JP4773581B2 - Pll回路を用いた膜厚測定器 - Google Patents
Pll回路を用いた膜厚測定器 Download PDFInfo
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- JP4773581B2 JP4773581B2 JP2010529559A JP2010529559A JP4773581B2 JP 4773581 B2 JP4773581 B2 JP 4773581B2 JP 2010529559 A JP2010529559 A JP 2010529559A JP 2010529559 A JP2010529559 A JP 2010529559A JP 4773581 B2 JP4773581 B2 JP 4773581B2
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- Prior art keywords
- frequency
- circuit
- oscillation
- film thickness
- signal
- Prior art date
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- 238000005259 measurement Methods 0.000 claims description 11
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- 230000015572 biosynthetic process Effects 0.000 claims description 6
- 239000013078 crystal Substances 0.000 description 50
- 239000010408 film Substances 0.000 description 47
- 238000010586 diagram Methods 0.000 description 19
- 230000008021 deposition Effects 0.000 description 12
- 238000003380 quartz crystal microbalance Methods 0.000 description 10
- 238000000034 method Methods 0.000 description 9
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- 239000010453 quartz Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000007740 vapor deposition Methods 0.000 description 6
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- 229910052751 metal Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 4
- 238000004544 sputter deposition Methods 0.000 description 4
- 239000000126 substance Substances 0.000 description 4
- 239000010409 thin film Substances 0.000 description 4
- 230000007704 transition Effects 0.000 description 4
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
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- IGLNJRXAVVLDKE-UHFFFAOYSA-N rubidium atom Chemical compound [Rb] IGLNJRXAVVLDKE-UHFFFAOYSA-N 0.000 description 2
- 238000012935 Averaging Methods 0.000 description 1
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Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/063—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using piezoelectric resonators
- G01B7/066—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using piezoelectric resonators for measuring thickness of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R23/00—Arrangements for measuring frequencies; Arrangements for analysing frequency spectra
- G01R23/02—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage
- G01R23/12—Arrangements for measuring frequency, e.g. pulse repetition rate; Arrangements for measuring period of current or voltage by converting frequency into phase shift
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0991—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider
- H03L7/0994—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator being a digital oscillator, e.g. composed of a fixed oscillator followed by a variable frequency divider comprising an accumulator
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/16—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop
- H03L7/22—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using more than one loop
- H03L7/23—Indirect frequency synthesis, i.e. generating a desired one of a number of predetermined frequencies using a frequency- or phase-locked loop using more than one loop with pulse counters or frequency dividers
- H03L7/235—Nested phase locked loops
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/24—Automatic control of frequency or phase; Synchronisation using a reference signal directly applied to the generator
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03B—GENERATION OF OSCILLATIONS, DIRECTLY OR BY FREQUENCY-CHANGING, BY CIRCUITS EMPLOYING ACTIVE ELEMENTS WHICH OPERATE IN A NON-SWITCHING MANNER; GENERATION OF NOISE BY SUCH CIRCUITS
- H03B5/00—Generation of oscillations using amplifier with regenerative feedback from output to input
- H03B5/30—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator
- H03B5/32—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator
- H03B5/36—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device
- H03B5/362—Generation of oscillations using amplifier with regenerative feedback from output to input with frequency-determining element being electromechanical resonator being a piezoelectric resonator active element in amplifier being semiconductor device the amplifier being a single transistor
