JP5161672B2 - Package for receiving semiconductor light receiving elements - Google Patents

Package for receiving semiconductor light receiving elements Download PDF

Info

Publication number
JP5161672B2
JP5161672B2 JP2008169850A JP2008169850A JP5161672B2 JP 5161672 B2 JP5161672 B2 JP 5161672B2 JP 2008169850 A JP2008169850 A JP 2008169850A JP 2008169850 A JP2008169850 A JP 2008169850A JP 5161672 B2 JP5161672 B2 JP 5161672B2
Authority
JP
Japan
Prior art keywords
plating film
semiconductor light
receiving element
light receiving
ceramic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2008169850A
Other languages
Japanese (ja)
Other versions
JP2010010517A (en
Inventor
英二 高橋
Original Assignee
日鉄住金エレクトロデバイス株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 日鉄住金エレクトロデバイス株式会社 filed Critical 日鉄住金エレクトロデバイス株式会社
Priority to JP2008169850A priority Critical patent/JP5161672B2/en
Publication of JP2010010517A publication Critical patent/JP2010010517A/en
Application granted granted Critical
Publication of JP5161672B2 publication Critical patent/JP5161672B2/en
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Landscapes

  • Solid State Image Pick-Up Elements (AREA)
  • Light Receiving Elements (AREA)

Description

本発明は、外部と電気的に導通状態とするために金属製の外部接続端子を固着させて設けたセラミック製の半導体受光素子収納用パッケージに関し、より詳細には、CCD(Charge Coupled Device)型や、MOS(Metal Oxide Semiconductor)型等の半導体受光素子を搭載し、外部接続端子を介して外部と電気的に導通状態とするための半導体受光素子収納用パッケージに関する。   BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a ceramic semiconductor light receiving element storage package provided with a metal external connection terminal fixed to be electrically connected to the outside, and more specifically, a CCD (Charge Coupled Device) type. Further, the present invention relates to a package for housing a semiconductor light receiving element, which is mounted with a semiconductor light receiving element such as a MOS (Metal Oxide Semiconductor) type and is electrically connected to the outside via an external connection terminal.

従来から、半導体受光素子は、光を直接関知するするにおいて、大気中の水分や化学物質等により破損しやすく、取り扱いに注意を必要としている。この半導体受光素子を収納するための半導体受光素子収納用パッケージには、例えば、平板形状のセラミック製の基体と、窓枠形状のセラミック製の枠体と、その間にFe−Ni系合金(以下、42アロイと呼ぶ)等からなる外部接続端子をガラスで接合して形成している。そして、更に、半導体受光素子収納用パッケージには、外部に露出する外部接続端子の表面に外部からの酸化を防止したり、ワイヤボンディング性を確保するために厚さ1.0〜8.0μm程度のNiめっき被膜と、この上面に0.1〜0.3μm程度のAuめっき被膜を施している。この半導体受光素子収納用パッケージには、セラミック基体とセラミック枠体とで形成されるキャビティ部に半導体受光素子を搭載し、半導体受光素子に設けるボンディングパッドと、キャビティ部内に突出する外部接続端子の表面のAuめっき被膜との間をボンディングワイヤで接続した後、セラミック枠体にガラスやサファイア板等からなる蓋体を接合させることで半導体受光素子をキャビティ部内に気密封止していた。そして、半導体受光素子と外部の回路基板との電気的な接続は、半導体受光素子収納用パッケージの外部に突出する外部接続端子と、回路基板を半田で接合させ、この外部接続端子を介して行われている。このような半導体受光素子収納用パッケージにおいては、電気信号を安定して高速に伝送する性質が求められ、且つ安価に製造できる構造とする必要があった。   2. Description of the Related Art Conventionally, semiconductor light receiving elements are easily damaged by moisture, chemical substances, etc. in the atmosphere when directly sensing light, and handling thereof requires attention. The semiconductor light-receiving element storage package for storing the semiconductor light-receiving element includes, for example, a flat plate-shaped ceramic base, a window frame-shaped ceramic frame, and an Fe—Ni-based alloy (hereinafter referred to as a “frame”). The external connection terminal made of 42 alloy is joined with glass. Further, the semiconductor light receiving element storage package has a thickness of about 1.0 to 8.0 μm in order to prevent external oxidation on the surface of the external connection terminal exposed to the outside or to secure wire bonding property. The Ni plating film and an Au plating film of about 0.1 to 0.3 μm are applied on this upper surface. In this semiconductor light receiving element storage package, a semiconductor light receiving element is mounted in a cavity formed by a ceramic base and a ceramic frame, and bonding pads provided on the semiconductor light receiving element and surfaces of external connection terminals protruding into the cavity are provided. Then, the semiconductor light-receiving element was hermetically sealed in the cavity portion by connecting a lid made of glass, sapphire plate, or the like to the ceramic frame body. The electrical connection between the semiconductor light receiving element and the external circuit board is performed by connecting the external connection terminal protruding outside the package for housing the semiconductor light receiving element and the circuit board with solder, and through the external connection terminal. It has been broken. Such a package for housing a semiconductor light receiving element is required to have a structure capable of stably transmitting electric signals at high speed and capable of being manufactured at low cost.

しかしながら、上記のような従来の半導体受光素子収納用パッケージは、セラミック基体とセラミック枠体との間に外部接続端子をガラスを加熱して接合させる必要があるために、セラミックと熱膨張係数が近似する42アロイのような高価な金属からなる外部接続端子を必要とするのと、高価なNiや、Auのめっき被膜を比較的厚く設けているので、半導体受光素子収納用パッケージが非常に高価なものとなると共に、42アロイがFe−Ni系合金からなることで電気信号の伝送速度に問題を抱えている。   However, since the conventional package for housing a semiconductor light receiving element as described above needs to join the external connection terminal by heating the glass between the ceramic base and the ceramic frame, the thermal expansion coefficient is close to that of the ceramic. Since the external connection terminal made of expensive metal such as 42 alloy is required and the expensive Ni or Au plating film is provided relatively thickly, the package for housing the semiconductor light receiving element is very expensive. In addition, since the 42 alloy is made of an Fe—Ni alloy, there is a problem in the transmission speed of electric signals.

従来の半導体受光素子収納用パッケージ用の外部接続端子には、例えば、特許文献1に開示されているような「半導体装置用リードフレーム」という名称で、CuまたはCu合金素材面に複数層の金属被膜が形成された半導体装置用リードフレームが開示されている。この半導体装置用リードフレームは、CuまたはCu合金素材全面にNi下地被膜を介して厚さ0.3μm以下のPdまたはPd合金被膜が形成されているとともに、リードフレームのアウターリードに形成されたPdまたはPd合金被膜上に、Auめっき被膜が0.001から0.1μmの厚さに形成されている。この半導体装置用リードフレームには、半導体素子を接合させるためのダイパッド用のリードフレーム上に半導体素子を載置させると共に、半導体素子とダイパッド用のリードフレームに近接して設けるリードフレームの一方の端子間をボンディングワイヤで接続した後、リードフレームの他方の端子部を外部に露出させて全体をモールディングして半導体装置としている。   A conventional external connection terminal for a package for housing a semiconductor light receiving element includes, for example, the name “lead frame for a semiconductor device” as disclosed in Patent Document 1, and a plurality of layers of metal on a Cu or Cu alloy material surface. A lead frame for a semiconductor device having a coating formed thereon is disclosed. In this lead frame for a semiconductor device, a Pd or Pd alloy film having a thickness of 0.3 μm or less is formed on the entire surface of the Cu or Cu alloy material via a Ni undercoat, and Pd formed on the outer lead of the lead frame. Alternatively, an Au plating film having a thickness of 0.001 to 0.1 μm is formed on the Pd alloy film. In this lead frame for a semiconductor device, a semiconductor element is placed on a lead frame for a die pad for bonding a semiconductor element, and one terminal of a lead frame provided close to the lead frame for the semiconductor element and the die pad After connecting them with a bonding wire, the other terminal portion of the lead frame is exposed to the outside and the whole is molded to obtain a semiconductor device.

特許第2543619号公報Japanese Patent No. 2543619

しかしながら、前述したような従来の半導体受光素子収納用パッケージは、次のような問題がある。
特許第2543619号公報で開示されるような半導体装置用リードフレームである外部接続端子を用いた半導体受光素子収納用パッケージは、Cu、又はCu合金を用いることで電気信号を安定して高速に伝送することができ、比較的安価なCu材で、しかも高価なAuめっき被膜を薄くして安価な外部接続端子を形成することができるものの、この外部接続端子をセラミック基体とセラミック枠体との間に介設させてガラスで固着させるのに、500℃程度の加熱が必要でありセラミックと外部接続端子との熱膨張係数差が大きくなって接合信頼性に問題が発生することで安価な半導体受光素子収納用パッケージを構成することができなくなっている。また、外部接続端子の金属にCuを用いる場合には、Cuの強度(引張強さや、ビッカース硬さ等)が低いので、外部接続端子としての形状が保てなく、半導体受光素子収納用パッケージを構成することができなくなっている。更に、外部接続端子の金属にCu合金を用いる場合には、Cuに含有させる金属を限定することでCu合金の強度が得られので、単なるCu合金の全てが使用できるものではなく、添加させる金属を選定することが必要である。
However, the conventional semiconductor light receiving element storage package as described above has the following problems.
A package for housing a semiconductor light receiving element using an external connection terminal, which is a lead frame for a semiconductor device as disclosed in Japanese Patent No. 2543619, stably transmits electric signals at high speed by using Cu or a Cu alloy. Although it is possible to form an inexpensive external connection terminal with a relatively inexpensive Cu material and by thinning an expensive Au plating film, the external connection terminal is provided between the ceramic base and the ceramic frame. It is necessary to heat at about 500 ° C. to fix it with glass, and the difference in the thermal expansion coefficient between the ceramic and the external connection terminal becomes large, causing a problem in bonding reliability. An element storage package cannot be configured. Further, when Cu is used for the metal of the external connection terminal, since the strength (tensile strength, Vickers hardness, etc.) of Cu is low, the shape as the external connection terminal cannot be maintained, and the package for housing the semiconductor light receiving element is used. It can no longer be configured. Furthermore, when a Cu alloy is used for the metal of the external connection terminal, the strength of the Cu alloy can be obtained by limiting the metal to be contained in Cu, so not all of the Cu alloy can be used, but the metal to be added It is necessary to select

本発明は、かかる事情に鑑みてなされたものであって、外部接続端子に電気信号を安定して高速に伝送することができ、安価で接合信頼性の高い構造を有する半導体受光素子収納用パッケージを提供することを目的とする。   SUMMARY OF THE INVENTION The present invention has been made in view of such circumstances, and is a package for housing a semiconductor light receiving element that can stably transmit electric signals to an external connection terminal at high speed, and has a structure that is inexpensive and has high bonding reliability. The purpose is to provide.

前記目的に沿う本発明に係る半導体受光素子収納用パッケージは、平板形状のセラミック基体と、セラミック基体の上面に接合され半導体受光素子を収納するためのキャビティ部を形成するセラミック基体の外形寸法と略同じ外形寸法を有する窓枠形状のセラミック枠体と、セラミック基体とセラミック枠体との間に介設されセラミック枠体の内周側からと、セラミック基体及びセラミック枠体の外周側からリード端子部をそれぞれ突出するようにしてエポキシ樹脂からなる接合材で固着するリードフレーム形状の外部接続端子を有する半導体受光素子収納用パッケージにおいて、外部接続端子がCu97重量%以上、残部にFe、P、Znの全てを含有するCu合金からなると共に、少なくともリード端子部の外部に露出する表面に0.2〜3.0μm厚のNiめっき被膜、Niめっき被膜の表面に0.01〜0.15μm厚のPdめっき被膜、及びPdめっき被膜の表面に0.003〜0.02μm厚の薄いフラッシュAuめっき被膜の3層からなるそれぞれが電解めっき方法で形成されるめっき被膜を有する。
The package for housing a semiconductor light receiving element according to the present invention that meets the above-mentioned object is substantially the same as the outer dimensions of the ceramic base that forms a flat ceramic base and a cavity that is bonded to the upper surface of the ceramic base and houses the semiconductor light receiving element. A window frame-shaped ceramic frame having the same outer dimensions, a lead terminal portion from the inner peripheral side of the ceramic frame interposed between the ceramic base and the ceramic frame, and from the outer peripheral side of the ceramic base and the ceramic frame In the package for housing a semiconductor light receiving element having lead frame-shaped external connection terminals that are fixed to each other with a bonding material made of an epoxy resin so that each of the external connection terminals is Cu 97 wt% or more, and the balance is Fe, P, Zn with a Cu alloy containing all the surface exposed to the outside at least the lead terminal portion 0.2 3.0μm thick Ni plating film on the surface of the Ni plating film 0.01~0.15μm thickness of Pd plating film, and Pd on the surface of the plated coating 0.003~0.02μm thickness of thin flash Au plating film Each of the three layers has a plating film formed by an electrolytic plating method .

上記構成の半導体受光素子収納用パッケージは、間に外部接続端子を介設させ、セラミック基体と略同じ外形寸法を有する窓枠形状のセラミック枠体とで形成されるキャビティ部の中空部に半導体受光素子を収納することができるという作用を有する。また、この半導体受光素子収納用パッケージは、Cu97重量%以上、残部にFe、P、Znの全てを含有するCu合金からなる複数本の外部接続端子がキャビティ部に収納された半導体受光素子からの電気信号をパッケージの外周側に伝送することができるという作用を有する。更に、この半導体受光素子収納用パッケージは、セラミック基体、セラミック枠体、及び外部接続端子がエポキシ樹脂で固着されて形成されるキャビティ部側に露出する外部接続端子の一方のリード端子部がボンディングワイヤを介して半導体受光素子と電気的に接続するための接続パッド部とすることができるという作用を有する。そして、パッケージの外周部側に露出する外部接続端子の他方のリード端子部は、回路基板である、例えば、ボード等に半田等を介して接合するための接合部とすることができるという作用を有する。   The semiconductor light receiving element storage package having the above structure has a semiconductor light receiving portion in a hollow portion of a cavity formed by a window frame-shaped ceramic frame having an external connection terminal interposed therebetween and having substantially the same external dimensions as the ceramic base. It has the effect | action that an element can be accommodated. The package for housing a semiconductor light receiving element includes a semiconductor light receiving element in which a plurality of external connection terminals made of a Cu alloy containing at least 97 wt% Cu and all of Fe, P, and Zn are contained in the cavity. An electric signal can be transmitted to the outer peripheral side of the package. Further, in this semiconductor light receiving element storage package, one lead terminal portion of the ceramic base, the ceramic frame, and the external connection terminal exposed to the cavity portion formed by fixing the external connection terminal with an epoxy resin is a bonding wire. It has the effect | action that it can be set as the connection pad part for electrically connecting with a semiconductor light receiving element via this. Then, the other lead terminal portion of the external connection terminal exposed on the outer peripheral portion side of the package is a circuit board, for example, an effect that it can be a joint portion for joining to a board or the like via solder or the like. Have.

また、この半導体受光素子収納用パッケージは、少なくともパッケージの外部と、キャビティ部内に露出するそれぞれのリード端子部の表面に、Niめっき被膜、その表面にPdめっき被膜、及び、その表面にAuめっき被膜からなる3層からなるめっき被膜を有することで、キャビティ部側に露出する一方のリード端子部にボンディングワイヤを安定して接続することができ、パッケージの外周部側に露出する他方のリード端子部に半田等を介して回路基板に安定して接合できるという作用を有している。   In addition, this semiconductor light receiving element storage package has a Ni plating film on the surface of each lead terminal part exposed at least outside the package and in the cavity part, a Pd plating film on the surface, and an Au plating film on the surface. By having a three-layer plating coating consisting of the bonding wire can be stably connected to one lead terminal portion exposed to the cavity portion side, and the other lead terminal portion exposed to the outer peripheral portion side of the package In addition, it has an effect that it can be stably bonded to the circuit board via solder or the like.

