JP4918298B2 - Polishing method and polishing apparatus - Google Patents

Polishing method and polishing apparatus Download PDF

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JP4918298B2
JP4918298B2 JP2006191332A JP2006191332A JP4918298B2 JP 4918298 B2 JP4918298 B2 JP 4918298B2 JP 2006191332 A JP2006191332 A JP 2006191332A JP 2006191332 A JP2006191332 A JP 2006191332A JP 4918298 B2 JP4918298 B2 JP 4918298B2
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polished
transfer
polishing
polishing method
resin particles
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JP2008018487A (en
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正樹 清水
慎一 満岡
伸治 佐藤
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Hoya Corp
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本発明は、研磨方法及び研磨装置に関し、特に回転軸を持たない面あるいは微小、マイクロな非球面の研磨に適した研磨方法及び研磨装置に関する。   The present invention relates to a polishing method and a polishing apparatus, and more particularly to a polishing method and a polishing apparatus suitable for polishing a surface that does not have a rotation axis, or a micro, micro aspherical surface.

例えば、微小非球面ガラスレンズやそのモールド用金型の非球面は従来、総形研磨によることなく、合成樹脂製の点当たりポリシャーで行っている。
特開2001-300843号公報
For example, a minute aspherical glass lens and an aspherical surface of a molding die thereof are conventionally performed by a point-stained polisher made of a synthetic resin without being polished by a total shape.
JP 2001-300843 A

しかし、レンズや金型の小型化が極限に達し、小型で十分な研磨能力のあるポリシャー自体の製作が困難になりつつある。また、ポリシャーによる研磨は、軌跡の重なり部分が原因でうねり成分が生じることがあり、粗さはよくなるが、全体としての面精度が下がるという問題もある。   However, miniaturization of lenses and molds has reached the limit, and it is becoming difficult to produce a polisher itself that is small and has sufficient polishing ability. Polishing with a polisher may cause waviness components due to the overlapping portions of the trajectory, and the roughness is improved, but there is also a problem that the overall surface accuracy is lowered.

本発明は、以上の問題意識に基づき、点当たりポリシャーによることなく、微小レンズや金型等の被研磨物を研磨することができる研磨方法を得ることを目的とする。   An object of the present invention is to obtain a polishing method capable of polishing an object to be polished such as a microlens or a metal mold without using a spot polisher based on the above problem awareness.

本発明は、被研磨物の被研磨面形状と凹凸が逆の転写面を有する転写型を用い、研磨剤の存在下で、この被研磨物と転写型とに相対回転を与えることなく相対的な微振動を与えることで、研磨前の加工形状を崩さず均一に点でなく面で研磨を遂行するものである。   The present invention uses a transfer mold having a transfer surface in which the shape of the surface to be polished is opposite to that of the surface to be polished, and in the presence of an abrasive, the object to be polished and the transfer mold are relatively free of relative rotation. By applying such fine vibration, the processed shape before polishing is not disturbed and polishing is performed uniformly on the surface, not on the point.

