JP4518759B2 - 画像形成システム、画像形成システムを製造する方法及び、入射放射線ビームを検知する方法 - Google Patents

画像形成システム、画像形成システムを製造する方法及び、入射放射線ビームを検知する方法 Download PDF

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JP4518759B2
JP4518759B2 JP2003280542A JP2003280542A JP4518759B2 JP 4518759 B2 JP4518759 B2 JP 4518759B2 JP 2003280542 A JP2003280542 A JP 2003280542A JP 2003280542 A JP2003280542 A JP 2003280542A JP 4518759 B2 JP4518759 B2 JP 4518759B2
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scintillator
radiation
radiation beam
photosensor
scintillators
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Japanese (ja)
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JP2004061516A (ja
JP2004061516A5 (enExample
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アブデラジズ・イクレフ
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GE Medical Systems Global Technology Co LLC
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GE Medical Systems Global Technology Co LLC
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20187—Position of the scintillator with respect to the photodiode, e.g. photodiode surrounding the crystal, the crystal surrounding the photodiode, shape or size of the scintillator
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/2018—Scintillation-photodiode combinations
    • G01T1/20182—Modular detectors, e.g. tiled scintillators or tiled photodiodes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01T—MEASUREMENT OF NUCLEAR OR X-RADIATION
    • G01T1/00—Measuring X-radiation, gamma radiation, corpuscular radiation, or cosmic radiation
    • G01T1/16—Measuring radiation intensity
    • G01T1/20—Measuring radiation intensity with scintillation detectors
    • G01T1/202—Measuring radiation intensity with scintillation detectors the detector being a crystal

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • High Energy & Nuclear Physics (AREA)
  • Molecular Biology (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Measurement Of Radiation (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
JP2003280542A 2002-07-29 2003-07-28 画像形成システム、画像形成システムを製造する方法及び、入射放射線ビームを検知する方法 Expired - Fee Related JP4518759B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/064,590 US6979826B2 (en) 2002-07-29 2002-07-29 Scintillator geometry for enhanced radiation detection and reduced error sensitivity

Publications (3)

Publication Number Publication Date
JP2004061516A JP2004061516A (ja) 2004-02-26
JP2004061516A5 JP2004061516A5 (enExample) 2008-09-11
JP4518759B2 true JP4518759B2 (ja) 2010-08-04

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Country Link
US (1) US6979826B2 (enExample)
EP (1) EP1387185A1 (enExample)
JP (1) JP4518759B2 (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12504550B2 (en) 2020-09-02 2025-12-23 The Research Foundation For The State University Of New York Tapered scintillator crystal modules and methods of using the same

