JP5015341B1 - 太陽電池の欠陥検査装置及び検査方法 - Google Patents
太陽電池の欠陥検査装置及び検査方法 Download PDFInfo
- Publication number
- JP5015341B1 JP5015341B1 JP2011156304A JP2011156304A JP5015341B1 JP 5015341 B1 JP5015341 B1 JP 5015341B1 JP 2011156304 A JP2011156304 A JP 2011156304A JP 2011156304 A JP2011156304 A JP 2011156304A JP 5015341 B1 JP5015341 B1 JP 5015341B1
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- JP
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- Prior art keywords
- bias current
- voltage
- light source
- output
- solar cell
- Prior art date
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- 238000007689 inspection Methods 0.000 title claims abstract description 46
- 230000007547 defect Effects 0.000 title claims abstract description 34
- 238000000034 method Methods 0.000 title claims abstract description 20
- 238000005259 measurement Methods 0.000 claims abstract description 53
- 238000012545 processing Methods 0.000 claims abstract description 18
- 238000000605 extraction Methods 0.000 claims description 20
- 238000001514 detection method Methods 0.000 claims description 7
- 239000000284 extract Substances 0.000 claims description 3
- 238000012360 testing method Methods 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 230000002950 deficient Effects 0.000 description 6
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 2
- 238000003384 imaging method Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000010248 power generation Methods 0.000 description 2
- 238000005070 sampling Methods 0.000 description 2
- 230000001052 transient effect Effects 0.000 description 2
- 239000013078 crystal Substances 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000001360 synchronised effect Effects 0.000 description 1
- 239000012780 transparent material Substances 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
-
- H—ELECTRICITY
- H02—GENERATION; CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
- H02S—GENERATION OF ELECTRIC POWER BY CONVERSION OF INFRARED RADIATION, VISIBLE LIGHT OR ULTRAVIOLET LIGHT, e.g. USING PHOTOVOLTAIC [PV] MODULES
- H02S50/00—Monitoring or testing of PV systems, e.g. load balancing or fault identification
- H02S50/10—Testing of PV devices, e.g. of PV modules or single PV cells
- H02S50/15—Testing of PV devices, e.g. of PV modules or single PV cells using optical means, e.g. using electroluminescence
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E10/00—Energy generation through renewable energy sources
- Y02E10/50—Photovoltaic [PV] energy
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P70/00—Climate change mitigation technologies in the production process for final industrial or consumer products
- Y02P70/50—Manufacturing or production processes characterised by the final manufactured product
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Photovoltaic Devices (AREA)
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011156304A JP5015341B1 (ja) | 2011-07-15 | 2011-07-15 | 太陽電池の欠陥検査装置及び検査方法 |
TW101121299A TWI394967B (zh) | 2011-07-15 | 2012-06-14 | Defect inspection device and inspection method of solar cell |
CN2012102407776A CN103033517A (zh) | 2011-07-15 | 2012-07-11 | 太阳能电池的缺陷检测装置及检测方法 |
KR1020120076542A KR101214884B1 (ko) | 2011-07-15 | 2012-07-13 | 태양 전지의 결함 검사 장치 및 검사 방법 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2011156304A JP5015341B1 (ja) | 2011-07-15 | 2011-07-15 | 太陽電池の欠陥検査装置及び検査方法 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP5015341B1 true JP5015341B1 (ja) | 2012-08-29 |
JP2013026255A JP2013026255A (ja) | 2013-02-04 |
Family
ID=46844550
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2011156304A Active JP5015341B1 (ja) | 2011-07-15 | 2011-07-15 | 太陽電池の欠陥検査装置及び検査方法 |
Country Status (4)
Country | Link |
---|---|
JP (1) | JP5015341B1 (zh) |
KR (1) | KR101214884B1 (zh) |
CN (1) | CN103033517A (zh) |
TW (1) | TWI394967B (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101355814B1 (ko) * | 2012-06-25 | 2014-01-28 | 한국표준과학연구원 | 태양 전지의 단락 전류 측정 방법 및 태양 전지의 단락 전류 측정 장치 |
JP2014048282A (ja) * | 2012-08-30 | 2014-03-17 | Npc Inc | 太陽電池の欠陥検査装置及び検査方法 |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP6054210B2 (ja) * | 2013-03-05 | 2016-12-27 | 株式会社エヌ・ピー・シー | 太陽電池の欠陥検査装置 |
JP5635150B2 (ja) * | 2013-04-02 | 2014-12-03 | 株式会社エヌ・ピー・シー | 太陽電池の欠陥検査装置及び欠陥検査方法 |
JP2014209518A (ja) * | 2013-04-16 | 2014-11-06 | 株式会社エヌ・ピー・シー | 太陽電池の欠陥検査装置 |
CN107764829A (zh) * | 2016-08-15 | 2018-03-06 | 上海太阳能工程技术研究中心有限公司 | 太阳电池外观缺陷识别方法 |
CN107274393B (zh) * | 2017-06-12 | 2018-03-23 | 郑州轻工业学院 | 基于栅线检测的单晶硅太阳能电池片表面缺陷检测方法 |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009283845A (ja) * | 2008-05-26 | 2009-12-03 | Npc Inc | 太陽電池出力特性評価装置および太陽電池出力特性評価方法 |
JP2010238906A (ja) * | 2009-03-31 | 2010-10-21 | Sharp Corp | 太陽電池の出力特性測定装置および出力特性測定方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4227814B2 (ja) | 2003-02-07 | 2009-02-18 | エスペック株式会社 | 電池状態診断装置および電池状態診断方法 |
US20050252545A1 (en) * | 2004-05-12 | 2005-11-17 | Spire Corporation | Infrared detection of solar cell defects under forward bias |
JP5015442B2 (ja) * | 2005-10-11 | 2012-08-29 | ローム株式会社 | 電流検出回路およびそれを用いた受光装置ならびに電子機器 |
JP5243785B2 (ja) * | 2007-12-28 | 2013-07-24 | 日清紡ホールディングス株式会社 | 太陽電池検査装置及び太陽電池欠陥判定方法 |
US20100237895A1 (en) * | 2009-03-19 | 2010-09-23 | Kyo Young Chung | System and method for characterizing solar cell conversion performance and detecting defects in a solar cell |
JPWO2011016420A1 (ja) * | 2009-08-03 | 2013-01-10 | 株式会社エヌ・ピー・シー | 太陽電池の欠陥検査装置、欠陥検査方法、およびプログラム |
JP2011138969A (ja) * | 2009-12-28 | 2011-07-14 | Mitsubishi Heavy Ind Ltd | 薄膜太陽電池モジュールの検査方法及び薄膜太陽電池モジュールの製造方法 |
-
2011
- 2011-07-15 JP JP2011156304A patent/JP5015341B1/ja active Active
-
2012
- 2012-06-14 TW TW101121299A patent/TWI394967B/zh not_active IP Right Cessation
- 2012-07-11 CN CN2012102407776A patent/CN103033517A/zh active Pending
- 2012-07-13 KR KR1020120076542A patent/KR101214884B1/ko active IP Right Grant
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2009283845A (ja) * | 2008-05-26 | 2009-12-03 | Npc Inc | 太陽電池出力特性評価装置および太陽電池出力特性評価方法 |
JP2010238906A (ja) * | 2009-03-31 | 2010-10-21 | Sharp Corp | 太陽電池の出力特性測定装置および出力特性測定方法 |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR101355814B1 (ko) * | 2012-06-25 | 2014-01-28 | 한국표준과학연구원 | 태양 전지의 단락 전류 측정 방법 및 태양 전지의 단락 전류 측정 장치 |
JP2014048282A (ja) * | 2012-08-30 | 2014-03-17 | Npc Inc | 太陽電池の欠陥検査装置及び検査方法 |
Also Published As
Publication number | Publication date |
---|---|
TW201303326A (zh) | 2013-01-16 |
KR101214884B1 (ko) | 2012-12-24 |
JP2013026255A (ja) | 2013-02-04 |
TWI394967B (zh) | 2013-05-01 |
CN103033517A (zh) | 2013-04-10 |
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