JP4440485B2 - フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法 - Google Patents

フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法 Download PDF

Info

Publication number
JP4440485B2
JP4440485B2 JP2001059713A JP2001059713A JP4440485B2 JP 4440485 B2 JP4440485 B2 JP 4440485B2 JP 2001059713 A JP2001059713 A JP 2001059713A JP 2001059713 A JP2001059713 A JP 2001059713A JP 4440485 B2 JP4440485 B2 JP 4440485B2
Authority
JP
Japan
Prior art keywords
film
inspected
polarizers
state
degrees
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP2001059713A
Other languages
English (en)
Japanese (ja)
Other versions
JP2001324453A (ja
JP2001324453A5 (enExample
Inventor
一弘 下田
文男 後藤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Fujifilm Corp
Original Assignee
Fujifilm Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Fujifilm Corp filed Critical Fujifilm Corp
Priority to JP2001059713A priority Critical patent/JP4440485B2/ja
Publication of JP2001324453A publication Critical patent/JP2001324453A/ja
Publication of JP2001324453A5 publication Critical patent/JP2001324453A5/ja
Application granted granted Critical
Publication of JP4440485B2 publication Critical patent/JP4440485B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
JP2001059713A 2000-03-08 2001-03-05 フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法 Expired - Fee Related JP4440485B2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2001059713A JP4440485B2 (ja) 2000-03-08 2001-03-05 フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000063027 2000-03-08
JP2000-63027 2000-03-08
JP2001059713A JP4440485B2 (ja) 2000-03-08 2001-03-05 フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP2008071132A Division JP2008151814A (ja) 2000-03-08 2008-03-19 フィルムの欠陥検査装置およびフィルムの欠陥検査方法

Publications (3)

Publication Number Publication Date
JP2001324453A JP2001324453A (ja) 2001-11-22
JP2001324453A5 JP2001324453A5 (enExample) 2006-03-30
JP4440485B2 true JP4440485B2 (ja) 2010-03-24

Family

ID=26586989

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2001059713A Expired - Fee Related JP4440485B2 (ja) 2000-03-08 2001-03-05 フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法

Country Status (1)

Country Link
JP (1) JP4440485B2 (enExample)

Families Citing this family (18)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4502104B2 (ja) * 2002-04-12 2010-07-14 株式会社ジェイエイアイコーポレーション 複合プリズム光学系を有する撮像装置
JP4396160B2 (ja) * 2003-07-31 2010-01-13 住友化学株式会社 透明性フィルムの異物検査方法
JP2005274383A (ja) * 2004-03-25 2005-10-06 Sumitomo Chemical Co Ltd 配向フィルムの穴明き欠陥の検査方法
JP4628824B2 (ja) * 2005-03-10 2011-02-09 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
JP4696607B2 (ja) * 2005-03-14 2011-06-08 株式会社ニコン 表面検査装置
JP2006337630A (ja) * 2005-06-01 2006-12-14 Sumitomo Chemical Co Ltd 積層光学フィルムの製造方法
JP2007017400A (ja) * 2005-07-11 2007-01-25 Sony Corp 視野角特性測定方法及び視野角特性測定装置
JP4869053B2 (ja) * 2006-01-11 2012-02-01 日東電工株式会社 積層フィルムの製造方法、積層フィルムの欠陥検出方法、積層フィルムの欠陥検出装置、積層フィルム、及び画像表示装置
JP4960026B2 (ja) * 2006-06-09 2012-06-27 富士フイルム株式会社 フイルムの欠陥検査装置及びフイルムの製造方法
JP5258349B2 (ja) * 2008-03-28 2013-08-07 富士フイルム株式会社 欠陥検出装置及び方法
KR101676333B1 (ko) * 2008-03-28 2016-11-15 후지필름 가부시키가이샤 결함 검출 방법 및 장치
US8260028B2 (en) 2009-10-28 2012-09-04 Corning Incorporated Off-axis sheet-handling apparatus and technique for transmission-mode measurements
JP2012163533A (ja) * 2011-02-09 2012-08-30 Fujifilm Corp レンチキュラシートの欠陥検査装置及び方法
JP2013210245A (ja) * 2012-03-30 2013-10-10 Dainippon Printing Co Ltd フィルム検査システム、フィルム検査方法
JP6641682B2 (ja) * 2014-10-15 2020-02-05 日本ゼオン株式会社 光学フィルムの位相差の測定方法、光学フィルムの製造方法、光学フィルム位相差の測定装置、及び光学フィルムの製造装置
TWI676797B (zh) * 2019-03-12 2019-11-11 住華科技股份有限公司 光學膜檢測裝置及光學膜的檢測方法
KR102864444B1 (ko) * 2020-11-12 2025-09-26 동우 화인켐 주식회사 얼룩 자동 검사 장치 및 이를 이용한 얼룩 검사 방법
CN112945984A (zh) * 2021-02-01 2021-06-11 深圳市华星光电半导体显示技术有限公司 显示面板的检测方法及其检测装置

