20. Therefore, even when static electricity is generated in the element formation region 14, the static electricity can be discharged outside the element formation region 14 before an unexpected voltage due to static electricity is applied to the elements included in the unit circuit 20. The electrostatic breakdown of the elements included in the unit circuit 20 can be suppressed.

[Modification 2 of the second embodiment]
Next, a modification of the second embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the second embodiment are denoted by the same reference numerals as those in FIG. FIG. 14 is a diagram schematically illustrating a configuration of the organic EL device 1 according to the second modification of the second embodiment.

  In the element formation region 14, a light emitting region 202 in which the unit circuit 20 is formed and a non-light emitting region in which the dummy unit circuit 28 is provided around the light emitting region 202 are provided. Similar to FIG. 2, the unit circuit 20 includes a switching TFT 22, a driving TFT 23, a storage capacitor 24, and an organic EL element 29 which is an example of the “light emitting element” according to the present invention. The dummy unit circuit 28 may not include an organic EL element, or may include an organic EL element that is not connected to the dummy unit circuit 28. Further, the organic EL element formed in the dummy unit circuit 28 is provided in order to avoid manufacturing defects in the periphery of the element formation region in the organic EL element manufacturing. Further, the dummy unit circuit 28 may be connected to the organic EL element in the same manner as the unit circuit 20. By doing so, the unit circuit 20 can be protected from static electricity.

  Further, one dummy unit circuit 28 is provided around each of the light emitting regions 202 formed in a rectangular shape, but a plurality of dummy unit circuits 28 may be provided. Further, although the dummy unit circuit 28 is provided so as to surround the light emitting region 202, it may be formed along at least one side of the light emitting region 202.

  The wires L3 and L4 connected to the dummy unit circuit 28 are wires having the same potential. Here, it is connected to the first power supply wiring 18. This prevents static electricity from reaching the unit circuit 20 and damaging the unit circuit, and prevents the dummy unit circuit from emitting light or leaking current when the organic EL device 1 emits light. can do.

  In addition, electrostatic protection circuits ESD4 and ESD2 are preferably provided in the middle of the wirings L3 and L4, respectively. The electrostatic protection circuits ESD3 and ESD4 are connected to the logic power supply wirings 16 and 17, discharge static electricity generated in the wirings L3 and L4 to the logic power supply wiring 16 or 17, and are included in the dummy unit circuit 28 and the unit circuit 20. Each element is prevented from being electrostatically damaged by static electricity. As in FIG. 2, the resistance elements R31, R32, and R41 are provided in the wirings L3 and L4, respectively, so that the unit circuit 20 and the dummy unit circuit 28 can be more reliably protected from static electricity. .

[Modification 3 of the second embodiment]
Next, a modification of the second embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the second embodiment are denoted by the same reference numerals as those in FIG. FIG. 15 is a diagram schematically illustrating a configuration of an organic EL device 1 according to Modification 3 of the second embodiment.

  In the element formation region 14, a light emitting region 202 in which the unit circuit 20 is formed and a dummy unit circuit 28 provided around the light emitting region 202 are provided. Furthermore, the wiring L5 connected to the dummy unit circuit 28 is connected to the logic power supply wiring 17 through the wiring 17a. The wiring L5 extends in the dummy unit circuit 28 in parallel with the write selection signal line L6. This prevents static electricity from reaching the unit circuit 20 and damaging the unit circuit, and prevents the dummy unit circuit from emitting light or leaking current when the organic EL device 1 emits light. can do.

[Third Embodiment]
Next, another embodiment of the electro-optical panel protection circuit according to the present invention will be described with reference to FIGS. FIG. 3 is a diagram illustrating a configuration of the unit circuit 120 included in the organic EL device 100 according to the present embodiment, and FIG. 4 is an enlarged view of a part of the four corners of the organic EL panel 110. 2 is a diagram showing a configuration of a protection circuit 111. FIG.

  3 and 4, the organic EL device 100 according to the present embodiment includes an organic EL panel 110, a current supply line L22 that supplies a drive current to the organic EL element 129, and a data line L21 that supplies a data signal to the unit circuit 120. , A scanning line L26 for supplying a scanning signal to the unit circuit 120, a data line driving circuit and a scanning line driving circuit (not shown), and logic power supply wirings 116 and 117 for supplying power to the data line driving circuit and the scanning line driving circuit. . In the organic EL device according to the present embodiment and the third embodiment, the layout of the organic EL panel in the organic EL device and the protection circuit provided in the peripheral region of the organic EL panel is the organic EL described in the first embodiment. It is the same as the apparatus, and detailed description is omitted. In the following embodiments, the configuration of the unit circuit and the configuration of the protection circuit will be mainly described.

(Unit circuit configuration)
3 and 4, the unit circuit 120 includes a driving TFT 123, switching TFTs 122a, 122b, 130, a storage capacitor 124, and an organic EL element 129.

  The source of the driving TFT 123 is electrically connected to a current supply line L22 that supplies a driving current to the organic EL element 129, while the drain is the drain of the switching TFT 130, the drain of the switching TFT 122a, and the switching TFT 122b. Are electrically connected to the source of each.

  The gate of the switching TFT 122a and the gate of the switching TFT 122b are electrically shared, and are electrically connected to the write selection signal line L26b or L26c included in the scanning line L26.

  The source of the switching TFT 122a is electrically connected to the data line L21, and the drain is electrically connected to the source of the switching TFT 122b. Further, the drain of the switching TFT 122b is electrically connected to one end of the storage capacitor 124. The switching TFTs 122a and 122b become active when the write selection signal S1 supplied from the write selection signal line L26a becomes a high potential, that is, an H level.

  The storage capacitor 124 has one end electrically connected to the drain of the switching TFT 122b and the other end electrically connected to the current supply line L22. The storage capacitor 124 stores a charge that defines a current supplied to the organic EL element 129 by the driving TFT 123.

  The switching TFT 130 becomes active only when the selection signal S2 or S3 supplied to the selection signal line L26b or L26c electrically connected to the gate thereof becomes H level, and supplies a current to the organic EL element 129. The source of the switching TFT 130 is electrically connected to the first electrode (anode) of the organic EL element 129, and the drain is electrically connected to the drain of the driving TFT 123.

