JP4464758B2 - 渦流探傷装置のマルチコイル式プローブ - Google Patents

渦流探傷装置のマルチコイル式プローブ Download PDF

Info

Publication number
JP4464758B2
JP4464758B2 JP2004226560A JP2004226560A JP4464758B2 JP 4464758 B2 JP4464758 B2 JP 4464758B2 JP 2004226560 A JP2004226560 A JP 2004226560A JP 2004226560 A JP2004226560 A JP 2004226560A JP 4464758 B2 JP4464758 B2 JP 4464758B2
Authority
JP
Japan
Prior art keywords
coil
flaw detection
probe
inspection target
holding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2004226560A
Other languages
English (en)
Japanese (ja)
Other versions
JP2006047036A5 (OSRAM
JP2006047036A (ja
Inventor
慶典 近藤
義和 西島
政康 金沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to JP2004226560A priority Critical patent/JP4464758B2/ja
Publication of JP2006047036A publication Critical patent/JP2006047036A/ja
Publication of JP2006047036A5 publication Critical patent/JP2006047036A5/ja
Application granted granted Critical
Publication of JP4464758B2 publication Critical patent/JP4464758B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
JP2004226560A 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ Expired - Fee Related JP4464758B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004226560A JP4464758B2 (ja) 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004226560A JP4464758B2 (ja) 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ

Publications (3)

Publication Number Publication Date
JP2006047036A JP2006047036A (ja) 2006-02-16
JP2006047036A5 JP2006047036A5 (OSRAM) 2007-09-20
JP4464758B2 true JP4464758B2 (ja) 2010-05-19

Family

ID=36025759

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2004226560A Expired - Fee Related JP4464758B2 (ja) 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ

Country Status (1)

Country Link
JP (1) JP4464758B2 (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9678175B2 (en) 2010-07-26 2017-06-13 Radiation Monitoring Devices, Inc. Eddy current detection

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4608322B2 (ja) * 2005-01-07 2011-01-12 オリンパス株式会社 渦流探傷マルチコイル式プローブの製造方法
JP2006194815A (ja) * 2005-01-17 2006-07-27 Olympus Corp 渦流探傷マルチコイル式プローブ及びその製造方法
JP4875510B2 (ja) * 2007-02-14 2012-02-15 三菱重工業株式会社 センサ素子および渦電流探傷プローブ
US8049494B2 (en) * 2007-05-21 2011-11-01 Olympus Ndt Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
JP5016977B2 (ja) * 2007-05-29 2012-09-05 株式会社日立製作所 渦電流探傷プローブ
JP5056381B2 (ja) * 2007-11-29 2012-10-24 新東工業株式会社 渦電流による金属製品の内部検査装置
DE102008054250A1 (de) * 2008-10-24 2010-04-29 Institut Dr. Foerster Gmbh & Co. Kg Elektromagnetisch-akustischer Messwandler und Ultraschall-Prüfsystem damit
JP6472334B2 (ja) * 2015-06-03 2019-02-20 日立Ｇｅニュークリア・エナジー株式会社 渦電流検査装置
CN108593762A (zh) * 2018-04-18 2018-09-28 北京京桥热电有限责任公司 燃机叶片缺陷检测工艺
CN109752450A (zh) * 2018-12-07 2019-05-14 兰州空间技术物理研究所 一种发动机叶片无损检测探头
CN110261470B (zh) * 2019-04-30 2024-07-26 中国铁道科学研究院集团有限公司金属及化学研究所 多工位钢轨涡流检测设备
JP7310430B2 (ja) * 2019-08-09 2023-07-19 大同特殊鋼株式会社 探傷装置
JP7351332B2 (ja) * 2020-12-01 2023-09-27 Ｊｆｅスチール株式会社 渦流探傷用プローブ、探傷方法および渦流探傷装置

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9678175B2 (en) 2010-07-26 2017-06-13 Radiation Monitoring Devices, Inc. Eddy current detection

Also Published As

Publication number Publication date
JP2006047036A (ja) 2006-02-16

Similar Documents

Publication Publication Date Title
JP4464758B2 (ja) 渦流探傷装置のマルチコイル式プローブ
KR102240208B1 (ko) 검사 지그, 및 검사 장치
JP3954622B2 (ja) トリガ付探触子
US20100164518A1 (en) Probe card
US20130293226A1 (en) Electric current sensor
JP2006024845A (ja) プローブカード及び磁気センサの検査方法
US20080229842A1 (en) Suspension equipped with vibration sensor and manufacturing method thereof
CN101310190B (zh) 基板检查用夹具和检查用探头
JP2006233985A (ja) 回転検出装置付き軸受
JP2006514275A (ja) 座標測定機械用プローブヘッド
US20190049410A1 (en) Eddy current inspection probe
KR101879806B1 (ko) 반도체 테스트 소켓의 이력관리 패드, 이의 제작 방법 및 이력관리 패드를 포함하는 반도체 테스트 장치
JP5140677B2 (ja) 管形状の被検体のための漏れ磁束検査装置
US20080186037A1 (en) Probe card and structure for fixing needle thereof
US7768281B2 (en) Probe assembly for lapping a bar using a patterned probe
JP5356793B2 (ja) 磁気検出装置及びその製造方法
JP6557313B2 (ja) 磁気誘導を測定して作動を検出する回転制御ステムを含む携帯品
CN101273210A (zh) 带有旋转检测装置的轴承
EP2889574B1 (en) Thickness inspection device
JP2006194815A (ja) 渦流探傷マルチコイル式プローブ及びその製造方法
JP5155917B2 (ja) 渦電流探傷プローブ及びその製造方法
JP5210550B2 (ja) 電気的接続装置
JP2006226829A (ja) プローブヘッド及び電子デバイスの検査方法
JP4608322B2 (ja) 渦流探傷マルチコイル式プローブの製造方法
CN101490500B (zh) 接触检测器

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20070802

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20070802

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20091015

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20091020

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091221

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A821

Effective date: 20091224

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100126

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100219

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130226

Year of fee payment: 3

R151 Written notification of patent or utility model registration

Ref document number: 4464758

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R151

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140226

Year of fee payment: 4

S531 Written request for registration of change of domicile

Free format text: JAPANESE INTERMEDIATE CODE: R313531

R350 Written notification of registration of transfer

Free format text: JAPANESE INTERMEDIATE CODE: R350

LAPS Cancellation because of no payment of annual fees