特に、めっき被膜は、3層で構成する中で、Auめっき被膜を厚さ0.02μm以下の薄いフラッシュAuめっき被膜で構成でき、十分なワイヤボンディング性を有しながら安価に作製できる構造とすることができるという作用を有している。   In particular, the plating film is composed of three layers, and the Au plating film can be composed of a thin flash Au plating film having a thickness of 0.02 μm or less, and has a structure that can be manufactured at low cost while having sufficient wire bonding properties. It has the effect of being able to.

請求項1記載の半導体受光素子収納用パッケージは、平板形状のセラミック基体と、セラミック基体の上面に接合され半導体受光素子を収納するためのキャビティ部を形成するセラミック基体の外形寸法と略同じ外形寸法を有する窓枠形状のセラミック枠体と、セラミック基体とセラミック枠体との間に介設されセラミック枠体の内周側からと、セラミック基体及びセラミック枠体の外周側からリード端子部をそれぞれ突出するようにしてエポキシ樹脂からなる接合材で固着するリードフレーム形状の外部接続端子を有する半導体受光素子収納用パッケージにおいて、外部接続端子がCu97重量%以上、残部にFe、P、Znの全てを含有するCu合金からなると共に、少なくともリード端子部の外部に露出する表面に0.2〜3.0μm厚のNiめっき被膜、Niめっき被膜の表面に0.01〜0.15μm厚のPdめっき被膜、及びPdめっき被膜の表面に0.003〜0.02μm厚の薄いフラッシュAuめっき被膜の3層からなるそれぞれが電解めっき方法で形成されるめっき被膜を有するので、セラミック基体、セラミック枠体、及び外部接続端子を固着させる接合材に150℃程度の低温で接合できるエポキシ樹脂を用いることで、セラミックと熱膨張係数が大幅に異なってもCu合金からなる外部接続端子を用いることができると共に、Cu合金がCu97重量%以上、残部にFe、P、Znの全てを含有して強度が高く取り扱いが容易なパッケージが構成でき、電気信号を安定して高速に伝送させることができる。また、半導体受光素子収納用パッケージは、Cu合金を用いる外部接続端子に比較的薄くしたNiめっき被膜、Auめっき被膜の厚み分を肩代わりできるPdめっき被膜、及び薄いAuめっき被膜の3層からなるめっき被膜を設ける構成からなるので、外部接続端子に十分なワイヤボンディング性と、半田付け性を確保させながら、安価に作製できる構造とすることができる。更に、Auめっき被膜が電解めっき方法で形成される厚さ0.003〜0.02μmの薄いフラッシュAuめっき被膜からなり、容易に高価なAuを用いたAuめっき被膜を薄くすることができ、安価なパッケージとすることができる。
The semiconductor light-receiving element storage package according to claim 1 Symbol placement is substantially the same external and external dimensions of the ceramic base to form a cavity for accommodating the ceramic substrate of a flat plate shape, a semiconductor light receiving element is bonded to the upper surface of the ceramic substrate The window frame-shaped ceramic frame having a size, the lead terminal portion from the inner peripheral side of the ceramic frame interposed between the ceramic base and the ceramic frame, and the lead terminal portion from the outer peripheral side of the ceramic base and the ceramic frame, respectively In a semiconductor light receiving element storage package having a lead frame-shaped external connection terminal which is fixed by a bonding material made of an epoxy resin so as to protrude , the external connection terminal is 97% by weight or more of Cu, and the balance is Fe, P, Zn. with a Cu alloy containing, 0.2 to 3.0 [mu] m on the surface exposed to the outside at least the lead terminal portion Composed of three layers of Ni plating film, Ni 0.01~0.15Myuemu thickness of Pd plating film on the surface of the plating film, and the surface 0.003~0.02μm thickness of the thin flash Au plating film of Pd plating film Since each of them has a plating film formed by an electrolytic plating method, an epoxy resin that can be bonded at a low temperature of about 150 ° C. is used as a bonding material for fixing the ceramic substrate, the ceramic frame, and the external connection terminals. An external connection terminal made of a Cu alloy can be used even if the expansion coefficients are significantly different, and the Cu alloy contains at least 97% by weight of Cu and the remainder contains all of Fe, P, and Zn, and has high strength and is easy to handle. A package can be constructed, and electric signals can be transmitted stably and at high speed. The semiconductor light receiving element storage package is a plating composed of three layers: a relatively thin Ni plating film on the external connection terminal using a Cu alloy, a Pd plating film that can replace the thickness of the Au plating film, and a thin Au plating film. than ing from the configuration of providing the coating may be sufficient wire bondability to the external connection terminal, while securing the solderability, and low cost manufacturing can be structured. Furthermore, the Au plating film is made of a thin flash Au plating film having a thickness of 0.003 to 0.02 μm formed by an electrolytic plating method, and the Au plating film using expensive Au can be easily made thin and inexpensive. Package.

なお、上記の半導体受光素子収納用パッケージは、外部接続端子に予めNiめっき被膜、Pdめっき被膜、及びAuめっき被膜を設けることで容易にパッケージを構成でき、安価なパッケージとすることができる。あるいは、半導体受光素子収納用パッケージは、外部接続端子にめっき被膜を設ける前に接合体を形成し、この接合体の外部に露出する外部接続端子にNiめっき被膜、Pdめっき被膜、及びAuめっき被膜を設けてパッケージを構成し、ワイヤボンディングや、半田付けの不要な部分に高価なめっき被膜を設けないことで更に安価なパッケージとすることができる。   The package for housing a semiconductor light receiving element can be easily configured by providing a Ni plating film, a Pd plating film, and an Au plating film in advance on the external connection terminals, and can be made into an inexpensive package. Alternatively, in the package for housing a semiconductor light receiving element, a joined body is formed before the plating film is provided on the external connection terminal, and the Ni plating film, the Pd plating film, and the Au plating film are formed on the external connection terminal exposed to the outside of the joined body. A package can be formed by providing a wire, and an expensive plating film is not provided on a portion that does not require wire bonding or soldering.