  The organic EL element 129 includes an organic EL layer sandwiched between a first electrode (anode) and a second electrode (cathode), and emits light with luminance according to a forward current from the first electrode to the second electrode. It is a light emitting element. The first electrode of the organic EL element 129 is connected to the source of the switching TFT 130. On the other hand, the second electrode of the organic EL element 129 is common to all the unit circuits 120 and is connected to a lower potential (that is, a reference potential) in a power source (not shown).

  The current supply line L22 supplies the drive current of the organic EL element 129 to the unit circuit 120 as in the first embodiment. The data line L21 is electrically connected to the X driver, and supplies the data signal I1 corresponding to the data signal to each unit circuit 120.

  The scanning line L26 includes a write selection signal line L26a electrically connected to the X driver, and selection signal lines L26b and L26c. The write selection signal line L26a is a wiring provided for applying a voltage for accumulating charges in the storage capacitor 124 of each pixel to the gates of the switching TFTs 122a and 122b in a programming stage described later, and the selection signal line 126b. And 126c are wirings for supplying a signal for switching the switching TFT 130 provided in each unit circuit 120 to an active state or an inactive state.

  The organic EL device 100 according to this embodiment is a display device capable of color display, which includes an organic EL element that emits light of each color wavelength of R (red), G (green), and B (blue). The selection signal line L26c is a selection signal line that supplies a selection signal GELG to a unit circuit including an organic EL element that emits green light, and the selection signal line L26b applies a selection signal S2 to the organic EL element that emits red light. The selection signal S2 is supplied to the organic EL element that emits blue light as well as being supplied.

  Next, the operation of the organic EL device 100 having the above configuration will be described.

  When the scanning line driving circuit supplies an H level write selection signal S1 to the write selection signal line L26a, a voltage is applied to both gates of the switching TFTs 122a and 122b in the unit circuit 120 (pixel row) corresponding to the write selection signal S1. When applied, these switching TFTs 122a and 122b become active.

  When the switching TFT 122b becomes active, the drain and source of the switching TFT 122b become conductive, so that the gate and drain of the drive TFT 123 become conductive, and the drive TFT 123 functions as a simple diode.

  On the other hand, as the H-level write selection signal S1 is supplied, the switching TFT 122b whose gate voltage is shared with the switching TFT 122a is also activated. As a result, during the period when the write selection signal S1 is at the H level, the data signal I1 supplied by the current source in the data line driving circuit sequentially passes through the current supply line L22, the driving TFT 123, the switching TFT 122a, and the data line L21. It will flow as a current through the path. During this period, charges corresponding to the potential difference between the gate potential of the driving TFT 123 and the potential of the current supply line L22 are stored in the storage capacitor 124. Since the charge stored in the storage capacitor 124 is a charge that defines a current supplied to the organic EL element 129 by the driving TFT 123, this period is referred to as a “programming stage”.

  When the scanning line driving circuit controls the write selection signal S1 to a low potential (that is, L level), the programming stage of the pixel row including the unit circuit 120 is completed. With the end of the programming stage (that is, supply of the L level write selection signal S1), the switching TFTs 122a and 122b become inactive. However, since charges are stored in the storage capacitor 124, the potential of the gate of the drive TFT 123 is held at the previous value.

  The scanning line driving circuit supplies an H level selection signal S2 or S3 to the selection signal line L26b or L26c of the unit circuit 120 that has completed the programming stage at a predetermined timing. When the selection signal S2 or S3 is supplied, the switching TFT 130 becomes active. Between the source and drain of the driving TFT 123, a current based on the voltage that the gate has between the reference potential and the gate TFT 123 flows. This current path flows through the current supply line L22, the driving TFT 123, the switching TFT 130, and the organic EL element 129 in order, and the organic EL element 129 emits light. Since the light emission of the organic EL element 129 is performed based on the current value programmed in advance in the previous programming stage, the light emission period of the organic EL element 129 is also referred to as a “reproduction stage”.

  In the element formation region 114, the scanning line driving circuit executes the programming stage in units of pixel rows, and sequentially scans the pixel rows that execute the programming stage. The pixel rows for which the programming stage has been completed shift to the reproduction stage with a predetermined delay time. The switching timing between the programming stage and the re-production stage is appropriately controlled by the scanning line driving circuit so that, for example, the programming stage and the re-production stage are not simultaneously executed for a certain pixel row.

  In this way, the organic EL device 100 drives the organic EL element 129 by the current programming method by the driving TFT 123, the switching TFTs 122a and 122b, the switching TFT 130, and the storage capacitor 124, and performs image display. In particular, the current supply line L22 and the data line L21 connect the power supply or current source and the unit circuit 120 with a low resistance in order to precisely program the data signal I1 by current. Therefore, in the organic EL device 100 according to the present embodiment, the drive TFT 123 connected to the current supply line L22 and the switching TFT 122a connected to the data line L21 are often electrostatically damaged, and thus the current supply line L22. In addition, an unexpected voltage caused by static electricity is applied to a current path connected to the data line L21, a path through which a current flows when programming, and a path through which a drive current flows when the organic EL element 129 emits light. It is important to reduce this.

(Configuration of protection circuit)
3 and 4, the organic EL device 100 includes a protection circuit 111 provided in a peripheral region of the element formation region 114 including the unit circuit 120 and the dummy unit circuit 128 of the organic EL panel 110.

  The protection circuit 111 according to the present embodiment includes an X-side protection circuit 111a and a Y-side protection circuit 111b provided in pairs so as to sandwich the element formation region 114 in a peripheral region located around the element formation region 114, respectively.

  The X-side protection circuit 111a is provided in the middle of the current supply line L22 and electrically connected to the logic power supply wirings 116 and 117, and is provided in the middle of the data line L21 and the logic power supply wirings 116 and 117. And an electrostatic protection circuit ESD21 that is electrically connected. The current supply line L22 is a wiring that supplies a drive current to the organic EL element 129 included in the unit circuit 120, and is connected to the source of the drive TFT 123 included in the unit circuit 120. The data line L21 is a signal line that supplies the unit circuit 120 with a current I1 corresponding to the data signal, and is connected to the source of the switching TFT 122a included in the unit circuit 120.

  The electrostatic protection circuit ESD22 provided in the middle of the current supply line L22 is an example of the “current supply line protection circuit” according to the present invention, and includes a logic power supply wiring 117 for supplying a low potential power supply V3 and a high potential supply circuit. It is electrically connected to the logic power supply wiring 116 that supplies the power supply V2. The electrostatic protection circuit ESD22 discharges this static electricity to one of the logic power supply wirings 116 and 117 according to the potential of static electricity generated in the current supply line L22 as in the first embodiment. Therefore, the electrostatic protection circuit ESD22 suppresses electrostatic breakdown of the driving TFT 123 included in the unit circuit 120 by discharging static electricity generated in the current supply line L22 to the logic power supply wiring 116 or 117. Since the electrostatic protection circuit ESD22 does not function as an electric resistance with respect to the drive current supplied from the current supply line L22 to the organic EL element 129, the electrostatic protection circuit ESD22 does not hinder the light emission of the organic EL element 129, and the image quality of the organic EL device 100 is reduced. Is not reduced.

  The electrostatic protection circuit ESD21 provided in the middle of the data line L21 is an example of the “data line protection circuit” according to the present invention. Similar to the electrostatic protection circuit ESD21, it is connected to two logic power supply lines 116 and 117. Similarly to the electrostatic protection circuit ESD22, the electrostatic protection circuit ESD21 discharges static electricity generated on the data line L21 to the logic power supply wiring 116 or 117, and the switching TFT 122a included in the unit circuit 120 is electrostatically destroyed. Reduce.

  The electrostatic protection circuit ESD21 can discharge static electricity that is difficult to discharge by the electrostatic protection circuit ESD22 provided in the current supply line L22, that is, static electricity generated in the data line L21. It is possible to protect against static electricity generated in the data line L21. In the present embodiment, the resistance element R21 is provided in the middle of the data line L21, so that the unit circuit 120 can be more reliably protected from static electricity.

  According to the electrostatic protection circuits ESD21 and ESD22, the unit circuit 120 is protected from static electricity generated in the current supply line L22 and the data line L21 without obstructing the flow of various currents necessary for causing the organic EL element 129 to emit light. Is possible. Therefore, both the protection of the unit circuit 120 from static electricity and the deterioration of the image quality of the organic EL device 100 can be achieved.

  The Y-side protection circuit 111b is provided in the middle of each of the write selection signal line L26a and the selection signal lines L26b and L26c, and is electrically connected to the logic power supply wirings 116 and 117. An electrostatic protection circuit ESD25 provided between the current supply line L22 extending in the direction and the element formation region 114, and an electrostatic protection circuit ESD27 provided between the logic power supply wiring 117 and the dummy unit circuit 128 are provided.

  Each of the electrostatic protection circuits ESD26a, ESD26b, and ESD26c is an example of the “scanning line protection circuit” according to the present invention, and includes two diodes connected in series like the electrostatic protection circuits ESD11 and 12 described above. Composed. The electrostatic protection circuits ESD26a, ESD26b, and ESD26c discharge static electricity to one of the logic power supply wirings 116 and 117 in accordance with the static electricity potential generated in the scanning line L26. Therefore, the electrostatic protection circuits ESD26a, ESD26b, and ESD26c can protect the switching TFTs 122a and 122b and the switching TFT 130 from static electricity generated in the scanning line L26. In the present embodiment, the resistance element R26 is provided in the middle of the scanning line 126, so that the unit circuit 120 can be more reliably protected from static electricity.

  The wiring 118 is electrically connected to the logic power wiring 117 having a low potential.

  The electrostatic protection circuit ESD 27 is an example of the “dummy unit circuit protection circuit” according to the present invention, and is provided between the wiring 118 extending in the peripheral region located around the element forming region 114 and the element forming region 114. The static electricity generated in the dummy unit circuit 128 is discharged to the wiring 118. A current supply line L22a extending in the Y direction in the drawing extends between the dummy unit circuit 128 and the wiring 118. The current supply line L22a is thicker than other wirings, and static electricity is likely to be accumulated in a region where the wirings intersect. Therefore, by providing the electrostatic protection circuit ESD27 closer to the element formation region 114 than the current supply line L22a, it is possible to suppress an unexpected voltage due to static electricity being applied to the element formation region 114, and to provide a dummy unit. Static electricity generated in the circuit 128 can be discharged to the wiring 118. In the present embodiment, the resistance element R27 is provided between the wiring 118 and the element formation region 114, so that the dummy unit circuit 128 can be more reliably protected from static electricity.

  In the present embodiment, the current supply line L22 includes a main line L22a extending in the X direction and the Y direction in the peripheral region of the element formation region 114, and a branch line L22b extending from each main line L22a into the element formation region 114. It is comprised including. Since the unit circuits 120 are arranged in a matrix in the element formation region 114, the branch line L22b extends in the element formation region 114 along each row and each column of the unit circuit 120. The branch line L22b is electrically connected to each other in the element formation region 114, and supplies the drive current of the organic EL element 129 to each unit circuit 120 and discharges static electricity generated in the element formation region 114 to the outside. Current path is configured. According to such a layout of the branch line L22b, a current path extends around the element formation region 114, and static electricity can be easily discharged to the outside through the branch line L22b.

  The electrostatic protection circuit ESD25 included in the Y-side protection circuit 111b discharges the static electricity generated in the main line L22a of the current supply line L22 extending in the Y direction to the logic power supply wiring 116 or 117, similarly to the electrostatic protection circuit ESD22. The dummy unit circuit 128 is protected from static electricity.

  According to the protection circuit 111 according to the present embodiment, similarly to the protection circuit 11 according to the first embodiment, the organic panel 110 can be improved in resistance to static electricity without greatly changing the design, and the organic EL in the manufacturing process can be improved. The yield of the panel 110 can be improved. Furthermore, since the image quality of the organic EL device 100 is not lowered, it is possible to provide a high-quality organic EL device capable of both improving the yield in the manufacturing process and not lowering the image quality.

[Modification 1 of the third embodiment]
Next, a modification of the third embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the third embodiment are denoted by the same reference numerals as those in FIGS. 3 and 4 and the description thereof is omitted as appropriate. FIG. 5 is a diagram for explaining an example of the “data line protection circuit” according to the present invention, and FIG. 6 is a diagram for explaining a protection diode connected between the data line and the current supply line. is there.

  In FIG. 5, transistors T1 and T2 constitute an example of the “data line protection circuit” according to the present invention. The transistor T1 is electrically connected to the wiring L29 and the data line L21 that are electrically connected to the second electrode (cathode) side CVT of the organic EL element 29. The transistor T2 is electrically connected to the data line L21 and the branch line L22b of the current supply line L22. The transistors T1 and T2 constitute an electrostatic protection circuit ESD100 and allow static electricity generated on the data line 21 to escape to at least one of the current supply line L22b and the wiring L29. The electrostatic protection circuit ESD100 is disposed so as to connect, for example, a branch line L22b and a data line L21 extending in the dummy unit circuit 128. Here, the wiring L29 may be connected to the ground side.

  As shown in FIG. 6, an electrostatic protection circuit ESD101 can be connected between the data line L21 ′ and the current supply line L22 ′ extending to the unit circuit 120 included in the element formation region 114. . The ESD 101 includes a plurality of transistors, and can discharge static electricity generated in one of the data line 21 'and the current supply line L22' to the other. As a result, the unit circuit 120 'can be more reliably protected from static electricity.

[Modification 2 of the third embodiment]
Next, a modification of the third embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the third embodiment are denoted by the same reference numerals as those in FIGS. 3 and 4 and the description thereof is omitted as appropriate. FIG. 16 is a diagram schematically illustrating a configuration of an organic EL device 100 according to a modification of the third embodiment.

  In FIG. 16, the organic EL device 100 includes a data line driving circuit 112a, a scanning line driving circuit 112b, a protection circuit 111, and an element formation region 114 in which a unit circuit 120 is formed.

  The scanning line driving circuit 112b is a circuit that supplies selection signals S1, S2, and S3, which are examples of scanning signals, to the selection signal lines L26a, L26b, and L26c.

  The data line driving circuit 12a includes a sampling circuit that samples the image signal sent from the image signal generation circuit 71 at a predetermined timing and a circuit that supplies the data signal Idata corresponding to the image signal to the data line L21.

  The operation of the scanning line driving circuit 112b and the operation of the data line driving circuit 112a are synchronized with each other by a synchronizing signal such as a clock signal supplied from the control circuit 72, and light emission by an active matrix method is performed. The logic power supply wirings 116 and 117 supply power from the drive power supply circuit 73 to the data line drive circuit 112a and the scanning line drive circuit 112b. Here, the logic power supply wiring 116 supplies the power supply V2 on the high potential side, and the logic power supply wiring 117 supplies the power supply V3 on the low potential side. The logic power supply wirings 116 and 117 are connected to the protection circuit 111.

  The unit circuit 120 includes a drive TFT 123, switching TFTs 122a, 122b, 130, a storage capacitor 124, and an organic EL element 129, as in FIG.

  Here, the organic EL element 29 includes a first electrode, a second electrode, and a light emitting layer sandwiched between the first electrode and the second electrode. The first electrode corresponds to the unit circuit 120. The second electrode is provided in common to the plurality of unit circuits 120 provided in a matrix. Each first electrode provided in the unit circuit 120 is connected to the light-emitting power supply circuit 74 by the first power supply wiring connection terminal 200 through the current supply line L22b and the first power supply wiring 118. The second electrode provided in the element formation region 114 is connected to the light emitting power supply circuit 74 through the second power supply wiring 119 through the second power supply wiring connection terminal 201. The light emission power supply circuit 74 supplies power between the first power supply wiring connection terminal 200 and the second power supply wiring connection terminal 201. Here, as in FIG. 2, the first power supply wiring 18 is connected to the first electrode (anode) of the organic EL element that emits light of each color, and is connected to the first power supply wiring 18R, 18G, and 18B. In order to simplify the description, only one current supply line L2 corresponding to the organic EL elements of these colors is shown.

  The light emitting device according to the present invention includes an electrostatic protection circuit ESD22 as an example of a “current supply line protection circuit”. The electrostatic protection circuit ESD22 is provided between the current supply line L22b connected to the unit circuit 120 and the first power supply wiring 118.

  As described above, according to the protection circuit 111 according to a modification of the third embodiment, the unit circuit 120 is removed from static electricity generated in the first power supply wiring 118, the current supply line L22b, or the first power supply wiring connection terminal 200. It is possible to protect, and it is possible to suppress electrostatic breakdown of elements such as the switching transistor 122a and the driving transistor 123 included in the unit circuit 120. Further, the protection circuit 111 is connected to the logic power supply wirings 116 and 117 via the electrostatic protection circuit, similarly to the electrostatic protection circuit ESD2 of FIG. Since it is discharged to the logic power supply wirings 116 and 117 included in the data line driving circuit 112a and the scanning line driving circuit 112b, a wiring for discharging static electricity is not separately provided.

  Further, the light emitting device according to the present invention includes an electrostatic protection circuit ESD21 as an example of a “data line protection circuit”. The electrostatic protection circuit ESD21 is provided between the data line driving circuit 112a and the data line L21. As described above, according to the protection circuit 111 according to a modification of the third embodiment, the unit circuit 120 can be protected from static electricity generated in the data line L21, and the switching transistor 122a included in the unit circuit 120 can be protected. In addition, electrostatic breakdown of elements such as the driving transistor 123 can be suppressed. Further, the protection circuit 111 is connected to the logic power supply wirings 116 and 117 via the electrostatic protection circuit ESD21, similarly to the electrostatic protection circuit ESD2 of FIG. Since it is discharged to the logic power supply wirings 116 and 117 included in the data line driving circuit 112a and the scanning line driving circuit 112b, a wiring for discharging static electricity is not separately provided.

  In the element formation region 14, a light emitting region 202 in which the unit circuit 120 is formed and a dummy unit circuit 128 provided around the light emitting region 202 are provided.

  The wirings L21 and L22b connected to the dummy unit circuit 128 are wirings having the same potential. Here, it is connected to the first power supply wiring 118. This prevents static electricity from reaching the unit circuit 120 and damaging the unit circuit, and prevents the dummy unit circuit from emitting light or leaking current when the organic EL device 100 emits light. can do.

  In addition, electrostatic protection circuits ESD24 and ESD23 are preferably provided in the middle of the wirings L21 and L22b, respectively. The electrostatic protection circuits ESD24 and ESD23 are examples of the “dummy unit circuit protection circuit”. The electrostatic protection circuits ESD24 and ESD23 are connected to the logic power supply wirings 116 and 117, discharge static electricity generated in the wirings L21 and L22b to the logic power supply wiring 116 or 117, and are included in the dummy unit circuit 128 and the unit circuit 20. Each element is prevented from being electrostatically damaged by static electricity. As in FIG. 2, the resistance elements are provided in the wirings L21 and L22b, respectively, so that the unit circuit 20 and the dummy unit circuit 128 can be more reliably protected from static electricity.

  Further, the wiring L27 connected to the dummy unit circuit 128 is connected to the logic power supply wiring 117 via the wiring 117a. This prevents static electricity from reaching the unit circuit 120 and damaging the unit circuit, and also causes the dummy unit circuit 128 to emit light or leak current when the organic EL device 100 emits light. Can be prevented.

[Modification 3 of the third embodiment]
Next, a modification of the third embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the third embodiment are denoted by the same reference numerals as those in FIGS. 3 and 4 and the description thereof is omitted as appropriate. FIG. 17 is a diagram schematically illustrating a configuration of an organic EL device 100 according to a modification of the third embodiment.

  17, the organic EL device 100 includes a data line driving circuit 112a, a scanning line driving circuit 112b, a protection circuit 111, and an element formation region 114 in which a unit circuit 120 is formed.

  The logic power supply wirings 116 and 117 supply power from the drive power supply circuit 73 to the data line drive circuit 112a and the scanning line drive circuit 112b. Here, the logic power supply wiring 116 supplies the power supply V2 on the high potential side, and the logic power supply wiring 117 supplies the power supply V3 on the low potential side. The logic power supply wirings 116 and 117 are connected to the protection circuit 111.

  The unit circuit 120 includes a drive TFT 123, switching TFTs 122a, 122b, 130, a storage capacitor 124, and an organic EL element 129, as in FIG.

  Here, the organic EL element 29 includes a first electrode, a second electrode, and a light emitting layer sandwiched between the first electrode and the second electrode. The first electrode corresponds to the unit circuit 120. The second electrode is provided in common to the plurality of unit circuits 120 provided in a matrix. Each first electrode provided in the unit circuit 120 is connected to the light-emitting power supply circuit 74 by the first power supply wiring connection terminal 200 via the current supply line L22 and the first power supply wiring 118. The second electrode provided in the element formation region 114 is connected to the light emitting power supply circuit 74 through the wiring 29 and the second power supply wiring 119 through the second power supply wiring connection terminal 201. The light emission power supply circuit 74 supplies power between the first power supply wiring connection terminal 200 and the second power supply wiring connection terminal 201. Here, as in FIG. 2, the first power supply wiring 18 is connected to the first electrode (anode) of the organic EL element that emits light of each color, and is connected to the first power supply wiring 18R, 18G, and 18B. In order to simplify the description, only one current supply line L2 corresponding to the organic EL elements of these colors is shown.

  The light emitting device according to the present invention includes an electrostatic protection circuit ESD100 which is an example of a “data line protection circuit”. The electrostatic protection circuit ESD100 is connected to the data line L21, and is provided between the diode provided between the first power supply wiring 118 and the data line L21, the second power supply wiring 119, and the data line L21. It consists of a diode.

  According to the protection circuit 111, the unit circuit 120 can be protected from static electricity generated in the data line L21, and elements such as the switching transistor 122a and the drive transistor 123 included in the unit circuit 120 are electrostatically destroyed. This can be suppressed. Further, the protection circuit 111 is connected to the current supply line L22 and the wiring 29. Since it is discharged to the current supply line L22 and the wiring 29, a new wiring for discharging static electricity is not separately provided. Further, diodes are formed between the current supply line L22 formed in the element formation region 114 and the first power supply wiring 118, and between the wiring 29 formed in the element formation region 114 and the second power supply wiring 119, respectively. Has been. Here, the first power supply wiring 118 supplies current to the plurality of current supply lines L 22, and the second power supply wiring 119 supplies current to the plurality of wirings 29. Therefore, the resistance of the first power supply wiring 118 is lower than that of one current supply line L22. If the same wiring is used, the wiring width of the first power supply wiring 118 is larger than that of the current supply line L22. Similarly, the resistance of the second power supply wiring 119 is lower than that of one wiring 29. If the same wiring is used, the wiring width of the second power supply wiring 119 is larger than that of the wiring 29. Even if static electricity is accumulated in the data line L21, the static electricity can be quickly eliminated from the first power supply wiring 118 or the second power supply wiring 119.

[Fourth Embodiment]
Next, another embodiment of the light-emitting device according to the present invention will be described with reference to FIGS. FIG. 7 is a diagram illustrating a configuration of the unit circuit 220 included in the organic EL device 200 according to the present embodiment, and FIG. 8 is an enlarged view of a part of the four corners of the organic EL panel 210. 2 is a diagram illustrating a configuration of a protection circuit 211. FIG.

  The organic EL device 200 according to the present embodiment scans the organic EL panel 210, the current supply line L32 that supplies a drive current to the organic EL element 229, the data line L31 that supplies a data signal to the unit circuit 220, and the unit circuit 220. A scanning line L36 for supplying signals, a data line driving circuit and a scanning line driving circuit (not shown), and logic power supply wirings 216 and 217 for supplying power to the data line driving circuit and the scanning line driving circuit are provided.

(Unit circuit configuration)
7 and 8, the unit circuit 220 includes TFTs 222a, 222b, 222c, and 223 that function as first to fourth switching elements, a driving TFT 230, a storage capacitor 224 that functions as a capacitor, and an organic EL element 229. Configured.

  The source of the driving TFT 230 is connected to the first electrode (anode) of the organic EL element 229, while the source of the switching TFT 223 is connected to the drain of the driving TFT 230 and one end (drain) of the switching TFT 222c. . Here, the gate of the switching TFT 223 is connected to the selection signal line L36b or L36c. Therefore, the switching TFT 223 is in an active state when the selection signal S2 or S3 is at the H level, and is inactive when the selection signal S2 or S3 is at the L level.

  The source of the driving TFT 230 is connected to the first electrode (anode) of the organic EL element 229. On the other hand, the organic EL element 229 is configured to be electrically inserted together with the switching TFT 223 and the driving TFT 230 in a path between the current supply line L32 and the second electrode side (CVT) of the organic EL element 229. .

  The gate of the driving TFT 230 is connected to one end of the storage capacitor 224 and the source of the switching TFT 222c.

  The switching TFT 222c is electrically inserted between the drain and gate of the driving TFT 230, and the gate of the switching TFT 222c is connected to the control line 236. For this reason, the switching TFT 222c is turned on when the control signal GINIT becomes H level, and causes the driving TFT 230 to function as a diode.

  On the other hand, one end (drain) of the switching TFT 222b is connected to the power supply line 237, while the other end (source) is connected to one end (drain) of the TFT 222a and the other end of the capacitor 224, respectively. The gate of the switching TFT 222b is connected to the control line 236. Therefore, the switching TFT 222b becomes active when the control signal GINIT becomes H level.

