JP5078902B2 - 単一光子計数用の読み出しチップ - Google Patents

単一光子計数用の読み出しチップ Download PDF

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Publication number
JP5078902B2
JP5078902B2 JP2008540528A JP2008540528A JP5078902B2 JP 5078902 B2 JP5078902 B2 JP 5078902B2 JP 2008540528 A JP2008540528 A JP 2008540528A JP 2008540528 A JP2008540528 A JP 2008540528A JP 5078902 B2 JP5078902 B2 JP 5078902B2
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Prior art keywords
shift register
counter
chip
bits
channel
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JP2008540528A
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Japanese (ja)
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JP2009519585A (ja
JP2009519585A5 (enExample
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シュミット・ベルント
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Scherrer Paul Institut
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Scherrer Paul Institut
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    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
    • H10F39/10—Integrated devices
    • H10F39/107—Integrated devices having multiple elements covered by H10F30/00 in a repetitive configuration, e.g. radiation detectors comprising photodiode arrays
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
    • H10F30/00—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors
    • H10F30/20—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors
    • H10F30/21—Individual radiation-sensitive semiconductor devices in which radiation controls the flow of current through the devices, e.g. photodetectors the devices having potential barriers, e.g. phototransistors the devices being sensitive to infrared, visible or ultraviolet radiation

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  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Measurement Of Radiation (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
JP2008540528A 2005-11-21 2006-11-20 単一光子計数用の読み出しチップ Active JP5078902B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP05025326.9 2005-11-21
EP05025326A EP1788629A1 (en) 2005-11-21 2005-11-21 A readout chip for single photon counting
PCT/EP2006/011098 WO2007057213A1 (en) 2005-11-21 2006-11-20 A readout chip for single photon counting

Publications (3)

Publication Number Publication Date
JP2009519585A JP2009519585A (ja) 2009-05-14
JP2009519585A5 JP2009519585A5 (enExample) 2012-02-09
JP5078902B2 true JP5078902B2 (ja) 2012-11-21

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Family Applications (1)

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JP2008540528A Active JP5078902B2 (ja) 2005-11-21 2006-11-20 単一光子計数用の読み出しチップ

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US (1) US8039784B2 (enExample)
EP (2) EP1788629A1 (enExample)
JP (1) JP5078902B2 (enExample)
AU (1) AU2006314714B2 (enExample)
WO (1) WO2007057213A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7889831B2 (en) * 2007-12-12 2011-02-15 Promos Technologies Pte. Ltd. N-bit shift register controller
EP2290403A1 (en) * 2009-08-28 2011-03-02 Paul Scherrer Institut X-ray detector with integrating readout chip for single photon resolution
PL2651119T3 (pl) * 2010-12-09 2017-06-30 Rigaku Corporation Detektor promieniowania
EP2490441A1 (en) * 2011-02-16 2012-08-22 Paul Scherrer Institut Single photon counting detector system having improved counter architecture
CN102323959B (zh) * 2011-06-09 2013-04-17 中国科学院西安光学精密机械研究所 用于时间分辨光子计数成像的采集卡
CN104838645A (zh) * 2012-12-20 2015-08-12 索尼公司 成像元件、成像装置、电子设备、阈值计算装置和成像方法
US9935152B2 (en) 2012-12-27 2018-04-03 General Electric Company X-ray detector having improved noise performance
US9029748B2 (en) 2013-03-15 2015-05-12 Her Majesty The Queen In Right Of Canada, As Represented By The Minister Of National Defence Method and apparatus for photon counting with optical space spreading
US9917133B2 (en) 2013-12-12 2018-03-13 General Electric Company Optoelectronic device with flexible substrate
KR101635980B1 (ko) * 2013-12-30 2016-07-05 삼성전자주식회사 방사선 디텍터 및 그에 따른 컴퓨터 단층 촬영 장치
EP3117204B1 (en) 2014-03-13 2021-06-16 General Electric Company Curved digital x-ray detector for weld inspection

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4477918A (en) * 1981-10-13 1984-10-16 Rca Corporation Multiple synchronous counters with ripple read
JPS59122180A (ja) * 1982-12-28 1984-07-14 Toshiba Corp 固体撮像装置
IT1245510B (it) * 1991-02-15 1994-09-29 Marelli Autronica Dispositivo di conteggio e memorizzazione del numero di impulsi di un segnale in un intervallo di tempo
JP3330403B2 (ja) * 1992-11-18 2002-09-30 浜松ホトニクス株式会社 固体撮像装置
US5665959A (en) 1995-01-13 1997-09-09 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Adminstration Solid-state image sensor with focal-plane digital photon-counting pixel array
US6028630A (en) * 1996-11-05 2000-02-22 Sony Corporation Driving control method for imaging element, imaging control method, imaging control device, imaging system and imaging device
JP4012661B2 (ja) * 1999-04-26 2007-11-21 株式会社リコー 信号生成回路、半導体レーザ駆動制御回路及び画像形成装置
AU2003260400A1 (en) 2003-01-10 2004-08-10 Paul Scherrer Institut Photon counting imaging device

Also Published As

Publication number Publication date
EP1952442B1 (en) 2018-01-31
US20090285352A1 (en) 2009-11-19
EP1952442A1 (en) 2008-08-06
US8039784B2 (en) 2011-10-18
EP1788629A1 (en) 2007-05-23
AU2006314714B2 (en) 2010-11-11
JP2009519585A (ja) 2009-05-14
AU2006314714A1 (en) 2007-05-24
WO2007057213A1 (en) 2007-05-24

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