JP5056308B2 - 硬化状態測定装置 - Google Patents

硬化状態測定装置 Download PDF

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Publication number
JP5056308B2
JP5056308B2 JP2007245756A JP2007245756A JP5056308B2 JP 5056308 B2 JP5056308 B2 JP 5056308B2 JP 2007245756 A JP2007245756 A JP 2007245756A JP 2007245756 A JP2007245756 A JP 2007245756A JP 5056308 B2 JP5056308 B2 JP 5056308B2
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JP
Japan
Prior art keywords
ultraviolet
fluorescence
curable resin
ultraviolet curable
irradiation
Prior art date
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Expired - Fee Related
Application number
JP2007245756A
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English (en)
Japanese (ja)
Other versions
JP2009075002A5 (enExample
JP2009075002A (ja
Inventor
憲一 中宗
洋治 長谷部
清司 今井
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Corp
Original Assignee
Omron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omron Corp filed Critical Omron Corp
Priority to JP2007245756A priority Critical patent/JP5056308B2/ja
Priority to KR1020080088607A priority patent/KR20090031233A/ko
Priority to CN2008101656474A priority patent/CN101393125B/zh
Priority to TW097135923A priority patent/TW200914825A/zh
Publication of JP2009075002A publication Critical patent/JP2009075002A/ja
Publication of JP2009075002A5 publication Critical patent/JP2009075002A5/ja
Application granted granted Critical
Publication of JP5056308B2 publication Critical patent/JP5056308B2/ja
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/33—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using ultraviolet light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/55—Specular reflectivity
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/892—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the flaw, defect or object feature examined
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G01N21/8914—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles characterised by the material examined
    • G01N2021/8918—Metal

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Engineering & Computer Science (AREA)
  • Textile Engineering (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
JP2007245756A 2007-09-21 2007-09-21 硬化状態測定装置 Expired - Fee Related JP5056308B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2007245756A JP5056308B2 (ja) 2007-09-21 2007-09-21 硬化状態測定装置
KR1020080088607A KR20090031233A (ko) 2007-09-21 2008-09-09 경화 상태 측정 장치
CN2008101656474A CN101393125B (zh) 2007-09-21 2008-09-19 固化状态测定装置
TW097135923A TW200914825A (en) 2007-09-21 2008-09-19 A device for determining the status of curing

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2007245756A JP5056308B2 (ja) 2007-09-21 2007-09-21 硬化状態測定装置

Publications (3)

Publication Number Publication Date
JP2009075002A JP2009075002A (ja) 2009-04-09
JP2009075002A5 JP2009075002A5 (enExample) 2010-09-02
JP5056308B2 true JP5056308B2 (ja) 2012-10-24

Family

ID=40493526

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2007245756A Expired - Fee Related JP5056308B2 (ja) 2007-09-21 2007-09-21 硬化状態測定装置

Country Status (4)

Country Link
JP (1) JP5056308B2 (enExample)
KR (1) KR20090031233A (enExample)
CN (1) CN101393125B (enExample)
TW (1) TW200914825A (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101707424B1 (ko) * 2009-09-10 2017-02-16 스미또모 가가꾸 가부시키가이샤 필름의 접착성 평가 방법 및 적층체의 제조 방법
JP5528966B2 (ja) 2010-09-24 2014-06-25 日本板硝子株式会社 紫外線硬化樹脂の状態推定装置、状態推定方法およびプログラム
JP5867073B2 (ja) * 2011-12-28 2016-02-24 富士通株式会社 樹脂硬化状態モニタリング装置及び樹脂硬化状態モニタリング方法
CN102692753B (zh) * 2012-05-24 2014-12-10 宁波大学 一种用于控制聚合物分散液晶中间态的装置及方法
JP6167624B2 (ja) * 2013-04-09 2017-07-26 富士通株式会社 光硬化樹脂の硬化方法及び光照射装置
JP6375752B2 (ja) * 2014-07-22 2018-08-22 富士通株式会社 硬化モニタリング装置及び硬化モニタリング方法
KR20170086520A (ko) * 2014-11-25 2017-07-26 오를리콘 서피스 솔루션스 아크티엔게젤샤프트, 페피콘 자외선 양생에 대한 공정 감시
JP6417906B2 (ja) * 2014-12-05 2018-11-07 Nok株式会社 硬化度測定装置及び硬化度測定方法
EP3568689B1 (en) 2017-01-10 2025-09-03 Sun Chemical Corporation In-line coating weight and radiant energy exposure measurement
CN110328862A (zh) * 2019-07-18 2019-10-15 佛山市高明金石建材有限公司 一种石英石生产线上的固化加热装置
CN110376144B (zh) * 2019-07-19 2021-11-26 业成科技（成都）有限公司 固化率检测装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005062165A (ja) * 2003-07-28 2005-03-10 Nitto Denko Corp シート状製品の検査方法、検査システム、シート状製品、及び、画像表示装置
JP4185939B2 (ja) * 2006-03-15 2008-11-26 オムロン株式会社 紫外線硬化樹脂の状態推定方法
JP4952473B2 (ja) * 2007-09-20 2012-06-13 オムロン株式会社 紫外線照射システムおよびそれにおける調整方法

Also Published As

Publication number Publication date
JP2009075002A (ja) 2009-04-09
CN101393125B (zh) 2011-05-25
KR20090031233A (ko) 2009-03-25
TW200914825A (en) 2009-04-01
CN101393125A (zh) 2009-03-25

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