  Further, the other end (source) of the TFT 222a is connected to the data line L31, and its gate is connected to a write signal line L36a included in the scanning line L36. For this reason, the TFT 222a becomes active when the write selection signal S1 becomes H level, and supplies the data signal supplied to the data line L31 to the other end of the capacitor 224.

  The unit circuit 220 is configured to commonly control the switching operation of switching the TFTs 222b and 222c between the active state and the inactive state by the control signal GINIT supplied to the control line 236. Similar to the second embodiment, the unit circuit 220 can cause the organic EL element 229 to emit light by a voltage programming method, and further, the unit circuit 220 can drive the organic EL element 229 without depending on variations in the threshold voltage of the driving TFT 230. It is possible to pass an electric current. In the unit circuit 220, before holding the voltage applied to the gate of the driving TFT 230, the control signal GINIT is set to the H level, the switching TFTs 222b and 222c are activated, and both ends of the storage capacitor 224 are initialized. At the same time, the driving TFT 230 functions as a diode, and the gate potential of the driving TFT 230 is set to a value corresponding to the threshold voltage of the driving TFT 230. After the control signal GINIT is set to L level to make the switching TFTs 222b and 222c inactive, the switching TFT 222a is made active and the data signal from the data line L31 is held as the voltage on the gate power of the driving TFT 230. When the organic EL element 229 emits light, a voltage is applied to the gate of the driving TFT 230 according to the electric potential of the charge held in the storage capacitor 224, and a driving current flows through the organic EL element 229. In the organic EL device 200, since static electricity is likely to be generated in the current supply line L32, the switching TFT 223 connected to the current supply line L32, the driving transistor 230, and the switching TFT 222a connected to the data line L31 are electrostatically destroyed. It is important to suppress this.

(Configuration of protection circuit)
The protection circuit 211 provided in the organic EL device 200 will be described in detail with reference to FIG.

  In FIG. 7, the organic EL device 200 includes a protection circuit 211 provided in a peripheral region of the element formation region 214 including the unit circuit 220 and the dummy unit circuit 228.

  The protection circuit 211 according to the present embodiment includes an X-side protection circuit 211 a and a Y-side protection circuit 211 b provided in pairs so as to sandwich the element formation region 214 in a peripheral region located around the element formation region 214. A part of the four corners of the organic EL panel 210 in the protection circuit 211 will be described in detail.

  The X-side protection circuit 211a is provided in the middle of the current supply line L32 and is electrically connected to the logic power supply wirings 216 and 217, and the logic power supply wirings 216 and 217 are provided in the middle of the data line L31. And ESD protection circuits ESD31a and ESD31b electrically connected to each other.

  The current supply line L32 is connected to the source of the switching TFT 223 included in the unit circuit 220 and supplies a drive current to the organic EL element 229 included in the unit circuit 220. The data line L31 is a data line that supplies a data signal to the unit circuit 220, and is connected to the source of the switching TFT 222a included in the unit circuit 220.

  The electrostatic protection circuit ESD32 provided in the middle of the current supply line L32 is an example of the “current supply line protection circuit” according to the present invention, and includes a logic power supply wiring 217 for supplying a low potential power supply and a high potential power supply. Is electrically connected to a logic power supply wiring 216 for supplying the power. The electrostatic protection circuit ESD32 includes two diodes connected in series, and similarly to the electrostatic protection circuit described in the first and third embodiments, the potential of static electricity generated in the current supply line L32. In response to this, the static electricity is discharged to one of the logic power supply wirings 216 and 217. Therefore, the electrostatic protection circuit ESD32 can reduce the electrostatic breakdown of the switching TFT 223 and the driving TFT 230. Since the electrostatic protection circuit ESD32 does not function as an electric resistance with respect to the drive current supplied from the current supply line L32 to the organic EL element 229, the electrostatic protection circuit ESD32 does not interfere with the light emission of the organic EL element 229 and the image quality of the organic EL device 200 It does not decrease

  The electrostatic protection circuits ESD31a and ESD31b provided in the middle of the data line L31 are examples of the “data line protection circuit” according to the present invention. The electrostatic protection circuits ESD 31a and 31b are connected to logic power supply wirings 216 and 217, respectively. Each of the electrostatic protection circuits ESD 31 a and 31 b discharges static electricity generated in the data line L 31 to one of the logic power supply wirings 216 and 217, and is included in the unit circuit 220, as in the first and second embodiments. It is possible to reduce the electrostatic breakdown of the switching TFT 222a.

  The two electrostatic protection circuits ESD31a and 31b include a current supply line L32 extending along the X direction and a data line L31 extending in the Y direction in the peripheral region of the element formation region 214 in the middle of the data line L31. It is provided at a position to sandwich the intersecting region B. A region B where the current supply line L32 and the data line L31 intersect is a region where static electricity is likely to be accumulated. According to the two electrostatic protection circuits ESD31a and ESD31b, the static electricity accumulated in this region is converted into the logic power supply wiring 216 or 217. The switching TFT 223 and the switching TFT 222a included in the unit circuit 220 can be prevented from being electrostatically damaged. Also in this embodiment, the resistance elements R31a and R31b are provided in the middle of the data line L31, so that the unit circuit 220 can be more reliably protected from static electricity.

  According to the electrostatic protection circuits ESD32, ESD31a and ESD31b, the unit circuit 220 can be formed from static electricity generated in the current supply line L32 and the data line L31 without obstructing the flow of various currents necessary for causing the organic EL element 229 to emit light. Can be protected, and the image quality of the organic EL device 200 is not deteriorated.

  The Y-side protection circuit 211b is provided in the middle of each of the write selection signal line L36a and the selection signal lines L36b and L36c, and is electrically connected to the logic power supply wirings 216 and 217. The ESD protection circuit ESD36a1, ESD36a2, ESD36b1, ESD36b2 ESD 36 c 1, ESD 36 c 2, electrostatic protection circuit ESD 35 provided between the current supply line L 32 and the element formation region 214, and electrostatic protection circuit provided between the low-potential-side power supply line 217 and the dummy unit circuit 228. An ESD 34 is provided.

