JP4810756B2 - Printed wiring board - Google Patents

Printed wiring board Download PDF

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Publication number
JP4810756B2
JP4810756B2 JP2001162665A JP2001162665A JP4810756B2 JP 4810756 B2 JP4810756 B2 JP 4810756B2 JP 2001162665 A JP2001162665 A JP 2001162665A JP 2001162665 A JP2001162665 A JP 2001162665A JP 4810756 B2 JP4810756 B2 JP 4810756B2
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Japan
Prior art keywords
circuit
limit value
lower limit
measurement
impedance
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JP2002359451A (en
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伸方 後藤
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Ibiden Co Ltd
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Ibiden Co Ltd
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【0001】
【技術分野】
本発明は,プリント配線板に関し,特に特性インピーダンスの測定に関する。
【0002】
【従来技術】
プリント配線板の品質を維持するためには,導体回路の特性インピーダンスを測定することが必要である。従来,導体回路の特性インピーダンスは,図6に示すごとく,インピーダンス測定機91に接続されたプローブ92を,プリント配線板93のインピーダンス測定領域94に接触させて電気信号を発信し受信することにより測定されていた。インピーダンス測定領域94には,測定用回路95と,接地回路96とを設けている。測定用回路95は測定用端子951と,接地回路96は接地用端子961と接続している。
プローブ92は,測定ピン925と,接地ピン926とを有し,それぞれ,プリント配線板93の測定用端子951及び接地用端子961に接触させる。そして,インピーダンス測定機91から所定電圧のパルス電流からなる信号電流を,測定用回路95に発信する。すると,測定用回路95からインピーダンス測定機91に向けて反射電流が流れる。入射電圧と反射電圧とにより,プリント配線板の導体回路の特性インピーダンスを演算し表示する。なお,符号97はケーブルである。
【0003】
近年,コンピュータ等の処理速度の向上に伴い,信号が流れるプリント配線板の性能に対する要求も厳しくなってきている。このため,プリント配線板に生じ得る特性インピーダンスも,正確に把握したいという要望がある。
【0004】
【解決しようとする課題】
しかしながら,従来のインピーダンス測定領域94では,測定用回路95が単線であったため,プリント配線板内の導体回路において生じ得る特性インピーダンスの最大値を測定できるに過ぎなかった。
実際は,導体回路において生じ得る特性インピーダンスにはバラツキがある。このため,特性インピーダンスの上限値だけを測定したのでは,導体回路の特性を正確に把握することができない。
【0005】
本発明はかかる従来の問題点に鑑み,導体回路の特性を正確に把握することができるインピーダンス測定領域を持つプリント配線板を提供しようとするものである。
【0006】
【課題の解決手段】
本発明は,導体回路を有し製品となるべき製品領域と,特性インピーダンスを測定するためのインピーダンス測定領域とを備えたプリント配線板であって,
上記インピーダンス測定領域は,上記導体回路において発生し得る特性インピーダンスの上限値を測定する上限値測定用回路と,上記導体回路において発生し得る特性インピーダンスの下限値を測定する下限値測定用回路とからなり,
上記上限値測定用回路は単線であり,
一方,上記下限値測定用回路の両側には,その長手方向に沿って,補助回路が配置されており,
上記上限値測定用回路,上記下限値測定用回路及び上記補助回路の線幅は,上記導体回路の線幅と同じかまたはその差異が±10%以内であり,
かつ上記下限値測定用回路と上記補助回路との配線ピッチは,上記導体回路の配線ピッチと同じかまたはその差異が±2%以内であることを特徴とするプリント配線板である(請求項1)。
【0007】
本発明のプリント配線板においては,製品領域内の導体回路において発生し得る特性インピーダンスの最大値だけでなく最小値をも測定することができる。このため,導体回路の特性を正確に把握することができる。
以上のように本発明によれば,導体回路の特性を正確に把握することができるインピーダンス測定領域を持つプリント配線板を提供することができる。
【0008】
発明において,上限値測定用回路及び下限値測定用回路の上側または/及び下側には,絶縁層を介して,電源回路または接地回路が配置されていることがある。上限値測定用回路及び下限値測定用回路は,プリント配線板の表面に形成されている場合もあるが,内部に形成されている場合もある。
【0009】
また,本発明においては,上記上限値測定用回路は単線であり,上記下限値測定用回路の両側には,その長手方向に沿って,補助回路が配置されており,かつ上記上限値測定用回路,上記下限値測定用回路及び上記補助回路の線幅は,上記導体回路の線幅と同じかまたはその差異が±10%以内であり,且つ上記下限値測定用回路と上記補助回路との配線ピッチは,上記導体回路の配線ピッチと同じかまたはその差異が±2%以内である。
以下,この点に関して,更に詳しく説明する。
【0010】
上記の上限値測定用回路は,導体回路の線幅とほぼ同じ線幅の単一線であり,導体回路で生じ得る特性インピーダンスの最大値を測定できる。
下限値測定用回路は,複数の補助回路を並列させている。この構造は,製品領域の導体回路において発生し得る特性インピーダンスの最小値を示すであろうと考えられる部位の構造をモデル化したものである。したがって,この下限値測定用回路によれば,導体回路で生じ得る特性インピーダンスの最小値を測定することができる。
【0011】
製品領域の導体回路において発生し得る特性インピーダンスの最小値を示すであろうと考えられる部位は,例えば,導体回路において測定対象部位の隣に少なくとも1本の導体回路があり,両回路間の間隙が狭い部位である。
ここで,補助回路は,導体回路の隣に配置されている回路をモデル化したものである。補助回路は,下限値測定用回路の両側に少なくとも1本配置されている。
上記下限値測定用回路と補助回路との配線ピッチとは,両回路の中心部間の距離をいう。
【0012】
一方,上限値測定用回路,下限値測定用回路及び補助回路の線幅と,導体回路の線幅との差異が±10%を超える場合,または下限値測定用回路と補助回路との配線ピッチと,導体回路の配線ピッチとの差異が±2%を超える場合には,導体回路の特性インピーダンスの上限値及び下限値を測定することができないおそれがある。
【0013】
本発明において,上限値測定用回路,下限値測定用回路及び補助回路の線幅は,導体回路において特性インピーダンスを知りたい測定対象部位の線幅と同じかまたはその差異が10%以内である。
これにより,当該測定対象部位の特性インピーダンスの上限値及び下限値を測定することができる。
製品領域の中に特性インピーダンスを知りたい測定対象部位が2本ある場合には,たとえば,線幅の細い測定対象部位の線幅に,上限値測定用回路,下限値測定用回路及び補助回路の線幅を上記のように合わせることが多い。線幅の太い測定対象部位の特性インピーダンスは,線幅の細い測定対象部位の特性インピーダンスの上限値及び下限値の範囲内に入ると考えられるからである。
【0014】
また,本発明において,下限値測定用回路と補助回路との配線ピッチは,導体回路において特性インピーダンスを知りたい測定対象部位の配線ピッチと同じかまたはその差異が±2%以内である。
これにより,測定対象部位の特性インピーダンスの上限値及び下限値を測定することができる。
製品領域の中に配線ピッチが異なる導体回路がある場合には,たとえば,狭い方の配線ピッチに,下限値測定用回路と補助回路との配線ピッチを上記のごとくあわせることが多い。配線ピッチが広い方の測定対象部位の特性インピーダンスの下限値は,配線ピッチが狭い方の測定対象部位の特性インピーダンスの下限値よりも大きいと考えられるからである。
【0015】
【発明の実施の形態】
上記上限値測定用回路又は/及び上記下限値測定用回路のそれぞれの長さL1と上記製品領域の長さL2との比率(L1/L2)は,0.5〜1であることが好ましい(請求項)。これにより,特性インピーダンスの測定値が安定になる。L1/L2が0.5未満の場合に,測定値が不正確になるおそれがある。また,特性インピーダンスの測定は,製品領域をある程度個片化した後に行われることが多い。このため,上記L1/L2が1を超えて長くても,個片化時に1を超えた分だけ切断されてしまうため,無意味になるからである。
【0016】
上記インピーダンス測定領域は,上記製品領域の外部に配置されていることが好ましい(請求項)。インピーダンス測定領域は,製品領域の外部に形成されていると,製品領域の外形加工のときに切断除去され,製品の中に残らない。したがって,製品の小型化を妨げなくてすむ。
【0017】
上記インピーダンス測定領域は,上記製品領域の中に配置されていることが好ましい(請求項)。これにより,各製品領域毎に特性インピーダンスを測定できるため,より正確な測定値が得られる。
【0018】
【実施例】
本発明の実施形態について実施例を用いて更に詳細に説明する。
(実施例1)
本例のプリント配線板8は,図1に示すごとく,導体回路71を有する製品領域7と,インピーダンス測定領域6とを備えている。
インピーダンス測定領域6は,製品領域7内の導体回路71において発生し得る特性インピーダンスの上限値を測定する上限値測定用回路1と,導体回路71において発生し得る特性インピーダンスの下限値を測定する下限値測定用回路2とからなる。
