JP4492267B2 - 質量分析装置 - Google Patents

質量分析装置 Download PDF

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Publication number
JP4492267B2
JP4492267B2 JP2004269112A JP2004269112A JP4492267B2 JP 4492267 B2 JP4492267 B2 JP 4492267B2 JP 2004269112 A JP2004269112 A JP 2004269112A JP 2004269112 A JP2004269112 A JP 2004269112A JP 4492267 B2 JP4492267 B2 JP 4492267B2
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JP
Japan
Prior art keywords
sample
ion
gas
column
primary
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Expired - Lifetime
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JP2004269112A
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English (en)
Japanese (ja)
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JP2006086002A (ja
JP2006086002A5 (https=
Inventor
益義 山田
泉 和氣
秀夫 鹿島
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Hitachi Ltd
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Hitachi Ltd
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Filing date
Publication date
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Priority to JP2004269112A priority Critical patent/JP4492267B2/ja
Priority to EP05004827.1A priority patent/EP1638132B1/en
Priority to US11/071,345 priority patent/US7064320B2/en
Publication of JP2006086002A publication Critical patent/JP2006086002A/ja
Publication of JP2006086002A5 publication Critical patent/JP2006086002A5/ja
Application granted granted Critical
Publication of JP4492267B2 publication Critical patent/JP4492267B2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0422—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for gaseous samples
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N30/00—Investigating or analysing materials by separation into components using adsorption, absorption or similar phenomena or using ion-exchange, e.g. chromatography or field flow fractionation
    • G01N30/02—Column chromatography
    • G01N30/62—Detectors specially adapted therefor
    • G01N30/72—Mass spectrometers
    • G01N30/7206—Mass spectrometers interfaced to gas chromatograph
    • G01N30/7213—Mass spectrometers interfaced to gas chromatograph splitting of the gaseous effluent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/14—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145—Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Engineering & Computer Science (AREA)
  • General Health & Medical Sciences (AREA)
  • Biochemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP2004269112A 2004-09-16 2004-09-16 質量分析装置 Expired - Lifetime JP4492267B2 (ja)

Priority Applications (3)

Application Number Priority Date Filing Date Title
JP2004269112A JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置
EP05004827.1A EP1638132B1 (en) 2004-09-16 2005-03-04 Mass chromatography
US11/071,345 US7064320B2 (en) 2004-09-16 2005-03-04 Mass chromatograph

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004269112A JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置

Publications (3)

Publication Number Publication Date
JP2006086002A JP2006086002A (ja) 2006-03-30
JP2006086002A5 JP2006086002A5 (https=) 2007-04-05
JP4492267B2 true JP4492267B2 (ja) 2010-06-30

Family

ID=35509336

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004269112A Expired - Lifetime JP4492267B2 (ja) 2004-09-16 2004-09-16 質量分析装置

Country Status (3)

Country Link
US (1) US7064320B2 (https=)
EP (1) EP1638132B1 (https=)
JP (1) JP4492267B2 (https=)

Families Citing this family (42)

