JP4323437B2 - 渦電流探傷プローブ及び渦電流探傷装置 - Google Patents
渦電流探傷プローブ及び渦電流探傷装置 Download PDFInfo
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- JP4323437B2 JP4323437B2 JP2005004898A JP2005004898A JP4323437B2 JP 4323437 B2 JP4323437 B2 JP 4323437B2 JP 2005004898 A JP2005004898 A JP 2005004898A JP 2005004898 A JP2005004898 A JP 2005004898A JP 4323437 B2 JP4323437 B2 JP 4323437B2
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/9013—Arrangements for scanning
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
- G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
- G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
- G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
- G01N27/904—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents with two or more sensors
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- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Description
Claims (4)
- 被検査体表面に面する可撓性基板と、この可撓性基板に固定され順次連続して切換えられる複数のコイルとを備えた渦電流探傷プローブにおいて、前記可撓性基板の反被検査体側に配置され前記コイルを収納するコイル収納溝を有する弾性体と、この弾性体を被検査体側に押圧するベークライト又はアルミニュウムで形成された押圧手段と、この押圧手段から前記被検査体側に向かって突出するように設けられると共にこの押圧手段による押圧時に前記被検査体に接触させて前記弾性体の弾性変形を規制し前記コイル収納溝の底部が前記コイルへ接触するのを規制して前記コイルの変形を防止する変位規制手段とを設けたことを特徴とする渦電流探傷プローブ。
- 前記弾性体は、前記可撓性基板に縫合されていることを特徴とする請求項1記載の渦電流探傷プローブ。
- 前記押圧手段は、可撓性基板の被検査体の凹曲面に接触させる角度を調整する手段を備えていることを特徴とする請求項1又は2記載の渦電流探傷プローブ。
- 被検査体表面に面する可撓性基板と、この可撓性基板に固定され順次連続して切換えられる複数のコイルと、前記可撓性基板の反被検査体側に配置され前記コイルを収納するコイル収納溝を有する弾性体と、この弾性体を被検査体側に押圧するベークライト又はアルミニュウムで形成された押圧手段と、この押圧手段から前記被検査体側に向かって突出するように設けられると共にこの押圧手段による押圧時に前記被検査体に接触させて前記弾性体の弾性変形を規制し前記コイル収納溝の底部が前記コイルへ接触するのを規制して前記コイルの変形を防止する変位規制手段とを設けた渦電流探傷プローブと、前記コイルを切換えるコイル切換え手段と、前記コイルのうち検出用コイルからの探傷信号を表示する表示部と、前記渦電流探傷プローブを前記被検査体の上を一方向に移動させる移動手段とを備えたことを特徴とする渦電流探傷装置。
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005004898A JP4323437B2 (ja) | 2005-01-12 | 2005-01-12 | 渦電流探傷プローブ及び渦電流探傷装置 |
US11/326,510 US7235967B2 (en) | 2005-01-12 | 2006-01-06 | Eddy current testing probe and eddy current testing apparatus |
Applications Claiming Priority (1)
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---|---|---|---|
JP2005004898A JP4323437B2 (ja) | 2005-01-12 | 2005-01-12 | 渦電流探傷プローブ及び渦電流探傷装置 |
Publications (2)
Publication Number | Publication Date |
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JP2006194661A JP2006194661A (ja) | 2006-07-27 |
JP4323437B2 true JP4323437B2 (ja) | 2009-09-02 |
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JP2005004898A Active JP4323437B2 (ja) | 2005-01-12 | 2005-01-12 | 渦電流探傷プローブ及び渦電流探傷装置 |
Country Status (2)
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US (1) | US7235967B2 (ja) |
JP (1) | JP4323437B2 (ja) |
Families Citing this family (34)
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US7557570B2 (en) | 2005-11-03 | 2009-07-07 | The Clock Spring Company L.P. | System and method for producing color contour maps of surface defects of high pressure pipelines |
US7295004B2 (en) * | 2006-03-03 | 2007-11-13 | Gary Kroner | Eddy current probe and method of manufacture thereof |
JP4234761B2 (ja) | 2006-11-21 | 2009-03-04 | 慶一 野々垣 | 渦電流探傷方法とその装置 |
JP5016977B2 (ja) | 2007-05-29 | 2012-09-05 | 株式会社日立製作所 | 渦電流探傷プローブ |
FR2916852B1 (fr) * | 2007-05-30 | 2009-09-11 | Snecma Sa | Reperage de points d'interet sur une zone de la surface d'une piece et application a l'optimisation de la trajectoire et de l'angulation des sondes a courants de foucault |
EP2182346A4 (en) * | 2007-08-21 | 2012-08-22 | Keiichi Nonogaki | METHOD AND DEVICE FOR DETECTING FAULTY CURRENT DETECTION |
JP2009050536A (ja) * | 2007-08-28 | 2009-03-12 | Samii Kk | 遊技機 |
US7888932B2 (en) * | 2007-11-05 | 2011-02-15 | General Electric Company | Surface flaw detection system to facilitate nondestructive inspection of a component and methods of assembling the same |
US7876093B2 (en) * | 2007-12-06 | 2011-01-25 | General Electric Company | Eddy current inspection device, proximity probe and method for assembling an eddy current inspection device |
US20090160437A1 (en) * | 2007-12-21 | 2009-06-25 | Carbon Steel Inspection, Inc. | Eddy Current Probe And Method Of Manufacture Thereof |
JP2009216559A (ja) | 2008-03-11 | 2009-09-24 | Hitachi-Ge Nuclear Energy Ltd | 渦電流検査装置 |
US8269489B2 (en) * | 2008-11-25 | 2012-09-18 | General Electric Company | System and method for eddy current inspection of parts with complex geometries |
JP5189469B2 (ja) * | 2008-11-27 | 2013-04-24 | 日立Geニュークリア・エナジー株式会社 | 渦電流探傷プローブ及び渦電流検査装置 |
JP2010230350A (ja) * | 2009-03-26 | 2010-10-14 | Honda Motor Co Ltd | ワーク硬度計測装置 |
JP5155917B2 (ja) * | 2009-03-26 | 2013-03-06 | 日立Geニュークリア・エナジー株式会社 | 渦電流探傷プローブ及びその製造方法 |
JP5138713B2 (ja) * | 2010-02-22 | 2013-02-06 | 日立Geニュークリア・エナジー株式会社 | 渦電流検査装置及び渦電流検査方法 |
DE202011103105U1 (de) * | 2011-07-12 | 2012-10-22 | Prozeq Sa | Vorrichtung zum Bestimmen des Verschleisszustands einer Karbonkeramik-Bremsscheibe |
US8884614B2 (en) | 2011-10-31 | 2014-11-11 | General Electric Company | Eddy current array probe |
JP5829930B2 (ja) * | 2012-01-27 | 2015-12-09 | 日立Geニュークリア・エナジー株式会社 | 渦電流探傷システム及び渦電流探傷方法 |
MX2015002822A (es) | 2012-11-19 | 2015-05-15 | Michelin & Cie | Soporte de sensor flexible para inspeccion de neumaticos. |
US9784715B2 (en) | 2013-04-19 | 2017-10-10 | Zetec, Inc. | Eddy current inspection probe based on magnetoresistive sensors |
JP6196605B2 (ja) * | 2014-12-01 | 2017-09-13 | 三菱重工業株式会社 | 渦電流探傷プローブ |
WO2016111672A1 (en) | 2015-01-05 | 2016-07-14 | Compagnie Generale Des Etablissements Michelin | Method of using multiple row sensing device for a tire |
WO2016111671A1 (en) * | 2015-01-05 | 2016-07-14 | Compagnie Generale Des Etablissements Michelin | Multiple row sensing device for a tire |
WO2016175783A1 (en) | 2015-04-29 | 2016-11-03 | Compagnie Generale Des Etablissements Michelin | Sensing device with proximity detection for tire inspection |
KR101692640B1 (ko) * | 2015-09-11 | 2017-01-04 | 한국전력공사 | 전주용 철근 파단 검출장치 |
KR102084194B1 (ko) * | 2018-11-27 | 2020-03-03 | 조선대학교산학협력단 | 비파괴검사용 탐상 장치 |
CN109752450A (zh) * | 2018-12-07 | 2019-05-14 | 兰州空间技术物理研究所 | 一种发动机叶片无损检测探头 |
JP7310430B2 (ja) * | 2019-08-09 | 2023-07-19 | 大同特殊鋼株式会社 | 探傷装置 |
FR3101948A1 (fr) * | 2019-10-15 | 2021-04-16 | Psa Automobiles Sa | Appareil de contrôle non destructif de soudure |
JP7312143B2 (ja) * | 2020-05-28 | 2023-07-20 | 日立Geニュークリア・エナジー株式会社 | プローブホルダ |
CN112345632A (zh) * | 2020-11-20 | 2021-02-09 | 西安热工研究院有限公司 | 重型燃机带涂层透平叶片基体裂纹涡流检测探头及制作方法 |
JP7351332B2 (ja) * | 2020-12-01 | 2023-09-27 | Jfeスチール株式会社 | 渦流探傷用プローブ、探傷方法および渦流探傷装置 |
JP7508415B2 (ja) | 2021-06-22 | 2024-07-01 | 株式会社東芝 | 非破壊検査プローブ |
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EP0130940B2 (de) * | 1983-07-05 | 1993-12-01 | C.A. Weidmüller GmbH & Co. | Induktive Sensoranordnung und Messanordnung zur Verwendung derselben |
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US6798198B2 (en) | 2000-09-12 | 2004-09-28 | Jentek Sensors, Inc. | Fluid supports for sensors |
US6545467B1 (en) | 2000-10-27 | 2003-04-08 | General Electric Company | Contoured surface eddy current inspection system |
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JP2003344360A (ja) | 2002-05-23 | 2003-12-03 | Central Res Inst Of Electric Power Ind | 3次元形状物検査装置 |
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2005
- 2005-01-12 JP JP2005004898A patent/JP4323437B2/ja active Active
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2006
- 2006-01-06 US US11/326,510 patent/US7235967B2/en active Active
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US7235967B2 (en) | 2007-06-26 |
JP2006194661A (ja) | 2006-07-27 |
US20060170420A1 (en) | 2006-08-03 |
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