JP4561962B2 - 信号検出装置 - Google Patents

信号検出装置 Download PDF

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Publication number
JP4561962B2
JP4561962B2 JP2004024869A JP2004024869A JP4561962B2 JP 4561962 B2 JP4561962 B2 JP 4561962B2 JP 2004024869 A JP2004024869 A JP 2004024869A JP 2004024869 A JP2004024869 A JP 2004024869A JP 4561962 B2 JP4561962 B2 JP 4561962B2
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JP
Japan
Prior art keywords
mode signal
signal
circuit
common mode
power supply
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004024869A
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English (en)
Japanese (ja)
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JP2005214902A5 (https=
JP2005214902A (ja
Inventor
賢 和崎
義広 斉藤
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TDK Corp
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TDK Corp
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Publication date
Application filed by TDK Corp filed Critical TDK Corp
Priority to JP2004024869A priority Critical patent/JP4561962B2/ja
Priority to PCT/JP2005/000968 priority patent/WO2005072071A2/ja
Priority to US10/586,949 priority patent/US7405574B2/en
Publication of JP2005214902A publication Critical patent/JP2005214902A/ja
Publication of JP2005214902A5 publication Critical patent/JP2005214902A5/ja
Application granted granted Critical
Publication of JP4561962B2 publication Critical patent/JP4561962B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

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  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Filters And Equalizers (AREA)
  • Monitoring And Testing Of Transmission In General (AREA)
  • Arrangements For Transmission Of Measured Signals (AREA)
JP2004024869A 2004-01-30 2004-01-30 信号検出装置 Expired - Fee Related JP4561962B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004024869A JP4561962B2 (ja) 2004-01-30 2004-01-30 信号検出装置
PCT/JP2005/000968 WO2005072071A2 (ja) 2004-01-30 2005-01-26 信号検出装置
US10/586,949 US7405574B2 (en) 2004-01-30 2005-01-26 Signal detector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004024869A JP4561962B2 (ja) 2004-01-30 2004-01-30 信号検出装置

Publications (3)

Publication Number Publication Date
JP2005214902A JP2005214902A (ja) 2005-08-11
JP2005214902A5 JP2005214902A5 (https=) 2006-12-07
JP4561962B2 true JP4561962B2 (ja) 2010-10-13

Family

ID=34823961

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004024869A Expired - Fee Related JP4561962B2 (ja) 2004-01-30 2004-01-30 信号検出装置

Country Status (3)

Country Link
US (1) US7405574B2 (https=)
JP (1) JP4561962B2 (https=)
WO (1) WO2005072071A2 (https=)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7787921B2 (en) * 2007-06-12 2010-08-31 Rosemount Inc. Link coupled antenna system on a field device having a grounded housing
FR2932338A1 (fr) * 2008-06-10 2009-12-11 Commissariat Energie Atomique Systeme de tranmission d'un signal electrique, notamment frequentiel et dispositif de mesure de rayonnements equipe d'un tel systeme
EP2154789B1 (en) * 2008-08-11 2019-10-02 Sony Corporation Method for detecting an ingress of a short-wave radio signal in a power line communication system and power line communication modem
KR101893013B1 (ko) * 2011-10-28 2018-08-30 삼성전자주식회사 전력 관리 장치 및 그 제어 방법
JP5993389B2 (ja) * 2014-02-24 2016-09-14 日本電信電話株式会社 測定装置
WO2016104014A1 (ja) * 2014-12-26 2016-06-30 株式会社村田製作所 ノイズ測定装置
CN104655965B (zh) * 2015-02-13 2017-07-07 中国农业大学 一种电力系统中相量测量方法
US9928978B1 (en) 2015-03-30 2018-03-27 Sean Butler Device monitoring prevention in power systems
CN119804966B (zh) * 2025-02-17 2026-03-27 深圳率能半导体有限公司 一种power管的单向电流检测方法

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6062831A (ja) * 1983-09-14 1985-04-11 松下電工株式会社 充電器
JPS6064269U (ja) * 1983-10-11 1985-05-07 株式会社安川電機 コモンモ−ドノイズ検出装置
JPH05300235A (ja) * 1992-04-17 1993-11-12 Anritsu Corp Isdn回線の信号無し検出装置
JP2980300B2 (ja) * 1992-05-29 1999-11-22 アンリツ株式会社 Isdn回線の雑音検出装置
JP2000314756A (ja) 1999-04-30 2000-11-14 Matsushita Electric Works Ltd ノイズ試験装置及びその試験方法
JP2002204189A (ja) * 2000-10-31 2002-07-19 Tdk Corp 電力線雑音フィルタ
JP3569681B2 (ja) 2001-02-02 2004-09-22 株式会社半導体理工学研究センター 半導体集積回路における電源電流波形の解析方法及び解析装置
JP2002290289A (ja) * 2001-03-27 2002-10-04 Tdk Corp 電力線通信ネットワークシステム
JP3756774B2 (ja) * 2001-03-27 2006-03-15 Tdk株式会社 インピーダンス調整器
JP3713477B2 (ja) * 2001-11-19 2005-11-09 Tdk株式会社 電力線通信システム
WO2004017515A1 (ja) * 2002-08-19 2004-02-26 Tdk Corporation コモンモード信号抑制回路およびノーマルモード信号抑制回路
US7285962B2 (en) * 2004-05-11 2007-10-23 International Business Machines Corporation Method and apparatus for evaluating susceptibility to common mode noise in a computer system

Also Published As

Publication number Publication date
WO2005072071A2 (ja) 2005-08-11
US20070268063A1 (en) 2007-11-22
WO2005072071A3 (ja) 2005-10-06
JP2005214902A (ja) 2005-08-11
US7405574B2 (en) 2008-07-29

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