JP4435634B2 - 発振回路、及び試験装置 - Google Patents
発振回路、及び試験装置 Download PDFInfo
- Publication number
- JP4435634B2 JP4435634B2 JP2004212231A JP2004212231A JP4435634B2 JP 4435634 B2 JP4435634 B2 JP 4435634B2 JP 2004212231 A JP2004212231 A JP 2004212231A JP 2004212231 A JP2004212231 A JP 2004212231A JP 4435634 B2 JP4435634 B2 JP 4435634B2
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- JP
- Japan
- Prior art keywords
- signal
- oscillation
- circuit
- generates
- synchronization signal
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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- 230000010355 oscillation Effects 0.000 title claims description 187
- 238000012360 testing method Methods 0.000 title claims description 38
- 230000008878 coupling Effects 0.000 claims description 43
- 238000010168 coupling process Methods 0.000 claims description 43
- 238000005859 coupling reaction Methods 0.000 claims description 43
- 230000007274 generation of a signal involved in cell-cell signaling Effects 0.000 claims description 24
- 230000001939 inductive effect Effects 0.000 claims description 13
- 230000004069 differentiation Effects 0.000 claims description 10
- 238000010586 diagram Methods 0.000 description 13
- 239000003990 capacitor Substances 0.000 description 5
- 230000001360 synchronised effect Effects 0.000 description 5
- 238000009825 accumulation Methods 0.000 description 2
- 238000004891 communication Methods 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000001413 cellular effect Effects 0.000 description 1
- 230000001934 delay Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000010363 phase shift Effects 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- 238000007493 shaping process Methods 0.000 description 1
- 239000000243 solution Substances 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/24—Automatic control of frequency or phase; Synchronisation using a reference signal directly applied to the generator
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
- G01R31/2836—Fault-finding or characterising
- G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
- G01R31/2841—Signal generators
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/083—Details of the phase-locked loop the reference signal being additionally directly applied to the generator
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03L—AUTOMATIC CONTROL, STARTING, SYNCHRONISATION OR STABILISATION OF GENERATORS OF ELECTRONIC OSCILLATIONS OR PULSES
- H03L7/00—Automatic control of frequency or phase; Synchronisation
- H03L7/06—Automatic control of frequency or phase; Synchronisation using a reference signal applied to a frequency- or phase-locked loop
- H03L7/08—Details of the phase-locked loop
- H03L7/099—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop
- H03L7/0995—Details of the phase-locked loop concerning mainly the controlled oscillator of the loop the oscillator comprising a ring oscillator
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K3/00—Circuits for generating electric pulses; Monostable, bistable or multistable circuits
- H03K3/02—Generators characterised by the type of circuit or by the means used for producing pulses
- H03K3/027—Generators characterised by the type of circuit or by the means used for producing pulses by the use of logic circuits, with internal or external positive feedback
- H03K3/03—Astable circuits
- H03K3/0315—Ring oscillators
- H03K3/0322—Ring oscillators with differential cells
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Stabilization Of Oscillater, Synchronisation, Frequency Synthesizers (AREA)
- Tests Of Electronic Circuits (AREA)
Description
Claims (9)
- 発振信号を生成する発振回路であって、
信号を正帰還させることにより前記発振信号を生成する発振器と、
前記発振信号の所定のサイクル毎に前記発振信号のエッジの理想タイミングでゼロクロスし、前記発振信号の当該エッジと同一方向の傾きのエッジを有する強制同期信号を生成する同期信号生成部と、
前記強制同期信号を前記発振器の正帰還経路に注入する結合部と
を備える発振回路。 - 前記発振器は、与えられる制御電圧に応じた周波数の前記発振信号を生成する電圧制御発振器であって、