本発明の研磨方法は、その一態様では、被研磨物の被研磨面形状と凹凸が逆の転写面を有する金属材料またはガラス材料からなる転写型を製造するステップ、樹脂粒子と、該樹脂粒子より小径で研磨能力が高い研磨微粒子とが分散しているスラリー中で、上記転写型の転写面と被研磨物の被研磨面とを対向させるステップ、及び対向させた上記転写型の転写面と被研磨物の被研磨面とに、相対回転を与えることなく、相対的な微振動を与えて、上記被研磨物の被研磨面を研磨するステップ、を有することを特徴としている。In one aspect of the polishing method of the present invention, a step of producing a transfer mold made of a metal material or glass material having a transfer surface having irregularities opposite to the shape of the surface to be polished of the object to be polished, resin particles, and the resin particles In a slurry in which abrasive fine particles having a smaller diameter and higher polishing ability are dispersed, a step of making the transfer surface of the transfer mold face the surface to be polished of the object to be polished, And polishing the surface of the object to be polished by applying a relative fine vibration to the surface of the object to be polished without applying relative rotation.
本発明の研磨方法は、別の態様では、樹脂粒子と、該樹脂粒子より小径で研磨能力が高い研磨微粒子とが分散しているスラリーを準備するステップ、被研磨物の被研磨面形状と凹凸が逆の転写面を有し、この転写面に上記樹脂粒子の半径以下の深さの多数の樹脂粒子保持凹部が形成された転写型を製造するステップ、上記スラリー中で、上記転写型の転写面と被研磨物の被研磨面とを対向させるステップ、及び上記樹脂粒子保持凹部に保持された樹脂粒子が上記転写型の転写面と被研磨物の被研磨面の双方に同時に接触し、かつ上記転写型の転写面と被研磨物の被研磨面が直接接触しない状態で、対向させた上記転写型の転写面と被研磨物の被研磨面とに、相対回転を与えることなく、相対的な微振動を与えて、上記被研磨物の被研磨面を研磨するステップ、を有することを特徴としている。According to another aspect of the polishing method of the present invention, a step of preparing a slurry in which resin particles and abrasive fine particles having a smaller diameter and a higher polishing ability than the resin particles are dispersed, the surface shape and unevenness of the object to be polished Manufacturing a transfer mold having a reverse transfer surface on which a large number of resin particle holding recesses having a depth equal to or less than the radius of the resin particles are formed on the transfer surface, transferring the transfer mold in the slurry The surface and the surface to be polished of the object to be polished, and the resin particles held in the resin particle holding recess simultaneously contact both the transfer surface of the transfer mold and the surface to be polished of the object, and In a state where the transfer surface of the transfer mold and the surface to be polished of the object to be polished are not in direct contact with each other, the transfer surface of the transfer mold and the surface to be polished of the object to be polished opposed to each other are relatively rotated without giving a relative rotation. The surface to be polished of the object to be polished is polished by applying a slight vibration. Is characterized by having steps, a.

本発明方法は、被研磨物と転写型とに相対回転を与えない点が重要な点の一つである。相対回転は、相対回転速度がゼロの部分(回転中心軸上)が存在するので、本発明研磨方法では与えない。その付近では研磨がなされず、外周に行くに従って研磨量が増大し、均一な研磨にならないからである。具体的な振動の方向は、研磨面と転写面がその間隔を大小に変化させる方向、被研磨面と転写面を摺り合わせる方向、あるいは両者の合成方向である。   One important point of the method of the present invention is that no relative rotation is given to the object to be polished and the transfer mold. The relative rotation is not given in the polishing method of the present invention because there is a portion (on the rotation center axis) where the relative rotation speed is zero. This is because polishing is not performed in the vicinity, and the polishing amount increases toward the outer periphery, so that uniform polishing is not achieved. Specifically, the direction of vibration is a direction in which the distance between the polishing surface and the transfer surface changes in size, a direction in which the surface to be polished and the transfer surface slide, or a combination direction of both.

また、微振動の大きさ(振幅)は、被研磨面の大きさ、精度に応じて、サブμmから数百μmとすることができる。   Further, the magnitude (amplitude) of the fine vibration can be set from sub μm to several hundred μm depending on the size and accuracy of the surface to be polished.

被研磨物の材質の例は、金属、ニューセラミックスまたはガラスである。 Examples of the material of the object to be polished are metal, new ceramics or glass .

また、樹脂粒子は平均粒径が1μm〜100μmのものを用いることができ、研磨微粒子は、同0.01μm〜10μmのものを用いることができる。   Resin particles having an average particle diameter of 1 μm to 100 μm can be used, and abrasive particles having a particle diameter of 0.01 μm to 10 μm can be used.

樹脂粒子は、研磨に適した材質、つまり研磨材を保持できある程度弾性をもったものが適し、具体的には、ポリウレタン(ゴム)、塩化ビニル、シリコ−ンゴムの1種以上を用いることができ、研磨微粒子は、コロイダルシリカ、アルミナ、ダイヤモンド、酸化セリウム、炭化珪素、立方晶窒化硼素の1種以上を用いることができる。   As the resin particles, a material suitable for polishing, that is, a material that can hold the abrasive and has elasticity to some extent is suitable. Specifically, one or more of polyurethane (rubber), vinyl chloride, and silicone rubber can be used. As the abrasive fine particles, one or more of colloidal silica, alumina, diamond, cerium oxide, silicon carbide, and cubic boron nitride can be used.

