JP4247514B2 - 欠陥ピクセルの補正方法及びシステム - Google Patents

欠陥ピクセルの補正方法及びシステム Download PDF

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JP4247514B2
JP4247514B2 JP2002103422A JP2002103422A JP4247514B2 JP 4247514 B2 JP4247514 B2 JP 4247514B2 JP 2002103422 A JP2002103422 A JP 2002103422A JP 2002103422 A JP2002103422 A JP 2002103422A JP 4247514 B2 JP4247514 B2 JP 4247514B2
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pixel
defective pixel
defective
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JP2003009004A5 (enExample
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ウィリアム・エル・ポスト
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マイクロン テクノロジー， インク．
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    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/68—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to defects

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  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Picture Signal Circuits (AREA)
  • Facsimile Image Signal Circuits (AREA)
JP2002103422A 2001-04-11 2002-04-05 欠陥ピクセルの補正方法及びシステム Expired - Fee Related JP4247514B2 (ja)

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US09/834,061 US7209168B2 (en) 2001-04-11 2001-04-11 Defective pixel correction method and system
US09/834061 2001-04-11

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JP2003009004A5 JP2003009004A5 (enExample) 2005-09-02
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EP (1) EP1250000B1 (enExample)
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Also Published As

Publication number Publication date
EP1250000B1 (en) 2013-03-20
EP1250000A3 (en) 2003-03-05
US20070285536A1 (en) 2007-12-13
EP1250000A2 (en) 2002-10-16
US7209168B2 (en) 2007-04-24
US20020149683A1 (en) 2002-10-17
JP2003009004A (ja) 2003-01-10
US7944488B2 (en) 2011-05-17

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