JP4748118B2 - Electronic component mounting apparatus and substrate receiving method in electronic component mounting apparatus - Google Patents

Electronic component mounting apparatus and substrate receiving method in electronic component mounting apparatus Download PDF

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JP4748118B2
JP4748118B2 JP2007157206A JP2007157206A JP4748118B2 JP 4748118 B2 JP4748118 B2 JP 4748118B2 JP 2007157206 A JP2007157206 A JP 2007157206A JP 2007157206 A JP2007157206 A JP 2007157206A JP 4748118 B2 JP4748118 B2 JP 4748118B2
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substrate
height
detection
elevating
electronic component
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JP2008311401A (en
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修 奥田
周蔵 八木
正雄 中根
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Panasonic Corp
Panasonic Holdings Corp
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Panasonic Corp
Matsushita Electric Industrial Co Ltd
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Description

本発明は、電子部品を基板に実装して実装基板を製造する電子部品実装ラインに使用される電子部品実装用装置および電子部品実装用装置において基板を下受けして支持する基板下受け方法に関するものである。   The present invention relates to an electronic component mounting apparatus used in an electronic component mounting line for mounting an electronic component on a substrate to manufacture a mounting substrate, and a substrate receiving method for receiving and supporting the substrate in the electronic component mounting apparatus. Is.

電子部品搭載装置やスクリーン印刷装置など、電子部品実装ラインにて使用される電子部品実装用装置においては、各装置に備えられた基板下受装置によって基板の下面を下受けピンや下受けブロックなどで支持した状態で、部品搭載動作やスクリーン印刷動作などの作業動作が実行される(例えば特許文献1参照)。この特許文献に示す先行技術例では、エアシリンダによって昇降するバックアッププレートに立設された複数のバックアップピンによって基板の下面を支持するとともに、基板の縁部をクランプして強制的に下反りを生じさせ、バックアップピンへの基板の密着性を向上させるようにしている。これにより、作業対象となる基板上面の高さ位置や平面度を良好に保つことができ、高さのばらつきや平面度不良に起因する実装不良を減少させることが可能となっている。
特開2003−86997号公報
In an electronic component mounting apparatus used in an electronic component mounting line, such as an electronic component mounting apparatus or a screen printing apparatus, the lower surface of the substrate is supported by a substrate receiving device provided in each device, such as a receiving pin or a receiving block. The work operation such as the component mounting operation and the screen printing operation is executed in the state supported by (see, for example, Patent Document 1). In the prior art example shown in this patent document, the lower surface of the substrate is supported by a plurality of backup pins erected on a backup plate that is raised and lowered by an air cylinder, and the edge of the substrate is clamped to forcibly cause downward warping. The adhesion of the substrate to the backup pin is improved. As a result, the height position and flatness of the upper surface of the substrate to be worked can be kept good, and it is possible to reduce mounting defects due to height variations and flatness defects.
JP 2003-86997 A

ところで同一の電子部品実装用装置の作業対象となる基板は単一種類ではなく、平面形状・サイズのみならず厚み寸法の異なる様々な形態の基板が作業対象となる。このため基板下受装置においても、厚みの異なる複数種類の基板に対応できることが求められている。しかしながら上述の先行技術例を含め、従来装置においては、基板下受け装置において厚み差分を補正するための機械的な調整あるいは制御データ上での設定変更など何らかの作業を必要とする場合が多く、品種切替時の作業負担を増大させる一因となっていた。   By the way, the substrate which is the work object of the same electronic component mounting apparatus is not a single type, and the work object is not only a planar shape / size but also various forms having different thickness dimensions. For this reason, the substrate receiving apparatus is also required to be able to cope with a plurality of types of substrates having different thicknesses. However, in the conventional apparatus including the above-mentioned prior art examples, there are many cases where some work such as mechanical adjustment for correcting the difference in thickness in the substrate receiving apparatus or setting change on the control data is required. This contributed to an increase in the work load at the time of switching.

さらに実際の生産ラインでは、同一品種を対象として連続生産する場合においても供給される基板の厚みが生産ロット毎にばらついている場合がある。このような場合には、基板が正しい高さ位置に良好な平面度で保持されない状態のまま部品搭載などの作業が行われることとなり、実装作業品質を低下させる要因となっていた。このように、従来の電子部品実装用装置においては、基板の厚み異常を正しく検出することが困難で、厚み異常に起因する基板の高さ位置誤差や平面度不良を防止することが困難であるという課題があった。   Furthermore, in an actual production line, the thickness of a substrate to be supplied may vary from production lot to production lot even when continuous production is performed for the same product type. In such a case, work such as component mounting is performed in a state where the board is not held at a correct height and good flatness, which causes a reduction in the quality of mounting work. As described above, in the conventional electronic component mounting apparatus, it is difficult to correctly detect the substrate thickness abnormality, and it is difficult to prevent the substrate height position error and the flatness defect caused by the thickness abnormality. There was a problem.

そこで本発明は、基板の厚み異常を正しく検出することができ、厚み異常に起因する基板の高さ位置誤差や平面度不良を防止することができる電子部品実装用装置および電子部品実装用装置における基板下受け方法を提供することを目的とする。   Accordingly, the present invention provides an electronic component mounting apparatus and an electronic component mounting apparatus that can correctly detect a substrate thickness abnormality and prevent a substrate height position error and flatness failure caused by the thickness abnormality. An object of the present invention is to provide a substrate receiving method.

本発明の電子部品実装用装置は、電子部品を基板に実装して実装基板を製造する電子部品実装ラインに使用される電子部品実装用装置であって、前記電子部品実装用装置において当該装置の作業動作の対象となる基板を下面側から下受けして支持する基板下受部は、前記基板の両側縁部が下方から当接する平面位置に、下面の高さ位置を前記作業動作における作業高さ位置に合わせて配設された1対の固定クランプ部材と、前記固定クランプ部材の下方に昇降自在に配設された昇降部材と、前記昇降部材を高さ制御パラメータにしたがって昇降させる昇降駆動手段と、前記昇降部材に対して相対上下動が可能に且つ付勢手段によって上方に付勢された状態で保持され、前記昇降部材と一体に上昇した状態において前記基板の両側縁部の下面に当接して前記固定クランプ部材との間に前記基板の両側縁部を挟み込む1対の可動クランプ部材と、前記昇降部材に設けられて一体に昇降し、上昇した状態において前記基板の下面に当接してこの基板を下受けする下受当接部材と、前記可動クランプ部材と前記固定クランプ部材との間に前記基板が挟み込まれさらに前記可動クランプ部材の前記昇降部材に対する相対上下位置が予め設定されたオフセット位置になったことを検出して検出信号を出力するクランプ検出手段とを有し、作業動作の対象となる正規厚みの基板が挟み込まれた状態で、前記検出信号が出力された検出タイミングにおける前記昇降部材の高さ位置を検出基準高さ位置として記憶する記憶部と、前記基板下受部によって前記基板を下受けして支持するために前記昇降部材を上昇させる基板下受動作において、前記昇降部材の高さ位置が前記検出基準高さ位置よりも所定高さだけ下方に設定された下方検出限界位置に到達した時点ですでに前記検出信号が出力されたならば、あるいは前記検出基準高さ位置よりも所定高さだけ上方に設定された上方検出限界位置に到達した時点でまだ前記検出信号が出力されないならば、その時点で前記可動クランパと前記固定クランパとの間に挟み込まれている基板の厚みが異常であると判定してその旨の報知を行う異常判定報知手段とを備えた。 The electronic component mounting apparatus of the present invention is an electronic component mounting apparatus used in an electronic component mounting line for manufacturing a mounting substrate by mounting an electronic component on a substrate, and the electronic component mounting apparatus includes: The substrate receiving portion that receives and supports the substrate that is the target of the work operation from the lower surface side is a planar position where both side edges of the substrate contact from below, and the height position of the lower surface is the work height in the work operation. A pair of fixed clamp members arranged in accordance with the position, an elevating member arranged to be movable up and down below the fixed clamp member, and an elevating drive means for elevating and lowering the elevating member according to a height control parameter And can be moved relative to the elevating member and urged upward by the urging means, and is lifted together with the elevating member and is formed on the lower surfaces of both side edges of the substrate. A pair of movable clamp members sandwiching both side edges of the substrate between the fixed clamp member and the fixed clamp member; The substrate is sandwiched between a lower contact member for receiving the substrate, the movable clamp member and the fixed clamp member, and an offset in which a relative vertical position of the movable clamp member with respect to the lifting member is set in advance. Clamp detection means for detecting that the position is reached and outputting a detection signal, and the detection signal is output at the detection timing when the detection signal is output in a state in which a substrate having a normal thickness as a target of work operation is sandwiched A storage unit for storing the height position of the lifting member as a detection reference height position, and the lifting unit for receiving and supporting the substrate by the substrate receiving unit. In the substrate receiving operation for raising the detection signal, the detection signal is already output when the height position of the elevating member reaches the lower detection limit position set at a predetermined height below the detection reference height position. If the detection signal is not yet output when reaching the upper detection limit position set by a predetermined height above the detection reference height position, the movable clamper and the movable clamper An abnormality determination notifying unit that determines that the thickness of the substrate sandwiched between the fixed clamper and the substrate is abnormal and notifies that effect.