本発明方法は、回転軸を持つ球面にも適用できるが、回転軸を持たない非球面または自由曲面の研磨に特に有用である。   The method of the present invention can be applied to a spherical surface having a rotation axis, but is particularly useful for polishing an aspherical surface or free-form surface having no rotation axis.

本発明方法を実行するための研磨装置は、被研磨物を支持するワーク支持部材と、転写型を支持する転写型支持部材と、ワーク支持部材と転写型支持部材との間に相対回転を与えることなく相対的な微振動を与えるアクチュエータとを備えている。この研磨装置の転写型の転写面には、上記樹脂粒子の半径以下の深さの多数の樹脂粒子保持凹部が形成することができる。 A polishing apparatus for carrying out the method of the present invention applies a relative rotation between a work support member that supports an object to be polished, a transfer mold support member that supports a transfer mold, and the work support member and the transfer mold support member. And an actuator that gives a relative minute vibration without any problems. A large number of resin particle holding recesses having a depth not larger than the radius of the resin particles can be formed on the transfer surface of the transfer mold of the polishing apparatus.

このアクチュエータは、直交三軸方向単独にあるいは合成した微振動を与えるアクチュエータから構成することができる。 This actuator can be composed of an actuator that gives a slight vibration in the three orthogonal directions alone or in combination .

ワーク支持部材には、樹脂粒子と研磨微粒子とを含むスラリーを保持するスラリー保持筒を設け、このスラリー保持筒内に、該ワーク支持部材に支持した被研磨物を位置させる(スラリー内に被研磨物を浸漬する)ことができる。 The workpiece support member is provided with a slurry holding cylinder for holding a slurry containing resin particles and abrasive fine particles, and an object to be polished supported by the workpiece support member is positioned in the slurry holding cylinder (to be polished in the slurry). Can be immersed) .

本発明によれば、点当たりポリシャーを用いることなく、被研磨面形状を問わずに研磨を行うことができる。   According to the present invention, polishing can be performed regardless of the shape of the surface to be polished without using a spot polisher.

図1、図2は、本発明による研磨方法の一実施形態の概念図である。ワーク(被研磨金型またはガラス)Wの被研磨面W1は、例えば自由曲面または軸対称非球面からなっている。この被研磨面W1に対して研磨を施すための転写型Tには、被研磨面W1と凹凸が逆の転写面T1が形成されている。被研磨面W1と転写面T1はそれぞれ、十分な面精度に機械加工されている。また、被研磨面W1と転写面T1は回転軸を持たない非回転対称形状であり、Z軸を中心とする特定の回転位相でその凹凸が逆になる。転写型Tは、金属、ガラス、樹脂材料またはピッチから構成することができる。   1 and 2 are conceptual views of an embodiment of a polishing method according to the present invention. A surface to be polished W1 of a workpiece (a metal mold or glass) W is, for example, a free-form surface or an axisymmetric aspheric surface. The transfer mold T for polishing the surface to be polished W1 is formed with a transfer surface T1 having irregularities opposite to the surface to be polished W1. The polished surface W1 and the transfer surface T1 are each machined with sufficient surface accuracy. Further, the surface to be polished W1 and the transfer surface T1 are non-rotation symmetric shapes having no rotation axis, and the concavities and convexities are reversed at a specific rotation phase around the Z axis. The transfer mold T can be made of metal, glass, resin material, or pitch.

本実施形態では、被研磨面W1と転写面T1との間に、樹脂粒子11と研磨微粒子12とを含む(分散させた)スラリー10を介在させた状態で、ワークWと転写型Tに両者が接離する方向Zまたは(および)摺り合わせる方向X(またはY)の相対的な微振動を与えることで、研磨を行う。被研磨面W1(ワークW)と転写面T1(転写型T)との間に、軸Zを中心とする相対的な回転運動は与えない。   In the present embodiment, the workpiece W and the transfer mold T are both placed with the slurry 10 containing (dispersed) the resin particles 11 and the abrasive fine particles 12 interposed between the surface to be polished W1 and the transfer surface T1. Polishing is performed by applying a relative fine vibration in the direction Z (and / or) the direction X and / or the direction of sliding. No relative rotational movement about the axis Z is given between the surface to be polished W1 (work W) and the transfer surface T1 (transfer mold T).