【0019】
下限値測定用回路2及び補助回路3の線幅B,B,配線ピッチP23,P33,間隙幅B23,B33は,導体回路71の中で線幅B711,配線ピッチP71及び間隙幅B70が狭い配線部711,例えばボンディングパッドの近傍部位に合わせている。具体的には,下限値測定用回路2の線幅Bは,100μmであり,導体回路71の上記配線部711の線幅B711と同じである。下限値測定用回路2の両側には,その長手方向に沿って,導体回路71の配線部711の間隙幅B70と同じ間隙幅B23を隔てて補助回路3が2本ずつ配置されている。補助回路3同士の間隙幅B33も,100μmであり,導体回路71の配線部711の間隙幅B70と同じである。補助回路3の線幅Bは,100μmであり,導体回路71の配線部711の線幅B711と同じである。
下限値測定用回路2と補助回路3との配線ピッチP23,及び補助回路3同士の配線ピッチP33は,導体回路71の配線部711の配線ピッチP70と同じである。
上限値測定用回路1は,導体回路71の配線部711の線幅B711と同じ線幅Bを有する単線である。その線幅Bは100μmである。
【0020】
上限値測定用回路1及び下限値測定用回路2の一端には,上限値測定用端子11及び下限値測定用端子21が接続されている。
図2,図3に示すごとく,インピーダンス測定領域6の内部には,ベタ状の電源回路4が配置されている。この電源回路4は,製品領域における電源回路とほぼ同じ位置にほぼ近似した形状である。内部の電源回路4は,インピーダンス測定領域6内に形成された直径0.3mmのビアホール42を通じて,外部の電源用端子43と接続している。図3に示すごとく,電源回路4と,上限値測定用回路1及び下限値測定用回路2との間には,ガラスエポキシ樹脂からなる厚み75μmの絶縁層85が介在している。上限値測定用回路1,下限値測定用回路2,補助回路3及び電源回路4は,それぞれ板状であり,互いに板面が並行に対向してマイクロストリップライン構造をなす。
【0021】
図1に示すごとく,上限値測定用回路1及び下限値測定用回路2の長さL1は40mmであり,製品領域7の長さL2は42.5mmであって,両者の比率(L1/L2)は,0.94である。
製品領域7に設けられた導体回路71は,配線部711と,ボンディングパッド712と,ビアホール710とを有する。製品領域7の中央には,電子部品を搭載するための搭載部72が設けられている。
【0022】
図4に示すごとく,インピーダンス測定領域6は,製品領域7の外部に形成されている。インピーダンス測定領域6は,プリント配線板8の周縁部のつかみ代81に形成されており,基板端部から20mm内側に位置している。インピーダンス測定領域6は,製品領域7の外形の延長線と同じになるように配置されている。
【0023】
図1に示すごとく,インピーダンス測定領域6において特性インピーダンスを測定するにあたっては,インピーダンス測定機51に接続された測定ピン525及び電源ピン526を,それぞれ,インピーダンス測定領域6の上限値測定用端子11及び電源用端子43に接触させる。このときの特性インピーダンスは53Ωであった。
次に,測定ピン525及び電源ピン526を,それぞれ,下限値測定用端子12及び電源用端子43に接触させる。このときの特性インピーダンスは48Ωであった。
インピーダンス測定領域6は,特性インピーダンス測定後に,外形加工により,つかみ代81の一部として切断除去される。
【0024】
本例のプリント配線板8においては,導体回路において発生し得る特性インピーダンスの最大値だけでなく最小値をも測定することができる。このため,導体回路の特性を正確に把握することができる。
【0025】
(実施例2)
本例は,図5に示すごとく,インピーダンス測定領域6が製品領域7の内部に配置されている例である。プリント配線板8の外形加工により製品領域6が個片化されて製品となるが,この製品にはインピーダンス測定領域6が残る。
インピーダンス測定領域6は,各製品領域7毎に形成されている。このため,各製品領域ごとの正確な特性インピーダンスを測定することができる。
その他は,実施例1と同様である。本例においては実施例1と同様の効果を発揮できる。
【図面の簡単な説明】
【図1】実施例1のプリント配線板の平面図。
【図2】実施例1における,プリント配線板の内部に形成された電源回路の平面図。
【図3】実施例1における,プリント配線板の断面図。
【図4】実施例1における,インピーダンス測定領域の配置説明図。
【図5】実施例2における,インピーダンス測定領域の配置説明図。
【図6】従来例のインピーダンス測定方法の説明図。
【符号の説明】
1...上限値測定用回路,
11...上限値測定用端子,
2...下限値測定用回路,
21...下限値測定用端子,
3...補助回路,
4...電源回路,
42...ビアホール,
43...電源用端子,
51...インピーダンス測定機,
6...インピーダンス測定領域,
7...製品領域,
71...導体回路,
711...配線部,
8...プリント配線板,
[0001]
【Technical field】
The present invention relates to a printed wiring board, and more particularly to measurement of characteristic impedance.
[0002]
[Prior art]
In order to maintain the quality of the printed wiring board, it is necessary to measure the characteristic impedance of the conductor circuit. Conventionally, as shown in FIG. 6, the characteristic impedance of a conductor circuit is measured by transmitting and receiving an electrical signal by bringing a probe 92 connected to an impedance measuring machine 91 into contact with an impedance measurement region 94 of a printed wiring board 93. It had been. In the impedance measurement region 94, a measurement circuit 95 and a ground circuit 96 are provided. The measurement circuit 95 is connected to the measurement terminal 951, and the ground circuit 96 is connected to the ground terminal 961.
The probe 92 has a measurement pin 925 and a ground pin 926, and is brought into contact with the measurement terminal 951 and the ground terminal 961 of the printed wiring board 93, respectively. Then, a signal current composed of a pulse current of a predetermined voltage is transmitted from the impedance measuring device 91 to the measuring circuit 95. Then, a reflected current flows from the measurement circuit 95 toward the impedance measuring device 91. The characteristic impedance of the conductor circuit of the printed wiring board is calculated and displayed based on the incident voltage and the reflected voltage. Reference numeral 97 denotes a cable.
[0003]
In recent years, with the increase in processing speed of computers and the like, demands on the performance of printed wiring boards through which signals flow have become stricter. Therefore, there is a demand for accurately grasping the characteristic impedance that can occur in the printed wiring board.
[0004]
[Problems to be solved]
However, in the conventional impedance measurement region 94, since the measurement circuit 95 is a single line, it is only possible to measure the maximum value of the characteristic impedance that can occur in the conductor circuit in the printed wiring board.
Actually, there are variations in characteristic impedance that can occur in a conductor circuit. For this reason, if only the upper limit of the characteristic impedance is measured, the characteristics of the conductor circuit cannot be accurately grasped.
[0005]
In view of the conventional problems, the present invention intends to provide a printed wiring board having an impedance measurement region capable of accurately grasping the characteristics of a conductor circuit.
[0006]
[Means for solving problems]
The present invention is a printed wiring board having a product area having a conductor circuit to be a product and an impedance measurement area for measuring characteristic impedance,
The impedance measurement region includes an upper limit value measuring circuit for measuring an upper limit value of the characteristic impedance that can be generated in the conductor circuit, and a lower limit value measuring circuit for measuring the lower limit value of the characteristic impedance that can be generated in the conductor circuit. Do Ri,
The upper limit measurement circuit is a single wire,
On the other hand, auxiliary circuits are arranged along the longitudinal direction on both sides of the lower limit measurement circuit.
The line widths of the upper limit value measuring circuit, the lower limit value measuring circuit and the auxiliary circuit are the same as or different from the line width of the conductor circuit within ± 10%.
The printed circuit board is characterized in that the wiring pitch between the lower limit value measuring circuit and the auxiliary circuit is the same as or different from the wiring pitch of the conductor circuit within ± 2%. ).
[0007]
In the printed wiring board of the present invention, not only the maximum value of characteristic impedance that can be generated in the conductor circuit in the product area but also the minimum value can be measured. For this reason, it is possible to accurately grasp the characteristics of the conductor circuit.
As described above, according to the present invention, it is possible to provide a printed wiring board having an impedance measurement region capable of accurately grasping the characteristics of a conductor circuit.
[0008]
In the present invention, a power supply circuit or a ground circuit may be disposed above or / and below the upper limit value measuring circuit and the lower limit value measuring circuit via an insulating layer. The upper limit value measurement circuit and the lower limit value measurement circuit may be formed on the surface of the printed wiring board, or may be formed inside.
[0009]
In the present invention, the upper limit value measuring circuit is a single wire, and auxiliary circuits are arranged along the longitudinal direction on both sides of the lower limit value measuring circuit, and the upper limit value measuring circuit is provided. The line widths of the circuit, the lower limit measurement circuit, and the auxiliary circuit are the same as or different from the line width of the conductor circuit, and the lower limit measurement circuit and the auxiliary circuit wiring pitch is the same or the difference between the wiring pitch of the conductive circuits Ru der within 2% ±.
Hereinafter, this point will be described in more detail.
[0010]
Upper limit measuring circuit described above, is substantially a single line of the same line width as that of the conductors circuit, it is possible to measure the maximum value of the characteristic impedance which may occur in the conductor circuit.
The lower limit measurement circuit has a plurality of auxiliary circuits arranged in parallel. This structure is a model of the structure of a part that is considered to exhibit the minimum value of characteristic impedance that can be generated in a conductor circuit in the product area. Therefore, according to this lower limit value measuring circuit, it is possible to measure the minimum value of characteristic impedance that can occur in the conductor circuit.
[0011]
For example, there is at least one conductor circuit next to the part to be measured in the conductor circuit, and the gap between the two circuits may be considered to be the minimum characteristic impedance that can occur in the conductor circuit in the product area. It is a narrow part.
Here, the auxiliary circuit is a model of a circuit arranged next to the conductor circuit. At least one auxiliary circuit is arranged on both sides of the lower limit value measuring circuit.
The wiring pitch between the lower limit value measuring circuit and the auxiliary circuit is the distance between the central portions of both circuits.
[0012]
On the other hand, when the difference between the line width of the upper limit measurement circuit, the lower limit measurement circuit and the auxiliary circuit and the line width of the conductor circuit exceeds ± 10%, or the wiring pitch between the lower limit measurement circuit and the auxiliary circuit If the difference between the wiring pitch of the conductor circuit exceeds ± 2%, the upper limit value and lower limit value of the characteristic impedance of the conductor circuit may not be measured.
[0013]
In the present invention, the upper limit value measuring circuit, the lower limit line width of the measuring circuit and the auxiliary circuit, Ru same or der is within 10% the difference between the line width of the stbm want to know the characteristic impedance at the conductor circuit .