続いて、添付した図面を参照しながら、本発明を具体化した実施するための最良の形態について説明し、本発明の理解に供する。
ここに、図1(A)、(B)はそれぞれ本発明の一実施の形態に係る半導体受光素子収納用パッケージの平面図、A−A’線拡大縦断面図である。
Subsequently, the best mode for carrying out the present invention will be described with reference to the accompanying drawings to provide an understanding of the present invention.
Here, FIGS. 1A and 1B are a plan view and an AA ′ line enlarged vertical sectional view of a semiconductor light receiving element storage package according to an embodiment of the present invention, respectively.

図1(A)、(B)に示すように、本発明の一実施の形態に係る半導体受光素子収納用パッケージ10は、平板形状のセラミック基体11と、このセラミック基体11の外形寸法と略同じ外形寸法を有する窓枠形状のセラミック枠体12と、セラミック基体11とセラミック枠体12との間に介設される複数本からなるリードフレーム形状の外部接続端子13とで構成されている。この半導体受光素子収納用パッケージ10は、外部接続端子13を介設させて接合材14で固着させたセラミック基体11の上面と、セラミック枠体12の内周側壁面とで半導体受光素子を収納するためのキャビティ部15を形成している。また、この半導体受光素子収納用パッケージ10は、外部接続端子13をセラミック枠体12の内周側からキャビティ部15の内部と、セラミック基体11及びセラミック枠体12の外周側からパッケージの外部にリード端子部をそれぞれ突出するようにして固着している。   As shown in FIGS. 1A and 1B, a semiconductor light receiving element storage package 10 according to an embodiment of the present invention has a flat plate-like ceramic base 11 and substantially the same external dimensions as the ceramic base 11. A window frame-shaped ceramic frame body 12 having external dimensions and a plurality of lead frame-shaped external connection terminals 13 interposed between the ceramic base body 11 and the ceramic frame body 12 are configured. The semiconductor light receiving element storage package 10 stores a semiconductor light receiving element between an upper surface of a ceramic substrate 11 that is fixed by a bonding material 14 with an external connection terminal 13 interposed therebetween and an inner peripheral side wall surface of the ceramic frame body 12. A cavity portion 15 is formed. The semiconductor light receiving element storage package 10 leads the external connection terminals 13 from the inner peripheral side of the ceramic frame 12 to the inside of the cavity 15 and from the outer peripheral sides of the ceramic base 11 and the ceramic frame 12 to the outside of the package. The terminal portions are fixed so as to protrude.

上記のセラミック基体11や、セラミック枠体12は、セラミックの一例であるアルミナ(Al)や、窒化アルミニウム(AlN)等からなり、例えば、Al等のセラミック粉末と、バインダー等を混合した水溶液をスプレードライヤーで乾燥して作製した造粒粉末原料を上金型、下金型、及びダイス等からなる粉末プレス用金型を用いて所望の大きさ、形状にプレス成形して成形体を形成した後、焼成炉で約1550℃程度の高温で焼成してそれぞれ焼成体にしている。そして、それぞれの焼成体は、両面を表面研削機等で切削加工して平坦にしてセラミック基体11や、セラミック枠体12としている。 The ceramic base 11 and the ceramic frame 12 are made of alumina (Al 2 O 3 ), aluminum nitride (AlN), or the like, which is an example of ceramic. For example, ceramic powder such as Al 2 O 3 and a binder The granulated powder raw material prepared by drying the aqueous solution mixed with a spray dryer is press-molded into a desired size and shape using a powder press die consisting of an upper die, a lower die, and a die. After forming the formed body, each is formed into a fired body by firing at a high temperature of about 1550 ° C. in a firing furnace. Each fired body is cut and flattened by a surface grinder or the like to form a ceramic base body 11 or a ceramic frame body 12.

上記の半導体受光素子収納用パッケージ10は、セラミック基体11、セラミック枠体12、及び外部接続端子13を固着させる接合材14がエポキシ樹脂からなっている。このエポキシ樹脂の接合材14は、大気中の加熱装置内で約150℃程度の低温で、1時間程度加熱して硬化させることで固着させることができる。従って、半導体受光素子収納用パッケージ10は、セラミック基体11や、セラミック枠体12と熱膨張係数が大きく異なる外部接続端子13を固着させるのに低い温度で処理できるので、接合信頼性に問題を発生させることなく固着させることができる。なお、セラミック基体11、セラミック枠体12、及び外部接続端子13の接合材14での固着方法は、通常、先ず、セラミック基体11と、セラミック枠体12のそれぞれの外部接続端子13との接合部分となるところに硬化前のペースト状のエポキシ樹脂をスクリーン印刷し乾燥させて所定厚みを形成している。次に、セラミック基体11、外部接続端子13、及びセラミック枠体12は、固着用治具にこの順序でそれぞれを位置決めしてセットした後、上記の加熱装置を用いて上記の温度と、時間で加熱して硬化させ半導体受光素子収納用パッケージ10を作製している。   In the semiconductor light receiving element storage package 10 described above, the bonding material 14 for fixing the ceramic base 11, the ceramic frame 12, and the external connection terminal 13 is made of an epoxy resin. The epoxy resin bonding material 14 can be fixed by heating and curing for about 1 hour at a low temperature of about 150 ° C. in a heating apparatus in the atmosphere. Therefore, the semiconductor light receiving element storage package 10 can be processed at a low temperature to fix the ceramic base 11 and the external connection terminal 13 having a coefficient of thermal expansion greatly different from that of the ceramic frame 12, which causes a problem in bonding reliability. It is possible to fix without causing. The fixing method of the ceramic base 11, the ceramic frame 12, and the external connection terminal 13 with the bonding material 14 is usually performed by first joining the ceramic base 11 and each external connection terminal 13 of the ceramic frame 12. Then, a paste-like epoxy resin before curing is screen-printed and dried to form a predetermined thickness. Next, the ceramic base 11, the external connection terminal 13, and the ceramic frame 12 are positioned and set in this order on the fixing jig, and then the above temperature and time are set using the above heating device. The semiconductor light receiving element storage package 10 is manufactured by heating and curing.

