JP5178046B2 - 半導体装置の作製方法 - Google Patents

半導体装置の作製方法 Download PDF

Info

Publication number
JP5178046B2
JP5178046B2 JP2007120554A JP2007120554A JP5178046B2 JP 5178046 B2 JP5178046 B2 JP 5178046B2 JP 2007120554 A JP2007120554 A JP 2007120554A JP 2007120554 A JP2007120554 A JP 2007120554A JP 5178046 B2 JP5178046 B2 JP 5178046B2
Authority
JP
Japan
Prior art keywords
pulse laser
surface layer
layer portion
pulse
auxiliary heating
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007120554A
Other languages
English (en)
Japanese (ja)
Other versions
JP2008277599A (ja
JP2008277599A5 (enExample
Inventor
隆介 川上
健一郎 西田
紀仁 河口
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Semiconductor Energy Laboratory Co Ltd
Original Assignee
Semiconductor Energy Laboratory Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Semiconductor Energy Laboratory Co Ltd filed Critical Semiconductor Energy Laboratory Co Ltd
Priority to JP2007120554A priority Critical patent/JP5178046B2/ja
Publication of JP2008277599A publication Critical patent/JP2008277599A/ja
Publication of JP2008277599A5 publication Critical patent/JP2008277599A5/ja
Application granted granted Critical
Publication of JP5178046B2 publication Critical patent/JP5178046B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Recrystallisation Techniques (AREA)
  • Insulated Gate Type Field-Effect Transistor (AREA)
JP2007120554A 2007-05-01 2007-05-01 半導体装置の作製方法 Expired - Fee Related JP5178046B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2007120554A JP5178046B2 (ja) 2007-05-01 2007-05-01 半導体装置の作製方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007120554A JP5178046B2 (ja) 2007-05-01 2007-05-01 半導体装置の作製方法

Publications (3)

Publication Number Publication Date
JP2008277599A JP2008277599A (ja) 2008-11-13
JP2008277599A5 JP2008277599A5 (enExample) 2010-05-27
JP5178046B2 true JP5178046B2 (ja) 2013-04-10

Family

ID=40055194

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007120554A Expired - Fee Related JP5178046B2 (ja) 2007-05-01 2007-05-01 半導体装置の作製方法

Country Status (1)

Country Link
JP (1) JP5178046B2 (enExample)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8461033B2 (en) 2009-01-13 2013-06-11 Dainippon Screen Mfg. Co., Ltd. Heat treatment apparatus and method for heating substrate by light-irradiation
JP5828997B2 (ja) * 2009-01-13 2015-12-09 株式会社Screenホールディングス 熱処理方法および熱処理装置
JP5828998B2 (ja) * 2009-02-18 2015-12-09 株式会社Screenホールディングス 半導体素子の製造方法
JP2011071261A (ja) * 2009-09-25 2011-04-07 Ushio Inc レーザーアニール装置
JP5556431B2 (ja) 2010-06-24 2014-07-23 富士電機株式会社 半導体装置の製造方法
JP5595152B2 (ja) * 2010-07-14 2014-09-24 住友重機械工業株式会社 レーザアニール方法
JP5786557B2 (ja) * 2011-08-25 2015-09-30 株式会社Sumco シミュレーションによるレーザースパイクアニールを施す際に生じる酸素析出物からの発生転位予測方法
CN116913768B (zh) * 2023-09-14 2023-12-05 中国科学院半导体研究所 多次脉冲亚熔化准分子激光退火方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3065825B2 (ja) * 1992-10-21 2000-07-17 株式会社半導体エネルギー研究所 レーザー処理方法
JPH07335586A (ja) * 1994-04-13 1995-12-22 Toshiba Corp レーザ熱処理方法およびその装置
KR100839259B1 (ko) * 2000-03-17 2008-06-17 베리안 세미콘덕터 이큅먼트 어소시에이츠, 인크. 레이저 어닐링 및 급속 열적 어닐링에 의한 울트라샬로우접합 형성 방법
JP4207488B2 (ja) * 2002-08-02 2009-01-14 ウシオ電機株式会社 光加熱装置
JP2005167005A (ja) * 2003-12-03 2005-06-23 Semiconductor Leading Edge Technologies Inc 半導体基板の熱処理方法、半導体装置の製造方法、及び熱処理装置
JP4614747B2 (ja) * 2004-11-30 2011-01-19 住友重機械工業株式会社 半導体装置の製造方法
US7943534B2 (en) * 2005-08-03 2011-05-17 Phoeton Corp. Semiconductor device manufacturing method and semiconductor device manufacturing system

Also Published As

Publication number Publication date
JP2008277599A (ja) 2008-11-13

Similar Documents

Publication Publication Date Title
JP5178046B2 (ja) 半導体装置の作製方法
US7943534B2 (en) Semiconductor device manufacturing method and semiconductor device manufacturing system
JP5105984B2 (ja) ビーム照射装置、及び、レーザアニール方法
JP6167358B2 (ja) レーザアニール装置及びレーザアニール方法
TWI497600B (zh) 用於積體電路製造之具有減少圖案密度效應的超快速雷射退火
EP1063049B1 (en) Apparatus with an optical system for laser heat treatment and method for producing semiconductor devices by using the same
TW564465B (en) Method and apparatus for making a poly silicon film, process for manufacturing a semiconductor device
US20040097103A1 (en) Laser annealing device and thin-film transistor manufacturing method
KR101790813B1 (ko) 레이저 어닐 방법 및 장치
JP4408668B2 (ja) 薄膜半導体の製造方法および製造装置
US6545248B2 (en) Laser irradiating apparatus
CN102157375A (zh) 双波长热流激光退火
JP2017174941A (ja) レーザ加工方法及びレーザ加工装置
CN103081065B (zh) 激光退火装置及激光退火方法
JP2004111584A (ja) 半導体装置の製造方法
JP2008251839A (ja) レーザアニール方法及びレーザアニール装置
JP2006344909A (ja) レーザ照射装置及び半導体装置の製造方法
JP3252403B2 (ja) レーザ照射装置及びシリコン薄膜の形成方法
US9190278B2 (en) Device and method for improving crystallization
CN1332426C (zh) 薄膜半导体的制造方法
JP2009160613A (ja) レーザビーム照射方法およびレーザビーム照射装置
JPH0562924A (ja) レーザアニール装置
JP3413484B2 (ja) レーザアニーリング装置
JP2006344844A (ja) レーザ処理装置
JPH10125614A (ja) レーザ照射装置

Legal Events

Date Code Title Description
A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A711

Effective date: 20080905

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20100412

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100412

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20121031

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20121106

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121115

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20130108

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20130108

R150 Certificate of patent or registration of utility model

Ref document number: 5178046

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20160118

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees