JP5075196B2 - 漏れ電力推定 - Google Patents
漏れ電力推定 Download PDFInfo
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- JP5075196B2 JP5075196B2 JP2009510475A JP2009510475A JP5075196B2 JP 5075196 B2 JP5075196 B2 JP 5075196B2 JP 2009510475 A JP2009510475 A JP 2009510475A JP 2009510475 A JP2009510475 A JP 2009510475A JP 5075196 B2 JP5075196 B2 JP 5075196B2
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- 230000015654 memory Effects 0.000 claims description 21
- 238000000034 method Methods 0.000 claims description 13
- 238000004891 communication Methods 0.000 claims description 8
- 238000013500 data storage Methods 0.000 claims description 3
- 238000012545 processing Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 9
- 238000013461 design Methods 0.000 description 7
- 239000000872 buffer Substances 0.000 description 5
- 230000002093 peripheral effect Effects 0.000 description 4
- 230000007423 decrease Effects 0.000 description 3
- 238000007726 management method Methods 0.000 description 3
- 230000003068 static effect Effects 0.000 description 3
- 238000012360 testing method Methods 0.000 description 3
- 238000004590 computer program Methods 0.000 description 2
- 230000001360 synchronised effect Effects 0.000 description 2
- 241000699666 Mus <mouse, genus> Species 0.000 description 1
- 241000699670 Mus sp. Species 0.000 description 1
- 238000009529 body temperature measurement Methods 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000001419 dependent effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007667 floating Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000009022 nonlinear effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 238000004088 simulation Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R21/00—Arrangements for measuring electric power or power factor
- G01R21/02—Arrangements for measuring electric power or power factor by thermal methods, e.g. calorimetric
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/52—Testing for short-circuits, leakage current or ground faults
-
- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F1/00—Details not covered by groups G06F3/00 - G06F13/00 and G06F21/00
- G06F1/26—Power supply means, e.g. regulation thereof
- G06F1/32—Means for saving power
- G06F1/3203—Power management, i.e. event-based initiation of a power-saving mode
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02D—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE
- Y02D10/00—Energy efficient computing, e.g. low power processors, power management or thermal management
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- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Theoretical Computer Science (AREA)
- Power Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Power Sources (AREA)
- Semiconductor Integrated Circuits (AREA)
- Logic Circuits (AREA)
Description
Claims (19)
- 1つ以上の検知された温度値に対応する第1の信号を生成する第1のロジックと、
対応する電圧セットの複数の基本漏れ電力値を格納し、格納された前記複数の基本漏れ電力値に基づいて1つ以上の電圧値に対応する第2の信号を生成する第2のロジックと、
前記第1の信号および前記第2の信号に基づき、漏れ電力値に対応する第3の信号を生成する第3のロジックと、
を備える装置。 - 前記第3の信号に基づき、コンピュータシステムの1つ以上の構成要素の電力消費を調整する第4のロジックをさらに備える、請求項1に記載の装置。
- 前記1つ以上の電圧値は、閾値電圧の現在の値と、供給電圧の現在の値とを含む、請求項1または請求項2に記載の装置。
- 基本漏れ電力値に対応する第4の信号を生成する第4のロジックをさらに備え、前記第3のロジックは、前記第1の信号、前記第2の信号、および、前記第4の信号に基づき前記第3の信号を生成する、請求項1から請求項3のいずれか1つに記載の装置。