Thereby, the upper limit value and lower limit value of the characteristic impedance of the measurement target part can be measured.
If there are two parts to be measured in the product area where you want to know the characteristic impedance, for example, the upper limit value measurement circuit, lower limit value measurement circuit, and auxiliary circuit are added to the line width of the measurement target part with a narrow line width. The line width is often matched as described above. This is because the characteristic impedance of the measurement target part having a large line width is considered to fall within the range of the upper limit value and the lower limit value of the characteristic impedance of the measurement target part having a narrow line width.
[0014]
Further, in the present invention, the wiring pitch of the lower limit value measuring circuit and auxiliary circuit are identical or the difference between the wiring pitch of stbm want to know the characteristic impedance in conductive circuits Ru der within 2% ±.
Thereby, the upper limit value and the lower limit value of the characteristic impedance of the measurement target part can be measured.
When there are conductor circuits with different wiring pitches in the product area, for example, the wiring pitch between the lower limit value measuring circuit and the auxiliary circuit is often adjusted to the narrower wiring pitch as described above. This is because the lower limit value of the characteristic impedance of the part to be measured with the wider wiring pitch is considered to be larger than the lower limit value of the characteristic impedance of the part to be measured with the narrower wiring pitch.
[0015]
DETAILED DESCRIPTION OF THE INVENTION
The ratio (L1 / L2) between the length L1 of the upper limit value measuring circuit and / or the lower limit value measuring circuit and the length L2 of the product region is preferably 0.5 to 1 ( Claim 2 ). This stabilizes the measured value of the characteristic impedance. If L1 / L2 is less than 0.5, the measured value may be inaccurate. In addition, the measurement of characteristic impedance is often performed after the product area is separated into a certain amount. For this reason, even if the L1 / L2 is longer than 1, it becomes meaningless because it is cut by the amount exceeding 1 at the time of singulation.
[0016]
The impedance measurement region is preferably arranged outside the product region (claim 3 ). If the impedance measurement area is formed outside the product area, it is cut off during the outer shape processing of the product area and does not remain in the product. Therefore, miniaturization of the product can be prevented.
[0017]
The impedance measuring region is preferably arranged in the product area (claim 4). As a result, the characteristic impedance can be measured for each product area, so that a more accurate measurement value can be obtained.
[0018]
【Example】
Embodiments of the present invention will be described in more detail using examples.
(Example 1)
As shown in FIG. 1, the printed wiring board 8 of this example includes a product region 7 having a conductor circuit 71 and an impedance measurement region 6.
The impedance measurement area 6 includes an upper limit measurement circuit 1 that measures the upper limit value of the characteristic impedance that can be generated in the conductor circuit 71 in the product area 7, and a lower limit that measures the lower limit value of the characteristic impedance that can be generated in the conductor circuit 71. And a value measuring circuit 2.
[0019]
The line widths B 2 and B 3 , the wiring pitches P 23 and P 33 , and the gap widths B 23 and B 33 of the lower limit measurement circuit 2 and the auxiliary circuit 3 are the line width B 711 and the wiring pitch P in the conductor circuit 71. 71 and the gap width B 70 are matched with the narrow wiring portion 711, for example, in the vicinity of the bonding pad. Specifically, the line width B 2 of the lower limit value measuring circuit 2 is 100 μm, which is the same as the line width B 711 of the wiring portion 711 of the conductor circuit 71. Two auxiliary circuits 3 are arranged on both sides of the lower limit value measuring circuit 2 along the longitudinal direction with a gap width B 23 equal to the gap width B 70 of the wiring portion 711 of the conductor circuit 71. . The gap width B 33 between the auxiliary circuits 3 is also 100 μm, which is the same as the gap width B 70 of the wiring part 711 of the conductor circuit 71. Line width B 3 of the auxiliary circuit 3 is 100 [mu] m, the same as the line width B 711 of the wiring portion 711 of the conductor circuit 71.
