JP4533158B2 - 画像処理装置、画像処理プログラムおよび屈折率分布測定装置 - Google Patents

画像処理装置、画像処理プログラムおよび屈折率分布測定装置 Download PDF

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JP4533158B2
JP4533158B2 JP2005012173A JP2005012173A JP4533158B2 JP 4533158 B2 JP4533158 B2 JP 4533158B2 JP 2005012173 A JP2005012173 A JP 2005012173A JP 2005012173 A JP2005012173 A JP 2005012173A JP 4533158 B2 JP4533158 B2 JP 4533158B2
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JP2006200998A5 (enExample
JP2006200998A (ja
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知 小松
保宏 沢田
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Canon Inc
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  • Investigating Or Analysing Materials By Optical Means (AREA)
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JP2005012173A 2005-01-19 2005-01-19 画像処理装置、画像処理プログラムおよび屈折率分布測定装置 Expired - Fee Related JP4533158B2 (ja)

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JP2006200998A5 JP2006200998A5 (enExample) 2008-03-06
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110687074A (zh) * 2019-10-28 2020-01-14 华中科技大学 一种基于波前传感器的光学制件均匀性检测装置与方法

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5008650B2 (ja) * 2008-12-25 2012-08-22 キヤノン株式会社 屈折率分布計測方法及び屈折率分布計測装置
JP5021054B2 (ja) * 2010-05-25 2012-09-05 キヤノン株式会社 屈折率分布計測方法および屈折率分布計測装置
JP5575161B2 (ja) * 2012-02-10 2014-08-20 キヤノン株式会社 屈折率分布計測方法および屈折率分布計測装置
JP2015102537A (ja) * 2013-11-28 2015-06-04 キヤノン株式会社 光干渉断層計
JP6242325B2 (ja) * 2014-11-18 2017-12-06 三菱電機株式会社 水温計測装置および水温計測方法
KR101826191B1 (ko) 2015-12-29 2018-02-07 주식회사 케이피에스 렌즈의 양면 곡률 형상과 굴절률 분포의 동시 측정 장치 및 방법
WO2019138685A1 (ja) * 2018-01-12 2019-07-18 浜松ホトニクス株式会社 位相画像取得装置および位相画像取得方法
JP7014681B2 (ja) * 2018-01-12 2022-02-01 浜松ホトニクス株式会社 位相画像取得装置および位相画像取得方法
JP7262067B2 (ja) * 2018-10-23 2023-04-21 国立大学法人埼玉大学 光学特性測定装置

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000180134A (ja) * 1998-12-17 2000-06-30 Olympus Optical Co Ltd 測定方法
JP3948852B2 (ja) * 1999-03-09 2007-07-25 株式会社リコー 屈折率分布の測定装置及び屈折率分布の測定方法
JP3913407B2 (ja) * 1999-07-09 2007-05-09 株式会社リコー 屈折率分布の測定装置及び方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110687074A (zh) * 2019-10-28 2020-01-14 华中科技大学 一种基于波前传感器的光学制件均匀性检测装置与方法

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