この半導体受光素子収納用パッケージ10は、外部接続端子13がCuを97重量%以上含有し、残部にFeと、Pと、Znの全てを含有するCu合金からなっている。なお、このCu合金は、Cuの含有量が97重量%を下まわる場合には、電気信号の伝送速度が遅くなるので好ましくない。また、このCu合金は、Cu合金中のFe、P、Znの全体含有量が3重量%以下となり、特に、それぞれの含有量を限定するものではないが、Feを2.1〜2.6重量%、Pを0.015〜0.15重量%、Znを0.05〜0.20重量%の範囲内で含有するのが好ましい。上記の範囲の含有量で構成されるCu合金からなる外部接続端子13は、高い強度と伸びを有してリード端子の形状を保ち、且つ加工性に優れると共に、電気信号の伝送速度を高めることができる。また、このCu合金は、耐食性に優れ、特に、応力腐蝕割れの発生を防止することができる外部接続端子13を形成することができる。   In the semiconductor light receiving element storage package 10, the external connection terminal 13 is made of Cu alloy containing 97 wt% or more of Cu, and the balance is Fe, P, and Zn. It is to be noted that this Cu alloy is not preferable when the Cu content is less than 97% by weight because the transmission speed of the electric signal becomes slow. In addition, this Cu alloy has a total content of Fe, P, and Zn in the Cu alloy of 3% by weight or less, and the content of Fe is not particularly limited, but Fe is 2.1 to 2.6. It is preferable to contain within a range of wt%, P of 0.015 to 0.15 wt%, and Zn of 0.05 to 0.20 wt%. The external connection terminal 13 made of a Cu alloy having a content in the above range has high strength and elongation, maintains the shape of the lead terminal, is excellent in workability, and increases the transmission speed of electric signals. Can do. Moreover, this Cu alloy is excellent in corrosion resistance, and can form the external connection terminal 13 which can prevent especially generation | occurrence | production of stress corrosion cracking.

上記の外部接続端子13は、Cu合金の板状金属板をエッチングや、パンチング等で複数本のリード端子を設けてパターン加工して複数の一方のリード端子部側をキャビティ部15側方向になるようにして解放し、他方のリード端子部側をそれぞれが接続状態となるようにして外周囲を取り巻くタイバー部(図示せず)を設ける平板状のリードフレーム形状体に形成している。そして、この平板状のリードフレーム形状体からは、平板状のままであったり、セラミック基体11の相対向する一方の幅方向に跨げることができる程度の位置を折り曲げたり等することで、タイバー部を有する外部接続端子13に形成している。   The external connection terminal 13 is formed by patterning a plurality of lead terminals by etching or punching a plate metal plate made of Cu alloy, so that one of the plurality of lead terminals is directed toward the cavity 15. In this manner, the other lead terminal portion side is formed into a flat lead frame shape body provided with a tie bar portion (not shown) surrounding the outer periphery so as to be in a connected state. And, from this flat lead frame shape body, by bending the position that can remain in the flat plate shape or straddle one of the opposing width directions of the ceramic substrate 11, The external connection terminal 13 having a tie bar portion is formed.

半導体受光素子収納用パッケージ10は、上記の外部接続端子13の少なくともリード端子部の外部に露出する表面にNiめっき被膜16、このNiめっき被膜16の表面にPdめっき被膜17、及びこのPdめっき被膜17の表面にAuめっき被膜18の3層からなるめっき被膜19を電解めっき方法で形成して有している。上記3層からなるめっき被膜19は、Cu合金板と、これに被覆する3層のそれぞれのめっき被膜16、17、18の組み合わせ構造によって、それぞれのめっき被膜16、17、18の長所を助長させながら、それぞれのめっき被膜16、17、18の欠点を補うことができるようになっている。上記3層のそれぞれのめっき被膜は、特に厚みを限定するものではないが、Niめっき被膜16厚さには、薄すぎないことでCu合金の酸化を防止すると共に、半田濡れ性が確保でき、厚すぎないことでストレスによるCu合金との密着性が損なわれるのを防止することができる厚さが必要である。また、Pdめっき被膜17厚さには、薄すぎないことで薄いAuめっき被膜18厚さをカバーしてワイヤボンド性が損なわれるのを防止することができ、厚すぎないことでパッケージが高価となるのを防止することができる厚さが必要である。更に、Auめっき被膜18厚さは、ワイヤボンド性が損なわれない程度のできるだけ薄い厚さにすることでパッケージが高価になるのを防止できることが必要である。   The semiconductor light receiving element storage package 10 has an Ni plating film 16 on the surface of the external connection terminal 13 exposed at least outside the lead terminal portion, a Pd plating film 17 on the surface of the Ni plating film 16, and the Pd plating film. A plating film 19 composed of three layers of an Au plating film 18 is formed on the surface 17 by an electrolytic plating method. The three-layer plating film 19 promotes the advantages of the respective plating films 16, 17, and 18 by the combined structure of the Cu alloy plate and the three-layer plating films 16, 17, and 18 covering the Cu alloy plate. However, the defect of each plating film 16, 17, 18 can be compensated. Each of the three plating films is not particularly limited in thickness, but the Ni plating film 16 thickness is not too thin to prevent oxidation of the Cu alloy and ensure solder wettability. It is necessary to have a thickness that can prevent the adhesiveness with the Cu alloy from being damaged due to the stress being not too thick. Further, the Pd plating film 17 is not too thin, so that the thin Au plating film 18 can be covered to prevent the wire bondability from being impaired. Thickness that can be prevented is required. Furthermore, it is necessary to prevent the package from becoming expensive by making the Au plating film 18 as thin as possible so that the wire bondability is not impaired.