The wiring pitch P 23 between the lower limit measurement circuit 2 and the auxiliary circuit 3 and the wiring pitch P 33 between the auxiliary circuits 3 are the same as the wiring pitch P 70 of the wiring portion 711 of the conductor circuit 71.
Upper limit measuring circuit 1 is a single line having the same line width B 1 and the line width B 711 of the wiring portion 711 of the conductor circuit 71. Its line width B 1 is 100 μm.
[0020]
An upper limit measurement terminal 11 and a lower limit measurement terminal 21 are connected to one end of the upper limit measurement circuit 1 and the lower limit measurement circuit 2.
As shown in FIGS. 2 and 3, a solid power supply circuit 4 is arranged inside the impedance measurement region 6. The power supply circuit 4 has a shape approximately approximate to the same position as the power supply circuit in the product area. The internal power supply circuit 4 is connected to an external power supply terminal 43 through a via hole 42 having a diameter of 0.3 mm formed in the impedance measurement region 6. As shown in FIG. 3, an insulating layer 85 made of glass epoxy resin and having a thickness of 75 μm is interposed between the power supply circuit 4 and the upper limit value measuring circuit 1 and the lower limit value measuring circuit 2. The upper limit value measuring circuit 1, the lower limit value measuring circuit 2, the auxiliary circuit 3 and the power supply circuit 4 are each plate-shaped and have a microstrip line structure with their plate surfaces facing each other in parallel.
[0021]
As shown in FIG. 1, the length L1 of the upper limit value measuring circuit 1 and the lower limit value measuring circuit 2 is 40 mm, the length L2 of the product region 7 is 42.5 mm, and the ratio between them (L1 / L2 ) Is 0.94.
The conductor circuit 71 provided in the product region 7 has a wiring portion 711, a bonding pad 712, and a via hole 710. In the center of the product area 7, a mounting portion 72 for mounting electronic components is provided.
[0022]
As shown in FIG. 4, the impedance measurement region 6 is formed outside the product region 7. The impedance measurement region 6 is formed at a gripping margin 81 at the peripheral edge of the printed wiring board 8 and is located 20 mm inside from the edge of the substrate. The impedance measurement region 6 is arranged so as to be the same as the extension line of the outer shape of the product region 7.
[0023]
As shown in FIG. 1, when measuring the characteristic impedance in the impedance measurement region 6, the measurement pin 525 and the power supply pin 526 connected to the impedance measuring machine 51 are connected to the upper limit value measurement terminal 11 and the impedance measurement region 6, respectively. Contact the power supply terminal 43. The characteristic impedance at this time was 53Ω.
Next, the measurement pin 525 and the power supply pin 526 are brought into contact with the lower limit value measurement terminal 12 and the power supply terminal 43, respectively. The characteristic impedance at this time was 48Ω.
The impedance measurement region 6 is cut and removed as a part of the gripping margin 81 by external processing after characteristic impedance measurement.
[0024]
In the printed wiring board 8 of this example, not only the maximum value of the characteristic impedance that can be generated in the conductor circuit but also the minimum value can be measured. For this reason, it is possible to accurately grasp the characteristics of the conductor circuit.
[0025]
(Example 2)
In this example, as shown in FIG. 5, the impedance measurement region 6 is arranged inside the product region 7. The product region 6 is separated into individual products by the outer shape processing of the printed wiring board 8, and the impedance measurement region 6 remains in the product.
The impedance measurement region 6 is formed for each product region 7. Therefore, it is possible to measure an accurate characteristic impedance for each product area.
Others are the same as in the first embodiment. In this example, the same effect as in the first embodiment can be exhibited.
[Brief description of the drawings]
FIG. 1 is a plan view of a printed wiring board according to Embodiment 1. FIG.
2 is a plan view of a power supply circuit formed inside a printed wiring board in Embodiment 1. FIG.
3 is a cross-sectional view of a printed wiring board in Embodiment 1. FIG.
FIG. 4 is an explanatory diagram of an arrangement of impedance measurement regions in the first embodiment.
FIG. 5 is an explanatory diagram of an arrangement of impedance measurement regions in the second embodiment.
