JP4850835B2 - 線形静電容量測定およびタッチレス・スイッチ - Google Patents

線形静電容量測定およびタッチレス・スイッチ Download PDF

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Publication number
JP4850835B2
JP4850835B2 JP2007526181A JP2007526181A JP4850835B2 JP 4850835 B2 JP4850835 B2 JP 4850835B2 JP 2007526181 A JP2007526181 A JP 2007526181A JP 2007526181 A JP2007526181 A JP 2007526181A JP 4850835 B2 JP4850835 B2 JP 4850835B2
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capacitor
capacitance
output
operational amplifier
electrode
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JP2007526181A
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Japanese (ja)
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JP2008510396A (ja
JP2008510396A5 (enExample
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インラウ リー
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
    • G01R27/2605—Measuring capacitance
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
    • H03F1/34—Negative-feedback-circuit arrangements with or without positive feedback
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/68—Combinations of amplifiers, e.g. multi-channel amplifiers for stereophonics
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/94—Electronic switching or gating, i.e. not by contact-making and –breaking characterised by the way in which the control signals are generated
    • H03K17/945—Proximity switches
    • H03K17/955—Proximity switches using a capacitive detector
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45138—Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45548—Indexing scheme relating to differential amplifiers the IC comprising one or more capacitors as shunts to earth or as short circuit between inputs
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45594—Indexing scheme relating to differential amplifiers the IC comprising one or more resistors, which are not biasing resistor

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  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Electronic Switches (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Amplifiers (AREA)
JP2007526181A 2004-08-16 2005-08-16 線形静電容量測定およびタッチレス・スイッチ Expired - Fee Related JP4850835B2 (ja)

Applications Claiming Priority (9)

Application Number Priority Date Filing Date Title
US60161004P 2004-08-16 2004-08-16
US60/601,610 2004-08-16
US61969704P 2004-10-19 2004-10-19
US60/619,697 2004-10-19
US66237805P 2005-03-17 2005-03-17
US60/662,378 2005-03-17
US69048605P 2005-06-15 2005-06-15
US60/690,486 2005-06-15
PCT/CN2005/001277 WO2006017988A1 (en) 2004-08-16 2005-08-16 Linear capacitance measurement and touchless switch

Publications (3)

Publication Number Publication Date
JP2008510396A JP2008510396A (ja) 2008-04-03
JP2008510396A5 JP2008510396A5 (enExample) 2008-10-02
JP4850835B2 true JP4850835B2 (ja) 2012-01-11

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Family Applications (1)

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JP2007526181A Expired - Fee Related JP4850835B2 (ja) 2004-08-16 2005-08-16 線形静電容量測定およびタッチレス・スイッチ

Country Status (6)

Country Link
US (1) US7323886B2 (enExample)
JP (1) JP4850835B2 (enExample)
CA (2) CA2658709C (enExample)
DE (1) DE112005001697T5 (enExample)
GB (2) GB2431246B (enExample)
WO (1) WO2006017988A1 (enExample)

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US9500686B1 (en) 2007-06-29 2016-11-22 Cypress Semiconductor Corporation Capacitance measurement system and methods
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US9104273B1 (en) 2008-02-29 2015-08-11 Cypress Semiconductor Corporation Multi-touch sensing method
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JP5655223B2 (ja) 2009-01-30 2015-01-21 株式会社フジクラ 乗員姿勢検知装置
ES2655729T3 (es) * 2010-02-10 2018-02-21 Microchip Technology Germany Gmbh Sistema y procedimiento de generación de una señal correlacionada con una operación de entrada manual
JP5502597B2 (ja) * 2010-05-24 2014-05-28 ルネサスエレクトロニクス株式会社 インピーダンス検出回路およびインピーダンス検出方法
JP5712558B2 (ja) * 2010-10-27 2015-05-07 セイコーエプソン株式会社 信号レベル変換回路、物理量検出装置及び電子機器
CN102006048B (zh) * 2010-12-24 2013-03-27 江苏惠通集团有限责任公司 按键侦测板
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CN102364879A (zh) * 2011-06-23 2012-02-29 苏州瀚瑞微电子有限公司 电容式触摸按键的电路结构
JP2015194813A (ja) * 2014-03-31 2015-11-05 Smk株式会社 静電容量式タッチパネル
US9304643B2 (en) 2014-06-24 2016-04-05 Synaptics Incorporated Classifying input objects interacting with a capacitive button
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Also Published As

Publication number Publication date
CA2658709A1 (en) 2006-02-23
JP2008510396A (ja) 2008-04-03
CA2658709C (en) 2013-06-25
DE112005001697T5 (de) 2008-07-24
CA2575648A1 (en) 2006-02-23
GB0701267D0 (en) 2007-02-28
GB0817444D0 (en) 2008-10-29
HK1102314A1 (zh) 2007-11-16
GB2431246A (en) 2007-04-18
GB2451765A8 (en) 2009-02-11
GB2451765B (en) 2009-05-06
GB2451765A (en) 2009-02-11
US20060033508A1 (en) 2006-02-16
US7323886B2 (en) 2008-01-29
CA2575648C (en) 2010-09-28
GB2431246B (en) 2009-01-14
WO2006017988A1 (en) 2006-02-23
GB2451765B8 (en) 2009-05-06

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