本発明の電子部品実装用装置における基板下受け方法は、電子部品を基板に実装して実装基板を製造する電子部品実装ラインに使用される電子部品実装用装置において、当該装置の作業動作の対象となる基板を基板下受部によって下面側から下受けして支持する電子部品実装用装置における基板下受方法であって、前記基板下受部は、前記基板の両側縁部が下方から当接する平面位置に、下面の高さ位置を前記作業動作における作業高さ位置に合わせて配設された1対の固定クランプ部材と、前記固定クランプ部材の下方に昇降自在に配設された昇降部材と、前記昇降部材を高さ制御パラメータにしたがって昇降させる昇降駆動手段と、前記昇降部材に対して相対上下動が可能に且つ付勢手段によって上方に付勢された状態で保持され、前記昇降部材と一体に上昇した状態において前記基板の両側縁部の下面に当接して前記固定クランプ部材との間に前記基板の両側縁部を挟み込む1対の可動クランプ部材と、前記昇降部材に設けられて一体に昇降し、上昇した状態において前記基板の下面に当接してこの基板を下受けする下受当接部材と、前記可動クランプ部材と前記固定クランプ部材との間に前記基板が挟み込まれさらに前記可動クランプ部材の前記昇降部材に対する相対上下位置が予め設定されたオフセット位置になったことを検出して検出信号を出力するクランプ検出手段とを有し、作業動作の対象となる正規厚みの基板が挟み込まれた状態で、前記検出信号が出力された検出タイミングにおける前記昇降部材の高さ位置を検出基準高さ位置として記憶させておき、前記基板下受部によって前記基板を下受けして支持するために前記昇降部材を上昇させる基板下受動作において、前記昇降部材の高さ位置が前記検出基準高さ位置よりも所定高さだけ下方に設定された下方検出限界位置に到達した時点ですでに前記検出信号が出力されたならば、あるいは前記検出基準高さ位置よりも所定高さだけ上方に設定された上方検出限界位置に到達した時点でまだ前記検出信号が出力されないならば、その時点で前記可動クランパと前記固定クランパとの間に挟み込まれている基板の厚みが異常であると判定してその旨の報知を行う。 The substrate receiving method in the electronic component mounting apparatus according to the present invention is an electronic component mounting apparatus used in an electronic component mounting line for manufacturing a mounting substrate by mounting an electronic component on a substrate. A substrate receiving method in an electronic component mounting apparatus for receiving and supporting a substrate to be received from a lower surface side by a substrate receiving portion, wherein both side edges of the substrate abut from below. A pair of fixed clamp members disposed in a planar position in accordance with the height position of the lower surface in accordance with the work height position in the work operation; and a lift member disposed to be movable up and down below the fixed clamp member; Elevating drive means for elevating the elevating member according to a height control parameter, and being held in a state in which the elevating member can be moved relative to the elevating member and urged upward by the urging means, A pair of movable clamp members that are in contact with the lower surfaces of both side edge portions of the substrate and sandwich the both side edge portions of the substrate with the fixed clamp member in a state of being raised integrally with the descending member, and provided on the elevating member The substrate is sandwiched between a lower contact contact member that contacts the lower surface of the substrate and receives the substrate in the raised state, and the movable clamp member and the fixed clamp member. And a clamp detection means for detecting that the relative vertical position of the movable clamp member with respect to the lifting member is a preset offset position and outputting a detection signal, and having a normal thickness that is a target of a work operation. with the substrate is sandwiched, it may be stored the height position of the elevating member at the detection timing of the detection signal is outputted as a detection reference height position, the group In the substrate receiving operation for raising the elevating member to receive and support the substrate by the receiving portion, the height position of the elevating member is set lower than the detection reference height position by a predetermined height. If the detection signal has already been output when the lower detection limit position is reached, or when the upper detection limit position set at a predetermined height above the detection reference height position is reached. If the detection signal is not yet output, it is determined that the thickness of the substrate sandwiched between the movable clamper and the fixed clamper is abnormal at that time, and a notification to that effect is given.

本発明によれば、基板下受部によって基板を下受けして支持するために昇降部材を上昇させる基板下受動作において、昇降部材の高さ位置が基準検出高さ位置に到達する前にすでに検出信号が出力されたならば、あるいは検出基準高さ位置に到達した後においてもまだ検出信号が出力されないならば、その時点で可動クランプ部材と固定クランプ部材との間に挟み込まれている基板の厚みが異常であると判定してその旨の報知を行うことにより、厚みが異なる異種基板が搬入された場合や、製造ロット間の厚み誤差などで基板の厚みがばらついている異なる場合にあっても、厚み異常を正しく検出することができ、厚み異常に起因する基板の高さ位置誤差や、平面度不良を防止することができる。   According to the present invention, in the substrate receiving operation for raising the elevating member to receive and support the substrate by the substrate receiving portion, before the height position of the elevating member reaches the reference detection height position, If the detection signal is output, or if the detection signal is not yet output even after reaching the detection reference height position, the substrate clamped between the movable clamp member and the fixed clamp member at that time By determining that the thickness is abnormal and notifying that effect, when different types of substrates with different thicknesses are carried in, or when the thicknesses of the substrates vary due to thickness errors between manufacturing lots, etc. In addition, it is possible to correctly detect an abnormality in thickness, and it is possible to prevent an error in height position of the substrate and an inferior flatness due to the abnormality in thickness.

次に本発明の実施の形態を図面を参照して説明する。図1は本発明の一実施の形態の電子部品搭載装置の斜視図、図2は本発明の一実施の形態の電子部品搭載装置における基板下受部の断面図、図3は本発明の一実施の形態の電子部品搭載装置における基板下受部の部分断面図、図4は本発明の一実施の形態の電子部品搭載装置における基板厚み異常検出の説明図、図5,図6,図7,図8は本発明の一実施の形態の電子部品搭載装置における基板下受け方法の動作説明図である。   Next, embodiments of the present invention will be described with reference to the drawings. FIG. 1 is a perspective view of an electronic component mounting apparatus according to an embodiment of the present invention, FIG. 2 is a cross-sectional view of a substrate receiving portion in the electronic component mounting apparatus according to an embodiment of the present invention, and FIG. FIG. 4 is a partial cross-sectional view of a substrate receiving portion in the electronic component mounting apparatus according to the embodiment. FIG. 4 is an explanatory diagram of detection of abnormal substrate thickness in the electronic component mounting apparatus according to the embodiment of the present invention. FIG. 8 is an operation explanatory diagram of the substrate underlaying method in the electronic component mounting apparatus according to the embodiment of the present invention.

まず図1を参照して、電子部品搭載装置の構造を説明する。この電子部品搭載装置は、電子部品を基板に実装して実装基板を製造する電子部品実装ラインにおいて使用される電子部品実装用装置である。図1において、基台1上にはX方向に搬送路2が配設されている。搬送路2には基板下受部3が設けられており、上流側装置から供給され当該装置による搭載作業動作の対象となる基板4は搬送路2によって基板下受部3まで搬送される。搬送された基板4は基板下受部3によって下面側から下受けして支持され、この状態で以下に説明する作業動作機構による部品搭載作業が行われ、部品搭載作業が完了した基板4は再び搬送路2によって下流側へ搬送され、下流側装置へ搬出される。   First, the structure of the electronic component mounting apparatus will be described with reference to FIG. This electronic component mounting apparatus is an electronic component mounting apparatus used in an electronic component mounting line for manufacturing a mounting substrate by mounting electronic components on a substrate. In FIG. 1, a transport path 2 is disposed on a base 1 in the X direction. A substrate support 3 is provided in the transport path 2, and a substrate 4 supplied from an upstream device and subjected to a mounting operation by the device is transported to the substrate support 3 by the transport path 2. The transported substrate 4 is supported by being supported from the lower surface side by the substrate receiving portion 3, and in this state, a component mounting operation is performed by a work operation mechanism described below, and the substrate 4 that has completed the component mounting operation is again It is conveyed downstream by the conveyance path 2 and is carried out to the downstream apparatus.

搬送路2の両側には部品供給部5が設けられており、部品供給部5には複数のテープフィーダ6が装着されている。基台1のX方向の一端部にはリニア駆動機構を備えたY軸移動テーブル8がY方向に水平に配設されている。Y軸移動テーブル8は水平方向に細長形状で設けられたビーム部材8aを主体としており、ビーム部材8aにはリニアレール9が水平方向に配設されている。リニアレール9には、矩形状の2つの結合ブラケット11が、それぞれリニアブロック10を介してY方向にスライド自在に装着されている。2つの結合ブラケット11には、Y軸移動テーブル8と同様にリニア駆動機構を備えたX軸移動テーブル12が結合されており、それぞれのX軸移動テーブル12には搭載ヘッド13がX方向に移動自在に装着されている。   Component supply units 5 are provided on both sides of the conveyance path 2, and a plurality of tape feeders 6 are attached to the component supply unit 5. A Y-axis moving table 8 provided with a linear drive mechanism is disposed horizontally in the Y direction at one end of the base 1 in the X direction. The Y-axis moving table 8 is mainly composed of a beam member 8a provided in an elongated shape in the horizontal direction, and linear rails 9 are arranged in the horizontal direction on the beam member 8a. Two linear coupling brackets 11 are mounted on the linear rail 9 via a linear block 10 so as to be slidable in the Y direction. Similar to the Y-axis movement table 8, the two coupling brackets 11 are coupled to an X-axis movement table 12 having a linear drive mechanism, and the mounting head 13 moves in the X direction on each X-axis movement table 12. It is installed freely.

搭載ヘッド13は複数(ここでは8個)の単位搭載ヘッド14を備えた多連型ヘッドであり、それぞれの単位搭載ヘッド14の下端部には、電子部品を吸着して保持する吸着ノズル14aが装着されている。吸着ノズル14aは、単位搭載ヘッド13に内蔵されたノズル昇降機構によって個別に昇降する。Y軸移動テーブル8、X軸移動テーブル12を駆動することにより、搭載ヘッド13はX方向、Y方向に移動し、これにより、各単位搭載ヘッド14は部品供給部5のテープフィーダ6から電子部品を取り出して、搬送路2に位置決めされ基板下受部3によって下受けされた基板4に移送搭載する。   The mounting head 13 is a multiple head including a plurality (eight in this case) of unit mounting heads 14. At the lower end of each unit mounting head 14, a suction nozzle 14 a that sucks and holds electronic components is provided. It is installed. The suction nozzle 14a is moved up and down individually by a nozzle lifting mechanism built in the unit mounting head 13. By driving the Y-axis moving table 8 and the X-axis moving table 12, the mounting head 13 moves in the X direction and the Y direction, whereby each unit mounting head 14 is moved from the tape feeder 6 of the component supply unit 5 to the electronic component. Is taken out and mounted on the substrate 4 positioned in the transport path 2 and received by the substrate receiving portion 3.