FIG. 6 is an explanatory diagram of a conventional impedance measurement method.
[Explanation of symbols]
1. . . Upper limit measurement circuit,
11. . . Terminal for measuring the upper limit value,
2. . . Lower limit measurement circuit,
21. . . Lower limit measurement terminal,
3. . . Auxiliary circuit,
4). . . Power supply circuit,
42. . . Beer hall,
43. . . Power terminal,
51. . . Impedance measuring machine,
6). . . Impedance measurement area,
7). . . Product areas,
71. . . Conductor circuit,
711. . . Wiring section,
8). . . Printed wiring board,

Claims (4)

導体回路を有し製品となるべき製品領域と,特性インピーダンスを測定するためのインピーダンス測定領域とを備えたプリント配線板であって,
上記インピーダンス測定領域は,上記導体回路において発生し得る特性インピーダンスの上限値を測定する上限値測定用回路と,上記導体回路において発生し得る特性インピーダンスの下限値を測定する下限値測定用回路とからなり,
上記上限値測定用回路は単線であり,
一方,上記下限値測定用回路の両側には,その長手方向に沿って,補助回路が配置されており,
上記上限値測定用回路,上記下限値測定用回路及び上記補助回路の線幅は,上記導体回路の線幅と同じかまたはその差異が±10%以内であり,
かつ上記下限値測定用回路と上記補助回路との配線ピッチは,上記導体回路の配線ピッチと同じかまたはその差異が±2%以内であることを特徴とするプリント配線板。
A printed wiring board having a product area to be a product having a conductor circuit and an impedance measurement area for measuring characteristic impedance,
The impedance measurement region includes an upper limit value measuring circuit for measuring an upper limit value of the characteristic impedance that can be generated in the conductor circuit, and a lower limit value measuring circuit for measuring the lower limit value of the characteristic impedance that can be generated in the conductor circuit. Do Ri,
The upper limit measurement circuit is a single wire,
On the other hand, auxiliary circuits are arranged along the longitudinal direction on both sides of the lower limit measurement circuit.
The line widths of the upper limit value measuring circuit, the lower limit value measuring circuit and the auxiliary circuit are the same as or different from the line width of the conductor circuit within ± 10%.
The printed wiring board is characterized in that a wiring pitch between the lower limit measuring circuit and the auxiliary circuit is the same as or different from a wiring pitch of the conductor circuit within ± 2% .
請求項1において,上記上限値測定用回路又は/及び上記下限値測定用回路のそれぞれの長さL1と上記製品領域の長さL2との比率(L1/L2)は,0.5〜1であることを特徴とするプリント配線板。 The ratio (L1 / L2) between the length L1 of the upper limit value measuring circuit and / or the lower limit value measuring circuit and the length L2 of the product area is 0.5 to 1. printed circuit board, characterized in that. 請求項1又は2において,上記インピーダンス測定領域は,上記製品領域の外部に配置されていることを特徴とするプリント配線板。 3. The printed wiring board according to claim 1, wherein the impedance measurement area is disposed outside the product area . 請求項1又は2において,上記インピーダンス測定領域は,上記製品領域の中に配置されていることを特徴とするプリント配線板。 The printed wiring board according to claim 1, wherein the impedance measurement area is disposed in the product area .
JP2001162665A 2001-05-30 2001-05-30 Printed wiring board Expired - Lifetime JP4810756B2 (en)

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JPH0541567A (en) * 1991-08-06 1993-02-19 Fujitsu Ltd Printed wiring board
JPH0548272A (en) * 1991-08-09 1993-02-26 Fujitsu Ltd Printed circuit board
JPH05102622A (en) * 1991-10-09 1993-04-23 Nec Corp Printed wiring board and inspection apparatus therefor
JP2886438B2 (en) * 1994-02-28 1999-04-26 沖電気工業株式会社 Printed wiring board and its wiring method
JP4034888B2 (en) * 1998-10-30 2008-01-16 イビデン株式会社 Test coupon on printed wiring board

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