JP4464561B2 - 軸外球面鏡と屈折素子を用いる分光計測システム - Google Patents
軸外球面鏡と屈折素子を用いる分光計測システム Download PDFInfo
- Publication number
- JP4464561B2 JP4464561B2 JP2000542645A JP2000542645A JP4464561B2 JP 4464561 B2 JP4464561 B2 JP 4464561B2 JP 2000542645 A JP2000542645 A JP 2000542645A JP 2000542645 A JP2000542645 A JP 2000542645A JP 4464561 B2 JP4464561 B2 JP 4464561B2
- Authority
- JP
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- Prior art keywords
- sample
- mirror
- optical system
- sampling
- radiation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
- 238000005259 measurement Methods 0.000 title claims description 24
- 230000003287 optical effect Effects 0.000 claims description 83
- 238000005070 sampling Methods 0.000 claims description 77
- 230000004075 alteration Effects 0.000 claims description 75
- 230000005855 radiation Effects 0.000 claims description 68
- 230000010287 polarization Effects 0.000 claims description 33
- 238000012937 correction Methods 0.000 claims description 25
- 238000001514 detection method Methods 0.000 claims description 25
- 238000000034 method Methods 0.000 claims description 16
- 230000003993 interaction Effects 0.000 claims description 15
- 230000008859 change Effects 0.000 claims description 14
- 230000005499 meniscus Effects 0.000 claims description 8
- 238000000391 spectroscopic ellipsometry Methods 0.000 claims description 8
- 238000012545 processing Methods 0.000 claims description 7
- 230000004044 response Effects 0.000 claims description 2
- 230000003595 spectral effect Effects 0.000 claims 3
- 238000013461 design Methods 0.000 description 27
- 239000000463 material Substances 0.000 description 9
- 239000011521 glass Substances 0.000 description 7
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 6
- 229910001634 calcium fluoride Inorganic materials 0.000 description 6
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000000572 ellipsometry Methods 0.000 description 5
- 230000009467 reduction Effects 0.000 description 5
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 4
- 238000013459 approach Methods 0.000 description 4
- 238000007516 diamond turning Methods 0.000 description 4
- 239000005350 fused silica glass Substances 0.000 description 4
- 230000006872 improvement Effects 0.000 description 3
- 230000004048 modification Effects 0.000 description 3
- 238000012986 modification Methods 0.000 description 3
- 238000005457 optimization Methods 0.000 description 3
- 230000008569 process Effects 0.000 description 3
- 206010010071 Coma Diseases 0.000 description 2
- 201000009310 astigmatism Diseases 0.000 description 2
- 239000006185 dispersion Substances 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000004593 Epoxy Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 239000013590 bulk material Substances 0.000 description 1
- 238000010276 construction Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 238000012938 design process Methods 0.000 description 1
- 238000003745 diagnosis Methods 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 239000010408 film Substances 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000003362 replicative effect Effects 0.000 description 1
- 238000001228 spectrum Methods 0.000 description 1
- 239000000758 substrate Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0205—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows
- G01J3/0208—Optical elements not provided otherwise, e.g. optical manifolds, diffusers, windows using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/42—Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/21—Polarisation-affecting properties
- G01N21/211—Ellipsometry
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0004—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed
- G02B19/0028—Condensers, e.g. light collectors or similar non-imaging optics characterised by the optical means employed refractive and reflective surfaces, e.g. non-imaging catadioptric systems
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0047—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with a light source
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B19/00—Condensers, e.g. light collectors or similar non-imaging optics
- G02B19/0033—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use
- G02B19/0095—Condensers, e.g. light collectors or similar non-imaging optics characterised by the use for use with ultraviolet radiation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Optics & Photonics (AREA)
- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Health & Medical Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/057,245 US5917594A (en) | 1998-04-08 | 1998-04-08 | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
| US09/057,245 | 1998-04-08 | ||
| PCT/US1999/006608 WO1999051955A1 (en) | 1998-04-08 | 1999-03-25 | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002510797A JP2002510797A (ja) | 2002-04-09 |
| JP2002510797A5 JP2002510797A5 (enExample) | 2006-04-06 |
