JP4768978B2 - 放射線検出器 - Google Patents
放射線検出器 Download PDFInfo
- Publication number
- JP4768978B2 JP4768978B2 JP2004295650A JP2004295650A JP4768978B2 JP 4768978 B2 JP4768978 B2 JP 4768978B2 JP 2004295650 A JP2004295650 A JP 2004295650A JP 2004295650 A JP2004295650 A JP 2004295650A JP 4768978 B2 JP4768978 B2 JP 4768978B2
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- Prior art keywords
- substrate
- electrode
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- photoconductor
- pixel
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- 230000005855 radiation Effects 0.000 title claims description 34
- 239000000758 substrate Substances 0.000 claims description 109
- 239000000463 material Substances 0.000 description 8
- 239000003990 capacitor Substances 0.000 description 7
- 238000003384 imaging method Methods 0.000 description 7
- 238000001514 detection method Methods 0.000 description 6
- 239000000969 carrier Substances 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000011159 matrix material Substances 0.000 description 5
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 238000004070 electrodeposition Methods 0.000 description 4
- 238000000034 method Methods 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 229910021419 crystalline silicon Inorganic materials 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 229910004613 CdTe Inorganic materials 0.000 description 1
- 229910021417 amorphous silicon Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 1
- 229920005591 polysilicon Polymers 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000000126 substance Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
Images
Landscapes
- Measurement Of Radiation (AREA)
- Solid State Image Pick-Up Elements (AREA)
- Transforming Light Signals Into Electric Signals (AREA)
- Light Receiving Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004295650A JP4768978B2 (ja) | 2004-10-08 | 2004-10-08 | 放射線検出器 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004295650A JP4768978B2 (ja) | 2004-10-08 | 2004-10-08 | 放射線検出器 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2006108525A JP2006108525A (ja) | 2006-04-20 |
| JP2006108525A5 JP2006108525A5 (enExample) | 2007-02-01 |
| JP4768978B2 true JP4768978B2 (ja) | 2011-09-07 |
Family
ID=36377862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004295650A Expired - Fee Related JP4768978B2 (ja) | 2004-10-08 | 2004-10-08 | 放射線検出器 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JP4768978B2 (enExample) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4770259B2 (ja) * | 2005-05-02 | 2011-09-14 | 株式会社島津製作所 | 光または放射線用検出器 |
| JP5172267B2 (ja) * | 2007-10-09 | 2013-03-27 | 富士フイルム株式会社 | 撮像装置 |
| US8890047B2 (en) * | 2011-09-21 | 2014-11-18 | Aptina Imaging Corporation | Stacked-chip imaging systems |
| FR3013175B1 (fr) * | 2013-11-08 | 2015-11-06 | Trixell | Circuit integre presentant plusieurs blocs identiques identifies |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3624165B2 (ja) * | 2000-03-31 | 2005-03-02 | キヤノン株式会社 | 電磁波検出装置 |
-
2004
- 2004-10-08 JP JP2004295650A patent/JP4768978B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006108525A (ja) | 2006-04-20 |
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