- 前記温度値を検知する1つ以上の温度センサをさらに備える、請求項1から請求項4のいずれか1つに記載の装置。
- 前記第3のロジックは、前記第1の信号と前記第2の信号とを乗じることにより、前記第3の信号を提供する乗算器を含む、請求項1から請求項5のいずれか1つに記載の装置。
- 1つ以上のプロセッサコアをさらに備え、前記1つ以上のプロセッサコアの少なくとも1つは、前記第1のロジック、前記第2のロジック、または、前記第3のロジックの1つ以上を含む、請求項1から請求項6のいずれか1つに記載の装置。
- 1つ以上のプロセッサコアをさらに備え、前記1つ以上のプロセッサコアの少なくとも1つ、前記第1のロジック、前記第2のロジック、および、前記第3のロジックは、同じダイにある、請求項1から請求項6のいずれか1つに記載の装置。
- デバイスから検知された1つ以上の温度値に基づき、温度係数を決定することと、
前記デバイスに対応する1つ以上の電圧値に基づき、電圧係数を決定することと、
前記温度係数、前記電圧係数、および前記デバイスの基準漏れ電力値に基づいて、前記デバイスの漏れ電力値に対応する信号を生成することと、
を含む方法。 - 前記検知することと、前記生成することとは、前記デバイスの実行時間中に実行される、請求項9に記載の方法。
- 前記温度係数を決定することは、記憶装置にアクセスすることを含む、請求項9または請求項10に記載の方法。
- 前記電圧係数を決定することは、記憶装置にアクセスすることを含む、請求項9から請求項11のいずれか1つに記載の方法。
- 複数のスケーリングファクタを表す複数のビットを格納するメモリと、
1つ以上のコンピュータ動作を実行する1つ以上の構成要素を有する第1のロジックと、
検知された温度変化と、前記格納された複数のスケーリングファクタの1つ以上とに少なくとも一部基づき、前記1つ以上の構成要素の少なくとも1つに対応する漏れ電力値に対応する信号を生成する第2のロジックと、
を含み、
前記複数のスケーリングファクタの少なくとも1つは、閾値電圧の現在の値および供給電圧の現在の値に対応し、
前記第2のロジックは、検知された温度変化に基づく温度係数に対応する第1の信号、前記閾値電圧の前記現在の値および前記供給電圧の前記現在の値に基づく電圧係数に対応する第2の信号、および前記1つ以上の構成要素の少なくとも1つに対応する基本漏れ電力値に対応する第3の信号を乗算することで、前記漏れ電力値に対応する第4の信号を生成する乗算器を含むコンピュータシステム。 - 前記第4の信号に対応する漏れ電力値に基づき、前記1つ以上の構成要素の少なくとも1つの電力消費を調整する第3のロジックをさらに備える、請求項13に記載のコンピュータシステム。
- 前記格納された複数のスケーリングファクタは、複数の温度係数と、複数の電圧係数とを含む、請求項13または請求項14に記載のコンピュータシステム。
- 1つ以上のプロセッサコアをさらに備え、前記1つ以上のプロセッサコアの少なくとも1つは、前記第1のロジック、前記第2のロジック、または、前記第3のロジックを含む、請求項14に記載のコンピュータシステム。
- 1つ以上のプロセッサコアをさらに備え、前記1つ以上のプロセッサコアの少なくとも1つ、前記第1のロジック、前記第2のロジック、および、前記第3のロジックは、同じダイにある、請求項14に記載のコンピュータシステム。
- 前記1つ以上のコンピュータ動作は、データ処理、データ記憶、および、データ通信の1つ以上を含む、請求項13から請求項17のいずれか1つに記載のコンピュータシステム。
- オーディオデバイスをさらに備える、請求項13から請求項18のいずれか1つに記載のコンピュータシステム。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/ES2006/070093 WO2008000858A1 (es) | 2006-06-30 | 2006-06-30 | Estimación de la potencia de fugas |
Publications (2)
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JP2009537103A JP2009537103A (ja) | 2009-10-22 |
JP5075196B2 true JP5075196B2 (ja) | 2012-11-14 |
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JP2009510475A Active JP5075196B2 (ja) | 2006-06-30 | 2006-06-30 | 漏れ電力推定 |
Country Status (6)
Country | Link |
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US (1) | US7814339B2 (ja) |
JP (1) | JP5075196B2 (ja) |
KR (1) | KR101048751B1 (ja) |
CN (1) | CN101449176B (ja) |
GB (1) | GB2457752B (ja) |
WO (1) | WO2008000858A1 (ja) |
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2006
- 2006-06-30 GB GB0900831A patent/GB2457752B/en active Active
- 2006-06-30 JP JP2009510475A patent/JP5075196B2/ja active Active
- 2006-06-30 KR KR1020087031737A patent/KR101048751B1/ko active IP Right Grant
- 2006-06-30 WO PCT/ES2006/070093 patent/WO2008000858A1/es active Application Filing
- 2006-06-30 US US10/594,827 patent/US7814339B2/en active Active
- 2006-06-30 CN CN200680054765.7A patent/CN101449176B/zh active Active
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WO2008000858A1 (es) | 2008-01-03 |
JP2009537103A (ja) | 2009-10-22 |
US20080244278A1 (en) | 2008-10-02 |
CN101449176A (zh) | 2009-06-03 |
US7814339B2 (en) | 2010-10-12 |
CN101449176B (zh) | 2014-04-23 |
GB2457752A (en) | 2009-08-26 |
KR20090027679A (ko) | 2009-03-17 |
GB0900831D0 (en) | 2009-03-04 |
KR101048751B1 (ko) | 2011-07-14 |
GB2457752B (en) | 2010-05-05 |
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