JP4876860B2 - Icテストシステム - Google Patents
Icテストシステム Download PDFInfo
- Publication number
- JP4876860B2 JP4876860B2 JP2006306090A JP2006306090A JP4876860B2 JP 4876860 B2 JP4876860 B2 JP 4876860B2 JP 2006306090 A JP2006306090 A JP 2006306090A JP 2006306090 A JP2006306090 A JP 2006306090A JP 4876860 B2 JP4876860 B2 JP 4876860B2
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- measurement
- measurement result
- test
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- 238000012360 testing method Methods 0.000 title claims description 48
- 238000005259 measurement Methods 0.000 claims description 147
- 238000000605 extraction Methods 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 7
- 238000012545 processing Methods 0.000 description 5
- 230000006870 function Effects 0.000 description 4
- 238000007689 inspection Methods 0.000 description 4
- 230000004044 response Effects 0.000 description 4
- 230000000052 comparative effect Effects 0.000 description 3
- 238000001514 detection method Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
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- Tests Of Electronic Circuits (AREA)
Description
12 本体
18 入力インターフェース
20 中央制御部
22 記憶部
24 表示部
40A、40B テストプログラム
42A、42B 測定ツール
44A、44B 測定結果ファイル
46A、46B 測定結果ファイル名
48A、48B 測定条件
50 データベース
Claims (2)
- テストプログラムに基づき所定の測定条件で被検査デバイスを測定した結果を測定結果ファイルに出力する測定手段と、
前記テストプログラムのデバッグを目的として複数の測定結果ファイルを記憶し、各測定結果ファイルのファイル名と測定条件とをルックアップテーブルに対応させて記憶する記憶手段と、
測定条件の全部または一部を検索キーとして該検索キーに対応するファイル名を前記記憶手段に記憶されたルックアップテーブルから抽出する抽出手段と、
該抽出されたファイル名のうち選択されたファイル名を有する測定結果ファイルの内容を表示する表示手段とを含むことを特徴とするICテストシステム。 - 前記表示手段は、前記選択されたファイル名を有する測定結果ファイルの内容とともに、前記検索キーとされた測定条件を表示することを特徴とする請求項1に記載のICテストシステム。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006306090A JP4876860B2 (ja) | 2006-11-13 | 2006-11-13 | Icテストシステム |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2006306090A JP4876860B2 (ja) | 2006-11-13 | 2006-11-13 | Icテストシステム |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2008122213A JP2008122213A (ja) | 2008-05-29 |
JP4876860B2 true JP4876860B2 (ja) | 2012-02-15 |
Family
ID=39507120
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006306090A Active JP4876860B2 (ja) | 2006-11-13 | 2006-11-13 | Icテストシステム |
Country Status (1)
Country | Link |
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JP (1) | JP4876860B2 (ja) |
Families Citing this family (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2010014576A (ja) * | 2008-07-04 | 2010-01-21 | Yokogawa Electric Corp | 半導体試験装置 |
JP2010015482A (ja) * | 2008-07-07 | 2010-01-21 | Yokogawa Electric Corp | Icテスタのデバック装置 |
JP2012154809A (ja) * | 2011-01-26 | 2012-08-16 | Mitsubishi Electric Corp | モニタリング装置及びモニタリングシステム |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3572626B2 (ja) * | 1992-03-06 | 2004-10-06 | 株式会社日立製作所 | 検査システム、解析ユニット及び電子デバイスの製造方法 |
JP2001156176A (ja) * | 1999-11-29 | 2001-06-08 | Hitachi Ltd | Lsiテストプログラム生成方法およびそのシステム |
JP2005300324A (ja) * | 2004-04-09 | 2005-10-27 | Agilent Technol Inc | 被試験対象デバイスの測定データ解析方法、プログラム、および測定データ解析システム |
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2006
- 2006-11-13 JP JP2006306090A patent/JP4876860B2/ja active Active
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Publication number | Publication date |
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JP2008122213A (ja) | 2008-05-29 |
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