スラリー10は、例えば1〜5重量%の樹脂粒子11と、1〜5重量%の研磨微粒子12と、残部(90〜98重量%)の潤滑液とを混合して構成されている。樹脂粒子11としては、平均粒径が1μm〜100μmのポリウレタン、塩化ビニル、シリコーンゴムの1種以上を用いることができ、研磨微粒子12としては、平均粒径が0.01μm〜10μm(使用する樹脂粒子11の平均粒径の1/10000〜1/2)のコロイダルシリカ、アルミナ、ダイヤモンド、酸化セリウムの1種以上を用いることができる。樹脂粒子11も研磨能力を持つが、研磨微粒子12の研磨能力は樹脂粒子11よりも高い。   The slurry 10 is configured, for example, by mixing 1 to 5% by weight of resin particles 11, 1 to 5% by weight of abrasive fine particles 12, and the remaining (90 to 98% by weight) of a lubricating liquid. As the resin particles 11, one or more of polyurethane, vinyl chloride, and silicone rubber having an average particle diameter of 1 μm to 100 μm can be used, and the abrasive particles 12 have an average particle diameter of 0.01 μm to 10 μm (resin used) One or more kinds of colloidal silica, alumina, diamond, and cerium oxide having an average particle size of 1/10000 to 1/2 of the average particle diameter of the particles 11 can be used. The resin particles 11 also have a polishing ability, but the polishing ability of the abrasive fine particles 12 is higher than that of the resin particles 11.

樹脂粒子11と研磨微粒子12の具体例は、例えば特開2001-300843号公報が開示している。樹脂粒子11は、例えば日本触媒株式会社製のベンゾクアナミン樹脂(商品名「エポスターL15」または「エポスターMS」)を用いることができ、研磨微粒子12は、例えば日産化学株式会社製のコロイダルシリカ(商品名「スノーテックス30」を使用することができる。   Specific examples of the resin particles 11 and the abrasive fine particles 12 are disclosed in, for example, Japanese Patent Application Laid-Open No. 2001-300843. The resin particles 11 may be, for example, a benzoquamine resin (trade name “Eposter L15” or “Eposter MS”) manufactured by Nippon Shokubai Co., Ltd. “Snowtex 30” can be used.

被研磨面W1(ワークW)と転写面T1(転写型T)に与える相対的な微振動の振幅は、被研磨面W1(転写面T1)の形状、樹脂粒子11と研磨微粒子12の材質及び平均粒径を考慮して、サブμm(1μm未満)から数百μmの範囲で定める。被研磨面W1と転写面T1との間にスラリー10を介在させた状態において、このような微振動をワークWと転写型Tとに与えると、特に被研磨面W1と転写面T1の間隔が縮まる方向の動きにより、樹脂粒子11と研磨微粒子12を強く被研磨面W1に押し付けて研磨を実行し、逆に被研磨面W1と転写面T1の間隔が広がる方向の動きによっては、樹脂粒子11と研磨微粒子12に与えていた力を開放し、新たなスラリー10を研磨面W1と転写面T1の間に供給(吸収)することができる。   The relative fine vibration amplitude given to the surface to be polished W1 (work W) and the transfer surface T1 (transfer mold T) depends on the shape of the surface to be polished W1 (transfer surface T1), the material of the resin particles 11 and the abrasive particles 12, and In consideration of the average particle diameter, it is determined in the range of sub-μm (less than 1 μm) to several hundred μm. When such a slight vibration is applied to the workpiece W and the transfer mold T in a state where the slurry 10 is interposed between the surface to be polished W1 and the transfer surface T1, the distance between the surface to be polished W1 and the transfer surface T1 is particularly large. By the movement in the shrinking direction, the resin particles 11 and the abrasive fine particles 12 are strongly pressed against the surface to be polished W1 to perform polishing, and conversely, depending on the movement in the direction in which the interval between the surface to be polished W1 and the transfer surface T1 is widened, the resin particles 11 Then, the force applied to the abrasive fine particles 12 is released, and a new slurry 10 can be supplied (absorbed) between the polishing surface W1 and the transfer surface T1.

