JP4870889B2 - 高度に構成可能な容量性トランスデューサインターフェイス回路 - Google Patents

高度に構成可能な容量性トランスデューサインターフェイス回路 Download PDF

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Publication number
JP4870889B2
JP4870889B2 JP2001533437A JP2001533437A JP4870889B2 JP 4870889 B2 JP4870889 B2 JP 4870889B2 JP 2001533437 A JP2001533437 A JP 2001533437A JP 2001533437 A JP2001533437 A JP 2001533437A JP 4870889 B2 JP4870889 B2 JP 4870889B2
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Japan
Prior art keywords
capacitor
capacitive
circuit
capacitance
capacitor array
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Expired - Fee Related
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JP2001533437A
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English (en)
Japanese (ja)
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JP2004500557A5 (enExample
JP2004500557A (ja
Inventor
シュ，イン
ソーンダーズ，クライスト
スー，カーク
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アプロレーザ ディベロップメント カンパニー リミテッド ライアビリティー カンパニー
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/25—Arrangements for measuring currents or voltages or for indicating presence or sign thereof using digital measurement techniques
    • G01R19/2506—Arrangements for conditioning or analysing measured signals, e.g. for indicating peak values ; Details concerning sampling, digitizing or waveform capturing

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measuring Fluid Pressure (AREA)
  • Transmission And Conversion Of Sensor Element Output (AREA)
JP2001533437A 1999-10-15 2000-10-16 高度に構成可能な容量性トランスデューサインターフェイス回路 Expired - Fee Related JP4870889B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US15983299P 1999-10-15 1999-10-15
US60/159,832 1999-10-15
PCT/US2000/041207 WO2001031351A1 (en) 1999-10-15 2000-10-16 Highly configurable capacitive transducer interface circuit

Publications (3)

Publication Number Publication Date
JP2004500557A JP2004500557A (ja) 2004-01-08
JP2004500557A5 JP2004500557A5 (enExample) 2010-02-12
JP4870889B2 true JP4870889B2 (ja) 2012-02-08

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ID=22574257

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JP2001533437A Expired - Fee Related JP4870889B2 (ja) 1999-10-15 2000-10-16 高度に構成可能な容量性トランスデューサインターフェイス回路

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EP (1) EP1224478A4 (enExample)
JP (1) JP4870889B2 (enExample)
WO (1) WO2001031351A1 (enExample)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005140657A (ja) * 2003-11-07 2005-06-02 Denso Corp 静電容量型センサの容量変化検出回路
EP1548409A1 (en) * 2003-12-23 2005-06-29 Dialog Semiconductor GmbH Differential capacitance measurement
US7368923B2 (en) * 2005-12-22 2008-05-06 Honeywell International Inc. Time interval trimmed differential capacitance sensor
GB0605717D0 (en) 2006-03-21 2006-05-03 Univ Sussex Electric potential sensor
EP2177880A1 (en) 2008-10-16 2010-04-21 Dialog Imaging Systems GmbH Distance measurement with capacitive sensor
DE102009026496B4 (de) 2009-05-27 2022-04-28 Robert Bosch Gmbh Kompensationskapazität für einen kapazitiven Sensor
EP2653846A1 (en) * 2012-04-18 2013-10-23 Nxp B.V. Sensor circuit and a method of calibration
EP2653845B1 (en) 2012-04-18 2015-07-15 Nxp B.V. Sensor circuit and calibration method
MX341070B (es) * 2012-06-01 2016-08-04 Smiths Detection - Watford Ltd Amplificador de transimpedancia capacitiva con desfase.
CN115580287B (zh) * 2022-09-23 2025-10-03 上海交通大学 一种基于开关电容的可重构传感器接口电路
DE102024201241A1 (de) * 2024-02-12 2025-08-14 Robert Bosch Gesellschaft mit beschränkter Haftung Sensorsystem mit einer Ausleseschaltung und Verfahren zum Betrieb eines Sensorsystems mit einer Ausleseschaltung

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0191529B1 (en) * 1985-02-13 1991-11-27 Philips Electronics Uk Limited Electrical filter
US5557267A (en) * 1993-04-23 1996-09-17 Ade Corporation Apparatus and methods for measurement system calibration
US5537109A (en) * 1993-05-28 1996-07-16 General Scanning, Inc. Capacitive transducing with feedback
JP3216955B2 (ja) * 1994-05-31 2001-10-09 株式会社日立製作所 容量式センサ装置
JPH08327392A (ja) * 1995-05-30 1996-12-13 Seikosha Co Ltd 静電容量型センサ
JP3265942B2 (ja) * 1995-09-01 2002-03-18 株式会社村田製作所 微少容量検出回路
US5670887A (en) * 1996-04-17 1997-09-23 Mitutoyo Corporation Method and apparatus for fast sampling in capacitive position transducers
DE19625666C1 (de) * 1996-06-26 1998-01-15 Siemens Ag Ausleseschaftung und kapazitiv messender Senser

Also Published As

Publication number Publication date
EP1224478A1 (en) 2002-07-24
EP1224478A4 (en) 2004-05-19
WO2001031351A1 (en) 2001-05-03
JP2004500557A (ja) 2004-01-08

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