  The electrostatic protection circuits ESD36a1, ESD36a2, ESD36b1, ESD36b2, ESD36c1, and ESD36c2 are examples of the “scanning line protection circuit” according to the present invention. The electrostatic protection circuits ESD 36a1 and 36a2 can protect the switching TFT 222a from static electricity generated in the write selection signal line L36a. Similarly, the electrostatic protection circuits ESD36b1, ESD36b2, ESD36c1, and ESD36b discharge static electricity generated in the selection signal lines L36b and L36c to one of the logic power supply wirings 216 and 217. Therefore, the electrostatic protection circuits ESD36a1, ESD36a2, ESD36b1, ESD36b2, ESD36c1, and ESD36c2 can reduce the electrostatic breakdown of each element included in the unit circuit 220. In the present embodiment, the resistance element R36 is provided in the middle of the scanning line L36, so that the unit circuit 220 can be more reliably protected from static electricity.

  The electrostatic protection circuits ESD36a1 and ESD36a1 are arranged so as to sandwich a region C where the write selection signal line L36a between the electrostatic protection circuits ESD36a1 and ESD36a1 and the current supply line L32 intersect. Similarly, the electrostatic protection circuits ESD36b1, ESD36b2, ESD36c1, and ESD36c2 are also arranged so as to sandwich the region C where the selection signal lines L36b and L36c intersect. The electrostatic protection circuits ESD36a1, ESD36a2, ESD36b1, ESD36b2, ESD36c1, and ESD36c2 are configured such that an unexpected voltage caused by static electricity accumulated in a region C where the current supply line L32 and the scanning line L36 intersect is a unit circuit 220 or a dummy unit circuit. It is possible to release static electricity so that it is not applied to 228.

  The electrostatic protection circuit ESD 34 connected to the low-potential logic power supply wiring 217 discharges static electricity generated in the dummy unit circuit 228 to the logic power supply wiring 217 and suppresses the dummy unit circuit 228 from being electrostatically destroyed. A current supply line L32 extending in the Y direction in the drawing extends between the dummy unit circuit 228 and the wiring 217. The current supply line L32 is thicker than other wirings, and static electricity is likely to be accumulated in a region where the wirings intersect. Therefore, by providing the electrostatic protection circuit ESD 34 on the element formation region 214 side from the current supply line L32, it is possible to suppress an unexpected voltage due to static electricity being applied to the element formation region 214. Static electricity generated in the circuit 228 can be discharged to the logic power supply wiring 216 or 217.

  In the present embodiment, the current supply line L32 includes a main line of the current supply line L32 and a branch line extending from the main line to the element formation region 214 in the peripheral region of the element formation region 214 as in the second embodiment. . Therefore, a current path for discharging static electricity generated in the element formation region 214 to the outside can be configured, and the unit circuit 220 can be prevented from being electrostatically damaged by the static electricity generated in the element formation region 214.

  According to the protection circuit 211 according to the present embodiment, the resistance to static electricity of the organic EL panel can be increased without significantly changing the design, as in the protection circuit according to the first and second embodiments. It is possible to improve the yield of the organic EL panel in the process. Furthermore, since the image quality of the organic EL device is not lowered, it is possible to provide a high-quality organic EL device capable of achieving both improvement in yield in the manufacturing process and reduction in image quality.

[Modification of Fourth Embodiment]
Next, a modification of the fourth embodiment will be described. In addition, you may combine each aspect illustrated below suitably. In addition, among the following aspects, the same elements as those in the third embodiment are denoted by the same reference numerals as those in FIGS. 7 and 8, and the description thereof is omitted as appropriate. FIG. 18 is a diagram schematically showing a configuration of an organic EL device 200 according to a modification of the fourth embodiment.

  In FIG. 18, the organic EL device 200 includes a data line driving circuit 12a, a scanning line driving circuit 12b, a protection circuit 211, and an element formation region 214 in which a unit circuit 220 is formed.

  The logic power supply wirings 216 and 217 supply power from the drive power supply circuit 73 to the data line drive circuit 12a and the scanning line drive circuit 12b. Here, the logic power supply wiring 216 supplies the high potential side power supply V2, and the logic power supply wiring 217 supplies the low potential side power supply V3. The logic power supply wirings 216 and 217 are connected to the protection circuit 211.

  Similarly to FIG. 8, the unit circuit 220 includes TFTs 222a, 222b, 222c and 223 that function as first to fourth switching elements, a driving TFT 230, a storage capacitor 224 that functions as a capacitor, and an organic EL element 229. Composed.

  Here, the organic EL element 229 includes a first electrode, a second electrode, and a light emitting layer sandwiched between the first electrode and the second electrode. The first electrode corresponds to the unit circuit 220. The second electrode is provided in common to the plurality of unit circuits 220 provided in a matrix. Each first electrode provided in the unit circuit 220 is connected to the light-emitting power supply circuit 74 by the first power supply wiring connection terminal 200 via the current supply line L32 and the first power supply wiring 218. The second electrode provided in the element formation region 214 is connected to the light-emitting power supply circuit 74 through the second power supply wiring 219 through the second power supply wiring connection terminal 201. The light emission power supply circuit 74 supplies power between the first power supply wiring connection terminal 200 and the second power supply wiring connection terminal 201. Similarly, the wiring 237 is connected to the light emitting power supply circuit 74 through the third power supply wiring connection terminal 203, and is supplied with the power VINIT. Here, as in FIG. 2, the first power supply wiring 18 is connected to the first electrode (anode) of the organic EL element that emits light of each color, and is connected to the first power supply wiring 18R, 18G, and 18B. In order to simplify the description, only one current supply line L32 corresponding to the organic EL elements of these colors is shown.

  The light emitting device according to the present invention includes an electrostatic protection circuit ESD101 which is an example of a “data line protection circuit”. The electrostatic protection circuit ESD101 is connected to the data line L31, and includes a diode provided between the current supply line L32 and the data line L31 and a diode provided between the wiring 237 and the data line L21. .

  According to the protection circuit 211, the unit circuit 220 can be protected from static electricity generated in the data line L31, and elements such as the switching transistor 222a and the drive transistor 230 included in the unit circuit 220 are electrostatically destroyed. This can be suppressed. Further, the protection circuit 211 is connected to the current supply line L32 and the wiring 237. Since it is discharged to the current supply line L32 and the wiring 237, there is no need to provide a new wiring for discharging static electricity.

  In addition to the configuration of the pixel circuit described with reference to FIGS. 1 to 18, various types of pixel circuits such as a voltage program type pixel circuit, a voltage comparison type pixel circuit, a subframe type pixel circuit, etc. A protection circuit similar to or similar to that of the present embodiment can be applied to an organic EL panel or the like having the above.