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/085—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal
- H03L7/093—Details of the phase-locked loop concerning mainly the frequency- or phase-detection arrangement including the filtering or amplification of its output signal using special filtering or amplification characteristics in the loop
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Length Measuring Devices Characterised By Use Of Acoustic Means (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
Description
2 バッファ回路
3 分周器
4 ループフィルタ
5 位相比較器
6 A/D変換器
7 CPU
8 DDS(第2の発振回路)
9 基準発振器
10 分周器
11 圧電素子(水晶振動子)
14 フィルタ回路
15 分周器
A 発振回路部
B 周波数計測部
C 真空チャンバー
L1 インダクタンス
R1 ダンプ抵抗
アラン標準偏差:1.00e-09
(2)ルビジウム発振器
アラン標準偏差:3.00e-11
(3)OCXO(Oven Controlled Crystal Oscillator:温度制御型水晶発振器)=水晶発振回路を高温槽に挿入することにより高安定化を図ったもの。
アラン標準偏差:4.00e-12
Claims (3)
- 圧電素子を備えた発振回路と、前記発振回路の出力信号の周波数を計測する周波数計測回路とを備え、前記圧電素子上に成膜材料を堆積させ、前記成膜材料の堆積による前記圧電素子の固有振動数の変化に基づいて、前記成膜材料の膜厚を測定する膜厚測定器であって、
前記周波数計測回路は、前記発振回路の出力信号が基準信号として入力される位相比較器と、前記位相比較器の出力信号が入力されるループフィルタと、前記ループフィルタの出力信号をデジタル信号に変換するA/D変換器と、前記A/D変換機から出力されたデジタル信号が入力される演算回路と、前記演算回路から出力される周波数設定信号に応じた周波数の信号を出力するDDS(ダイレクトデジタルシンセサイザ)とを備え、
前記DDSの出力信号は、前記位相比較器に対して前記基準信号との比較信号として入力されるように構成され、前記DDSの出力信号の一部が注入同期信号として、前記発振回路に注入されるように構成されていることを特徴とする膜厚測定器。 - 前記発振回路において、前記圧電素子と直列にインダクタンスが接続されていることを特徴とする請求項1に記載された膜厚測定器。
- 前記インダクタンスと並列に抵抗素子が接続されていることを特徴とする請求項2に記載された膜厚測定器。
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2008/067096 WO2010032328A1 (ja) | 2008-09-22 | 2008-09-22 | Pll回路およびこれを用いた膜厚測定器 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP4773581B2 true JP4773581B2 (ja) | 2011-09-14 |
JPWO2010032328A1 JPWO2010032328A1 (ja) | 2012-02-02 |
Family
ID=42039181
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2010529559A Expired - Fee Related JP4773581B2 (ja) | 2008-09-22 | 2008-09-22 | Pll回路を用いた膜厚測定器 |
Country Status (3)
Country | Link |
---|---|
US (1) | US8432151B2 (ja) |
JP (1) | JP4773581B2 (ja) |
WO (1) | WO2010032328A1 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US10178723B2 (en) | 2011-06-03 | 2019-01-08 | Cree, Inc. | Systems and methods for controlling solid state lighting devices and lighting apparatus incorporating such systems and/or methods |
CN105917023B (zh) * | 2013-10-03 | 2019-05-10 | 英飞康公司 | 监控薄膜沉积 |
KR102035146B1 (ko) * | 2014-05-26 | 2019-10-22 | 가부시키가이샤 아루박 | 성막 장치, 유기막의 막후 측정 방법 및 유기막용 막후 센서 |
CN105223555B (zh) * | 2015-09-22 | 2017-12-26 | 北京理工雷科电子信息技术有限公司 | 一种宽带低噪声调频信号源 |
EP3758235A1 (en) | 2019-06-25 | 2020-12-30 | Comet AG | Device and method for synchronizing a high frequency power signal and an external reference signal |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0677823A (ja) * | 1992-08-24 | 1994-03-18 | Oki Electric Ind Co Ltd | 周波数シンセサイザ |
JPH08340254A (ja) * | 1995-06-12 | 1996-12-24 | Fujitsu Ltd | 周波数シンセサイザ |
JP2001044757A (ja) * | 1999-07-27 | 2001-02-16 | Nippon Dempa Kogyo Co Ltd | 電圧制御発振器 |
JP2004279167A (ja) * | 2003-03-14 | 2004-10-07 | Seiko Epson Corp | 測定方法及び測定信号出力回路並びに測定装置 |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3483749B2 (ja) | 1997-11-28 | 2004-01-06 | 株式会社アルバック | 圧電結晶発振式膜厚計 |
JP4078555B2 (ja) * | 2004-03-17 | 2008-04-23 | セイコーエプソン株式会社 | ニオブ酸カリウム堆積体の製造方法 |
-
2008
- 2008-09-22 JP JP2010529559A patent/JP4773581B2/ja not_active Expired - Fee Related
- 2008-09-22 US US13/002,865 patent/US8432151B2/en not_active Expired - Fee Related
- 2008-09-22 WO PCT/JP2008/067096 patent/WO2010032328A1/ja active Application Filing
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0677823A (ja) * | 1992-08-24 | 1994-03-18 | Oki Electric Ind Co Ltd | 周波数シンセサイザ |
JPH08340254A (ja) * | 1995-06-12 | 1996-12-24 | Fujitsu Ltd | 周波数シンセサイザ |
JP2001044757A (ja) * | 1999-07-27 | 2001-02-16 | Nippon Dempa Kogyo Co Ltd | 電圧制御発振器 |
JP2004279167A (ja) * | 2003-03-14 | 2004-10-07 | Seiko Epson Corp | 測定方法及び測定信号出力回路並びに測定装置 |
Also Published As
Publication number | Publication date |
---|---|
WO2010032328A1 (ja) | 2010-03-25 |
US20110115467A1 (en) | 2011-05-19 |
JPWO2010032328A1 (ja) | 2012-02-02 |
US8432151B2 (en) | 2013-04-30 |
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