図3は、本発明による研磨方法を実施するための装置の一例を示す概念図である。この研磨装置は、その下方に、ワークWを支持するXYテーブル(ワーク支持部材)20を備え、上方に転写型Tを支持するXYZアクチュエータ(転写型支持部材)30を備えている。XYテーブル20は、水平面内のX方向に移動自在なXステージ21Xと、このXステージ21X上にX方向と直交するY方向に移動自在に支持したYステージ21Yを有しており、Yステージ21Y上には、鉛直軸Zを中心とする回転位相を変化させることができるロータリテーブル22が支持されている。ワークWは、このロータリテーブル22上のワークチャック(ワーク支持部材)23に固定される。   FIG. 3 is a conceptual diagram showing an example of an apparatus for carrying out the polishing method according to the present invention. The polishing apparatus includes an XY table (work support member) 20 that supports the workpiece W below and an XYZ actuator (transfer type support member) 30 that supports the transfer die T below. The XY table 20 includes an X stage 21X that is movable in the X direction within a horizontal plane, and a Y stage 21Y that is supported on the X stage 21X so as to be movable in the Y direction perpendicular to the X direction. A rotary table 22 that can change the rotation phase about the vertical axis Z is supported above. The work W is fixed to a work chuck (work support member) 23 on the rotary table 22.

Xステージ21Xは、X方向アクチュエータ24Xによって同方向に移動可能であり、Yステージ21Yは、Y方向アクチュエータ24Yによって同方向に移動可能であり、ロータリテーブル22の回転位相は、エンコーダにより検出制御される。   The X stage 21X can be moved in the same direction by an X direction actuator 24X, the Y stage 21Y can be moved in the same direction by a Y direction actuator 24Y, and the rotational phase of the rotary table 22 is detected and controlled by an encoder. .

XYZアクチュエータ30は、転写型Tを支持するツールチャック(転写型支持部材)31を有し、3軸アクチュエータ(アクチュエータ)32により、XYZの3軸方向単独にあるいは合成して微振動を与えることができる。XYZアクチュエータ30は具体的には例えばピエゾ素子から構成することができる。   The XYZ actuator 30 has a tool chuck (transfer type support member) 31 that supports the transfer mold T, and can give a fine vibration by the triaxial actuator (actuator) 32 singly or in combination with the XYZ triaxial directions. it can. Specifically, the XYZ actuator 30 can be composed of a piezo element, for example.

ワークチャック23上には、半断面として示すスラリー保持筒25が備えられ、このスラリー保持筒25内には、撹拌機26が位置している。スラリー保持筒25内には、少なくともその液面25XがワークWの被研磨面W1より上方になるレベルまで樹脂粒子11と研磨微粒子12とのスラリー10が入れられている。撹拌機26は必要に応じ樹脂粒子11と研磨微粒子12を十分に分散させるべく、スラリー保持筒25内のスラリー10を撹拌する。   A slurry holding cylinder 25 shown as a half section is provided on the work chuck 23, and a stirrer 26 is located in the slurry holding cylinder 25. In the slurry holding cylinder 25, the slurry 10 of the resin particles 11 and the abrasive fine particles 12 is put at least to a level where the liquid surface 25X is above the surface W1 to be polished of the workpiece W. The agitator 26 agitates the slurry 10 in the slurry holding cylinder 25 so as to sufficiently disperse the resin particles 11 and the abrasive fine particles 12 as necessary.

この研磨装置によれば、ワークチャック23に支持されたワークWを、XYテーブル20によって、ツールチャック31に支持された転写型Tの軸線上に位置させ、ロータリテーブル22により、ワークWの回転位相と転写型Tの回転位相を合致させることができる。スラリー保持筒25内の液面25Xのレベルを被研磨面W1より十分上にした状態において、XYZアクチュエータ30及び3軸アクチュエータ32により、ワークWの被研磨面W1と転写型Tの転写面T1の間隔を調整し、その調整後の間隔でXYZアクチュエータ30及び3軸アクチュエータ32により、Z方向あるいはX方向(またはY方向)に転写型Tを微振動させることにより、本発明方法を実行することができる。   According to this polishing apparatus, the workpiece W supported by the workpiece chuck 23 is positioned on the axis of the transfer mold T supported by the tool chuck 31 by the XY table 20, and the rotational phase of the workpiece W is rotated by the rotary table 22. And the rotational phase of the transfer mold T can be matched. In a state where the level of the liquid surface 25X in the slurry holding cylinder 25 is sufficiently higher than the surface to be polished W1, the surface to be polished W1 of the workpiece W and the transfer surface T1 of the transfer mold T are moved by the XYZ actuator 30 and the triaxial actuator 32. The method of the present invention can be executed by adjusting the interval and finely vibrating the transfer mold T in the Z direction or the X direction (or Y direction) by the XYZ actuator 30 and the triaxial actuator 32 at the adjusted interval. it can.