したがって、Y軸移動テーブル8、第1のX軸移動テーブル12および搭載ヘッド13は、部品供給部5から電子部品を取り出して基板4上に移送して基板4に搭載する部品搭載動作、すなわち電子部品実装用装置としての電子部品搭載装置において、当該装置の作業動作を実行するための作業動作機構となっている。部品供給部5と搬送路2との間には部品認識装置7が配設されており、部品供給部5から電子部品を取り出した搭載ヘッド13が部品認識装置7の上方を移動する際に、部品認識装置7は搭載ヘッド13に保持された状態の電子部品を撮像して認識する。   Therefore, the Y-axis movement table 8, the first X-axis movement table 12, and the mounting head 13 take out electronic components from the component supply unit 5, transfer them onto the substrate 4, and mount them on the substrate 4, that is, electronic An electronic component mounting apparatus as a component mounting apparatus is a work operation mechanism for executing a work operation of the apparatus. A component recognition device 7 is disposed between the component supply unit 5 and the conveyance path 2, and when the mounting head 13 that has taken out an electronic component from the component supply unit 5 moves above the component recognition device 7, The component recognition device 7 captures and recognizes the electronic component held by the mounting head 13.

次に図2を参照して、基板下受部3の構造を説明する。図2において基台1の上面には搬送路2を構成する2条の搬送レール2aが平行に配設されており、搬送レール2aの上部の内側面には基板搬送レベルに高さ位置を合わせてコンベア機構20が設けられている。コンベア機構20はコンベアレール20aの上下面に沿って搬送ベルト20bを往復動させる構成となっており、搬入された基板4は搬送レール2aによって側端部をガイドされ、搬送ベルト20bによって搬送される。   Next, the structure of the substrate receiving portion 3 will be described with reference to FIG. In FIG. 2, two transport rails 2a constituting the transport path 2 are arranged in parallel on the upper surface of the base 1, and the height of the upper inner surface of the transport rail 2a is adjusted to the substrate transport level. A conveyor mechanism 20 is provided. The conveyor mechanism 20 is configured to reciprocate the conveyor belt 20b along the upper and lower surfaces of the conveyor rail 20a. The loaded substrate 4 is guided at the side edge by the conveyor rail 2a and is conveyed by the conveyor belt 20b. .

搬送レール2aの上端部には、内側方向に延出して平板状の1対の固定クランプ部材21が、基板4の両側端部が下方から当接する平面位置に設けられている。固定クランプ部材21は、前述の作業動作機構による作業動作、すなわち吸着ノズル14aによって電子部品Pを基板4の実装面に搭載する部品搭載作業における作業高さ位置に下面の高さ位置を合わせて配設されている。すなわちここでは、実装対象の基板4を上下から挟み込んでクランプする構成において、基板の上面に位置する側のクランプ部材を固定とし、この固定クランプ部材21の下面に基板4を押し付けることにより、基板4の上面が所定の作業高さ位置に保持されるようになっている。   At the upper end of the transport rail 2a, a pair of flat fixed clamp members 21 extending inward are provided at planar positions where both side ends of the substrate 4 abut from below. The fixed clamp member 21 is arranged so that the height position of the lower surface is aligned with the work height position in the component mounting operation in which the electronic component P is mounted on the mounting surface of the substrate 4 by the suction nozzle 14a, that is, the operation operation by the above-described operation mechanism. It is installed. That is, here, in the configuration in which the substrate 4 to be mounted is sandwiched and clamped from above and below, the clamp member on the side of the upper surface of the substrate is fixed, and the substrate 4 is pressed against the lower surface of the fixed clamp member 21, thereby Is held at a predetermined working height position.

固定クランプ部材21の下方には、昇降部材24が昇降自在に配設されており、昇降部材24はサーボモータなど数値制御が可能な回転駆動機構31によって送りねじ32を回転駆動する構成の昇降駆動手段によって昇降する。すなわち、回転駆動機構31を制御部34によって高さ制御パラメータにしたがって制御することにより、昇降部材24を高さ制御パラメータにしたがって任意の高さ位置に停止させ、また任意の速度で昇降させることが可能となっている。   An elevating member 24 is disposed below the fixed clamp member 21 so as to be movable up and down. The elevating member 24 is configured to drive the elevating screw 32 by a rotational drive mechanism 31 capable of numerical control such as a servo motor. It goes up and down by means. That is, by controlling the rotation drive mechanism 31 according to the height control parameter by the control unit 34, the elevating member 24 can be stopped at an arbitrary height position according to the height control parameter, and can be moved up and down at an arbitrary speed. It is possible.

昇降部材24の上面には、固定クランプ部材21の下方に位置して1対の可動クランプ部材22が弾性支持部23によって支持されている。弾性支持部23は、可動クランプ部材22の下面に結合された軸摺動部25、軸摺動部25に上下方向に設けられた摺動孔25aに摺動自在に嵌合する軸部材26および昇降部材24の上面と軸摺動部25の下面との間に介装された圧縮バネ27より構成される。軸部材26が摺動孔25a内で上下動することにより、可動クランプ部材22は昇降部材24に対して相対上下動し、このとき圧縮バネ27は常に軸摺動部25に上向きの付勢力を与える。そしてこの付勢力により、基板4は固定クランプ部材21と可動クランプ部材22とによって上下からクランプされる。   On the upper surface of the elevating member 24, a pair of movable clamp members 22 positioned below the fixed clamp member 21 are supported by elastic support portions 23. The elastic support portion 23 includes a shaft sliding portion 25 coupled to the lower surface of the movable clamp member 22, a shaft member 26 slidably fitted in a sliding hole 25a provided in the shaft sliding portion 25 in the vertical direction, and A compression spring 27 is interposed between the upper surface of the elevating member 24 and the lower surface of the shaft sliding portion 25. When the shaft member 26 moves up and down in the sliding hole 25a, the movable clamp member 22 moves up and down relative to the elevating member 24. At this time, the compression spring 27 always applies an upward biasing force to the shaft sliding portion 25. give. The urging force clamps the substrate 4 from above and below by the fixed clamp member 21 and the movable clamp member 22.

昇降部材24を上昇させることにより可動クランプ部材22も昇降部材24と一体に上昇し、これにより可動クランプ部材22は基板4の下面を押し上げ、固定クランプ部材21の下面との間に基板4の両側端部を挟み込む。すなわち、可動クランプ部材22は、昇降部材24に対して相対上下動が可能に且つ付勢手段である圧縮バネ27によって上方に付勢された状態で保持され、昇降部材24と一体に上昇した状態において基板4の両側縁部の下面に当接して固定クランプ部材21との間に基板4の両側縁部を挟み込む機能を有している。   By raising the elevating member 24, the movable clamp member 22 is also raised integrally with the elevating member 24, whereby the movable clamp member 22 pushes up the lower surface of the substrate 4, and between both sides of the substrate 4 between the lower surface of the fixed clamp member 21. Insert the end. That is, the movable clamp member 22 is held in a state in which the movable clamp member 22 can be moved up and down relative to the elevating member 24 and is urged upward by the compression spring 27 as an urging means, and is lifted integrally with the elevating member 24. 2 has a function of being in contact with the lower surfaces of both side edges of the substrate 4 and sandwiching both side edges of the substrate 4 between the fixed clamp member 21.

昇降部材24の上面には、複数の下受けピン30が立設されており、昇降部材24を所定の高さ位置まで上昇させることにより、下受けピン30の上面30aは基板4の下面に当接する。すなわち、下受けピン30は昇降部材24に設けられて一体に昇降し、上昇した状態において基板4の下面に当接してこの基板4を下受けする下受当接部材となっている。なお下受け当接部材としては、基板4を複数の点で支持する下受けピン30以外にも種々の形態のものを用いることができる。例えば、基板4の下面を面で支持する場合には、上面に基板4の下面と当接して面支持する下受面が設けられた方形ブロック形状の下受ブロックを用いることができる。   A plurality of lower receiving pins 30 are erected on the upper surface of the elevating member 24, and the upper surface 30 a of the lower receiving pin 30 contacts the lower surface of the substrate 4 by raising the elevating member 24 to a predetermined height position. Touch. In other words, the lower receiving pin 30 is provided on the elevating member 24 and is integrally moved up and down, and is a lower abutting member for receiving the substrate 4 by contacting the lower surface of the substrate 4 in the raised state. As the lower contact member, various forms other than the lower support pins 30 that support the substrate 4 at a plurality of points can be used. For example, when the lower surface of the substrate 4 is supported by a surface, a rectangular block-shaped receiving block in which an upper surface is provided with a receiving surface that abuts the lower surface of the substrate 4 and supports the surface can be used.

ここで、可動クランプ部材22と下受けピン30とでは基板4に対する機能が異なり、可動クランプ部材22は基板4の下面に当接して基板4を固定クランプ部材21に対して圧縮バネ27の付勢力により押し付けてクランプする機能を有している。これに対し下受けピン30は基板4の下面に当接して下方から支持する機能のみを有している。したがって、昇降部材24を可動クランプ部材22および下受けピン30とともに上昇させて基板4を下受けする基板下受け動作において、正しい下受け状態を実現するためには、可動クランプ部材22を基板4の下面に当接させて適正なクランプ力で基板4をクランプすると
ともに、下受けピン30の上面が基板4の下面に正しく当接する位置まで昇降部材24を上昇させることが必要となる。
Here, the movable clamp member 22 and the lower receiving pin 30 have different functions with respect to the substrate 4, and the movable clamp member 22 abuts against the lower surface of the substrate 4 to force the substrate 4 against the fixed clamp member 21 and the biasing force of the compression spring 27. It has the function to press and clamp by. On the other hand, the lower receiving pin 30 has only a function of contacting the lower surface of the substrate 4 and supporting it from below. Therefore, in order to realize a correct receiving state in the substrate receiving operation in which the elevating member 24 is lifted together with the movable clamp member 22 and the lower receiving pin 30 to receive the substrate 4, the movable clamping member 22 is attached to the substrate 4. It is necessary to clamp the substrate 4 with an appropriate clamping force by contacting the lower surface and raise the elevating member 24 to a position where the upper surface of the lower receiving pin 30 correctly contacts the lower surface of the substrate 4.

昇降部材24の一方側の端部にはフォトセンサ29が配置されており、フォトセンサ29の上方には、一方の可動クランプ部材22の外端部から下方に延出した遮光ドグ28が位置している。遮光ドグ28はフォトセンサ29の検出隙間に進入可能に設けられており、昇降部材24の下降動作に伴って遮光ドグ28が検出隙間内を下降して下端部がフォトセンサ29の検出位置29aに一致したタイミングで、フォトセンサ29は検出信号を出力する。   A photo sensor 29 is disposed at one end of the elevating member 24, and a light shielding dog 28 extending downward from the outer end of one movable clamp member 22 is located above the photo sensor 29. ing. The light shielding dog 28 is provided so as to be able to enter the detection gap of the photo sensor 29, and as the lifting member 24 is lowered, the light shielding dog 28 is lowered in the detection gap and the lower end portion is at the detection position 29 a of the photo sensor 29. At the coincidence timing, the photo sensor 29 outputs a detection signal.

本実施の形態においては、この検出信号が出力される検出位置は、可動クランプ部材22の昇降部材24に対する相対上下位置が、基板4を下受けするための正規位置から所定のオフセット寸法(図3(a)に示すΔH)だけ隔てられた状態にあることを示すオフセット位置としての意味合いを有している。ここで、基板4を下受けするための正規位置とは、可動クランプ部材22の上面22aと下受けピン30の上面30aとが同一レベルになるような(図3(c)参照)、可動クランプ部材22と昇降部材24との相対位置関係をいう。   In the present embodiment, the detection position at which this detection signal is output is such that the relative vertical position of the movable clamp member 22 relative to the lifting member 24 is a predetermined offset dimension from the normal position for receiving the substrate 4 (FIG. 3). It has an implication as an offset position indicating that it is in a state separated by ΔH shown in (a). Here, the normal position for receiving the substrate 4 is such that the upper surface 22a of the movable clamp member 22 and the upper surface 30a of the lower receiving pin 30 are at the same level (see FIG. 3C). The relative positional relationship between the member 22 and the elevating member 24 is referred to.

フォトセンサ29によって検出された検出信号は制御部34に伝達され、制御部34はこの検出信号に基づいて後述する昇降動作制御を行う。制御部34は吸着ノズル14aを昇降させるノズル昇降機構33を制御するとともに、ノズル昇降機構33の駆動モータに備えられたエンコーダのパルス信号を監視することにより、吸着ノズル14aの下端部の高さ位置を検出することが可能となっている。すなわち吸着ノズル14aの下端部を高さ検出対象に接触させることにより、高さ検出対象部位の高さ位置を計測できるようになっている。本実施の形態においては、この高さ計測機能を用いて、後述する下受け高さオフセットを計測するようにしている。   A detection signal detected by the photosensor 29 is transmitted to the control unit 34, and the control unit 34 performs a lifting operation control to be described later based on the detection signal. The control unit 34 controls the nozzle lifting mechanism 33 that lifts and lowers the suction nozzle 14a, and monitors the pulse signal of the encoder provided in the drive motor of the nozzle lifting mechanism 33, whereby the height position of the lower end portion of the suction nozzle 14a. Can be detected. That is, the height position of the height detection target portion can be measured by bringing the lower end portion of the suction nozzle 14a into contact with the height detection target. In the present embodiment, this height measurement function is used to measure a later-described receiving height offset.

制御部34には記憶部35、報知部36が付属しており、記憶部35は部品搭載動作に必要な各種の制御プログラムやデータを記憶する。ここで記憶されるデータには、下受け高さオフセットの値や、作業対象の基板4の厚みが正規厚みと異なる厚み異常を検出するために設定される検出基準高さ(後述)についてのデータが含まれる。また報知部36は部品搭載動作の実行過程における各種の報知を行う。この報知には、基板4の厚みが正規厚みと異なる場合の厚み異常報知が含まれる。   A storage unit 35 and a notification unit 36 are attached to the control unit 34, and the storage unit 35 stores various control programs and data necessary for the component mounting operation. The data stored here is data on the detection reference height (described later) that is set to detect the value of the bearing height offset and the thickness abnormality in which the thickness of the work target substrate 4 is different from the normal thickness. Is included. The notification unit 36 performs various notifications in the process of executing the component mounting operation. This notification includes a thickness abnormality notification when the thickness of the substrate 4 is different from the normal thickness.

次に図3を参照して、固定クランプ部材21、可動クランプ部材22による基板のクランプ動作、下受けピン30による基板4の下受け動作およびフォトセンサ29によって出力される検出信号について説明する。前述のように、本実施の形態に示す基板下受部3においては、厚みの異なる複数種類の基板4を下受け対象とするに際して、基板4を固定クランプ部材21に対して下方から押し付けて高さ位置を合わせるいわゆる上面基準を採用している。   Next, the substrate clamping operation by the fixed clamp member 21 and the movable clamp member 22, the substrate 4 receiving operation by the lower receiving pin 30, and the detection signal output by the photosensor 29 will be described with reference to FIG. 3. As described above, in the substrate receiving portion 3 shown in the present embodiment, when a plurality of types of substrates 4 having different thicknesses are to be received, the substrate 4 is pressed against the fixed clamp member 21 from below to increase the height. A so-called upper surface reference is used to adjust the position.

このため下受け状態における基板4の下面の高さ位置は、対象とする基板4の厚みによって異なったものとなり、下受け状態において基板4の下面に当接する可動クランプ部材22や下受けピン30を上昇させる昇降部材24の高さ位置を、それぞれの基板4の厚みに応じて個別に正しく設定することが必要となる。すなわち、制御部34が回転駆動機構31を制御するための高さ制御パラメータを、それぞれの基板の厚みに応じて複数種類設定しておき、品種切換の都度高さ制御パラメータを変更する作業操作が必要とされる。   For this reason, the height position of the lower surface of the substrate 4 in the receiving state varies depending on the thickness of the target substrate 4, and the movable clamp member 22 and the lower receiving pin 30 that contact the lower surface of the substrate 4 in the receiving state are provided. It is necessary to correctly set the height position of the elevating member 24 to be raised individually according to the thickness of each substrate 4. In other words, a plurality of types of height control parameters for the control unit 34 to control the rotation drive mechanism 31 are set according to the thickness of each substrate, and the operation operation for changing the height control parameter every time the product type is switched. Needed.

本実施の形態においては、このような高さ制御パラメータの変更作業の煩を避けるため、前述のフォトセンサ29の検出信号が出力される検出タイミングにおける可動クランプ
部材22と昇降部材24との相対上下位置(換言すれば可動クランプ部材22の上面22aと昇降部材24に設けられた下受けピン30の上面30aとの高さ差)を予め各装置固有のオフセット値(下受け高さオフセット)として計測により求めて記憶させておき、昇降部材24を上昇させる基板下受け動作においては、フォトセンサ29の検出タイミングと下受け高さオフセットとを組み合わせて昇降部材24の昇降動作制御を行うようにしている。
In the present embodiment, in order to avoid such a trouble of changing the height control parameter, the relative vertical movement between the movable clamp member 22 and the elevating member 24 at the detection timing at which the detection signal of the photosensor 29 is output. The position (in other words, the height difference between the upper surface 22a of the movable clamp member 22 and the upper surface 30a of the lower receiving pin 30 provided on the elevating member 24) is measured in advance as an offset value (lower receiving height offset) unique to each device. In the substrate receiving operation for raising the elevating member 24, the elevating operation control of the elevating member 24 is performed by combining the detection timing of the photo sensor 29 and the lower height of the receiving member. .

次に、図3を参照して、下受け高さオフセットを求めるための作業について説明する。なお図3においては、各装置固有の下受け高さオフセットを教示するためのティーチング用として実際の基板4よりも幅が狭く作業に便宜なダミー基板40を用いた例を示している。まず可動クランプ部材22の上面にダミー基板40を載置した状態で昇降部材24を上昇させ、ダミー基板40を固定クランプ部材21と可動クランプ部材22との間に挟み込む。このときクランプ状態が弱く可動クランプ部材22が圧縮バネ27を下方に押し下げる量が小さい間は遮光ドグ28の下端部はフォトセンサ29の検出位置29aにはまだ到達せず、フォトセンサ29からの検出信号は出力されない。   Next, with reference to FIG. 3, an operation for obtaining the bearing height offset will be described. FIG. 3 shows an example in which a dummy substrate 40 having a width narrower than that of the actual substrate 4 and convenient for work is used for teaching for teaching a base height offset unique to each apparatus. First, the elevating member 24 is raised with the dummy substrate 40 placed on the upper surface of the movable clamp member 22, and the dummy substrate 40 is sandwiched between the fixed clamp member 21 and the movable clamp member 22. At this time, as long as the clamp state is weak and the movable clamp member 22 pushes the compression spring 27 downward is small, the lower end of the light shielding dog 28 has not yet reached the detection position 29 a of the photosensor 29, and detection from the photosensor 29 No signal is output.

この後、回転駆動機構31を駆動して昇降部材24を徐々に上昇させ、可動クランプ部材22が圧縮バネ27をさらに下方に押し下げる過程において、図3(a)に示すように、遮光ドグ28の下端部が検出位置29aに一致するタイミング、すなわち昇降部材24の高さ位置がクランプ検出高さ位置H0に到達するタイミングにて、フォトセンサ29は検出信号を制御部34に対して出力する。そしてこの検出タイミングにおける下受けピン30の上面と可動クランプ部材22の上面との高さ差ΔHが、求める対象の下受け高さオフセットとなる。   Thereafter, in the process in which the rotary drive mechanism 31 is driven to raise the elevating member 24 gradually and the movable clamp member 22 pushes the compression spring 27 further downward, as shown in FIG. The photosensor 29 outputs a detection signal to the control unit 34 at the timing when the lower end portion coincides with the detection position 29a, that is, at the timing when the height position of the elevating member 24 reaches the clamp detection height position H0. The height difference ΔH between the upper surface of the lower receiving pin 30 and the upper surface of the movable clamp member 22 at this detection timing becomes the lower height of the target to be obtained.