| JP4464561B2 true JP4464561B2 (ja) | 2010-05-19 |
Family
ID=22009410
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2000542645A Expired - Fee Related JP4464561B2 (ja) | 1998-04-08 | 1999-03-25 | 軸外球面鏡と屈折素子を用いる分光計測システム |
Country Status (4)
| Country | Link |
|---|---|
| US (2) | US5917594A (enExample) |
| JP (1) | JP4464561B2 (enExample) |
| AU (1) | AU3205999A (enExample) |
| WO (1) | WO1999051955A1 (enExample) |
Families Citing this family (101)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| US7518725B1 (en) | 1995-09-20 | 2009-04-14 | J.A. Woollam Co., Inc. | Temperature controlled lens |
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| US6804004B1 (en) * | 1998-03-03 | 2004-10-12 | J. A. Woollam Co., Inc | Multiple-element lens systems and methods for uncorrelated evaluation of parameters in parameterized mathematical model equations for lens retardance, in ellipometry and polarimetry |
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| US20020030813A1 (en) * | 1999-03-29 | 2002-03-14 | Norton Adam E. | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
| US5917594A (en) | 1998-04-08 | 1999-06-29 | Kla-Tencor Corporation | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
| JP4168543B2 (ja) * | 1998-10-08 | 2008-10-22 | 株式会社ニコン | 光学特性測定ユニット |
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| US7468794B1 (en) | 1999-10-18 | 2008-12-23 | J.A. Woollam Co., Inc. | Rotating compensator ellipsometer system with spatial filter equivalent |
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| DE10021378A1 (de) * | 2000-05-02 | 2001-11-08 | Leica Microsystems | Optische Messanordnung mit einem Ellipsometer |
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| RU2521249C1 (ru) * | 2012-12-19 | 2014-06-27 | Открытое акционерное общество "Красногорский завод им. С.А. Зверева" | Зеркальный автоколлимационный спектрометр |
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| US10338362B1 (en) | 2014-06-06 | 2019-07-02 | J.A. Woollam Co., Inc. | Beam focusing and reflecting optics with enhanced detector system |
| US9921395B1 (en) | 2015-06-09 | 2018-03-20 | J.A. Woollam Co., Inc. | Beam focusing and beam collecting optics with wavelength dependent filter element adjustment of beam area |
| US10151631B2 (en) | 2016-10-04 | 2018-12-11 | Kla-Tencor Corporation | Spectroscopy with tailored spectral sampling |
| KR102654872B1 (ko) * | 2019-01-29 | 2024-04-05 | 삼성전자주식회사 | 반사 기하학 구조를 이용한 광학 장치 |
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| CN112684609B (zh) * | 2021-03-19 | 2021-06-22 | 中国科学院西安光学精密机械研究所 | 一种分孔径的紧凑型宽波段偏振同时成像装置及系统 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US3598468A (en) * | 1970-02-02 | 1971-08-10 | Donald M Perry | Optical system with tilted concave mirror and astigmatism compensator |
| US3748015A (en) * | 1971-06-21 | 1973-07-24 | Perkin Elmer Corp | Unit power imaging catoptric anastigmat |
| GB1521585A (en) * | 1975-09-09 | 1978-08-16 | Perkin Elmer Corp | Spectrophotometers |
| DE2622113C3 (de) * | 1976-05-18 | 1982-04-08 | Erwin Sick Gmbh Optik-Elektronik, 7808 Waldkirch | Optische Vorrichtung zur Korrektur der sphärischen Aberration eines sphärischen Hohlspiegels |
| DE2740183A1 (de) * | 1977-09-07 | 1979-03-08 | Leybold Heraeus Gmbh & Co Kg | Einrichtung zur fokussierung elektromagnetischer strahlung auf eine probe |
| US4226501A (en) * | 1978-10-12 | 1980-10-07 | The Perkin-Elmer Corporation | Four mirror unobscurred anastigmatic telescope with all spherical surfaces |
| US4230394A (en) * | 1979-04-02 | 1980-10-28 | Xerox Corporation | Mirror facet tracker using spherical mirrors |
| US4588269A (en) * | 1984-07-05 | 1986-05-13 | Eastman Kodak Company | Apparatus which shapes gaussian beams by spherical mirrors |
| US5168386A (en) * | 1990-10-22 | 1992-12-01 | Tencor Instruments | Flat field telecentric scanner |
| US5608526A (en) * | 1995-01-19 | 1997-03-04 | Tencor Instruments | Focused beam spectroscopic ellipsometry method and system |
| US5859424A (en) | 1997-04-08 | 1999-01-12 | Kla-Tencor Corporation | Apodizing filter system useful for reducing spot size in optical measurements and other applications |
| US5917594A (en) | 1998-04-08 | 1999-06-29 | Kla-Tencor Corporation | Spectroscopic measurement system using an off-axis spherical mirror and refractive elements |
-
1998
- 1998-04-08 US US09/057,245 patent/US5917594A/en not_active Expired - Lifetime
-
1999
- 1999-03-25 AU AU32059/99A patent/AU3205999A/en not_active Abandoned
- 1999-03-25 JP JP2000542645A patent/JP4464561B2/ja not_active Expired - Fee Related
- 1999-03-25 WO PCT/US1999/006608 patent/WO1999051955A1/en not_active Ceased
- 1999-03-29 US US09/280,752 patent/US6323946B1/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| JP2002510797A (ja) | 2002-04-09 |
| US5917594A (en) | 1999-06-29 |
| WO1999051955A1 (en) | 1999-10-14 |
| US6323946B1 (en) | 2001-11-27 |
| AU3205999A (en) | 1999-10-25 |
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