JP4713629B2 - 自動分析装置 - Google Patents

自動分析装置 Download PDF

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Publication number
JP4713629B2
JP4713629B2 JP2008317805A JP2008317805A JP4713629B2 JP 4713629 B2 JP4713629 B2 JP 4713629B2 JP 2008317805 A JP2008317805 A JP 2008317805A JP 2008317805 A JP2008317805 A JP 2008317805A JP 4713629 B2 JP4713629 B2 JP 4713629B2
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Japan
Prior art keywords
sample
dispensing
analysis
abnormality
occurred
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JP2008317805A
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English (en)
Japanese (ja)
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JP2009058532A5 (enExample
JP2009058532A (ja
Inventor
雅人 石沢
一啓 田中
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Hitachi High Tech Corp
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Hitachi High Technologies Corp
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Priority to JP2008317805A priority Critical patent/JP4713629B2/ja
Publication of JP2009058532A publication Critical patent/JP2009058532A/ja
Publication of JP2009058532A5 publication Critical patent/JP2009058532A5/ja
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JP2008317805A 2008-12-15 2008-12-15 自動分析装置 Expired - Lifetime JP4713629B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2008317805A JP4713629B2 (ja) 2008-12-15 2008-12-15 自動分析装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2008317805A JP4713629B2 (ja) 2008-12-15 2008-12-15 自動分析装置

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
JP2004184384A Division JP4416579B2 (ja) 2004-06-23 2004-06-23 自動分析装置

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2011020295A Division JP5174930B2 (ja) 2011-02-02 2011-02-02 自動分析装置

Publications (3)

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JP2009058532A JP2009058532A (ja) 2009-03-19
JP2009058532A5 JP2009058532A5 (enExample) 2011-03-17
JP4713629B2 true JP4713629B2 (ja) 2011-06-29

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ID=40554365

Family Applications (1)

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JP2008317805A Expired - Lifetime JP4713629B2 (ja) 2008-12-15 2008-12-15 自動分析装置

Country Status (1)

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JP (1) JP4713629B2 (enExample)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5366747B2 (ja) 2009-09-30 2013-12-11 シスメックス株式会社 分析装置

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07280814A (ja) * 1994-04-14 1995-10-27 Hitachi Ltd 検体検査自動化システム
JP3298332B2 (ja) * 1994-10-19 2002-07-02 株式会社日立製作所 生体試料分析システム
JPH10325829A (ja) * 1997-05-22 1998-12-08 Daido Steel Co Ltd 渦流探傷装置
JP4070312B2 (ja) * 1998-07-30 2008-04-02 株式会社日立製作所 検体検査システムおよび検体検査方法
JP2001124783A (ja) * 1999-08-13 2001-05-11 Tomiyuki Imai 検体容器及びその移送装置
JP2002005942A (ja) * 2000-06-23 2002-01-09 Teruaki Ito 検体処理ユニット及び検体処理システム
JP2002040033A (ja) * 2000-07-27 2002-02-06 Tomiyuki Imai 検体処理装置
JP4763160B2 (ja) * 2001-06-18 2011-08-31 日立アロカメディカル株式会社 分注良否判定装置
JP4733315B2 (ja) * 2001-08-23 2011-07-27 シスメックス株式会社 検体検査システム及び搬送制御装置並びに方法
JP3740399B2 (ja) * 2001-09-11 2006-02-01 アロカ株式会社 検体前処理装置
JP3901587B2 (ja) * 2002-06-12 2007-04-04 株式会社東芝 自動分析装置および自動分析装置におけるデータ管理方法

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Publication number Publication date
JP2009058532A (ja) 2009-03-19

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