ここで、半導体受光素子収納用パッケージ10のAuめっき被膜18の厚さは、0.02μm以下の薄いフラッシュAuめっき被膜からなるのがよい。そして、3層のそれぞれのめっき被膜16、17、18の厚さは、好ましい形態として、Niめっき被膜16厚さを0.2〜3.0μm、Pdめっき被膜17厚さを0.01〜0.15μm、Auめっき被膜18厚さを0.003〜0.02μm程度とするのがよい。半導体受光素子収納用パッケージ10は、これらの組み合わせによって、半導体受光素子を収納するためのパッケージとしての要求品質を確保しながら、パッケージを安価にすることができる。   Here, the thickness of the Au plating film 18 of the semiconductor light receiving element storage package 10 is preferably a thin flash Au plating film of 0.02 μm or less. The thickness of each of the three plating films 16, 17, and 18 is preferably as follows: Ni plating film 16 thickness is 0.2 to 3.0 μm, and Pd plating film 17 thickness is 0.01 to 0. The thickness of the Au plating film 18 is preferably about 0.003 to 0.02 μm. With the combination of these, the package 10 for housing the semiconductor light receiving element can reduce the package while ensuring the required quality as a package for housing the semiconductor light receiving element.

なお、上記の半導体受光素子収納用パッケージ10は、図示しないが、外部接続端子13がリードフレーム形状のCu合金板に予めNiめっき被膜16、Pdめっき被膜17、及びAuめっき被膜18を設ける形態であってよい。あるいは、半導体受光素子収納用パッケージ10は、図1(B)に示すような、外部接続端子13に3層からなるめっき被膜19を設ける前にセラミック基体11、セラミック枠体12、及び外部接続端子13を接合材14で固着させた接合体の外部に露出するリードフレーム形状のCu合金板にNiめっき被膜16、Pdめっき被膜17、及びAuめっき被膜18の3層からなるめっき被膜19を設ける形態であってもよい。   Although the semiconductor light receiving element storage package 10 is not shown, the external connection terminal 13 is provided with a Ni plating film 16, a Pd plating film 17, and an Au plating film 18 on a lead frame-shaped Cu alloy plate in advance. It may be. Alternatively, the semiconductor light receiving element storage package 10 has the ceramic base 11, the ceramic frame 12, and the external connection terminals before the three-layer plating film 19 is provided on the external connection terminals 13 as shown in FIG. The lead frame-shaped Cu alloy plate exposed to the outside of the joined body in which 13 is fixed with the joining material 14 is provided with a plating film 19 composed of three layers of a Ni plating film 16, a Pd plating film 17, and an Au plating film 18. It may be.

本発明の半導体受光素子収納用パッケージは、CCD型等の半導体受光素子を搭載し、ファクシミリや、ラインスキャナーや、イメージスキャナー等に用いることができる。また、本発明の半導体受光素子収納用パッケージは、MOS型等の半導体受光素子を搭載し、デジタルカメラや、デジタルビデオカメラ等に用いることができる。   The semiconductor light receiving element storage package of the present invention is equipped with a CCD type semiconductor light receiving element and can be used for a facsimile, a line scanner, an image scanner, and the like. Further, the semiconductor light receiving element housing package of the present invention is equipped with a MOS type semiconductor light receiving element and can be used for a digital camera, a digital video camera, or the like.

(A)、(B)はそれぞれ本発明の一実施の形態に係る半導体受光素子収納用パッケージの斜視図、A−A’線拡大縦断面図である。(A), (B) is a perspective view of the package for housing a semiconductor light receiving element according to an embodiment of the present invention, respectively, and is an enlarged vertical sectional view taken along line A-A ′.