本実施の形態においては、高さ計測を吸着ノズル14aの高さ検出機能によって行うようにしているため、計測対処となる下受けピン30を極力吸着ノズル14aによる高さ計測が行いやすくなるよう、昇降部材24を図3(a)に示すクランプ検出高さ位置H0から固定高さ寸法(例えば2mm)だけさらに上昇させた状態で高さ計測を行うようにしている。すなわち、図3(b)に示すように、昇降部材24を固定高さ寸法Cだけ上昇させた状態で停止させ、下受け高さオフセットの計測を行う。   In the present embodiment, since the height measurement is performed by the height detection function of the suction nozzle 14a, the height measurement by the suction nozzle 14a is made as easy as possible for the receiving pin 30 serving as a measure. Height measurement is performed in a state where the elevating member 24 is further raised by a fixed height dimension (for example, 2 mm) from the clamp detection height position H0 shown in FIG. That is, as shown in FIG. 3B, the elevating member 24 is stopped in a state where it is raised by the fixed height dimension C, and measurement of the lower height offset is performed.

この計測においては、吸着ノズル14aをダミー基板40の端部において挟み込まれずに露呈した部分の上面40aおよび下受けピン30の上面30aに順次下降させ、ノズル昇降機構33、制御部34の高さ計測機能を利用して高さ計測を行う。そして計測された高さ差(基板40の上面40aと下受けピン30の上面30aとの高さ差)からダミー基板40の既知の厚みtを減算することにより、求める対象の高さ差ΔHから固定高さ寸法Cを減算した寸法(ΔH−C)が求められる。そして求めた寸法(ΔH−C)に固定高さ寸法Cを加算することにより、フォトセンサ29による検出タイミングにおける下受けピン30の上面30aと可動クランプ部材22の上面22aとの高さ差ΔH、すなわち下受け高さオフセットを求めることができる。   In this measurement, the suction nozzle 14a is sequentially lowered to the exposed upper surface 40a and the upper surface 30a of the receiving pin 30 without being sandwiched at the end of the dummy substrate 40, and the height measurement of the nozzle lifting mechanism 33 and the control unit 34 is performed. Use the function to measure the height. Then, by subtracting the known thickness t of the dummy substrate 40 from the measured height difference (height difference between the upper surface 40a of the substrate 40 and the upper surface 30a of the receiving pin 30), the height difference ΔH is calculated. A dimension (ΔH−C) obtained by subtracting the fixed height dimension C is obtained. Then, by adding the fixed height dimension C to the obtained dimension (ΔH−C), a height difference ΔH between the upper surface 30a of the receiving pin 30 and the upper surface 22a of the movable clamp member 22 at the detection timing by the photosensor 29, That is, the bearing height offset can be obtained.

この下受け高さオフセットΔHは当該基板下受部3に固有のオフセット値であり、後述するように対象とする基板4の厚みに関係なく、同一の下受け高さオフセットΔHを用いて基板下受け動作を正しく制御出来る。すなわち図3(c)に示すように、フォトセンサ29が検出した検出タイミングにおける昇降部材24のクランプ検出高さ位置H0から、昇降部材24をさらに下受け高さオフセットΔHだけ上昇させることにより、下受けピン30は図3(a)に示す状態から同様にΔHだけ上昇し、これにより下受けピン30の上面30aはダミー基板40の下面に正しく当接する位置まで上昇する。このときの昇降部材24の高さ位置H1は、ダミー基板40の厚みtと等しい厚みを有する基板4を対象とする場合の下受け高さ位置を示す高さ制御パラメータとして記憶部35に記憶される。   This base height offset ΔH is an offset value inherent to the base base part 3 and will be described below using the same base height offset ΔH regardless of the thickness of the target base 4 as will be described later. The receiving operation can be controlled correctly. That is, as shown in FIG. 3C, by raising the elevating member 24 further by the lower support height offset ΔH from the clamp detection height position H0 of the elevating member 24 at the detection timing detected by the photosensor 29, Similarly, the receiving pin 30 rises by ΔH from the state shown in FIG. 3A, whereby the upper surface 30 a of the lower receiving pin 30 rises to a position where it correctly contacts the lower surface of the dummy substrate 40. The height position H1 of the elevating member 24 at this time is stored in the storage unit 35 as a height control parameter that indicates the height position of the support when the substrate 4 having a thickness equal to the thickness t of the dummy substrate 40 is targeted. The

上記構成において、遮光ドグ28と組み合わされたフォトセンサ29は、可動クランプ部材22の昇降部材24に対する相対上下動において、相対上下位置が予め設定された可動クランプ部材22と固定クランプ部材21との間に基板4が挟み込まれさらに可動クランプ部材22の昇降部材24に対する相対上下位置が予め設定されたオフセット位置になったことを検出して検出信号を出力するクランプ検出手段として機能している。   In the above configuration, the photo sensor 29 combined with the light shielding dog 28 is located between the movable clamp member 22 and the fixed clamp member 21 whose relative vertical positions are set in advance in the relative vertical movement of the movable clamp member 22 with respect to the lift member 24. The clamp 4 functions as a clamp detection means for detecting that the substrate 4 is sandwiched between the movable clamp member 22 and the relative vertical position of the movable clamp member 22 with respect to the lift member 24 is a preset offset position and outputs a detection signal.

また記憶部35は、クランプ検出手段が検出信号を出力した検出タイミングにおける可動クランプ部材22の上面22aと下受けピン30の上面30aとの高さ差を、当該装置固有の下受け高さオフセットΔHとして記憶するとともに、図3(c)に示す下受け高さ位置H1,すなわち対象となった基板4の厚みに対応して設定される下受け高さ位置H1を記憶する。   In addition, the storage unit 35 calculates the difference in height between the upper surface 22a of the movable clamp member 22 and the upper surface 30a of the lower receiving pin 30 at the detection timing when the clamp detection means outputs the detection signal, as a base height offset ΔH unique to the device. As well as the receiving height position H1 shown in FIG. 3C, that is, the receiving height position H1 set corresponding to the thickness of the target substrate 4.

次に図4を参照して、フォトセンサ29の検出タイミングの差異を利用して基板4の厚みの異常を検知する方法について説明する。図4(a)は、特定品種の基板4において当該品種についての正しい規定厚みtoを有する正規の基板4が固定クランプ部材21、可動クランプ部材22によってクランプされ、フォトセンサ29によって検出信号が出力された状態を模式的に示している。このとき、検出タイミングにおける昇降部材24の高さ位置は、当該規定厚みt0に対応した検出基準高さ位置Hsとなっている。この検出基準高さ位置Hsは、図3に示す例においてダミー基板40の厚みがt0である場合におけるクランプ検出高さ位置に相当するものである。 Next, a method for detecting an abnormality in the thickness of the substrate 4 using a difference in detection timing of the photosensor 29 will be described with reference to FIG. FIG. 4A shows that a regular substrate 4 having a correct specified thickness to for a specific type of substrate 4 is clamped by a fixed clamp member 21 and a movable clamp member 22, and a detection signal is output by a photo sensor 29. The state is shown schematically. At this time, the height position of the elevating member 24 at the detection timing is the detection reference height position Hs corresponding to the specified thickness t0. This detection reference height position Hs corresponds to the clamp detection height position when the thickness of the dummy substrate 40 is t0 in the example shown in FIG.

検出基準高さ位置Hsは新たな基板品種を対象とする度に、その都度その基板を実際にクランプして基板下受け動作を実行させることにより求められる。すなわち、フォトセンサ29からの検出信号が出力される検出タイミングにおける昇降部材24の高さ位置を、回転駆動機構31,制御部34によって検出することにより求められ、求められた検出基準高さ位置Hsは当該基板品種に対応した基準検出高さ位置として記憶部35に記憶される。   The detection reference height position Hs is obtained by actually clamping the substrate and executing the substrate receiving operation each time a new substrate type is targeted. That is, the height position of the elevating member 24 at the detection timing at which the detection signal from the photosensor 29 is output is obtained by detecting the rotation drive mechanism 31 and the control unit 34, and the obtained detection reference height position Hs. Is stored in the storage unit 35 as a reference detection height position corresponding to the board type.

図4(b)は、規定厚みtoよりも厚い厚みt1を有する基板4Aが固定クランプ部材21、可動クランプ部材22によってクランプされた状態におけるフォトセンサ29の検出タイミングを示している。すなわち、t1がt0よりも厚いため、昇降部材24の高さ位置が検出基準高さ位置Hsに到達する以前に遮光ドグ28の下端部が検出位置29aに一致し、フォトセンサ29は検出信号を出力する。図4(c)はこの反対に、規定厚みtoよりも薄い厚みt2を有する基板4Bが固定クランプ部材21、可動クランプ部材22によってクランプされた状態におけるフォトセンサ29の検出タイミングを示している。すなわち、t1がt0よりも薄いため、昇降部材24の高さ位置が検出基準高さ位置Hsに到達しても遮光ドグ28の下端部は検出位置29aに到達せず、昇降部材24の高さ位置が検出基準高さ位置Hsを通過して行き過ぎた後に遮光ドグ28の下端部が検出位置29aに一致して、フォトセンサ29は検出信号を出力する。   FIG. 4B shows the detection timing of the photosensor 29 in a state where the substrate 4 </ b> A having a thickness t <b> 1 thicker than the specified thickness to is clamped by the fixed clamp member 21 and the movable clamp member 22. That is, since t1 is thicker than t0, before the height position of the elevating member 24 reaches the detection reference height position Hs, the lower end portion of the light shielding dog 28 coincides with the detection position 29a, and the photosensor 29 outputs a detection signal. Output. On the other hand, FIG. 4C shows the detection timing of the photosensor 29 in a state where the substrate 4B having a thickness t2 smaller than the specified thickness to is clamped by the fixed clamp member 21 and the movable clamp member 22. That is, since t1 is thinner than t0, even if the height position of the lifting member 24 reaches the detection reference height position Hs, the lower end portion of the light shielding dog 28 does not reach the detection position 29a, and the height of the lifting member 24 After the position passes the detection reference height position Hs, the lower end portion of the light shielding dog 28 coincides with the detection position 29a, and the photosensor 29 outputs a detection signal.

