JP4773677B2 - 工作機械プローブ - Google Patents

工作機械プローブ Download PDF

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Publication number
JP4773677B2
JP4773677B2 JP2002562938A JP2002562938A JP4773677B2 JP 4773677 B2 JP4773677 B2 JP 4773677B2 JP 2002562938 A JP2002562938 A JP 2002562938A JP 2002562938 A JP2002562938 A JP 2002562938A JP 4773677 B2 JP4773677 B2 JP 4773677B2
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JP
Japan
Prior art keywords
probe
mode
switch
stylus
probe according
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2002562938A
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English (en)
Japanese (ja)
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JP2004522961A (ja
JP2004522961A5 (https=
Inventor
コリングウッド デイビッド
ポール フーゲ ジョナサン
ソルト ジェフリー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Renishaw PLC
Original Assignee
Renishaw PLC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from GB0102750A external-priority patent/GB0102750D0/en
Priority claimed from GB0112998A external-priority patent/GB0112998D0/en
Application filed by Renishaw PLC filed Critical Renishaw PLC
Publication of JP2004522961A publication Critical patent/JP2004522961A/ja
Publication of JP2004522961A5 publication Critical patent/JP2004522961A5/ja
Application granted granted Critical
Publication of JP4773677B2 publication Critical patent/JP4773677B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/04—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness by measuring coordinates of points
    • G01B21/047—Accessories, e.g. for positioning, for tool-setting, for measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00—Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/004—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points
    • G01B5/008—Measuring arrangements characterised by the use of mechanical techniques for measuring coordinates of points using coordinate measuring machines
    • G01B5/012—Contact-making feeler heads therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2210/00—Aspects not specifically covered by any group under G01B, e.g. of wheel alignment, caliper-like sensors
    • G01B2210/58—Wireless transmission of information between a sensor or probe and a control or evaluation unit
    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B2219/00—Program-control systems
    • G05B2219/30—Nc systems
    • G05B2219/37—Measurements
    • G05B2219/37193—Multicoordinate measuring system, machine, cmm

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
  • Cutting Tools, Boring Holders, And Turrets (AREA)
  • Measuring And Recording Apparatus For Diagnosis (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)
  • Machine Tool Sensing Apparatuses (AREA)
  • Electrical Discharge Machining, Electrochemical Machining, And Combined Machining (AREA)
  • Automatic Tool Replacement In Machine Tools (AREA)
JP2002562938A 2001-02-02 2002-02-01 工作機械プローブ Expired - Fee Related JP4773677B2 (ja)

Applications Claiming Priority (5)

Application Number Priority Date Filing Date Title
GB0102750A GB0102750D0 (en) 2001-02-02 2001-02-02 Machine tool probe
GB0102750.7 2001-02-02
GB0112998A GB0112998D0 (en) 2001-05-30 2001-05-30 Machine tool probe
GB0112998.0 2001-05-30
PCT/GB2002/000465 WO2002063235A2 (en) 2001-02-02 2002-02-01 Machine tool probe

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2008119925A Division JP4851488B2 (ja) 2001-02-02 2008-05-01 工作機械プローブ

Publications (3)

Publication Number Publication Date
JP2004522961A JP2004522961A (ja) 2004-07-29
JP2004522961A5 JP2004522961A5 (https=) 2005-12-22
JP4773677B2 true JP4773677B2 (ja) 2011-09-14

Family

ID=26245677

Family Applications (2)

Application Number Title Priority Date Filing Date
JP2002562938A Expired - Fee Related JP4773677B2 (ja) 2001-02-02 2002-02-01 工作機械プローブ
JP2008119925A Expired - Fee Related JP4851488B2 (ja) 2001-02-02 2008-05-01 工作機械プローブ

Family Applications After (1)

Application Number Title Priority Date Filing Date
JP2008119925A Expired - Fee Related JP4851488B2 (ja) 2001-02-02 2008-05-01 工作機械プローブ

Country Status (6)

Country Link
US (3) US7145468B2 (https=)
EP (4) EP1988439B1 (https=)
JP (2) JP4773677B2 (https=)
AT (3) ATE336742T1 (https=)
DE (4) DE60213956T2 (https=)
WO (1) WO2002063235A2 (https=)

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US9772394B2 (en) 2010-04-21 2017-09-26 Faro Technologies, Inc. Method and apparatus for following an operator and locking onto a retroreflector with a laser tracker
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JP6727306B2 (ja) 2015-12-22 2020-07-22 株式会社ミツトヨ Ｃｍｍタッチプローブのためのセンサ信号オフセット補正システム
WO2017182875A1 (en) * 2016-04-21 2017-10-26 Mitutoyo Corporation Coordinate measurement probe body
JP7100119B2 (ja) * 2017-09-29 2022-07-12 株式会社ミツトヨ 複雑な回路の統合用のコンパクトな測定デバイス構成体
US10967510B2 (en) * 2017-11-16 2021-04-06 Industrial Technology Research Institute Robot arm processing system and method thereof
DE102019116873A1 (de) * 2019-06-24 2020-12-24 M & H Inprocess Messtechnik Gmbh Verfahren zum Verbinden einer Sende- und Empfangseinheit mit einem Messinstrument
US11408762B2 (en) * 2019-08-14 2022-08-09 Edlund Company, Llc Electronic weighing scales with user-configurable check weigh function and methods of using the same
GB202103105D0 (en) 2021-03-05 2021-04-21 Renishaw Plc Measurement probe
DE102022001371A1 (de) * 2022-04-21 2023-10-26 Grob-Werke Gmbh & Co. Kg Vorrichtung und Verfahren zum Vermessen von Prüflingen
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US12488448B2 (en) 2023-07-20 2025-12-02 Mitutoyo Corporation Machine vision system with objective lens and collision protection

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Also Published As

Publication number Publication date
ATE407389T1 (de) 2008-09-15
US7145468B2 (en) 2006-12-05
JP4851488B2 (ja) 2012-01-11
DE60213956D1 (de) 2006-09-28
EP1373995B1 (en) 2006-08-16
JP2008203270A (ja) 2008-09-04
WO2002063235A2 (en) 2002-08-15
WO2002063235A3 (en) 2003-10-30
US7812736B2 (en) 2010-10-12
ATE336742T1 (de) 2006-09-15
ATE400011T1 (de) 2008-07-15
DE60228772D1 (de) 2008-10-16
US20060250266A1 (en) 2006-11-09
JP2004522961A (ja) 2004-07-29
US7486195B2 (en) 2009-02-03
DE60237556D1 (de) 2010-10-14
EP1701234A1 (en) 2006-09-13
EP1988439A1 (en) 2008-11-05
DE60213956T2 (de) 2006-12-21
EP1988439B1 (en) 2010-09-01
DE60227431D1 (de) 2008-08-14
EP1373995A2 (en) 2004-01-02
EP1734426A1 (en) 2006-12-20
US20090140873A1 (en) 2009-06-04
EP1701234B1 (en) 2008-09-03
US20030179097A1 (en) 2003-09-25
EP1734426B1 (en) 2008-07-02

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