Families Citing this family (26)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP1825299B1 (en) * 2004-12-09 2016-03-09 Koninklijke Philips N.V. Pixelated detectors with depth of interaction sensitivity
US20070086565A1 (en) * 2005-10-13 2007-04-19 Thompson Richard A Focally aligned CT detector
US7521685B2 (en) * 2006-01-18 2009-04-21 General Electric Company Structured scintillator and systems employing structured scintillators
US7676073B2 (en) * 2006-08-29 2010-03-09 Siemens Medical Solutions Usa, Inc. System and method for reducing circular artifacts in tomographic imaging
US7639777B2 (en) * 2008-02-26 2009-12-29 United Technologies Corp. Computed tomography systems and related methods involving forward collimation
US20090213984A1 (en) * 2008-02-26 2009-08-27 United Technologies Corp. Computed Tomography Systems and Related Methods Involving Post-Target Collimation
US20090225954A1 (en) * 2008-03-06 2009-09-10 United Technologies Corp. X-Ray Collimators, and Related Systems and Methods Involving Such Collimators
US8238521B2 (en) * 2008-03-06 2012-08-07 United Technologies Corp. X-ray collimators, and related systems and methods involving such collimators
US7876875B2 (en) * 2008-04-09 2011-01-25 United Technologies Corp. Computed tomography systems and related methods involving multi-target inspection
US7888647B2 (en) * 2008-04-30 2011-02-15 United Technologies Corp. X-ray detector assemblies and related computed tomography systems
US20090274264A1 (en) * 2008-04-30 2009-11-05 United Technologies Corp. Computed Tomography Systems and Related Methods Involving Localized Bias
US8941070B2 (en) * 2008-11-19 2015-01-27 General Electric Company Portable digital image detector positioning apparatus
JP5400546B2 (ja) * 2009-09-28 2014-01-29 株式会社日立メディコ Ｘ線ｃｔ装置
US8258479B2 (en) * 2009-12-15 2012-09-04 Saint-Gobain Ceramics & Plastics, Inc. Radiation detection system and method of making a radiation detection system
US20110211667A1 (en) * 2010-02-26 2011-09-01 Abdelaziz Ikhlef De-populated detector for computed tomography and method of making same
US8155265B2 (en) 2010-07-15 2012-04-10 General Electric Company Asymmetric de-populated detector for computed tomography and method of making same
US8204171B2 (en) 2010-10-11 2012-06-19 General Electric Company Multi-faceted tileable detector for volumetric computed tomography imaging
US8548119B2 (en) 2011-01-13 2013-10-01 General Electric Company Multi-slice CT detector with tileable packaging structure
US9168008B2 (en) 2011-11-03 2015-10-27 General Electric Company Coarse segmented detector architecture and method of making same
US9689996B2 (en) * 2013-04-05 2017-06-27 General Electric Company Integrated diode DAS detector
JP2015025665A (ja) 2013-07-24 2015-02-05 ソニー株式会社 放射線撮像装置および放射線撮像表示システム
US11156727B2 (en) * 2015-10-02 2021-10-26 Varian Medical Systems, Inc. High DQE imaging device
CN109073764B (zh) 2016-04-15 2022-08-16 圣戈本陶瓷及塑料股份有限公司 在闪烁体表面上布置的光电传感器
JP6740943B2 (ja) * 2017-03-28 2020-08-19 コニカミノルタ株式会社 放射線変換パネルおよびタルボ撮影装置
US20200144314A1 (en) * 2018-11-05 2020-05-07 Varex Imaging Corporation Detector architecture using photodetector substrates and semiconductor devices
US11944476B2 (en) 2021-04-22 2024-04-02 MinFound Medical Systems Co., Ltd. Apparatus and method of assembly of module for a CT detector

Family Cites Families (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4234792A (en) * 1977-09-29 1980-11-18 Raytheon Company Scintillator crystal radiation detector
US4180737A (en) * 1978-02-06 1979-12-25 General Electric Company X-ray detector
US4159424A (en) * 1978-04-03 1979-06-26 General Electric Company Trapezoidal scintillator for radiation detectors
US4323925A (en) * 1980-07-07 1982-04-06 Avco Everett Research Laboratory, Inc. Method and apparatus for arraying image sensor modules
DE4101645A1 (de) * 1990-01-29 1991-08-01 Gen Electric Zweidimensionaler mosaikartiger szintillationsdetektor
US5059800A (en) * 1991-04-19 1991-10-22 General Electric Company Two dimensional mosaic scintillation detector
US5241180A (en) * 1992-08-05 1993-08-31 General Electric Company Radiation detection devices with tapered scintillator crystals
JPH0836059A (ja) * 1994-07-25 1996-02-06 Shimadzu Corp 放射線検出器
JP3345186B2 (ja) * 1994-09-19 2002-11-18 浜松ホトニクス株式会社 シンチレーション検出器
CA2194942A1 (en) 1996-01-18 1997-07-19 William P. Novak Radiation detector with improved response
JPH09325185A (ja) * 1996-06-03 1997-12-16 Toshiba Fa Syst Eng Kk 放射線検出器とその製造方法と透視検査装置とｃｔスキャナ
US6344649B2 (en) * 1997-11-26 2002-02-05 General Electric Company Scintillator for a multi-slice computed tomograph system
US6295331B1 (en) * 1999-07-12 2001-09-25 General Electric Company Methods and apparatus for noise compensation in imaging systems
US6414315B1 (en) * 1999-10-04 2002-07-02 General Electric Company Radiation imaging with continuous polymer layer for scintillator
US6473486B2 (en) * 2000-12-05 2002-10-29 Ge Medical Systems Global Technology Co., Llc System and method of computed tomography imaging using a focused scintillator and method of manufacturing
JP2002181940A (ja) * 2000-12-15 2002-06-26 Canon Inc 波長変換型光検出素子

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US12504550B2 (en) 2020-09-02 2025-12-23 The Research Foundation For The State University Of New York Tapered scintillator crystal modules and methods of using the same

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JP2004061516A (ja) 2004-02-26
EP1387185A1 (en) 2004-02-04
US6979826B2 (en) 2005-12-27
US20040016885A1 (en) 2004-01-29

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