換言すれば、フォトセンサ29の検出タイミングを監視することにより、その時点において固定クランプ部材21、可動クランプ部材22によってクランプされた基板の厚みが規定厚みに対して正常なばらつき範囲にあるか、あるいは正常範囲を超えた厚み異常であるかを判定することができる。すなわち、図4(b)、(c)に示す検出タイミングにおける高さ位置の上下の変動が、予め厚みの許容誤差寸法dに対応して設定された上方異常位置UL、下方異常位置LL内に収まっていない場合には、制御部34はその時点でクランプされている基板の厚みが異常であると判定し、その旨報知部36によって報知する。すなわち、制御部34、報知部36は基板の厚みが異常であると判定しその旨の報知を行う異常判定報知手段となっている。   In other words, by monitoring the detection timing of the photosensor 29, the thickness of the substrate clamped by the fixed clamp member 21 and the movable clamp member 22 is within a normal variation range with respect to the specified thickness at that time, or It is possible to determine whether the thickness is abnormal beyond the normal range. That is, the vertical fluctuation of the height position at the detection timing shown in FIGS. 4B and 4C is within the upper abnormal position UL and the lower abnormal position LL set in advance corresponding to the allowable error dimension d of the thickness. If not, the control unit 34 determines that the thickness of the substrate clamped at that time is abnormal, and notifies the notification unit 36 to that effect. That is, the control unit 34 and the notification unit 36 serve as an abnormality determination notification unit that determines that the thickness of the substrate is abnormal and notifies that effect.

ここで、基板の厚みが異常であると判定されたならば、いずれかに誤差またはミスが発生していると判断して対応策を選定する。対応策としては、下受け高さオフセットのティーチングを再度実行して更新するとともに、図3(c)に示す下受け高さ位置H1を示す高さ制御パラメータを更新するようにしている。すなわちこの場合には、制御部34は下受け高さオフセットを更新するオフセット更新手段として機能する。   Here, if it is determined that the thickness of the substrate is abnormal, it is determined that an error or error has occurred in any of the substrates, and a countermeasure is selected. As a countermeasure, the teaching of offset height offset is executed again and updated, and the height control parameter indicating the bearing height position H1 shown in FIG. 3C is updated. That is, in this case, the control unit 34 functions as an offset update unit that updates the bearing height offset.

次に、図5,図6,図7,図8を参照して、電子部品を基板に実装して実装基板を製造する電子部品実装ラインに使用される電子部品実装用装置において、当該装置の作業動作の対象となる基板を基板下受部3によって下面側から下受けして支持する基板下受け方法について説明する。   Next, referring to FIG. 5, FIG. 6, FIG. 7, and FIG. 8, in an electronic component mounting apparatus used in an electronic component mounting line for manufacturing a mounting substrate by mounting electronic components on a substrate, A substrate receiving method for receiving and supporting a substrate to be a work operation from the lower surface side by the substrate receiving portion 3 will be described.

まず上流側装置から対象となる基板4が供給され、図5(a)に示すように、コンベア機構20に受け渡されて基板下受部3による下受け位置まで搬送される。次いで、下受け昇降動作が開始され、図5(b)に示すように、回転駆動機構31を駆動して昇降部材24を可動クランプ部材22、下受けピン30とともに基板4に対して上昇させる。図6(a)は、この上昇過程において、可動クランプ部材22が基板4の下面に当接した状態を示しており、これ以後さらに昇降部材24を上昇させることにより、図6(b)に示すように、基板4はコンベア機構20から浮き上がってさらに上昇する。   First, the target substrate 4 is supplied from the upstream device, and is delivered to the conveyor mechanism 20 and conveyed to the receiving position by the substrate receiving portion 3 as shown in FIG. Next, the lower support raising / lowering operation is started, and as shown in FIG. 5B, the rotary drive mechanism 31 is driven to raise the elevating member 24 together with the movable clamp member 22 and the lower receiving pin 30 with respect to the substrate 4. FIG. 6A shows a state in which the movable clamp member 22 is in contact with the lower surface of the substrate 4 in the ascending process. Thereafter, the raising / lowering member 24 is further raised, as shown in FIG. 6B. Thus, the board | substrate 4 lifts from the conveyor mechanism 20, and raises further.

次いで図7(a)に示すように、可動クランプ部材22によって持ち上げられた基板4はさらに上昇して基板4の上面が固定クランプ部材21の下面に当接する。これにより、基板4の両側端部は固定クランプ部材21と可動クランプ部材22によって挟み込まれた状態となる。この状態からさらに昇降部材24を徐々に上昇させることにより、図7(b)に示すように、遮光ドグ28の下端部が検出位置29aに一致し、これによりフォトセンサ29は検出信号を出力する。この出力信号を受信した制御部34は記憶部35に記憶されている下受け高さオフセットΔHを読み出し、この検出タイミングから下受け高さオフセットΔH分だけ昇降部材24を上昇させるように、回転駆動機構31を制御する。   Next, as shown in FIG. 7A, the substrate 4 lifted by the movable clamp member 22 is further raised so that the upper surface of the substrate 4 contacts the lower surface of the fixed clamp member 21. As a result, both end portions of the substrate 4 are sandwiched between the fixed clamp member 21 and the movable clamp member 22. By gradually raising the elevating member 24 from this state, as shown in FIG. 7B, the lower end of the light shielding dog 28 coincides with the detection position 29a, whereby the photosensor 29 outputs a detection signal. . Receiving this output signal, the control unit 34 reads the backing height offset ΔH stored in the storage unit 35 and rotationally drives the raising / lowering member 24 to be raised by the backing height offset ΔH from this detection timing. The mechanism 31 is controlled.

すなわち、制御部34は、基板下受部3によって基板4を下受けして支持するために昇降部材24を上昇させる基板下受動作において、昇降駆動手段としての回転駆動機構31を制御してオフセット位置になったことが検出されるまで昇降部材24を上昇させ、次いで下受け高さオフセットΔH分だけ昇降部材24を上昇させることにより、下受当接部材である下受けピン30の上面が基板4の下面に当接する下受け高さ位置に到達させる昇降制御手段となっている。   That is, the control unit 34 controls the rotational drive mechanism 31 as the lifting drive means to offset in the substrate receiving operation for raising the lifting member 24 to receive and support the substrate 4 by the substrate receiving unit 3. The elevating member 24 is raised until it is detected that the position has been reached, and then the elevating member 24 is raised by the lower receiving height offset ΔH, whereby the upper surface of the lower receiving pin 30 that is the lower receiving contact member becomes the substrate. Ascending / descending control means for reaching a lower receiving height position in contact with the lower surface of 4.

図5〜図8に示す基板下受け動作を、同種類の基板を対象として反復する場合には、最初の基板を対象とした基板下受け動作において図3(c)に示す状態における昇降部材24の下受け高さ位置H1が制御部34によって読み込まれて記憶部35に記憶される。そして後続の基板を対象とする基板下受け動作においては、下受け高さ位置H1を目標として昇降部材24を停止させることなく上昇させる。   When the substrate receiving operation shown in FIGS. 5 to 8 is repeated for the same type of substrate, the lifting member 24 in the state shown in FIG. 3C in the substrate receiving operation for the first substrate is used. The under support height position H1 is read by the control unit 34 and stored in the storage unit 35. Then, in the substrate receiving operation for the subsequent substrate, the elevating member 24 is raised without stopping with the target height position H1 as a target.

すなわち本実施の形態においては、記憶部35は作業動作の最初の基板を対象とした基板下受動作における下受け高さ位置H1を記憶し、制御部34は最初の基板4と同種類の基板を対象とする後続の基板下受動作において、記憶された下受け高さ位置H1を目標位置として回転駆動機構31を制御するようにしている。   That is, in the present embodiment, the storage unit 35 stores the receiving height position H1 in the substrate receiving operation for the first substrate of the work operation, and the control unit 34 is the same type of substrate as the first substrate 4. In the subsequent substrate receiving operation for the above, the rotation drive mechanism 31 is controlled with the stored receiving height position H1 as the target position.

同様に基板下受け動作を反復して実行する過程においては、図4に示す方法によって、基板の厚みの異常有無が監視される。すなわち、対象となる正規厚みの基板が固定クランプ部材21と可動クランプ部材22に挟み込まれた状態で、フォトセンサ29の検出信号
が出力された検出タイミングにおける昇降部材24の高さ位置を、検出基準高さ位置Hsとして記憶部35に記憶させる。
Similarly, in the process of repeatedly performing the substrate receiving operation, the presence or absence of abnormality in the thickness of the substrate is monitored by the method shown in FIG. That is, the height position of the elevating member 24 at the detection timing when the detection signal of the photosensor 29 is output in a state where the target regular thickness substrate is sandwiched between the fixed clamp member 21 and the movable clamp member 22, is the detection reference. The height position Hs is stored in the storage unit 35.

基板下受部3によって基板4を下受けして支持するために昇降部材24を上昇させる基板下受動作において、昇降部材24の高さ位置が検出基準高さ位置Hsよりも所定高さである許容誤差寸法dだけ下方に設定された下方検出限界位置LLに到達した時点で昇降部材24の上昇を停止させ、フォトセンサ29の信号出力を監視する。ここでフォトセンサ29からすでに検出信号が出力されたならば、制御部34はその時点で可動クランプ部材22と固定クランプ部材21との間に挟み込まれている基板の厚みが異常であると判定し、報知部36によってその旨の報知を行う。   In the substrate receiving operation for raising the elevating member 24 to receive and support the substrate 4 by the substrate receiving portion 3, the height position of the elevating member 24 is a predetermined height from the detection reference height position Hs. When reaching the lower detection limit position LL set downward by the allowable error dimension d, the raising of the elevating member 24 is stopped and the signal output of the photosensor 29 is monitored. If a detection signal has already been output from the photosensor 29, the control unit 34 determines that the thickness of the substrate sandwiched between the movable clamp member 22 and the fixed clamp member 21 is abnormal at that time. The notification unit 36 notifies that fact.