  1 to 18, the organic EL device has been described. However, an inorganic EL element, a field emission (FE) element, a surface conduction emission (SE) element, a ballistic electron emission (BS) element, an LED ( The present invention is also applied to a light-emitting device using other self-light-emitting elements such as light-emitting diode) elements. Further, although the light-emitting device in which unit circuits are provided in a matrix is described, the present invention may be applied to a light-emitting device in which unit circuits are provided in one column. Further, the present invention is not limited to the display device, and the present invention is also applied to a light emitting device such as an optical writing type printer or a writing head (line head) of an electronic copying machine as in the embodiment.

(Electronics)
Next, various electronic devices equipped with the above-described organic EL device will be described. Various electronic devices described below include any protection circuit among the protection circuits for the electro-optical panel according to the first to third embodiments.

<A: Mobile computer>
An example in which the above-described organic EL device is applied to a mobile personal computer will be described with reference to FIG. FIG. 9 is a perspective view showing the configuration of the computer 1200.

  In FIG. 9, a computer 1200 includes a main body 1204 including a keyboard 1202 and a display unit 1206 having a display unit 1005 configured using an organic EL device (not shown). In the display portion 1005, electrostatic breakdown of each element due to static electricity generated in the manufacturing process is reduced, and the reliability of the entire device is also improved. Furthermore, a high quality image can be displayed. Further, by forming organic EL elements that emit light of the three primary colors of red, green, and blue in a plurality of organic EL devices included in the display unit 1005, the display unit 1005 displays an image in full color display. be able to.

<B: Mobile phone>
Further, an example in which the above-described organic EL device is applied to a mobile phone will be described with reference to FIG. FIG. 10 is a perspective view showing the configuration of the mobile phone 1300.

  In FIG. 10, a mobile phone 1300 includes a display unit 1305 having an organic EL device according to an embodiment of the present invention, together with a plurality of operation buttons 1302.

  The display unit 1305 can display a high-quality image in the same manner as the display unit 1005 described above, and has high reliability. Since the yield of the organic EL panel included in the display portion 1305 is improved, the price of the entire mobile phone 1300 can be suppressed and the durability of the mobile phone 1300 is also improved. In addition, the plurality of organic EL elements included in the display portion 1305 emit light of the three primary colors of red, green, and blue, so that the display portion 1305 can perform image display in full color display.

  The present invention is not limited to the above-described embodiments, and can be appropriately changed without departing from the spirit or idea of the invention that can be read from the claims and the entire specification. A device manufacturing method, an organic EL device, and an electronic device are also included in the technical scope of the present invention.

It is the figure which showed typically the structure of the organic electroluminescent apparatus which concerns on 1st Embodiment of this invention. It is a figure for demonstrating the structure of the protection circuit and unit circuit of the organic electroluminescent apparatus which concern on 1st Embodiment of this invention. It is a figure which shows the structure of the unit circuit with which the organic EL apparatus concerning 3rd Embodiment of this invention is provided. It is a figure for demonstrating the protection circuit of the organic electroluminescent apparatus which concerns on 3rd Embodiment of this invention. It is a figure for demonstrating an example of the light-emitting device which concerns on this invention. It is a figure for demonstrating an example of the protection diode connected between the data line and current supply line of 3rd Embodiment of this invention. It is a figure which shows the structure of the unit circuit with which the organic EL apparatus concerning 4th Embodiment of this invention is provided. It is a figure for demonstrating the protection circuit of the organic electroluminescent apparatus which concerns on 4th Embodiment of this invention. It is a perspective view which shows an example of the electronic device which concerns on this invention. It is a perspective view which shows the other example of the electronic device which concerns on this invention. It is a figure for demonstrating the structure of the protection circuit of the organic EL apparatus which concerns on 1st Embodiment of this invention, a drive circuit, and a unit circuit. It is the figure which showed typically the structure of the organic electroluminescent apparatus concerning 2nd Embodiment. It is the figure which showed typically the structure of the organic EL apparatus 1 which concerns on the modification 1 of 2nd Embodiment. It is the figure which showed typically the structure of the organic electroluminescent apparatus 1 which concerns on the modification 2 of 2nd Embodiment. It is the figure which showed typically the structure of the organic electroluminescent apparatus 1 which concerns on the modification 3 of 2nd Embodiment. It is the figure which showed typically the structure of the organic electroluminescent apparatus 100 which concerns on the aspect which deform | transformed 3rd Embodiment. It is the figure which showed typically the structure of the organic electroluminescent apparatus 100 which concerns on the aspect which deform | transformed 3rd Embodiment. It is the figure which showed typically the structure of the organic electroluminescent apparatus 200 which concerns on the aspect which deform | transformed 4th Embodiment.

Explanation of symbols

  DESCRIPTION OF SYMBOLS 10,110,210 ... Organic EL panel, 11, 111, 211 ... Protection circuit, 14, 114, 214 ... Element formation area, 20, 120, 220 ... Unit circuit.

Claims (5)

A unit circuit;
A dummy unit circuit disposed outside a region where a plurality of the unit circuits are disposed,
The unit circuit is
A light emitting device having a first electrode and a second electrode;
A first transistor having a source and a drain connected between a first power line and the light emitting element;
A second transistor having a source and a drain connected between a data line and the gate of the first transistor;
With
The dummy unit circuit is:
A third transistor having one of a source and a drain connected to the second power supply line;
A fourth transistor having a source and a drain connected between a third power supply line and the gate of the third transistor;
A second light emitting element;
With
A scanning line is connected to the gate of the second transistor and the gate of the fourth transistor,
The same potential is supplied to the second power supply line and the third power supply line ,
The other of the source and the drain of the third transistor is connected to the second light emitting element, or the other of the source and the drain of the third transistor is connected to the second light emitting element. There is no light emitting device.   2. The light emitting device according to claim 1, wherein an electrostatic protection circuit is connected to each of the data line, the first power supply line, the second power supply line, and the third power supply line. . The electrostatic protection circuit includes a first diode and a second diode, one side of which is connected to any one of the data line, the first power line, the second power line, and the third power line. And
The other side of the first diode is connected to a fourth power supply line having a first potential,
3. The light emitting device according to claim 2, wherein the second diode has the other side connected to a fifth power supply line having a higher potential than the first potential. A gate of the fourth transistor is connected to a sixth power line;
The light emitting device according to claim 3, wherein the first potential is supplied to the sixth power supply line. An electronic apparatus comprising: a light-emitting device according to any one of claims 1 to 4.

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