JP5120862B2 - 低密度パリティ検査符号を使用する通信システムのチャネル符号化装置及びその方法 - Google Patents

低密度パリティ検査符号を使用する通信システムのチャネル符号化装置及びその方法 Download PDF

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JP5120862B2
JP5120862B2 JP2010546703A JP2010546703A JP5120862B2 JP 5120862 B2 JP5120862 B2 JP 5120862B2 JP 2010546703 A JP2010546703 A JP 2010546703A JP 2010546703 A JP2010546703 A JP 2010546703A JP 5120862 B2 JP5120862 B2 JP 5120862B2
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parity check
check matrix
ldpc
code
ldpc code
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JP2011515036A (ja
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セホ ミョン，
ホン−シル ジョン，
キョン−ジュン キム，
ヒョン−クウ ヤン，
キョン−チョル ヤン，
ゼ−ヨル キム，
ファン−ジュン クォン，
ヨン−ジュ リム，
ソン−リュル ユン，
ハク−ジュ リ，
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Samsung Electronics Co Ltd
Academy Industry Foundation of POSTECH
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Samsung Electronics Co Ltd
Academy Industry Foundation of POSTECH
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Priority claimed from KR1020080117264A external-priority patent/KR20090093778A/ko
Priority claimed from KR1020090007662A external-priority patent/KR101192920B1/ko
Application filed by Samsung Electronics Co Ltd, Academy Industry Foundation of POSTECH filed Critical Samsung Electronics Co Ltd
Priority claimed from PCT/KR2009/000767 external-priority patent/WO2009104898A2/en
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JP2010546703A 2008-02-18 2009-02-18 低密度パリティ検査符号を使用する通信システムのチャネル符号化装置及びその方法 Active JP5120862B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
KR20080014649 2008-02-18
KR10-2008-0014649 2008-02-18
KR20080019373 2008-02-29
KR10-2008-0019373 2008-02-29
KR10-2008-0117264 2008-11-25
KR1020080117264A KR20090093778A (ko) 2008-02-29 2008-11-25 저밀도 패리티 검사 부호를 사용하는 통신 시스템에서 채널부호/복호 장치 및 방법
KR1020090007662A KR101192920B1 (ko) 2008-02-18 2009-01-30 저밀도 패리티 검사 부호를 사용하는 통신 시스템에서 채널부호/복호 장치 및 방법
KR10-2009-0007662 2009-01-30
PCT/KR2009/000767 WO2009104898A2 (en) 2008-02-18 2009-02-18 Apparatus and method for encoding and decoding channel in a communication system using low-density parity-check codes

Related Child Applications (2)

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JP2012200590A Division JP5506878B2 (ja) 2008-02-18 2012-09-12 低密度パリティ検査符号のパリティ検査行列生成方法
JP2012200591A Division JP5506879B2 (ja) 2008-02-18 2012-09-12 低密度パリティ検査符号を使用する通信システムのチャネル復号化装置及び方法

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JP2011515036A JP2011515036A (ja) 2011-05-12
JP5120862B2 true JP5120862B2 (ja) 2013-01-16

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JP2012200591A Active JP5506879B2 (ja) 2008-02-18 2012-09-12 低密度パリティ検査符号を使用する通信システムのチャネル復号化装置及び方法
JP2012200590A Active JP5506878B2 (ja) 2008-02-18 2012-09-12 低密度パリティ検査符号のパリティ検査行列生成方法

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JP2012200590A Active JP5506878B2 (ja) 2008-02-18 2012-09-12 低密度パリティ検査符号のパリティ検査行列生成方法

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JP (3) JP5120862B2 (pt)
CN (3) CN103138768B (pt)
AU (1) AU2009216008B2 (pt)
DK (2) DK2093887T3 (pt)
ES (2) ES2437143T3 (pt)
MY (1) MY153328A (pt)
PT (2) PT2093887E (pt)
RU (1) RU2450442C2 (pt)
SI (2) SI2091156T1 (pt)
TW (1) TWI387212B (pt)

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JP2015156530A (ja) * 2014-02-19 2015-08-27 ソニー株式会社 データ処理装置、及び、データ処理方法
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TWI635712B (zh) * 2017-06-21 2018-09-11 晨星半導體股份有限公司 準循環低密度同位檢查碼的解碼電路及其方法
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Publication number Priority date Publication date Assignee Title
JP2012239240A (ja) * 2008-02-18 2012-12-06 Samsung Electronics Co Ltd 低密度パリティ検査符号のパリティ検査行列生成方法
JP2012239241A (ja) * 2008-02-18 2012-12-06 Samsung Electronics Co Ltd 低密度パリティ検査符号を使用する通信システムのチャネル復号化装置及び方法

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AU2009216008B2 (en) 2013-07-25
CN103152055A (zh) 2013-06-12
JP2012239240A (ja) 2012-12-06
ES2437144T3 (es) 2014-01-09
TWI387212B (zh) 2013-02-21
JP5506878B2 (ja) 2014-05-28
MY153328A (en) 2015-01-29
SI2093887T1 (sl) 2013-12-31
JP2012239241A (ja) 2012-12-06
CN103138768B (zh) 2016-06-15
RU2010134401A (ru) 2012-02-27
DK2091156T3 (da) 2013-11-25
AU2009216008A1 (en) 2009-08-27
JP5506879B2 (ja) 2014-05-28
RU2450442C2 (ru) 2012-05-10
TW200939641A (en) 2009-09-16
CN101946414A (zh) 2011-01-12
DK2093887T3 (da) 2013-11-25
PT2091156E (pt) 2013-11-25
JP2011515036A (ja) 2011-05-12
CN103138768A (zh) 2013-06-05
CN101946414B (zh) 2013-08-14
SI2091156T1 (sl) 2013-12-31
CN103152055B (zh) 2016-09-21
ES2437143T3 (es) 2014-01-09
PT2093887E (pt) 2013-11-25

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