また昇降部材24が検出基準高さ位置Hsに到達してもフォトセンサ29からの検出信号が出力されず、さらに検出基準高さ位置Hsよりも許容誤差寸法dだけ上方に設定された上方検出限界位置ULに到達した時点で昇降部材24の上昇を停止させ、フォトセンサ29の信号出力を監視する。ここでもフォトセンサ29からまだ検出信号が出力されないならば、制御部34は同様にその時点で可動クランプ部材22と固定クランプ部材21との間に挟み込まれている基板の厚みが異常であると判定し、報知部36によってその旨の報知を行う。このような基板厚みの異常有無検出動作は、基板が当該装置に搬入されて、基板認識カメラによる位置認識のための撮像などの作業を実行している間の時間を利用して実行される。   Further, even if the elevating member 24 reaches the detection reference height position Hs, the detection signal from the photo sensor 29 is not output, and the upper detection limit is set above the detection reference height position Hs by an allowable error dimension d. When the position UL is reached, the lifting of the elevating member 24 is stopped and the signal output of the photosensor 29 is monitored. Again, if the detection signal is not yet output from the photosensor 29, the controller 34 similarly determines that the thickness of the substrate sandwiched between the movable clamp member 22 and the fixed clamp member 21 is abnormal at that time. Then, the notification unit 36 notifies that effect. Such a substrate thickness abnormality presence / absence detection operation is performed using a time during which a substrate is carried into the apparatus and an operation such as imaging for position recognition by the substrate recognition camera is being performed.

ここで、基板の厚みが異常であると判定されたならば、いずれかに誤差またはミスが発生していると判断して対応策を選定する。ここに示す実施例においては、異常と判定されたその基板を対象として、図3に示す高さ差Δを再度計測により求めて新たに記憶部35に記憶させ、下受け高さオフセットΔHを更新する。これとともに、当該基板を対象として、図3(c)に示す下受け高さ位置H1を示す高さ制御パラメータを新たに求め、記憶部35に記憶させて更新する。   Here, if it is determined that the thickness of the substrate is abnormal, it is determined that an error or error has occurred in any of the substrates, and a countermeasure is selected. In the embodiment shown here, for the board determined to be abnormal, the height difference Δ shown in FIG. 3 is again obtained by measurement and newly stored in the storage unit 35, and the bearing height offset ΔH is updated. To do. At the same time, for the board, a new height control parameter indicating the receiving height position H1 shown in FIG. 3C is newly obtained, stored in the storage unit 35, and updated.

上記説明したように、本実施の形態に示す基板下受部3は、可動クランプ部材22と固定クランプ部材21との間に基板4が挟み込まれさらに可動クランプ部材22の昇降部材24に対する相対上下位置が予め設定されたオフセット位置になったことを検出して検出信号を出力するクランプ検出手段を設け、検出タイミングにおける可動クランプ部材22の上面と下受ピン30の上面との高さ差を当該装置固有の下受け高さオフセットΔHとして記憶させておくようにしている。   As described above, in the substrate receiving portion 3 shown in the present embodiment, the substrate 4 is sandwiched between the movable clamp member 22 and the fixed clamp member 21 and the relative vertical position of the movable clamp member 22 with respect to the lifting member 24. Is provided with a clamp detection means for detecting that the offset position is set in advance and outputting a detection signal, and the height difference between the upper surface of the movable clamp member 22 and the upper surface of the receiving pin 30 at the detection timing is provided. It is memorized as a unique bearing height offset ΔH.

そして基板下受動作においてオフセット位置になったことが検出されるまで昇降部材を上昇させ、次いで下受け高さオフセットΔH分だけ昇降部材24を上昇させるように動作制御するようにしたものである。これにより、対象とする複数品種の基板の厚みがそれぞれ異なる場合にあっても、品種切替時の機械調整や制御パラメータの変更などの作業を必要とすることなく、基板を正しい高さ位置に良好な平面度で支持することができる。   Then, the raising / lowering member is raised until it is detected that the offset position is reached in the substrate receiving operation, and then the raising / lowering member 24 is raised by the amount of the receiving height offset ΔH. As a result, even if the thicknesses of multiple target board types differ, the board can be placed in the correct height position without the need for operations such as machine adjustment and change of control parameters when switching between types. It can be supported with a flatness.

さらに基板下受動作において、昇降部材24の高さ位置が基準検出高さ位置Hsから許容誤差寸法dだけ下方に設定された下方検出限界位置LLに到達した時点ですでに検出信号が出力されたならば、あるいは基準検出高さ位置Hsから許容誤差寸法dだけ上方に設定された上方検出限界位置ULに到達した時点でまだ検出信号が出力されないならば、その時点でクランプされている基板の厚みが異常であると判定してその旨の報知を行うようにしている。これにより、厚みが異なる異種基板が搬入された場合や、製造ロット間の厚み誤差などで基板の厚みがばらついている場合にあっても、厚み異常を正しく検出することができ、厚み異常に起因する基板の高さ位置誤差や、平面度不良を防止することができる。   Further, in the substrate receiving operation, the detection signal is already output when the height position of the elevating member 24 reaches the lower detection limit position LL set below the reference detection height position Hs by the allowable error dimension d. If the detection signal is not yet output when reaching the upper detection limit position UL set by the allowable error dimension d from the reference detection height position Hs, the thickness of the substrate clamped at that time Is determined to be abnormal and a notification to that effect is made. As a result, even when different types of substrates with different thicknesses are brought in, or when the thickness of the substrates varies due to a thickness error between manufacturing lots, the thickness abnormality can be detected correctly. It is possible to prevent the height position error of the substrate and the flatness failure.

なお本実施の形態においては、電子部品実装ラインにおいて使用される電子部品実装用装置として、基板に電子部品を搭載する電子部品搭載装置の例を示したが、本発明はこれに限定されるものではない。例えばスクリーン印刷装置や検査装置など、電子部品実装ラインにおいて使用される装置であって、基板を下面側から下受けして支持する形態の基板下受部を備えたものであれば、本発明の適用対象となる。   In the present embodiment, an example of an electronic component mounting apparatus for mounting an electronic component on a substrate is shown as an electronic component mounting apparatus used in the electronic component mounting line. However, the present invention is not limited to this. is not. For example, an apparatus used in an electronic component mounting line, such as a screen printing apparatus or an inspection apparatus, which has a substrate receiving portion configured to receive and support a substrate from the lower surface side, the present invention Applicable.

本発明の電子部品実装用装置および電子部品実装用装置における基板下受け方法は、厚みが異なる異種基板が搬入された場合や、製造ロット間の厚み誤差などで基板の厚みがばらついている異なる場合にあっても、厚み異常を正しく検出することができ、厚み異常に起因する基板の高さ位置誤差や、平面度不良を防止することができるという効果を有し、スクリーン印刷装置や電子部品実装装置など電子部品実装用装置において基板を下受けする用途に利用可能である。   The electronic component mounting apparatus of the present invention and the substrate receiving method in the electronic component mounting apparatus are different when different types of substrates having different thicknesses are loaded, or when the thicknesses of the substrates vary due to a thickness error between manufacturing lots. Even in this case, it is possible to correctly detect the thickness abnormality, and it is possible to prevent an error in the height position of the substrate due to the thickness abnormality and a poor flatness. The present invention can be used for receiving a substrate in an electronic component mounting apparatus such as an apparatus.

本発明の一実施の形態の電子部品搭載装置の斜視図The perspective view of the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板下受部の断面図Sectional drawing of the board | substrate receiving part in the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板下受部の部分断面図The fragmentary sectional view of the board | substrate receiving part in the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板厚み異常検出の説明図Explanatory drawing of the board thickness abnormality detection in the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板下受け方法の動作説明図Operation | movement explanatory drawing of the board | substrate underlay method in the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板下受け方法の動作説明図Operation | movement explanatory drawing of the board | substrate underlay method in the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板下受け方法の動作説明図Operation | movement explanatory drawing of the board | substrate underlay method in the electronic component mounting apparatus of one embodiment of this invention 本発明の一実施の形態の電子部品搭載装置における基板下受け方法の動作説明図Operation | movement explanatory drawing of the board | substrate underlay method in the electronic component mounting apparatus of one embodiment of this invention

符号の説明Explanation of symbols

2 搬送路
3 基板下受部
4,4A.4B 基板
5 部品供給部
13 搭載ヘッド
21 固定クランプ部材
22 可動クランプ部材
23 弾性支持部
27 圧縮バネ
28 遮光ドグ
29 フォトセンサ
30 下受けピン
31 回転駆動機構
32 送りねじ
40 ダミー基板
2 Conveying path 3 Substrate receiving part 4, 4A. 4B substrate 5 component supply unit 13 mounting head 21 fixed clamp member 22 movable clamp member 23 elastic support unit 27 compression spring 28 light shielding dog 29 photosensor 30 lower receiving pin 31 rotation drive mechanism 32 feed screw 40 dummy substrate

Claims (4)

