JP5172200B2 - Ｘ線アノードの焦点軌道領域 - Google Patents

Ｘ線アノードの焦点軌道領域 Download PDF

Info

Publication number
JP5172200B2
JP5172200B2 JP2007125165A JP2007125165A JP5172200B2 JP 5172200 B2 JP5172200 B2 JP 5172200B2 JP 2007125165 A JP2007125165 A JP 2007125165A JP 2007125165 A JP2007125165 A JP 2007125165A JP 5172200 B2 JP5172200 B2 JP 5172200B2
Authority
JP
Japan
Prior art keywords
ray
pattern
region
focal
anode
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2007125165A
Other languages
English (en)
Japanese (ja)
Other versions
JP2007311340A5 (enExample
JP2007311340A (ja
Inventor
トーマス・ラバー
バーナード・ビューレイ
アンドリュー・トリマー
ビン・ウェイ
コリン・アール・ウィルソン
マーク・ベンツ
アーネスト・バルク
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
General Electric Co
Original Assignee
General Electric Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by General Electric Co filed Critical General Electric Co
Publication of JP2007311340A publication Critical patent/JP2007311340A/ja
Publication of JP2007311340A5 publication Critical patent/JP2007311340A5/ja
Application granted granted Critical
Publication of JP5172200B2 publication Critical patent/JP5172200B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J35/00—X-ray tubes
    • H01J35/02—Details
    • H01J35/04—Electrodes ; Mutual position thereof; Constructional adaptations therefor
    • H01J35/08—Anodes; Anti cathodes
    • H01J35/10—Rotary anodes; Arrangements for rotating anodes; Cooling rotary anodes
    • H01J35/105—Cooling of rotating anodes, e.g. heat emitting layers or structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/081—Target material
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/085—Target treatment, e.g. ageing, heating
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/08—Targets (anodes) and X-ray converters
    • H01J2235/086—Target geometry
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/12—Cooling
    • H01J2235/1204—Cooling of the anode
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/12—Cooling
    • H01J2235/1225—Cooling characterised by method
    • H01J2235/1229—Cooling characterised by method employing layers with high emissivity
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2235/00—X-ray tubes
    • H01J2235/12—Cooling
    • H01J2235/1225—Cooling characterised by method
    • H01J2235/1245—Increasing emissive surface area
    • H01J2235/1254—Increasing emissive surface area with microscopic surface features

Landscapes

  • Apparatus For Radiation Diagnosis (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2007125165A 2006-05-18 2007-05-10 Ｘ線アノードの焦点軌道領域 Expired - Fee Related JP5172200B2 (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/419,078 2006-05-18
US11/419,078 US7356122B2 (en) 2006-05-18 2006-05-18 X-ray anode focal track region

Publications (3)

Publication Number Publication Date
JP2007311340A JP2007311340A (ja) 2007-11-29
JP2007311340A5 JP2007311340A5 (enExample) 2012-07-26
JP5172200B2 true JP5172200B2 (ja) 2013-03-27

Family

ID=38608331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007125165A Expired - Fee Related JP5172200B2 (ja) 2006-05-18 2007-05-10 Ｘ線アノードの焦点軌道領域

Country Status (3)

Country Link
US (1) US7356122B2 (enExample)
JP (1) JP5172200B2 (enExample)
DE (1) DE102007024255A1 (enExample)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102011078520B4 (de) * 2011-07-01 2013-02-21 Siemens Aktiengesellschaft Verfahren zum Herstellen einer Drehanode
DE102011083413B4 (de) 2011-09-26 2018-08-23 Siemens Healthcare Gmbh Verfahren zum Herstellen einer Röntgenanode und Röntgenanode
AT12462U3 (de) 2012-01-09 2013-05-15 Plansee Se Röntgendrehanode mit zumindest anteilig radial ausgerichteter schleifstruktur
US10487416B2 (en) 2015-06-15 2019-11-26 General Electric Company Electrochemical machining employing electrical voltage pulses to drive reduction and oxidation reactions
DE102018128552A1 (de) 2018-11-14 2020-05-14 Hochschule Magdeburg-Stendal Untersuchungsvorrichtung zur Durchführung diagnostischer Untersuchungen und/oder therapeutischer Verfahren
AT17122U1 (de) * 2020-02-10 2021-06-15 Plansee Se Röntgendrehanode
US11581160B2 (en) 2020-02-25 2023-02-14 GE Precision Healthcare LLC Methods and systems for x-ray tube with texturing
EP3933881A1 (en) 2020-06-30 2022-01-05 VEC Imaging GmbH & Co. KG X-ray source with multiple grids
US12405392B1 (en) * 2022-05-03 2025-09-02 Triad National Security, Llc Electroplated materials and array design for scintillators
US12320029B2 (en) 2022-06-17 2025-06-03 General Electric Company Methods and systems of electrochemical machining
US12350750B2 (en) 2022-06-17 2025-07-08 General Electric Company Methods and systems of electrochemical machining
US12230468B2 (en) 2022-06-30 2025-02-18 Varex Imaging Corporation X-ray system with field emitters and arc protection