図4、図5は、転写型Tの転写面に、多数の樹脂粒子保持凹部T1’を形成した実施形態を示している。保持凹部T1’の深さは、転写型TとワークWが直接機械的に接触することがないように、樹脂粒子11の半径以下の深さとするのがよい。図では保持凹部T1’及び樹脂粒子11の大きさは誇張して描いている。多数の保持凹部T1’は、転写型Tに図1、図2のような正確な転写面T1を形成した後、該転写面T1の巨視的な形状を崩すことなく形成するものであり、その凹凸をならすと、転写面T1と平行な平均転写面T1”となるように形成されている。図4と図5の違いは、樹脂粒子保持凹部T1’の形状の違いである。また、保持凹部T1’は平面的に見たときには線状に形成するのがよく、その線形状は、螺旋状、同心状、ランダム形状等を選択できる。   4 and 5 show an embodiment in which a large number of resin particle holding recesses T1 'are formed on the transfer surface of the transfer mold T. FIG. The depth of the holding recess T <b> 1 ′ is preferably set to a depth equal to or less than the radius of the resin particle 11 so that the transfer mold T and the work W are not in direct mechanical contact. In the drawing, the size of the holding recess T1 'and the resin particles 11 is exaggerated. A number of holding recesses T1 ′ are formed on the transfer mold T without forming the macroscopic shape of the transfer surface T1 after forming an accurate transfer surface T1 as shown in FIGS. When the unevenness is smoothed, the average transfer surface T1 ″ parallel to the transfer surface T1 is formed. The difference between FIG. 4 and FIG. 5 is the difference in the shape of the resin particle holding recess T1 ′. The recess T1 ′ is preferably formed in a linear shape when viewed in plan, and the linear shape can be selected from a spiral shape, a concentric shape, a random shape, and the like.

本発明方法は、特に回転軸を持たない自由曲面や非球面の研磨加工に有用であるが、回転軸を持つ球面の研磨加工にも用いることが可能であり、微小・マイクロ非球面ではポリシャーを製作するのが困難なので有効となる。また面で研磨するのでポリシャー研磨(点あたり)による形状うねりも乗らず前加工形状を維持した均一な研磨が可能となる。   The method of the present invention is particularly useful for polishing a free-form surface or an aspherical surface having no rotation axis, but can also be used for polishing a spherical surface having a rotation axis. It is effective because it is difficult to manufacture. Further, since polishing is performed on the surface, uniform polishing can be performed while maintaining the pre-processed shape without any shape undulation due to polish polishing (per point).

本発明による研磨方法の一例を示す、被研磨物と転写型の模式断面図である。1 is a schematic cross-sectional view of an object to be polished and a transfer mold, showing an example of a polishing method according to the present invention. 被研磨物と転写型に接近離隔方向の微振動を与えた際の研磨の様子を示す模式断面図である。FIG. 3 is a schematic cross-sectional view showing a state of polishing when a fine vibration in an approaching / separating direction is applied to an object to be polished and a transfer mold. 本発明方法を実施するための研磨装置の具体例を示す斜視図である。It is a perspective view which shows the specific example of the grinding | polishing apparatus for implementing this invention method. 転写型の転写面に、多数の樹脂粒子保持凹部を形成した実施形態を示す模式断面図である。It is a schematic cross section which shows embodiment which formed many resin particle holding recessed parts in the transfer surface of a transfer type. 転写型の転写面に、多数の樹脂粒子保持凹部を形成した他の実施形態を示す模式断面図である。It is a schematic cross section which shows other embodiment which formed many resin particle holding | maintenance recessed parts in the transfer surface of a transfer type.