電子部品を基板に実装して実装基板を製造する電子部品実装ラインに使用される電子部品実装用装置であって、
前記電子部品実装用装置において当該装置の作業動作の対象となる基板を下面側から下受けして支持する基板下受部は、
前記基板の両側縁部が下方から当接する平面位置に、下面の高さ位置を前記作業動作における作業高さ位置に合わせて配設された1対の固定クランプ部材と、
前記固定クランプ部材の下方に昇降自在に配設された昇降部材と、前記昇降部材を高さ制御パラメータにしたがって昇降させる昇降駆動手段と、
前記昇降部材に対して相対上下動が可能に且つ付勢手段によって上方に付勢された状態で保持され、前記昇降部材と一体に上昇した状態において前記基板の両側縁部の下面に当接して前記固定クランプ部材との間に前記基板の両側縁部を挟み込む1対の可動クランプ部材と、
前記昇降部材に設けられて一体に昇降し、上昇した状態において前記基板の下面に当接してこの基板を下受けする下受当接部材と、
前記可動クランプ部材と前記固定クランプ部材との間に前記基板が挟み込まれさらに前記可動クランプ部材の前記昇降部材に対する相対上下位置が予め設定されたオフセット位置になったことを検出して検出信号を出力するクランプ検出手段とを有し、
作業動作の対象となる正規厚みの基板が挟み込まれた状態で、前記検出信号が出力された検出タイミングにおける前記昇降部材の高さ位置を検出基準高さ位置として記憶する記憶部と、
前記基板下受部によって前記基板を下受けして支持するために前記昇降部材を上昇させる基板下受動作において、前記昇降部材の高さ位置が前記検出基準高さ位置よりも所定高さだけ下方に設定された下方検出限界位置に到達した時点ですでに前記検出信号が出力されたならば、あるいは前記検出基準高さ位置よりも所定高さだけ上方に設定された上方検出限界位置に到達した時点でまだ前記検出信号が出力されないならば、その時点で前記可動クランパと前記固定クランパとの間に挟み込まれている基板の厚みが異常であると判定してその旨の報知を行う異常判定報知手段とを備えたことを特徴とする電子部品実装用装置。
An electronic component mounting device used in an electronic component mounting line for manufacturing a mounting substrate by mounting an electronic component on a substrate,
In the electronic component mounting apparatus, a substrate receiving part that supports and supports a substrate that is a target of work operation of the apparatus from the lower surface side,
A pair of fixed clamp members disposed in a plane position where both side edges of the substrate abut from below, and the height position of the lower surface is matched to the work height position in the work operation;
An elevating member disposed below the fixed clamp member so as to be movable up and down, and an elevating drive means for elevating the elevating member according to a height control parameter;
It is held in a state of being able to move up and down relative to the elevating member and urged upward by an urging means, and in contact with the lower surfaces of both side edges of the substrate in the state of being raised together with the elevating member. A pair of movable clamp members that sandwich both side edges of the substrate between the fixed clamp members;
A lower contact member that is provided on the elevating member and integrally moves up and down and contacts the lower surface of the substrate in the raised state to receive the substrate;
A detection signal is output by detecting that the substrate is sandwiched between the movable clamp member and the fixed clamp member and that the relative vertical position of the movable clamp member with respect to the lifting member is a preset offset position. Clamping detection means
A storage unit that stores a height position of the elevating member at a detection timing at which the detection signal is output as a detection reference height position in a state where a substrate having a normal thickness that is a target of work operation is sandwiched,
In a substrate receiving operation for raising the elevating member to receive and support the substrate by the substrate receiving portion, the height position of the elevating member is lower than the detection reference height position by a predetermined height. If the detection signal has already been output when reaching the lower detection limit position set to, or has reached the upper detection limit position set a predetermined height above the detection reference height position If the detection signal is not yet output at that time, it is determined that the thickness of the substrate sandwiched between the movable clamper and the fixed clamper is abnormal at that time, and an abnormality determination notification is issued to that effect. And an electronic component mounting apparatus.
前記記憶部は、前記クランプ検出手段が前記検出信号を出力した検出タイミングにおける前記可動クランプ部材の上面と前記下受当接部材の上面との高さ差を、当該装置固有の下受け高さオフセットとして記憶し、
前記基板下受部によって前記基板を下受けして支持するために前記昇降部材を上昇させる基板下受動作において、前記昇降駆動手段を制御して前記オフセット位置になったことが検出されるまで前記昇降部材を上昇させ、次いで前記下受け高さオフセット分だけ前記昇降部材を上昇させることにより、前記下受当接部材の上面が前記基板の下面に当接する下受け高さ位置に到達させる昇降制御手段と、
前記基板の厚みが異常であると判定されたならば、前記高さ差を再度求めて前記下受け高さオフセットを更新するオフセット更新手段とを備えたことを特徴とする請求項1記載の電子部品実装用装置。
The storage unit calculates a difference in height between the upper surface of the movable clamp member and the upper surface of the lower contact member at a detection timing when the clamp detection unit outputs the detection signal, and receives a base height offset corresponding to the device. Remember as
In the substrate receiving operation for raising the elevating member to receive and support the substrate by the substrate receiving portion, the elevating driving means is controlled until the offset position is detected. Elevating control that raises the elevating member and then raises the elevating member by an amount corresponding to the lower height of the lower receiving portion to reach the lower receiving height position where the upper surface of the lower receiving contact member contacts the lower surface of the substrate Means,
2. The electronic apparatus according to claim 1, further comprising offset updating means for re-determining the height difference and updating the base height offset if it is determined that the thickness of the substrate is abnormal. Component mounting equipment.
電子部品を基板に実装して実装基板を製造する電子部品実装ラインに使用される電子部品実装用装置において、当該装置の作業動作の対象となる基板を基板下受部によって下面側から下受けして支持する電子部品実装用装置における基板下受方法であって、
前記基板下受部は、前記基板の両側縁部が下方から当接する平面位置に、下面の高さ位置を前記作業動作における作業高さ位置に合わせて配設された1対の固定クランプ部材と、前記固定クランプ部材の下方に昇降自在に配設された昇降部材と、前記昇降部材を高さ制御パラメータにしたがって昇降させる昇降駆動手段と、前記昇降部材に対して相対上下動が可能に且つ付勢手段によって上方に付勢された状態で保持され、前記昇降部材と一体に上昇した状態において前記基板の両側縁部の下面に当接して前記固定クランプ部材との間に前記基板の両側縁部を挟み込む1対の可動クランプ部材と、前記昇降部材に設けられて一体に昇降し、上昇した状態において前記基板の下面に当接してこの基板を下受けする下受当接部材と、前記可動クランプ部材と前記固定クランプ部材との間に前記基板が挟み込まれさらに前記可動クランプ部材の前記昇降部材に対する相対上下位置が予め設定されたオフセット位置になったことを検出して検出信号を出力するクランプ検出手段とを有し、
作業動作の対象となる正規厚みの基板が挟み込まれた状態で、前記検出信号が出力された検出タイミングにおける前記昇降部材の高さ位置を検出基準高さ位置として記憶させておき、
前記基板下受部によって前記基板を下受けして支持するために前記昇降部材を上昇させる基板下受動作において、前記昇降部材の高さ位置が前記検出基準高さ位置よりも所定高さだけ下方に設定された下方検出限界位置に到達した時点ですでに前記検出信号が出力されたならば、あるいは前記検出基準高さ位置よりも所定高さだけ上方に設定された上方検出限界位置に到達した時点でまだ前記検出信号が出力されないならば、その時点で前記可動クランパと前記固定クランパとの間に挟み込まれている基板の厚みが異常であると判定してその旨の報知を行うことを特徴とする電子部品実装用装置における基板下受け方法。
In an electronic component mounting apparatus used in an electronic component mounting line that mounts an electronic component on a board to manufacture a mounting board, the board that is the target of work operation of the apparatus is received from the lower surface side by the board receiving portion. A substrate receiving method in an electronic component mounting apparatus to be supported,
The substrate receiving portion includes a pair of fixed clamp members disposed at a planar position where both side edges of the substrate abut from below, and with the height position of the lower surface aligned with the work height position in the work operation. An elevating member disposed below the fixed clamp member so as to be movable up and down, elevating drive means for elevating the elevating member according to a height control parameter, and a vertical movement relative to the elevating member. Both sides of the substrate are held in a state of being biased upward by the biasing means and are in contact with the lower surfaces of the side edges of the substrate in a state of being lifted together with the lifting member. A pair of movable clamp members that sandwich the substrate, a lower contact contact member that is provided on the elevating member and moves up and down integrally, and in contact with the lower surface of the substrate in the raised state, and the movable clamp A clamp that outputs a detection signal by detecting that the substrate is sandwiched between a clamp member and the fixed clamp member, and that the relative vertical position of the movable clamp member with respect to the lift member is a preset offset position. Detecting means,
In a state where a substrate having a normal thickness that is a target of work operation is sandwiched, the height position of the elevating member at the detection timing at which the detection signal is output is stored as a detection reference height position,
In a substrate receiving operation for raising the elevating member to receive and support the substrate by the substrate receiving portion, the height position of the elevating member is lower than the detection reference height position by a predetermined height. If the detection signal has already been output when reaching the lower detection limit position set to, or has reached the upper detection limit position set a predetermined height above the detection reference height position If the detection signal is not yet output at the time, it is determined that the thickness of the substrate sandwiched between the movable clamper and the fixed clamper at that time is abnormal, and a notification to that effect is given. A substrate underlaying method in an electronic component mounting apparatus.
前記クランプ検出手段が前記検出信号を出力した検出タイミングにおける前記可動クランプ部材の上面と前記下受当接部材の上面との高さ差を、当該装置固有の下受け高さオフセットとして記憶させておき、
前記基板下受部によって前記基板を下受けして支持するために前記昇降部材を上昇させる基板下受動作において、前記昇降駆動手段を制御して前記オフセット位置になったことが検出されるまで前記昇降部材を上昇させ、次いで前記下受け高さオフセット分だけ前記昇降部材を上昇させることにより、前記下受当接部材の上面が前記基板の下面に当接する下受け高さ位置に到達させ、
前記基板の厚みが異常であると判定されたならば、前記高さ差を再度求めて前記下受け高さオフセットを更新することを特徴とする請求項3記載の電子部品実装用装置における基板下受け方法。
The difference in height between the upper surface of the movable clamp member and the upper surface of the lower contact member at the detection timing when the clamp detection means outputs the detection signal is stored as a lower height of the lower device unique to the device. ,
In the substrate receiving operation for raising the elevating member to receive and support the substrate by the substrate receiving portion, the elevating driving means is controlled until the offset position is detected. Raising the elevating member, and then raising the elevating member by an amount corresponding to the lower receiving height offset, so that the upper surface of the lower abutting contact member reaches the lower receiving height position where it abuts the lower surface of the substrate,
4. If the thickness of the substrate is determined to be abnormal, the height difference is obtained again to update the lower height offset of the substrate in the electronic component mounting apparatus according to claim 3. How to receive.
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