* Cited by examiner, † Cited by third party
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US7095019B1 (en) 2003-05-30 2006-08-22 Chem-Space Associates, Inc. Remote reagent chemical ionization source
US7138626B1 (en) 2005-05-05 2006-11-21 Eai Corporation Method and device for non-contact sampling and detection
US7568401B1 (en) 2005-06-20 2009-08-04 Science Applications International Corporation Sample tube holder
US7576322B2 (en) * 2005-11-08 2009-08-18 Science Applications International Corporation Non-contact detector system with plasma ion source
JP4982087B2 (ja) 2006-02-08 2012-07-25 株式会社日立製作所 質量分析装置及び質量分析方法
JP4823794B2 (ja) * 2006-07-24 2011-11-24 株式会社日立製作所 質量分析装置及び探知方法
US8123396B1 (en) 2007-05-16 2012-02-28 Science Applications International Corporation Method and means for precision mixing
US8008617B1 (en) 2007-12-28 2011-08-30 Science Applications International Corporation Ion transfer device
US8227750B1 (en) * 2008-04-28 2012-07-24 Bruker-Michrom, Inc. Method and apparatus for nano-capillary/micro electrospray for use in liquid chromatography-mass spectrometry
WO2009155007A1 (en) * 2008-05-30 2009-12-23 Thermo Finnigan Llc Method and apparatus for generation of reagent ions in a mass spectrometer
US8071957B1 (en) 2009-03-10 2011-12-06 Science Applications International Corporation Soft chemical ionization source
JP5622751B2 (ja) 2010-01-25 2014-11-12 株式会社日立ハイテクノロジーズ 質量分析装置
JP5596402B2 (ja) 2010-04-19 2014-09-24 株式会社日立ハイテクノロジーズ 分析装置、イオン化装置及び分析方法
WO2012024570A2 (en) * 2010-08-19 2012-02-23 Leco Corporation Mass spectrometer with soft ionizing glow discharge and conditioner
EP2423945A3 (en) 2010-08-25 2015-11-18 Hitachi High-Technologies Corporation Drug detection equipment
JP5497615B2 (ja) * 2010-11-08 2014-05-21 株式会社日立ハイテクノロジーズ 質量分析装置
JP6025406B2 (ja) 2012-06-04 2016-11-16 株式会社日立ハイテクノロジーズ 質量分析装置
CN103940899B (zh) * 2014-03-21 2019-03-29 东华理工大学 一种痕量爆炸物的快速检测方法及装置
CN112964625B (zh) 2015-03-06 2024-06-07 英国质谱公司 细胞群体分析
WO2016142685A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Collision surface for improved ionisation
GB2552602B (en) 2015-03-06 2020-12-30 Micromass Ltd Desorption electrospray ionisation mass spectrometry ("DESI-MS") analysis of swabs
US11139156B2 (en) 2015-03-06 2021-10-05 Micromass Uk Limited In vivo endoscopic tissue identification tool
KR101956496B1 (ko) 2015-03-06 2019-03-08 마이크로매스 유케이 리미티드 전기수술 응용분야에 대한 액체 트랩 또는 세퍼레이터
EP3265818B1 (en) 2015-03-06 2020-02-12 Micromass UK Limited Imaging guided ambient ionisation mass spectrometry
CA2978165A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Improved ionisation of gaseous samples
CA2978042A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Tissue analysis by mass spectrometry or ion mobility spectrometry
DE202016008460U1 (de) 2015-03-06 2018-01-22 Micromass Uk Limited Zellpopulationsanalyse
WO2016142692A1 (en) 2015-03-06 2016-09-15 Micromass Uk Limited Spectrometric analysis
GB2554181B (en) 2015-03-06 2021-09-08 Micromass Ltd Inlet instrumentation for ion analyser coupled to rapid evaporative ionisation mass spectrometry ("REIMS") device
EP3726562B1 (en) 2015-03-06 2023-12-20 Micromass UK Limited Ambient ionization mass spectrometry imaging platform for direct mapping from bulk tissue
EP3741303A3 (en) 2015-03-06 2020-12-30 Micromass UK Limited Chemically guided ambient ionisation mass spectrometry
GB2554206B (en) 2015-03-06 2021-03-24 Micromass Ltd Spectrometric analysis of microbes
CN105181785A (zh) * 2015-03-19 2015-12-23 南昌大学 一种快速判别不同化学型香樟树的方法
GB201517195D0 (en) * 2015-09-29 2015-11-11 Micromass Ltd Capacitively coupled reims technique and optically transparent counter electrode
EP3443354B1 (en) 2016-04-14 2025-08-20 Micromass UK Limited Spectrometric analysis of plants
US11583182B2 (en) * 2016-07-22 2023-02-21 Synaptive Medical Inc. Method for multimodal tissue imaging based on resonance Raman effect on metal based MRI contrast agents and method for ionizing laser plumes through atmospheric pressure chemical ionization
JP6767037B2 (ja) * 2016-07-28 2020-10-14 国立大学法人静岡大学 同位体測定装置及び同位体測定方法
US11482405B2 (en) * 2018-04-05 2022-10-25 Shimadzu Corporation Mass spectrometry device and mass spectrometry method
CN111102914B (zh) * 2019-12-30 2025-11-28 上海安平静电科技有限公司 一种离子发生装置电极间距的确定方法
KR102917636B1 (ko) * 2020-02-25 2026-01-23 바이오크로마토 인코퍼레이티드 이온화 장치, 질량 분석 시스템 및 이온화 방법
JP7780360B2 (ja) 2022-02-25 2025-12-04 シャープ株式会社 Ｉｍｓ分析装置
CN114864373B (zh) * 2022-04-25 2023-08-11 苏州大学 一种电晕放电离子源

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0550648U (ja) * 1991-11-27 1993-07-02 株式会社日立製作所 質量分析計
JPH06310091A (ja) * 1993-04-26 1994-11-04 Hitachi Ltd 大気圧イオン化質量分析計
JPH0915207A (ja) * 1995-06-29 1997-01-17 Osaka Oxygen Ind Ltd ガスの高感度分析装置
JP3607997B2 (ja) * 1998-04-09 2005-01-05 大陽日酸株式会社 ガス中の微量不純物の分析装置
JP4054493B2 (ja) 1999-09-20 2008-02-27 株式会社日立製作所 イオン源
EP1093151B1 (en) * 1999-09-20 2010-09-01 Hitachi, Ltd. Ion source, mass spectrometer, mass spectrometry, and monitoring system
JP2001351569A (ja) * 2000-06-02 2001-12-21 Hitachi Ltd ガス測定用オンラインモニター装置
JP3660279B2 (ja) * 2001-07-23 2005-06-15 株式会社日立製作所 試料イオン化装置及び質量分析計
JP3787116B2 (ja) * 2002-11-06 2006-06-21 株式会社日立製作所 化学剤の探知方法
JP2004157057A (ja) * 2002-11-08 2004-06-03 Hitachi Ltd 質量分析装置

Also Published As

Publication number Publication date
JP2006086002A (ja) 2006-03-30
EP1638132B1 (en) 2016-02-17
US20060054806A1 (en) 2006-03-16
EP1638132A2 (en) 2006-03-22
US7064320B2 (en) 2006-06-20
EP1638132A3 (en) 2007-03-14

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