前記発振回路は、
所定の周波数を有し、前記発振信号の位相を制御するための基準信号を生成する基準信号生成部と、
前記基準信号の位相と、前記発振信号の位相との位相差に基づいて前記制御電圧を生成して前記電圧制御発振器に供給する位相比較器と
を更に備え、
前記同期信号生成部は、前記基準信号に基づいて前記強制同期信号を生成する
請求項1に記載の発振回路。 - 前記同期信号生成部は、前記基準信号を微分した信号を反転し、更に微分して前記強制同期信号を生成する請求項2に記載の発振回路。
- 前記結合部及び前記位相比較器は、前記強制同期信号による前記発振信号の位相の制御と、前記制御電圧による前記発振信号の周波数の制御とを交互に行う請求項2に記載の発振回路。
- 前記基準信号を分周した分周基準信号を生成する分周回路を更に備え、
前記同期信号生成部は、前記分周基準信号の前縁又は後縁のいずれか一方のエッジに基づいて、前記強制同期信号を生成し、
前記位相比較器は、前記分周基準信号の前縁又は後縁の他方のエッジの位相と、前記発振信号の位相との位相差に基づいて前記制御電圧を生成する
請求項4に記載の発振回路。 - 前記同期信号生成部は、
前記分周基準信号の前縁を微分する前縁微分回路と、
前記前縁微分回路が出力する信号を反転する反転回路と、
前記反転回路が出力する信号を微分する微分回路と
を有する請求項5に記載の発振回路。 - 前記発振回路は奇数段のインバータを直列に接続し、最終段のインバータが出力する発振信号を初段のインバータの入力に帰還するリング発振回路であって、
前記結合部は、前記微分回路の出力端と、前記初段のインバータの入力端とを容量結合することにより、前記強制同期信号を注入する
請求項6に記載の発振回路。 - 前記発振回路は誘導成分と容量成分とが設けられたLC共振回路であって、
前記結合部は、前記微分回路の出力端と、前記誘導成分とを容量結合することにより、前記強制同期信号を注入する
請求項6に記載の発振回路。 - 電子デバイスを試験する試験装置であって、
前記電子デバイスを試験するための試験パターンを生成するパターン発生器と、
前記電子デバイスに入力するべき試験信号の周波数に応じた発振信号を生成する発振回路と、
前記パターン発生器が生成した前記試験パターンと、前記発振回路が生成した前記発振信号とに基づいて、前記電子デバイスに入力する試験信号を生成する波形整形器と、
前記電子デバイスが出力する出力信号と、前記パターン発生器が生成する期待値パターンとを比較することにより、前記電子デバイスの良否を判定する判定部と
を備え、
前記発振回路は、
信号を正帰還させることにより前記発振信号を生成する発振器と、
前記発振信号の所定のサイクル毎に前記発振信号のエッジの理想タイミングでゼロクロスし、前記発振信号の当該エッジと同一方向の傾きのエッジを有する強制同期信号を生成する同期信号生成部と、
前記強制同期信号を前記発振器の正帰還経路に注入する結合部と
を有する試験装置。
Priority Applications (5)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004212231A JP4435634B2 (ja) | 2004-07-20 | 2004-07-20 | 発振回路、及び試験装置 |
JP2006529182A JPWO2006009111A1 (ja) | 2004-07-20 | 2005-07-15 | 発振回路、及び試験装置 |
PCT/JP2005/013154 WO2006009111A1 (ja) | 2004-07-20 | 2005-07-15 | 発振回路、及び試験装置 |
DE112005001769T DE112005001769T5 (de) | 2004-07-20 | 2005-07-15 | Oszillatorschaltung und Prüfvorrichtung |
US11/656,346 US7394328B2 (en) | 2004-07-20 | 2007-01-22 | Oscillator circuit and test apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004212231A JP4435634B2 (ja) | 2004-07-20 | 2004-07-20 | 発振回路、及び試験装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006033637A JP2006033637A (ja) | 2006-02-02 |
JP4435634B2 true JP4435634B2 (ja) | 2010-03-24 |
Family
ID=35785222
Family Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2004212231A Expired - Fee Related JP4435634B2 (ja) | 2004-07-20 | 2004-07-20 | 発振回路、及び試験装置 |
JP2006529182A Withdrawn JPWO2006009111A1 (ja) | 2004-07-20 | 2005-07-15 | 発振回路、及び試験装置 |
Family Applications After (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2006529182A Withdrawn JPWO2006009111A1 (ja) | 2004-07-20 | 2005-07-15 | 発振回路、及び試験装置 |
Country Status (4)
Country | Link |
---|---|
US (1) | US7394328B2 (ja) |
JP (2) | JP4435634B2 (ja) |
DE (1) | DE112005001769T5 (ja) |
WO (1) | WO2006009111A1 (ja) |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7538582B2 (en) * | 2005-10-28 | 2009-05-26 | Advantest Corporation | Driver circuit, test apparatus and adjusting method |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2877205B2 (ja) * | 1996-08-28 | 1999-03-31 | 日本電気株式会社 | 2相ノンオーバラップ信号生成回路 |
JP2001282383A (ja) * | 2000-03-31 | 2001-10-12 | Sony Corp | クロック生成回路 |
US7567138B2 (en) * | 2006-08-29 | 2009-07-28 | Texas Instruments Incorporated | Single-electron injection/extraction device for a resonant tank circuit and method of operation thereof |
-
2004
- 2004-07-20 JP JP2004212231A patent/JP4435634B2/ja not_active Expired - Fee Related
-
2005
- 2005-07-15 DE DE112005001769T patent/DE112005001769T5/de not_active Withdrawn
- 2005-07-15 JP JP2006529182A patent/JPWO2006009111A1/ja not_active Withdrawn
- 2005-07-15 WO PCT/JP2005/013154 patent/WO2006009111A1/ja active Application Filing
-
2007
- 2007-01-22 US US11/656,346 patent/US7394328B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
JPWO2006009111A1 (ja) | 2008-05-01 |
DE112005001769T5 (de) | 2007-06-21 |
US7394328B2 (en) | 2008-07-01 |
WO2006009111A1 (ja) | 2006-01-26 |
US20070176695A1 (en) | 2007-08-02 |
JP2006033637A (ja) | 2006-02-02 |
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