符号の説明Explanation of symbols

W ワーク
W1 被研磨面
T 転写型
T1 転写面
T1’ 樹脂ボール保持凹部
10 スラリー
11 樹脂粒子
12 研磨微粒子
20 XYテーブル(ワーク支持部材)
22 ロータリテーブル
23 ワークチャック(ワーク支持部材)
25 スラリー保持筒
26 撹拌機
30 XYZアクチュエータ(転写型保持部材)
31 ツールチャック(転写型保持部材)
32 3軸アクチュエータ(アクチュエータ)


W Work W1 Polished surface T Transfer mold T1 Transfer surface T1 ′ Resin ball holding recess 10 Slurry 11 Resin particle 12 Polishing fine particle 20 XY table (work support member)
22 Rotary table 23 Work chuck (work support member)
25 Slurry holding cylinder 26 Stirrer 30 XYZ actuator (transfer type holding member)
31 Tool chuck (transfer type holding member)
32 3-axis actuator (actuator)


Claims (14)

被研磨物の被研磨面形状と凹凸が逆の転写面を有する金属材料またはガラス材料からなる転写型を製造するステップ、
樹脂粒子と、該樹脂粒子より小径で研磨能力が高い研磨微粒子とが分散しているスラリー中で、上記転写型の転写面と被研磨物の被研磨面とを対向させるステップ、及び
対向させた上記転写型の転写面と被研磨物の被研磨面とに、相対回転を与えることなく、相対的な微振動を与えて、上記被研磨物の被研磨面を研磨するステップ、
を有することを特徴とする研磨方法。
Producing a transfer mold made of a metal material or a glass material having a transfer surface in which the surface to be polished and the unevenness of the object to be polished are reversed;
In a slurry in which resin particles and abrasive fine particles having a diameter smaller than that of the resin particles and having a high polishing ability are dispersed, the transfer surface of the transfer mold and the surface to be polished are made to face each other. on the polished surface of the transfer-type transfer surface and the polishing of, without providing relative rotation, giving a relative fine vibration, polishing the surface of the object to be polished step,
A polishing method characterized by comprising:
樹脂粒子と、該樹脂粒子より小径で研磨能力が高い研磨微粒子とが分散しているスラリーを準備するステップ、
被研磨物の被研磨面形状と凹凸が逆の転写面を有し、この転写面に上記樹脂粒子の半径以下の深さの多数の樹脂粒子保持凹部が形成された転写型を製造するステップ、
上記スラリー中で、上記転写型の転写面と被研磨物の被研磨面とを対向させるステップ、及び
上記樹脂粒子保持凹部に保持された樹脂粒子が上記転写型の転写面と被研磨物の被研磨面の双方に同時に接触し、かつ上記転写型の転写面と被研磨物の被研磨面が直接接触しない状態で、対向させた上記転写型の転写面と被研磨物の被研磨面とに、相対回転を与えることなく、相対的な微振動を与えて、上記被研磨物の被研磨面を研磨するステップ、
を有することを特徴とする研磨方法。
Preparing a slurry in which resin particles and fine abrasive particles having a smaller diameter than the resin particles and high polishing ability are dispersed;
The step of the surface to be polished shapes and irregularities of the polishing target have a reverse of the transfer surface, to produce a transfer type multiple resin particle retention recess of radius less depth is formed of the resin particles to the transfer surface,
In the slurry, the step of facing the transfer surface of the transfer mold and the surface to be polished of the object to be polished; and
The resin particles held in the resin particle holding recess simultaneously contact both the transfer surface of the transfer mold and the surface to be polished of the object to be polished, and the transfer surface of the transfer mold and the surface to be polished of the object to be polished are directly with no contact, to a polished surface of the transfer-type transfer surface and the polishing of which are opposed, without providing relative rotation, giving a relative slight vibration, the polished surface of the object to be polished Polishing step,
A polishing method characterized by comprising:
請求項1または2記載の研磨方法において、上記微振動の方向は、被研磨面と転写面がその間隔を大小に変化させる方向である研磨方法。 3. The polishing method according to claim 1 or 2 , wherein the direction of the minute vibration is a direction in which the distance between the surface to be polished and the transfer surface is changed to be large or small. 請求項1または2記載の研磨方法において、上記微振動の方向は、被研磨面と転写面を摺り合わせる方向である研磨方法。 3. The polishing method according to claim 1, wherein the direction of the minute vibration is a direction in which the surface to be polished and the transfer surface slide together. 請求項1または2記載の研磨方法において、上記微振動の方向は、被研磨面と転写面がその間隔を大小に変化させる方向と、被研磨面と転写面を摺り合わせる方向とを合成した方向である研磨方法。 3. The polishing method according to claim 1, wherein the direction of the fine vibration is a direction in which a direction in which the distance between the polished surface and the transfer surface is changed to a large size and a direction in which the polished surface and the transfer surface slide are combined. A polishing method. 請求項1ないし5のいずれか1項記載の研磨方法において、微振動の振幅は、サブμmから数百μmである研磨方法。 6. The polishing method according to claim 1, wherein the amplitude of the minute vibration is from sub [mu] m to several hundred [mu] m. 請求項1ないし6のいずれか1項記載の研磨方法において、上記被研磨物は、金属、ニューセラミックスまたはガラスからなる研磨方法。 In the polishing method of any one of claims 1 to 6, the object to be polished, the polishing method comprising a metal, new ceramic or glass. 請求項1ないし7のいずれか1項記載の研磨方法において、樹脂粒子の平均粒径は1μm〜100μmであり、研磨微粒子の平均粒径は、0.01μm〜10μmである研磨方法。   8. The polishing method according to claim 1, wherein the average particle diameter of the resin particles is 1 μm to 100 μm, and the average particle diameter of the abrasive fine particles is 0.01 μm to 10 μm. 請求項1ないし8のいずれか1項記載の研磨方法において、樹脂粒子は、ポリウレタン、塩化ビニル、シリコーンゴムの1種以上からなり、研磨微粒子は、コロイダルシリカ、ダイヤモンド、アルミナ、酸化セリウム、炭化珪素、立方晶窒化硼素の1種以上からなる研磨方法。   9. The polishing method according to claim 1, wherein the resin particles are one or more of polyurethane, vinyl chloride, and silicone rubber, and the abrasive particles are colloidal silica, diamond, alumina, cerium oxide, silicon carbide. A polishing method comprising at least one of cubic boron nitride. 請求項1ないし9のいずれか1項記載の研磨方法において、被研磨面は非球面または自由曲面である研磨方法。   10. The polishing method according to claim 1, wherein the surface to be polished is an aspherical surface or a free curved surface. 請求項1ないし10のいずれか1項記載の研磨方法を実行するための研磨装置であって、上記被研磨物を支持するワーク支持部材と、上記転写型を支持する転写型支持部材と、上記ワーク支持部材と転写型支持部材との間に相対回転を与えることなく相対的な微振動を与えるアクチュエータとを備える研磨装置。   A polishing apparatus for performing the polishing method according to any one of claims 1 to 10, wherein the work support member supports the workpiece, the transfer mold support member supports the transfer mold, and A polishing apparatus comprising: an actuator that applies a relative fine vibration without applying a relative rotation between a work support member and a transfer mold support member. 請求項11記載の研磨装置において、上記転写型の転写面には、上記樹脂粒子の半径以下の深さの多数の樹脂粒子保持凹部が形成されている研磨装置。12. The polishing apparatus according to claim 11, wherein a large number of resin particle holding recesses having a depth less than or equal to the radius of the resin particles are formed on the transfer surface of the transfer mold. 請求項11または12記載の研磨装置において、上記アクチュエータは直交三軸方向単独にあるいは合成した微振動を与えるアクチュエータである研磨装置。 13. The polishing apparatus according to claim 11 or 12, wherein the actuator is an actuator that applies a slight vibration in the three orthogonal directions alone or in combination. 請求項11ないし13のいずれか1項記載の研磨装置において、上記ワーク支持部材には、上記樹脂粒子と研磨微粒子とを含むスラリーを保持するスラリー保持筒が備えられ、このスラリー保持筒内に、該ワーク支持部材に支持した被研磨物が位置する研磨装置。   The polishing apparatus according to any one of claims 11 to 13, wherein the work support member includes a slurry holding cylinder that holds a slurry containing the resin particles and abrasive fine particles, and the slurry holding cylinder includes: A polishing apparatus in which an object to be polished supported by the workpiece support member is located.
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