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE1937351A1 (de) * 1969-07-23 1971-02-04 Siemens Ag Drehanoden-Roentgenroehre
NL7115946A (enExample) * 1971-11-19 1973-05-22
US4309637A (en) * 1979-11-13 1982-01-05 Emi Limited Rotating anode X-ray tube
JPS57154756A (en) * 1981-03-20 1982-09-24 Toshiba Corp Rotary anode for x-ray tube
US4455504A (en) * 1981-04-02 1984-06-19 Iversen Arthur H Liquid cooled anode x-ray tubes
FR2617332B1 (fr) * 1987-06-26 1995-06-23 Thomson Cgr Tube radiogene a faible rayonnement extra-focal
FR2625605A1 (fr) * 1987-12-30 1989-07-07 Thomson Cgr Anode tournante pour tube a rayons x
JPH02172149A (ja) 1988-12-24 1990-07-03 Hitachi Ltd 回転陽極ｘ線管用ターゲツト
US5148463A (en) * 1991-11-04 1992-09-15 General Electric Company Adherent focal track structures for X-ray target anodes having diffusion barrier film therein and method of preparation thereof
US5541975A (en) * 1994-01-07 1996-07-30 Anderson; Weston A. X-ray tube having rotary anode cooled with high thermal conductivity fluid
US5722870A (en) * 1995-12-22 1998-03-03 General Electric Company System and method for manufacturing x-ray tubes having glass envelopes
US5629970A (en) * 1996-01-11 1997-05-13 General Electric Company Emissivity enhanced x-ray target
US6115454A (en) * 1997-08-06 2000-09-05 Varian Medical Systems, Inc. High-performance X-ray generating apparatus with improved cooling system
US6005918A (en) * 1997-12-19 1999-12-21 Picker International, Inc. X-ray tube window heat shield
US7079625B2 (en) * 2003-01-20 2006-07-18 Siemens Aktiengesellschaft X-ray anode having an electron incident surface scored by microslits

Also Published As

Publication number Publication date
DE102007024255A1 (de) 2007-11-22
US20070269015A1 (en) 2007-11-22
US7356122B2 (en) 2008-04-08
JP2007311340A (ja) 2007-11-29

Similar Documents

Publication Publication Date Title
JP5172200B2 (ja) Ｘ線アノードの焦点軌道領域
US7215741B2 (en) X-ray generating apparatus
JP7095083B2 (ja) 半導体計測用の液体金属回転式アノードｘ線照明源、ｘ線ベース計測システム、ｘ線放射発生方法
US5857008A (en) Microfocus X-ray device
JP4801903B2 (ja) 電子ビームを用いたエッチングにおける終点検出ための方法および装置
JP2004351203A (ja) コンパクトなｘ線源組立体を持つ静止型コンピュータ断層撮影システム
CN101290858A (zh) 钎焊x射线管靶的发射层
US20090285363A1 (en) Apparatus for increasing radiative heat transfer in an x-ray tube and method of making same
KR20040085163A (ko) 대면적 개별 어드레스 가능한 다중 빔 ｘ선 시스템
US20240347310A1 (en) X-ray tube cathode focusing element
JP2004006348A (ja) Ｘ線管用の薄型回転プレート・ターゲット
CN1162242A (zh) X射线装置
JP6100560B2 (ja) 液体金属軸受け用の濡れ防止皮膜及びその製造方法
TW202203281A (zh) 基於具有電子發射器陣列的x射線源之半導體量測及檢測
EP4202968A2 (en) X-ray cathode focusing element
US20090086919A1 (en) Apparatus for x-ray generation and method of making same
JP2019519900A (ja) Ｘ線の生成に使用するためのカソードアセンブリ
US8428222B2 (en) X-ray tube target and method of repairing a damaged x-ray tube target
US10304652B2 (en) Fabrication methods and modal stiffining for non-flat single/multi-piece emitter
CN115116810A (zh) X射线阳极、x射线辐射器和用于制造x射线阳极的方法
EP4358113A2 (en) System and method for creating a vacuum in an x-ray tube
US11581160B2 (en) Methods and systems for x-ray tube with texturing
WO2019172269A1 (ja) 位相イメージング用ｘ線発生装置
CN117790268A (zh) X射线管装置以及x射线ct装置
JPH01109646A (ja) レーザプラズマｘ線源

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20100428

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20100428

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20110420

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20120613

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120905

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120911

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121105

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121211

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20121226

R150 Certificate of patent or registration of utility model

Ref document number: 5172200

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees