JP4424758B2 - 露出制御システムを含むｘ線検査装置 - Google Patents

露出制御システムを含むｘ線検査装置 Download PDF

Info

Publication number
JP4424758B2
JP4424758B2 JP52937598A JP52937598A JP4424758B2 JP 4424758 B2 JP4424758 B2 JP 4424758B2 JP 52937598 A JP52937598 A JP 52937598A JP 52937598 A JP52937598 A JP 52937598A JP 4424758 B2 JP4424758 B2 JP 4424758B2
Authority
JP
Japan
Prior art keywords
ray
image
inspection apparatus
ray inspection
control system
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
JP52937598A
Other languages
English (en)
Japanese (ja)
Other versions
JP2000512799A (ja
JP2000512799A5 (enExample
Inventor
アナ ジョ カンプス，ヒュベルト
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Koninklijke Philips NV
Original Assignee
Koninklijke Philips NV
Koninklijke Philips Electronics NV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninklijke Philips NV, Koninklijke Philips Electronics NV filed Critical Koninklijke Philips NV
Publication of JP2000512799A publication Critical patent/JP2000512799A/ja
Publication of JP2000512799A5 publication Critical patent/JP2000512799A5/ja
Application granted granted Critical
Publication of JP4424758B2 publication Critical patent/JP4424758B2/ja
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/36—Temperature of anode; Brightness of image power
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/26—Measuring, controlling or protecting
    • H05G1/30—Controlling
    • H05G1/38—Exposure time
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05G—X-RAY TECHNIQUE
    • H05G1/00—X-ray apparatus involving X-ray tubes; Circuits therefor
    • H05G1/08—Electrical details
    • H05G1/64—Circuit arrangements for X-ray apparatus incorporating image intensifiers

Landscapes

  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Toxicology (AREA)
  • Apparatus For Radiation Diagnosis (AREA)
  • X-Ray Techniques (AREA)
JP52937598A 1997-04-24 1998-03-23 露出制御システムを含むｘ線検査装置 Expired - Fee Related JP4424758B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
EP97201222 1997-04-24
EP97201222.3 1997-04-24
PCT/IB1998/000426 WO1998048600A2 (en) 1997-04-24 1998-03-23 X-ray examination apparatus including an exposure control system

Publications (3)

Publication Number Publication Date
JP2000512799A JP2000512799A (ja) 2000-09-26
JP2000512799A5 JP2000512799A5 (enExample) 2005-10-06
JP4424758B2 true JP4424758B2 (ja) 2010-03-03

Family

ID=8228245

Family Applications (1)

Application Number Title Priority Date Filing Date
JP52937598A Expired - Fee Related JP4424758B2 (ja) 1997-04-24 1998-03-23 露出制御システムを含むｘ線検査装置

Country Status (5)

