JP4487518B2 - 吐出検査装置、吐出検査方法、プログラム及び印刷システム - Google Patents

吐出検査装置、吐出検査方法、プログラム及び印刷システム Download PDF

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Publication number
JP4487518B2
JP4487518B2 JP2003305367A JP2003305367A JP4487518B2 JP 4487518 B2 JP4487518 B2 JP 4487518B2 JP 2003305367 A JP2003305367 A JP 2003305367A JP 2003305367 A JP2003305367 A JP 2003305367A JP 4487518 B2 JP4487518 B2 JP 4487518B2
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pattern
sensor
inspection
ink
discharge
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Japanese (ja)
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JP2005074697A5 (enrdf_load_stackoverflow
JP2005074697A (ja
Inventor
宏典 遠藤
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Seiko Epson Corp
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Seiko Epson Corp
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JP2003305367A 2003-08-28 2003-08-28 吐出検査装置、吐出検査方法、プログラム及び印刷システム Expired - Fee Related JP4487518B2 (ja)

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JP2003305367A JP4487518B2 (ja) 2003-08-28 2003-08-28 吐出検査装置、吐出検査方法、プログラム及び印刷システム

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JP2003305367A JP4487518B2 (ja) 2003-08-28 2003-08-28 吐出検査装置、吐出検査方法、プログラム及び印刷システム

Publications (3)

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JP2005074697A JP2005074697A (ja) 2005-03-24
JP2005074697A5 JP2005074697A5 (enrdf_load_stackoverflow) 2006-10-12
JP4487518B2 true JP4487518B2 (ja) 2010-06-23

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JP2003305367A Expired - Fee Related JP4487518B2 (ja) 2003-08-28 2003-08-28 吐出検査装置、吐出検査方法、プログラム及び印刷システム

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JP (1) JP4487518B2 (enrdf_load_stackoverflow)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5040317B2 (ja) * 2006-01-17 2012-10-03 セイコーエプソン株式会社 記録装置、記録制御プログラムおよび記録方法
WO2015190146A1 (ja) * 2014-06-09 2015-12-17 コニカミノルタ株式会社 インクジェット記録装置
JP7043323B2 (ja) * 2018-03-30 2022-03-29 キヤノン株式会社 インクジェット記録装置および検査装置
KR102833583B1 (ko) * 2019-05-20 2025-07-15 삼성전자주식회사 스핀 코터 및 그를 이용한 반도체 소자의 제조 방법

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JP2005074697A (ja) 2005-03-24

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