JP4427383B2 - 測定方法及び測定システム - Google Patents

測定方法及び測定システム Download PDF

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Publication number
JP4427383B2
JP4427383B2 JP2004135439A JP2004135439A JP4427383B2 JP 4427383 B2 JP4427383 B2 JP 4427383B2 JP 2004135439 A JP2004135439 A JP 2004135439A JP 2004135439 A JP2004135439 A JP 2004135439A JP 4427383 B2 JP4427383 B2 JP 4427383B2
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measurement
data
line
image
image data
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JP2004135439A
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Japanese (ja)
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JP2005315770A (ja
JP2005315770A5 (enExample
Inventor
文夫 大友
仁志 大谷
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Topcon Corp
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Topcon Corp
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Priority to JP2004135439A priority Critical patent/JP4427383B2/ja
Priority to US11/096,648 priority patent/US7671998B2/en
Priority to EP05008587.7A priority patent/EP1591752B1/en
Priority to CN200510070146.4A priority patent/CN1693854B/zh
Publication of JP2005315770A publication Critical patent/JP2005315770A/ja
Publication of JP2005315770A5 publication Critical patent/JP2005315770A5/ja
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
    • G01C15/00—Surveying instruments or accessories not provided for in groups G01C1/00 - G01C13/00

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Radar, Positioning & Navigation (AREA)
  • Remote Sensing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Image Input (AREA)
  • Image Processing (AREA)
  • Image Analysis (AREA)
JP2004135439A 2004-04-30 2004-04-30 測定方法及び測定システム Expired - Fee Related JP4427383B2 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
JP2004135439A JP4427383B2 (ja) 2004-04-30 2004-04-30 測定方法及び測定システム
US11/096,648 US7671998B2 (en) 2004-04-30 2005-04-01 Surface configuration measuring method and surface configuration measuring system
EP05008587.7A EP1591752B1 (en) 2004-04-30 2005-04-20 Measuring method and measuring system
CN200510070146.4A CN1693854B (zh) 2004-04-30 2005-04-30 测定方法及测定系统

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2004135439A JP4427383B2 (ja) 2004-04-30 2004-04-30 測定方法及び測定システム

Publications (3)

Publication Number Publication Date
JP2005315770A JP2005315770A (ja) 2005-11-10
JP2005315770A5 JP2005315770A5 (enExample) 2007-04-26
JP4427383B2 true JP4427383B2 (ja) 2010-03-03

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Family Applications (1)

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JP2004135439A Expired - Fee Related JP4427383B2 (ja) 2004-04-30 2004-04-30 測定方法及び測定システム

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US (1) US7671998B2 (enExample)
EP (1) EP1591752B1 (enExample)
JP (1) JP4427383B2 (enExample)
CN (1) CN1693854B (enExample)

Families Citing this family (25)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2004163292A (ja) * 2002-11-13 2004-06-10 Topcon Corp 測量装置と電子的記憶媒体
JP4958802B2 (ja) * 2008-01-16 2012-06-20 飛島建設株式会社 露出地層・露出岩盤のスケッチ図作成・記録支援システム
JP5473383B2 (ja) * 2009-04-17 2014-04-16 三菱電機株式会社 断面計測装置、断面計測方法および断面計測プログラム
CN101881000B (zh) * 2010-06-11 2011-10-12 中国人民解放军国防科学技术大学 一种公路路面平整度的摄像测量系统及方法
JP5841346B2 (ja) * 2011-04-18 2016-01-13 朝日航洋株式会社 航空レーザ測量システム
JP5775354B2 (ja) 2011-04-28 2015-09-09 株式会社トプコン 離着陸ターゲット装置及び自動離着陸システム
EP2527787B1 (en) 2011-05-23 2019-09-11 Kabushiki Kaisha TOPCON Aerial photograph image pickup method and aerial photograph image pickup apparatus
JP5882693B2 (ja) 2011-11-24 2016-03-09 株式会社トプコン 航空写真撮像方法及び航空写真撮像装置
US20160046010A1 (en) * 2012-06-29 2016-02-18 Black & Decker Inc. System for enhancing operation of power tools
CN102789644B (zh) * 2012-07-18 2014-10-15 兰州大学 一种基于两条相交直线的相机标定方法
JP6122591B2 (ja) 2012-08-24 2017-04-26 株式会社トプコン 写真測量用カメラ及び航空写真装置
JP6055274B2 (ja) * 2012-10-31 2016-12-27 株式会社トプコン 航空写真測定方法及び航空写真測定システム
CN102967299B (zh) * 2012-11-16 2014-07-30 中国科学院金属研究所 船用曲轴弯曲镦锻的分度定位精度在线监测系统及用法
CN103148843B (zh) * 2013-02-07 2015-05-20 上海岩土工程勘察设计研究院有限公司 一种用于变形观测仪器的观测方法
CN103386531B (zh) * 2013-07-25 2015-11-04 中国华冶科工集团有限公司 异形断面模板的制作方法
JP5936792B2 (ja) * 2014-06-25 2016-06-22 三菱電機株式会社 建築限界測定図の作成装置、建築限界測定図データの作成装置および建築限界測定図の作成方法
CN105004320B (zh) * 2015-06-09 2017-11-14 北京师范大学 一种高分卫星数据陆表植被覆盖度反演方法及系统
JP6751383B2 (ja) * 2017-12-12 2020-09-02 株式会社日立プラントコンストラクション 無人航空機
US10380440B1 (en) 2018-10-23 2019-08-13 Capital One Services, Llc Method for determining correct scanning distance using augmented reality and machine learning models
JP7297636B2 (ja) * 2019-10-25 2023-06-26 株式会社トプコン スキャナ装置およびこれを用いた測量方法
JP7401074B2 (ja) * 2020-03-19 2023-12-19 株式会社トプコン 測量支援用の携帯表示端末、測量支援システム、測量支援方法、及び測量支援プログラム
JP7406435B2 (ja) * 2020-03-31 2023-12-27 株式会社熊谷組 杭出来形検査方法
JP7521964B2 (ja) * 2020-07-31 2024-07-24 株式会社トプコン 測量支援プログラム、測量支援装置、測量支援方法、および測量支援システム
JP7487863B2 (ja) * 2020-08-25 2024-05-21 株式会社トプコン 測量システム、丁張設置支援方法、丁張設置支援プログラム
JP2023013815A (ja) * 2021-07-16 2023-01-26 大成建設株式会社 表面変位計測方法および表面変位計測システム

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US3314068A (en) * 1964-03-30 1967-04-11 Frank J Catalani Grading method and appartaus
IT1163442B (it) * 1983-06-03 1987-04-08 Agip Spa Metodo perfezionato di rilevamento stereofotogrammetrico di oggetti di grandi dimensioni in mare e su terraferma
US5141307A (en) * 1990-12-05 1992-08-25 Bennett Michael L Surveying method
US5500737A (en) * 1993-07-21 1996-03-19 General Electric Company Method for measuring the contour of a surface
JP3486461B2 (ja) * 1994-06-24 2004-01-13 キヤノン株式会社 画像処理装置及び方法
US6304669B1 (en) * 1997-11-10 2001-10-16 Asahi Kogaku Kogyo Kabushiki Kaisha Photogrammetric analytical measurement system
JP3441657B2 (ja) 1997-11-10 2003-09-02 ペンタックス株式会社 画像点設定装置及びこの画像点設定装置を用いた写真測量方法
JP3965781B2 (ja) 1998-05-29 2007-08-29 株式会社ニコン 撮像装置付き測量機
CA2327894A1 (en) * 2000-12-07 2002-06-07 Clearview Geophysics Inc. Method and system for complete 3d object and area digitizing
US20030103651A1 (en) * 2001-12-03 2003-06-05 Kurt Novak Photogrammetric apparatus
CN1372126A (zh) * 2002-01-12 2002-10-02 中国水利水电第四工程局 非量测像机进行数字摄影测量的方法
JP2004028630A (ja) 2002-06-21 2004-01-29 Yoshio Obara 路面形状の計測方法
US7098997B2 (en) * 2002-06-26 2006-08-29 Pentax Corporation Surveying system
JP2004163292A (ja) 2002-11-13 2004-06-10 Topcon Corp 測量装置と電子的記憶媒体
CN2599528Y (zh) * 2003-02-25 2004-01-14 张祖勋 摄影全站仪

Also Published As

Publication number Publication date
EP1591752B1 (en) 2014-12-03
JP2005315770A (ja) 2005-11-10
US20050243329A1 (en) 2005-11-03
EP1591752A3 (en) 2009-03-04
CN1693854B (zh) 2010-06-23
US7671998B2 (en) 2010-03-02
CN1693850A (zh) 2005-11-09
EP1591752A2 (en) 2005-11-02

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