JP4207156B2 - 液晶基板検査装置 - Google Patents
液晶基板検査装置 Download PDFInfo
- Publication number
- JP4207156B2 JP4207156B2 JP2003411231A JP2003411231A JP4207156B2 JP 4207156 B2 JP4207156 B2 JP 4207156B2 JP 2003411231 A JP2003411231 A JP 2003411231A JP 2003411231 A JP2003411231 A JP 2003411231A JP 4207156 B2 JP4207156 B2 JP 4207156B2
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- JP
- Japan
- Prior art keywords
- prober
- liquid crystal
- frame
- substrate
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Description
Claims (2)
- プローバを用いて液晶基板の検査を行う液晶基板検査装置において、
前記プローバを設けたプローバフレームと、当該プローバフレームをスライド自在に案内するアウタフレームとを有するフレームを備え、
前記アウタフレームは対向する両側の辺部に案内部を備え、
前記プローバフレームは前記案内部と係合する係合部を備え、
前記案内部は係合部をスライド自在に支持し、前記プローバフレームをアウタフレームに対してスライドさせることによりプローバのプローバピンを液晶基板の電極に位置合わせし、
前記案内部及び係合部は共に摺動電極を備え、当該両摺動電極の接触により液晶基板と外部との通電を行うことを特徴とする液晶基板検査装置。 - 前記係合部はプローバフレームの両端に設けたL字状突起であり、
前記案内部はアウタフレームに形成され、前記L字状突起を納める溝であり、
前記L字状突起の少なくとも一方の面、及び当該面と対向する前記溝の側面は摺動電極を備え、前記L字状突起が備える摺動電極はプローバと導通し、前記溝の側面が備える摺動電極は外部装置と導通することを特徴とする請求項1に記載の液晶基板検査装置。
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
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JP2003411231A JP4207156B2 (ja) | 2003-12-10 | 2003-12-10 | 液晶基板検査装置 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2003411231A JP4207156B2 (ja) | 2003-12-10 | 2003-12-10 | 液晶基板検査装置 |
Publications (2)
Publication Number | Publication Date |
---|---|
JP2005173062A JP2005173062A (ja) | 2005-06-30 |
JP4207156B2 true JP4207156B2 (ja) | 2009-01-14 |
Family
ID=34732028
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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JP2003411231A Expired - Fee Related JP4207156B2 (ja) | 2003-12-10 | 2003-12-10 | 液晶基板検査装置 |
Country Status (1)
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JP (1) | JP4207156B2 (ja) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7355418B2 (en) * | 2004-02-12 | 2008-04-08 | Applied Materials, Inc. | Configurable prober for TFT LCD array test |
JP2007171094A (ja) * | 2005-12-26 | 2007-07-05 | Shimadzu Corp | 液晶基板検査装置 |
JP4936058B2 (ja) * | 2007-06-08 | 2012-05-23 | 株式会社島津製作所 | 基板検査装置 |
CN102753979B (zh) * | 2010-01-08 | 2016-05-04 | 烽腾科技有限公司 | 自动探针结构站及其方法 |
JP7300329B2 (ja) * | 2019-06-26 | 2023-06-29 | 池上通信機株式会社 | 電子式可変調光素子用フィルターターレット |
-
2003
- 2003-12-10 JP JP2003411231A patent/JP4207156B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
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JP2005173062A (ja) | 2005-06-30 |
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