JP2006047036A5 - - Google Patents

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Publication number
JP2006047036A5
JP2006047036A5 JP2004226560A JP2004226560A JP2006047036A5 JP 2006047036 A5 JP2006047036 A5 JP 2006047036A5 JP 2004226560 A JP2004226560 A JP 2004226560A JP 2004226560 A JP2004226560 A JP 2004226560A JP 2006047036 A5 JP2006047036 A5 JP 2006047036A5
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JP
Japan
Prior art keywords
flaw detection
coil
coil unit
holding
detection coils
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JP2004226560A
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English (en)
Japanese (ja)
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JP2006047036A (ja
JP4464758B2 (ja
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Priority to JP2004226560A priority Critical patent/JP4464758B2/ja
Priority claimed from JP2004226560A external-priority patent/JP4464758B2/ja
Publication of JP2006047036A publication Critical patent/JP2006047036A/ja
Publication of JP2006047036A5 publication Critical patent/JP2006047036A5/ja
Application granted granted Critical
Publication of JP4464758B2 publication Critical patent/JP4464758B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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JP2004226560A 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ Expired - Fee Related JP4464758B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2004226560A JP4464758B2 (ja) 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004226560A JP4464758B2 (ja) 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ

Publications (3)

Publication Number Publication Date
JP2006047036A JP2006047036A (ja) 2006-02-16
JP2006047036A5 true JP2006047036A5 (OSRAM) 2007-09-20
JP4464758B2 JP4464758B2 (ja) 2010-05-19

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ID=36025759

Family Applications (1)

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JP2004226560A Expired - Fee Related JP4464758B2 (ja) 2004-08-03 2004-08-03 渦流探傷装置のマルチコイル式プローブ

Country Status (1)

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JP (1) JP4464758B2 (OSRAM)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4608322B2 (ja) * 2005-01-07 2011-01-12 オリンパス株式会社 渦流探傷マルチコイル式プローブの製造方法
JP2006194815A (ja) * 2005-01-17 2006-07-27 Olympus Corp 渦流探傷マルチコイル式プローブ及びその製造方法
JP4875510B2 (ja) * 2007-02-14 2012-02-15 三菱重工業株式会社 センサ素子および渦電流探傷プローブ
US8049494B2 (en) * 2007-05-21 2011-11-01 Olympus Ndt Flexible array probe for the inspection of a contoured surface with varying cross-sectional geometry
JP5016977B2 (ja) * 2007-05-29 2012-09-05 株式会社日立製作所 渦電流探傷プローブ
JP5056381B2 (ja) * 2007-11-29 2012-10-24 新東工業株式会社 渦電流による金属製品の内部検査装置
DE102008054250A1 (de) * 2008-10-24 2010-04-29 Institut Dr. Foerster Gmbh & Co. Kg Elektromagnetisch-akustischer Messwandler und Ultraschall-Prüfsystem damit
US9678175B2 (en) 2010-07-26 2017-06-13 Radiation Monitoring Devices, Inc. Eddy current detection
JP6472334B2 (ja) * 2015-06-03 2019-02-20 日立Ｇｅニュークリア・エナジー株式会社 渦電流検査装置
CN108593762A (zh) * 2018-04-18 2018-09-28 北京京桥热电有限责任公司 燃机叶片缺陷检测工艺
CN109752450A (zh) * 2018-12-07 2019-05-14 兰州空间技术物理研究所 一种发动机叶片无损检测探头
CN110261470B (zh) * 2019-04-30 2024-07-26 中国铁道科学研究院集团有限公司金属及化学研究所 多工位钢轨涡流检测设备
JP7310430B2 (ja) * 2019-08-09 2023-07-19 大同特殊鋼株式会社 探傷装置
JP7351332B2 (ja) * 2020-12-01 2023-09-27 Ｊｆｅスチール株式会社 渦流探傷用プローブ、探傷方法および渦流探傷装置

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