JP4317338B2 - 高機能化された後デコードを有するメモリテスタ - Google Patents
高機能化された後デコードを有するメモリテスタ Download PDFInfo
- Publication number
- JP4317338B2 JP4317338B2 JP2001332489A JP2001332489A JP4317338B2 JP 4317338 B2 JP4317338 B2 JP 4317338B2 JP 2001332489 A JP2001332489 A JP 2001332489A JP 2001332489 A JP2001332489 A JP 2001332489A JP 4317338 B2 JP4317338 B2 JP 4317338B2
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- JP
- Japan
- Prior art keywords
- test
- memory
- mask
- dut
- data
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
Landscapes
- Tests Of Electronic Circuits (AREA)
- For Increasing The Reliability Of Semiconductor Memories (AREA)
- Techniques For Improving Reliability Of Storages (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US09/702,631 US6687861B1 (en) | 2000-10-31 | 2000-10-31 | Memory tester with enhanced post decode |
| US09/702631 | 2000-10-31 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2002203399A JP2002203399A (ja) | 2002-07-19 |
| JP2002203399A5 JP2002203399A5 (enExample) | 2005-06-30 |
| JP4317338B2 true JP4317338B2 (ja) | 2009-08-19 |
Family
ID=24822008
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2001332489A Expired - Fee Related JP4317338B2 (ja) | 2000-10-31 | 2001-10-30 | 高機能化された後デコードを有するメモリテスタ |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US6687861B1 (enExample) |
| JP (1) | JP4317338B2 (enExample) |
| KR (1) | KR20020033559A (enExample) |
| DE (1) | DE10153665A1 (enExample) |
| IT (1) | ITRM20010644A1 (enExample) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4127819B2 (ja) * | 2001-05-25 | 2008-07-30 | 株式会社アドバンテスト | 半導体試験装置 |
| US7464310B2 (en) * | 2002-09-30 | 2008-12-09 | Broadcom Corporation | Programmable state machine of an integrated circuit |
| JP2006266835A (ja) * | 2005-03-23 | 2006-10-05 | Advantest Corp | 試験装置、試験方法、及び試験制御プログラム |
| JP2006275986A (ja) * | 2005-03-30 | 2006-10-12 | Advantest Corp | 診断プログラム、切替プログラム、試験装置、および診断方法 |
| JP2007047098A (ja) * | 2005-08-12 | 2007-02-22 | Advantest Corp | 試験装置 |
| DE102005048872A1 (de) * | 2005-10-12 | 2007-04-26 | Mühlbauer Ag | Testkopfeinrichtung |
| JP4889357B2 (ja) * | 2006-04-14 | 2012-03-07 | 株式会社アドバンテスト | 試験装置、プログラムおよび試験方法 |
| KR100984523B1 (ko) * | 2008-04-28 | 2010-10-01 | 박재석 | 화상 골프 연습장치 |
| US9281080B2 (en) * | 2014-03-11 | 2016-03-08 | Advantest Corporation | Staged buffer caching in a system for testing a device under test |
| US9836277B2 (en) * | 2014-10-01 | 2017-12-05 | Samsung Electronics Co., Ltd. | In-memory popcount support for real time analytics |
| US9740558B2 (en) * | 2015-05-31 | 2017-08-22 | Intel Corporation | On-die ECC with error counter and internal address generation |
| KR102039112B1 (ko) * | 2017-06-20 | 2019-10-31 | 포스필 주식회사 | 피시험 디바이스를 테스트하기 위한 프로세서 기반의 계측 방법 및 이를 이용한 계측 장치 |
Family Cites Families (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5610925A (en) * | 1995-03-27 | 1997-03-11 | Advantest Corporation | Failure analyzer for semiconductor tester |
-
2000
- 2000-10-31 US US09/702,631 patent/US6687861B1/en not_active Expired - Lifetime
-
2001
- 2001-10-30 KR KR1020010067006A patent/KR20020033559A/ko not_active Ceased
- 2001-10-30 JP JP2001332489A patent/JP4317338B2/ja not_active Expired - Fee Related
- 2001-10-31 DE DE10153665A patent/DE10153665A1/de not_active Withdrawn
- 2001-10-31 IT IT2001RM000644A patent/ITRM20010644A1/it unknown
Also Published As
| Publication number | Publication date |
|---|---|
| KR20020033559A (ko) | 2002-05-07 |
| ITRM20010644A1 (it) | 2003-05-01 |
| US6687861B1 (en) | 2004-02-03 |
| DE10153665A1 (de) | 2002-05-16 |
| JP2002203399A (ja) | 2002-07-19 |
| ITRM20010644A0 (it) | 2001-10-31 |
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