Country Link
US (1) US6047043A (enExample)
EP (1) EP0909527B1 (enExample)
JP (1) JP4424758B2 (enExample)
DE (1) DE69840401D1 (enExample)
WO (1) WO1998048600A2 (enExample)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1999043152A2 (en) * 1998-02-23 1999-08-26 Koninklijke Philips Electronics N.V. X-ray examination apparatus including exposure control
DE19847219C2 (de) * 1998-10-13 2000-07-06 Ziehm Gmbh Röntgendiagnostikeinrichtung mit Bildverstärker und CCD-Kamera und einer Schaltung zur Regelung der Dosisleistung der Röntgenröhre und der Verstärkung des Videoverstärkers sowie einem Verfahren hierzu
WO2000035254A1 (en) * 1998-12-08 2000-06-15 Koninklijke Philips Electronics N.V. An x-ray examination apparatus having an object absorption dependent brightness control
EP1086612A2 (en) * 1998-12-17 2001-03-28 Koninklijke Philips Electronics N.V. X-ray examination apparatus including a control loop for adjusting the x-ray flux
JP2002541639A (ja) * 1999-04-02 2002-12-03 コーニンクレッカ フィリップス エレクトロニクス エヌ ヴィ 輝度制御システムを有するｘ線検査装置
US6175614B1 (en) * 1999-05-07 2001-01-16 Oec Medical Systems, Inc. Method and apparatus for automatic sizing and positioning of ABS sampling window in an x-ray imaging system
DE19945018A1 (de) * 1999-09-20 2001-04-12 Siemens Ag Verfahren zum Betrieb eines digitalen Bildsystems einer Röntgendiagnostikeinrichtung
DE10019242B4 (de) * 2000-04-18 2007-08-23 Siemens Ag Verfahren zur Steuerung einer Röntgendiagnostikeinrichtung mit Festkörperbildwandler für die Mammographie
JP3525865B2 (ja) 2000-06-29 2004-05-10 株式会社島津製作所 Ｘ線透視装置
DE10132816A1 (de) 2001-05-31 2002-12-05 Philips Corp Intellectual Pty Vorrichtung und Verfahren zur Anpassung der Strahlungsdosis einer Röntgenstrahlungsquelle
DE10163215B4 (de) * 2001-12-21 2020-02-20 Philips Gmbh System und Verfahren mit automatisch optimierter Bilderzeugung
FR2846503B1 (fr) * 2002-10-29 2005-03-25 Ge Med Sys Global Tech Co Llc Procede de determination des parametres optimaux d'une acquisition de radiographie
DE60334915D1 (de) * 2003-11-26 2010-12-23 Carestream Health Inc Verfahren zur Signalverarbeitung in einem Dental-Radiologiegerät
US8060774B2 (en) * 2005-06-24 2011-11-15 Google Inc. Memory systems and memory modules
US20080159477A1 (en) * 2006-12-29 2008-07-03 General Electric Company System and method for radiographic inspection without a-priori information of inspected object
JP5224898B2 (ja) * 2008-05-09 2013-07-03 キヤノン株式会社 放射線画像撮影装置及びその駆動方法
JP5316123B2 (ja) * 2009-03-13 2013-10-16 株式会社島津製作所 放射線撮影装置
CN105528764B (zh) 2015-12-01 2019-01-15 沈阳东软医疗系统有限公司 一种图像亮度调节方法、装置及设备
US12133755B2 (en) * 2021-12-14 2024-11-05 BAE Systems Imaging Solutions Inc. X-ray image data monitoring and signaling for patient safety

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8502569A (nl) * 1985-09-20 1987-04-16 Philips Nv Roentgenonderzoekapparaat met een locaal opgedeelde hulpdetector.
DE3732634A1 (de) 1987-09-28 1989-04-06 Siemens Ag Roentgendiagnostikeinrichtung
US5012504A (en) * 1989-12-26 1991-04-30 General Electric Company Automatic brightness compensation for fluorography systems
JPH06154198A (ja) * 1992-11-27 1994-06-03 Toshiba Corp Ｘ線診断装置
US5461658A (en) * 1993-05-21 1995-10-24 U.S. Philips Corporation X-ray examination apparatus
EP0635804B1 (en) * 1993-07-22 2002-02-27 Koninklijke Philips Electronics N.V. Image processing method and device for performing that method
DE4330787A1 (de) * 1993-09-10 1995-03-23 Siemens Ag Verfahren zum Betrieb eines Röntgenbelichtungsautomaten
DE69531395T2 (de) * 1994-12-23 2004-04-15 Koninklijke Philips Electronics N.V. Röntgenuntersuchungsapparat mit einer belichtungssteuerschaltung
US5574764A (en) * 1995-06-06 1996-11-12 General Electric Company Digital brightness detector
US5617462A (en) * 1995-08-07 1997-04-01 Oec Medical Systems, Inc. Automatic X-ray exposure control system and method of use
US5675624A (en) * 1995-12-14 1997-10-07 General Electric Company Adaptive x-ray brightness and display control for a medical imaging system
US5694449A (en) * 1996-05-20 1997-12-02 General Electric Company Method and system for detecting and correcting erroneous exposures generated during x-ray imaging

Also Published As

Publication number Publication date
DE69840401D1 (de) 2009-02-12
JP2000512799A (ja) 2000-09-26
WO1998048600A2 (en) 1998-10-29
WO1998048600A3 (en) 1999-01-21
EP0909527B1 (en) 2008-12-31
US6047043A (en) 2000-04-04
EP0909527A2 (en) 1999-04-21

Similar Documents

Publication Publication Date Title
JP4424758B2 (ja) 露出制御システムを含むｘ線検査装置
JP3554129B2 (ja) 放射線撮影装置
JP3949698B2 (ja) 露出制御回路を有するｘ線検査装置
US6415049B1 (en) Apparatus for detecting and processing a radiation image
JP3785817B2 (ja) 放射線画像の画像処理装置
JPH05130990A (ja) 自動露出機能付き医療用ｘ線画像検出装置
EP0855678B1 (en) Method and apparatus for sensing an image
JP2527361B2 (ja) 放射線画像読取再生装置
EP0914755B1 (en) Exposure control on the basis of a relevant part of an x-ray image
JPH0730815A (ja) Ｘ線検査装置
JPS63183435A (ja) 画像処理条件決定方法
JP2002528851A (ja) 照射量制御を備えたｘ線検査装置
JP2002541639A (ja) 輝度制御システムを有するｘ線検査装置
JPH08299316A (ja) Ｘ線診断装置
JP2000030046A (ja) 放射線画像検出処理装置
US6044127A (en) X-ray examination apparatus including an exposure control system and a method of controlling an amplifier of an image pick-up apparatus
JP2002512764A (ja) 露出制御手段を含むｘ線検査装置
WO2000011608A1 (en) Apparatus and method for providing an optimum brightness control signal for lung tissue x-ray images
JPH04134568A (ja) 放射線画像処理装置
JPH05192318A (ja) Ｘ線画像作成装置
JPH08102396A (ja) Ｘ線透視撮影装置
JPH04347142A (ja) 放射線画像処理装置
JPS638600B2 (enExample)
JPS63262131A (ja) 医用画像の撮影体位判別方法
JPH0878186A (ja) Ｘ線透視撮影装置

Legal Events

Date Code Title Description
A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20050318

A621 Written request for application examination

Free format text: JAPANESE INTERMEDIATE CODE: A621

Effective date: 20050318

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080401

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20080627

A131 Notification of reasons for refusal

Free format text: JAPANESE INTERMEDIATE CODE: A131

Effective date: 20080930

A601 Written request for extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A601

Effective date: 20081225

A602 Written permission of extension of time

Free format text: JAPANESE INTERMEDIATE CODE: A602

Effective date: 20090209

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090325

A02 Decision of refusal

Free format text: JAPANESE INTERMEDIATE CODE: A02

Effective date: 20090602

A521 Request for written amendment filed

Free format text: JAPANESE INTERMEDIATE CODE: A523

Effective date: 20090901

A911 Transfer to examiner for re-examination before appeal (zenchi)

Free format text: JAPANESE INTERMEDIATE CODE: A911

Effective date: 20091015

TRDD Decision of grant or rejection written
A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

Effective date: 20091110

A01 Written decision to grant a patent or to grant a registration (utility model)

Free format text: JAPANESE INTERMEDIATE CODE: A01

A61 First payment of annual fees (during grant procedure)

Free format text: JAPANESE INTERMEDIATE CODE: A61

Effective date: 20091208

R150 Certificate of patent or registration of utility model

Free format text: JAPANESE INTERMEDIATE CODE: R150

FPAY Renewal fee payment (event date is renewal date of database)

Free format text: PAYMENT UNTIL: 20121218

Year of fee payment: 3

LAPS Cancellation because of no payment of annual fees