JP4426402B2 - 粒径分布測定装置 - Google Patents
粒径分布測定装置 Download PDFInfo
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- JP4426402B2 JP4426402B2 JP2004252230A JP2004252230A JP4426402B2 JP 4426402 B2 JP4426402 B2 JP 4426402B2 JP 2004252230 A JP2004252230 A JP 2004252230A JP 2004252230 A JP2004252230 A JP 2004252230A JP 4426402 B2 JP4426402 B2 JP 4426402B2
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- 239000002245 particle Substances 0.000 title claims description 45
- 238000009826 distribution Methods 0.000 title claims description 24
- 230000007246 mechanism Effects 0.000 claims description 23
- 230000004308 accommodation Effects 0.000 claims description 13
- 239000002612 dispersion medium Substances 0.000 claims description 12
- 230000000149 penetrating effect Effects 0.000 claims description 6
- 238000005259 measurement Methods 0.000 description 14
- 239000004065 semiconductor Substances 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 10
- 239000007788 liquid Substances 0.000 description 9
- 239000006185 dispersion Substances 0.000 description 8
- 238000000691 measurement method Methods 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- 238000011161 development Methods 0.000 description 5
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- 230000035515 penetration Effects 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 238000007789 sealing Methods 0.000 description 3
- 239000007921 spray Substances 0.000 description 3
- 239000000758 substrate Substances 0.000 description 3
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 description 2
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- 230000008859 change Effects 0.000 description 2
- 238000001816 cooling Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
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- 238000004140 cleaning Methods 0.000 description 1
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- 230000000593 degrading effect Effects 0.000 description 1
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- 230000007613 environmental effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 230000008531 maintenance mechanism Effects 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
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- 230000001629 suppression Effects 0.000 description 1
- 238000011144 upstream manufacturing Methods 0.000 description 1
Landscapes
- Investigating Or Analysing Materials By Optical Means (AREA)
Description
3・・・セル保持機構
41a・・・光源(半導体レーザ)
42a・・・光源LED
5・・・光検出器
6・・・演算装置
7A、7B・・・筐体
7・・・ベース構造体
71・・・中間体
72、73・・・起立支持体
81、82・・・開閉蓋
S・・・セル収容空間
Claims (5)
- 分散媒中に分散させた粒子群を収容する透明セルと、その透明セル中の粒子群に光を照射する光源と、その光の照射によって発生する回折又は/及び散乱光(以下、回折散乱光という。)の強度を検出する離散配置した複数の光検出器と、前記光検出器から出力される光強度信号に基づいて前記粒子群の粒径分布を算出する演算装置とを備えたものであって、
前記光源及び光検出器を分担収容する互いに離間配置した一対の筐体を設け、一面から対向面に貫通するセル収容空間を、それら筐体同士の対向する壁間に形成し、
中間体と、その中間体の両端から一体的に起立する起立支持体とからなる一体成型品のベース構造体を設け、前記各起立支持体に光源及び光検出器を分担支持させるとともに、これら各起立支持体の少なくとも一部を利用して前記筐体を形成し、
一方の起立支持体が少なくとも光源及び広角散乱光検出器を支持し、他方の起立支持体が少なくとも狭角散乱光検出器を支持するものである粒径分布測定装置。 - 前記セル収容空間の開口面のうち、前記一面又はその対向面のいずれかを含む少なくとも2つの開口面に開閉可能な開閉蓋を設けるとともに、その他の開口面を閉塞し、前記セル収容空間を密閉可能に構成している請求項1記載の粒径分布測定装置。
- 前記2つの開口面が、セル収容空間の上面と前面とである請求項2記載の粒径分布測定装置。
- 複数のセルを前記貫通方向に沿って移動可能に保持するセル保持機構を設け、前記セルのうちのいずれか1つを光源からの光が照射される光照射位置に選択的に位置づけることができるように構成している請求項1、2又は3記載の粒径分布測定装置。
- 前記起立支持体に上下に延びるスリット状の透光窓を設け、当該透光窓が前記光源からの光又は前記回折散乱光が透過するものである請求項1、2、3又は4記載の粒径分布測定装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004252230A JP4426402B2 (ja) | 2004-08-31 | 2004-08-31 | 粒径分布測定装置 |
US11/214,581 US7499809B2 (en) | 2004-08-30 | 2005-08-30 | Particle size distribution analyzer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004252230A JP4426402B2 (ja) | 2004-08-31 | 2004-08-31 | 粒径分布測定装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2006071329A JP2006071329A (ja) | 2006-03-16 |
JP4426402B2 true JP4426402B2 (ja) | 2010-03-03 |
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Application Number | Title | Priority Date | Filing Date |
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JP2004252230A Active JP4426402B2 (ja) | 2004-08-30 | 2004-08-31 | 粒径分布測定装置 |
Country Status (1)
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JP (1) | JP4426402B2 (ja) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5188758B2 (ja) * | 2007-07-17 | 2013-04-24 | 株式会社堀場製作所 | 粒径分布測定装置 |
JP5546454B2 (ja) * | 2007-08-15 | 2014-07-09 | マルベルン インスツルメンツ リミテッド | 広幅分光計 |
JP6897437B2 (ja) * | 2017-09-05 | 2021-06-30 | 株式会社島津製作所 | 分光光度計 |
WO2024058063A1 (ja) * | 2022-09-14 | 2024-03-21 | 株式会社堀場製作所 | 試料投入装置、試料投入システム、粒径分布測定システム、及び、試料投入方法 |
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2004
- 2004-08-31 JP JP2004252230A patent/JP4426402B2/ja active Active
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