Also Published As

Publication number Publication date
JP2001324453A (ja) 2001-11-22

Similar Documents

Publication Publication Date Title
JP2012137502A (ja) 複屈折特性を有する部材の検査方法および複屈折特性を有する部材の製造方法
JP4440485B2 (ja) フィルムの欠陥検査装置、欠陥検査システムおよび欠陥検査方法ならびに複屈折特性を有するフィルムの製造方法
KR101376648B1 (ko) 막결함 검사 장치 및 방법
KR101744606B1 (ko) 필름의 결함 검사 장치, 결함 검사 방법 및 이형 필름
JP2008298566A (ja) フィルムの欠陥検査装置及び方法
KR101441876B1 (ko) 광학이방성 패러미터 측정 방법 및 측정 장치
JP5258349B2 (ja) 欠陥検出装置及び方法
JP5446232B2 (ja) カラーフィルタ基板の欠陥検査装置および欠陥検査方法
KR101965449B1 (ko) 패턴화 위상차 필름의 결함 검출 장치 및 방법, 그리고 제조 방법
JP4628824B2 (ja) フイルムの欠陥検査装置及びフイルムの製造方法
JP2007327915A5 (enExample)
JP3803999B2 (ja) 欠陥検査装置
CN100570310C (zh) 光学各向异性参数测定方法及测定装置
JP7476897B2 (ja) 位相差フィルムの配向ムラ欠陥検出方法及び配向ムラ欠陥検出装置
WO1998015871A1 (en) Method of manufacturing liquid crystal display, optically inspecting instrument, and optically inspecting method
JP4663529B2 (ja) 光学的異方性パラメータ測定方法及び測定装置
JP2013205091A (ja) フィルム検査システム、フィルム検査方法
TW200916889A (en) A method of inspecting an optical film
JP2001124661A (ja) 平面表示装置の品位検査方法およびその品位検査装置
JP4728830B2 (ja) 光学的異方性パラメータ測定方法及び測定装置
CA2003528A1 (en) Methods and apparatus for optically enhancing selected features in an image
JP7105925B2 (ja) ディスプレイユニットの異物検査システム
JP2008241469A (ja) 欠陥検査装置
JP2006250631A (ja) 光学補償シートの検査方法および検査装置
JPS63269045A (ja) 画像処理式複屈折率計

Legal Events

Date Code Title Description
A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20060130

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20060130

A711 Notification of change in applicant

Free format text: JAPANESE INTERMEDIATE CODE: A712

Effective date: 20061213

RD04 Notification of resignation of power of attorney

Free format text: JAPANESE INTERMEDIATE CODE: A7424

Effective date: 20080725

A977 Report on retrieval

Free format text: JAPANESE INTERMEDIATE CODE: A971007

Effective date: 20080729

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080909

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20081106

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090401

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090430

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20090901

A521 Written amendment

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20091102

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20100105

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20100107

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130115

Year of fee payment: 3

R150 Certificate of patent or registration of utility model

Ref document number: 4440485

Country of ref document: JP

Free format text: JAPANESE INTERMEDIATE CODE: R150

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20130115

Year of fee payment: 3

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20140115

Year of fee payment: 4

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

R250 Receipt of annual fees

Free format text: JAPANESE INTERMEDIATE CODE: R250

LAPS Cancellation because of no payment of annual fees