符号の説明Explanation of symbols

10:半導体受光素子収納用パッケージ、11:セラミック基体、12:セラミック枠体、13:外部接続端子、14:接合材、15:キャビティ部、16:Niめっき被膜、17:Pdめっき被膜、18:Auめっき被膜、19:めっき被膜   10: Semiconductor light receiving element storage package, 11: Ceramic substrate, 12: Ceramic frame, 13: External connection terminal, 14: Bonding material, 15: Cavity, 16: Ni plating film, 17: Pd plating film, 18: Au plating film, 19: plating film

Claims (1)

平板形状のセラミック基体と、該セラミック基体の上面に接合され半導体受光素子を収納するためのキャビティ部を形成する前記セラミック基体の外形寸法と略同じ外形寸法を有する窓枠形状のセラミック枠体と、前記セラミック基体と前記セラミック枠体との間に介設され該セラミック枠体の内周側からと、前記セラミック基体及び前記セラミック枠体の外周側からリード端子部をそれぞれ突出するようにしてエポキシ樹脂からなる接合材で固着するリードフレーム形状の外部接続端子を有する半導体受光素子収納用パッケージにおいて、前記外部接続端子がCu97重量%以上、残部にFe、P、Znの全てを含有するCu合金からなると共に、少なくとも前記リード端子部の外部に露出する表面に0.2〜3.0μm厚のNiめっき被膜、該Niめっき被膜の表面に0.01〜0.15μm厚のPdめっき被膜、及び該Pdめっき被膜の表面に0.003〜0.02μm厚の薄いフラッシュAuめっき被膜の3層からなるそれぞれが電解めっき方法で形成されるめっき被膜を有することを特徴とする半導体受光素子収納用パッケージ。 A plate-shaped ceramic base body, and a window frame-shaped ceramic frame body having substantially the same external dimensions as the external dimensions of the ceramic base body that is bonded to the upper surface of the ceramic base body to form a cavity for housing a semiconductor light receiving element; An epoxy resin is provided between the ceramic base and the ceramic frame so that lead terminal portions protrude from the inner peripheral side of the ceramic frame and from the outer peripheral side of the ceramic base and the ceramic frame, respectively. in the semiconductor light-receiving element storage package having an external connection terminal of the lead frame shape fixed by bonding material made of the external connection terminal Cu97% by weight or more, made of a Cu alloy containing any Fe, P, Zn the remainder together, Ni plating 0.2~3.0μm thickness on the surface exposed to the outside of at least the lead terminal portion to be , Pd plating film of 0.01~0.15μm thickness on the surface of the Ni plating film and each consisting of three layers of thin flash Au plating film of 0.003~0.02μm thickness on the surface of the Pd plating film A package for housing a semiconductor light receiving element, comprising a plating film formed by an electrolytic plating method .
JP2008169850A 2008-06-30 2008-06-30 Package for receiving semiconductor light receiving elements Expired - Fee Related JP5161672B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008169850A JP5161672B2 (en) 2008-06-30 2008-06-30 Package for receiving semiconductor light receiving elements

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008169850A JP5161672B2 (en) 2008-06-30 2008-06-30 Package for receiving semiconductor light receiving elements

Publications (2)

Publication Number Publication Date
JP2010010517A JP2010010517A (en) 2010-01-14
JP5161672B2 true JP5161672B2 (en) 2013-03-13

Family

ID=41590625

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2008169850A Expired - Fee Related JP5161672B2 (en) 2008-06-30 2008-06-30 Package for receiving semiconductor light receiving elements

Country Status (1)

Country Link
JP (1) JP5161672B2 (en)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP7172338B2 (en) * 2018-09-19 2022-11-16 富士電機株式会社 Semiconductor device and method for manufacturing semiconductor device

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06342853A (en) * 1993-04-06 1994-12-13 Tokuyama Soda Co Ltd Package for semiconductor element
JP2004079965A (en) * 2002-08-22 2004-03-11 Sumitomo Electric Ind Ltd Optical semiconductor module and its manufacturing method
JP4671744B2 (en) * 2005-04-18 2011-04-20 京セラ株式会社 Image pickup device storage package and image pickup apparatus
JP5193522B2 (en) * 2007-08-01 2013-05-08 日鉄住金エレクトロデバイス株式会社 Ceramic package for storing semiconductor element and manufacturing method thereof

Also Published As

Publication number Publication date
JP2010010517A (en) 2010-01-14

Similar Documents

Publication Publication Date Title
JP5004669B2 (en) Imaging component, imaging unit, and manufacturing method thereof
JP6524003B2 (en) Semiconductor device
JP3816821B2 (en) High frequency power module substrate and manufacturing method thereof
JP5161672B2 (en) Package for receiving semiconductor light receiving elements
JP3404277B2 (en) Package for storing semiconductor elements
JP6849556B2 (en) Electronic device packages and electronic devices
JP4902880B2 (en) Ceramic package
JP2012114362A (en) Package for storing semiconductor and semiconductor device including the same
JP2003100921A (en) Container for optical semiconductor element
JP2014175557A (en) Package for housing semiconductor imaging element
JP6162520B2 (en) Package for housing semiconductor element and mounting structure including the same
JP2746826B2 (en) Electronic component storage package
JP2012049377A (en) Package for housing imaging element and imaging device
JP4511214B2 (en) Electronic component storage package and electronic device
JP4034912B2 (en) Manufacturing method of semiconductor device storage package
JP2003068900A (en) Package for housing electronic component
JP2006128183A (en) Package for storing semiconductor element and semiconductor device
JP5084382B2 (en) Electronic component storage package
JP3181011B2 (en) Package for storing semiconductor elements
JP2003224222A (en) Package for containing semiconductor element
JPH09321261A (en) Surface mount solid-state image sensor device
JP3393784B2 (en) Electronic component storage package
JP2014143355A (en) Hollow package for solid state image sensor, solid state image sensor, and solid state image pick-up device
JP5865783B2 (en) Electronic component storage container and electronic device
JP2728584B2 (en) Method for manufacturing semiconductor device

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20110527

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20120918

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20120926

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20121106

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20121210

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20121214

R150 Certificate of patent or registration of utility model

Ref document number: 5161672

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20151221

Year of fee payment: 3

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees