JP4194565B2 - 結晶材料の精製方法及び装置、結晶材料からの結晶製造方法及び装置、及び結晶使用方法 - Google Patents
結晶材料の精製方法及び装置、結晶材料からの結晶製造方法及び装置、及び結晶使用方法 Download PDFInfo
- Publication number
- JP4194565B2 JP4194565B2 JP2005017804A JP2005017804A JP4194565B2 JP 4194565 B2 JP4194565 B2 JP 4194565B2 JP 2005017804 A JP2005017804 A JP 2005017804A JP 2005017804 A JP2005017804 A JP 2005017804A JP 4194565 B2 JP4194565 B2 JP 4194565B2
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- Expired - Fee Related
Links
- 239000013078 crystal Substances 0.000 title claims description 99
- 238000000034 method Methods 0.000 title claims description 65
- 238000004519 manufacturing process Methods 0.000 title claims description 16
- 239000000463 material Substances 0.000 title claims description 15
- 238000000746 purification Methods 0.000 title description 4
- 238000002844 melting Methods 0.000 claims description 46
- 230000008018 melting Effects 0.000 claims description 46
- 239000002994 raw material Substances 0.000 claims description 24
- 238000010438 heat treatment Methods 0.000 claims description 21
- 238000001035 drying Methods 0.000 claims description 20
- 239000000155 melt Substances 0.000 claims description 19
- 238000000265 homogenisation Methods 0.000 claims description 15
- 230000008569 process Effects 0.000 claims description 15
- 239000002516 radical scavenger Substances 0.000 claims description 14
- 238000010521 absorption reaction Methods 0.000 claims description 10
- 238000006243 chemical reaction Methods 0.000 claims description 10
- 239000012535 impurity Substances 0.000 claims description 9
- 238000012937 correction Methods 0.000 claims description 7
- 238000007670 refining Methods 0.000 claims description 6
- 239000002245 particle Substances 0.000 claims description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 4
- 238000004891 communication Methods 0.000 claims description 3
- 230000035484 reaction time Effects 0.000 claims description 3
- 238000009826 distribution Methods 0.000 claims description 2
- 229910052745 lead Inorganic materials 0.000 claims 2
- 239000002184 metal Substances 0.000 claims 2
- 229910052751 metal Inorganic materials 0.000 claims 2
- 229910001507 metal halide Inorganic materials 0.000 claims 2
- 150000005309 metal halides Chemical group 0.000 claims 2
- 238000001179 sorption measurement Methods 0.000 claims 2
- 229910052718 tin Inorganic materials 0.000 claims 2
- 229910052725 zinc Inorganic materials 0.000 claims 2
- 239000012212 insulator Substances 0.000 claims 1
- 230000035515 penetration Effects 0.000 claims 1
- 230000012010 growth Effects 0.000 description 14
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 11
- 239000001301 oxygen Substances 0.000 description 11
- 229910052760 oxygen Inorganic materials 0.000 description 11
- 230000003287 optical effect Effects 0.000 description 8
- 238000005259 measurement Methods 0.000 description 7
- 239000000047 product Substances 0.000 description 7
- WUKWITHWXAAZEY-UHFFFAOYSA-L calcium difluoride Chemical compound [F-].[F-].[Ca+2] WUKWITHWXAAZEY-UHFFFAOYSA-L 0.000 description 5
- 229910001634 calcium fluoride Inorganic materials 0.000 description 5
- OYLGJCQECKOTOL-UHFFFAOYSA-L barium fluoride Chemical compound [F-].[F-].[Ba+2] OYLGJCQECKOTOL-UHFFFAOYSA-L 0.000 description 4
- 229910001632 barium fluoride Inorganic materials 0.000 description 4
- 230000015572 biosynthetic process Effects 0.000 description 4
- 238000001816 cooling Methods 0.000 description 4
- ORUIBWPALBXDOA-UHFFFAOYSA-L magnesium fluoride Chemical compound [F-].[F-].[Mg+2] ORUIBWPALBXDOA-UHFFFAOYSA-L 0.000 description 4
- 229910001635 magnesium fluoride Inorganic materials 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 239000000843 powder Substances 0.000 description 4
- FVRNDBHWWSPNOM-UHFFFAOYSA-L strontium fluoride Chemical compound [F-].[F-].[Sr+2] FVRNDBHWWSPNOM-UHFFFAOYSA-L 0.000 description 4
- 229910001637 strontium fluoride Inorganic materials 0.000 description 4
- 239000007795 chemical reaction product Substances 0.000 description 3
- 239000000203 mixture Substances 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 229910016036 BaF 2 Inorganic materials 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 2
- KRHYYFGTRYWZRS-UHFFFAOYSA-M Fluoride anion Chemical compound [F-] KRHYYFGTRYWZRS-UHFFFAOYSA-M 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 238000002109 crystal growth method Methods 0.000 description 2
- 238000002425 crystallisation Methods 0.000 description 2
- 230000008025 crystallization Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 229910002804 graphite Inorganic materials 0.000 description 2
- 239000010439 graphite Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000001459 lithography Methods 0.000 description 2
- 238000012423 maintenance Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 230000002000 scavenging effect Effects 0.000 description 2
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 2
- 238000003756 stirring Methods 0.000 description 2
- 238000012360 testing method Methods 0.000 description 2
- OYPRJOBELJOOCE-UHFFFAOYSA-N Calcium Chemical compound [Ca] OYPRJOBELJOOCE-UHFFFAOYSA-N 0.000 description 1
- 238000004458 analytical method Methods 0.000 description 1
- 229910052791 calcium Inorganic materials 0.000 description 1
- 239000011575 calcium Substances 0.000 description 1
- 150000001768 cations Chemical class 0.000 description 1
- 239000002178 crystalline material Substances 0.000 description 1
- 230000003635 deoxygenating effect Effects 0.000 description 1
- 238000006392 deoxygenation reaction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 230000003628 erosive effect Effects 0.000 description 1
- 238000013213 extrapolation Methods 0.000 description 1
- 238000011049 filling Methods 0.000 description 1
- 150000002222 fluorine compounds Chemical class 0.000 description 1
- 230000008014 freezing Effects 0.000 description 1
- 238000007710 freezing Methods 0.000 description 1
- 239000007789 gas Substances 0.000 description 1
- 150000004820 halides Chemical class 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000009413 insulation Methods 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 150000002500 ions Chemical class 0.000 description 1
- 239000004922 lacquer Substances 0.000 description 1
- 238000011031 large-scale manufacturing process Methods 0.000 description 1
- 230000007257 malfunction Effects 0.000 description 1
- 238000010907 mechanical stirring Methods 0.000 description 1
- 238000010309 melting process Methods 0.000 description 1
- 238000001393 microlithography Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000005693 optoelectronics Effects 0.000 description 1
- 238000000206 photolithography Methods 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000004544 sputter deposition Methods 0.000 description 1
- 239000007858 starting material Substances 0.000 description 1
- 229910052712 strontium Inorganic materials 0.000 description 1
- CIOAGBVUUVVLOB-UHFFFAOYSA-N strontium atom Chemical compound [Sr] CIOAGBVUUVVLOB-UHFFFAOYSA-N 0.000 description 1
- 238000000859 sublimation Methods 0.000 description 1
- 230000008022 sublimation Effects 0.000 description 1
- 238000005496 tempering Methods 0.000 description 1
- 238000009834 vaporization Methods 0.000 description 1
- 230000008016 vaporization Effects 0.000 description 1
- 235000012431 wafers Nutrition 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B11/00—Single-crystal growth by normal freezing or freezing under temperature gradient, e.g. Bridgman-Stockbarger method
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/12—Halides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B33/00—After-treatment of single crystals or homogeneous polycrystalline material with defined structure
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B1/00—Optical elements characterised by the material of which they are made; Optical coatings for optical elements
- G02B1/02—Optical elements characterised by the material of which they are made; Optical coatings for optical elements made of crystals, e.g. rock-salt, semi-conductors
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
- Y10T117/1072—Seed pulling including details of means providing product movement [e.g., shaft guides, servo means]
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1076—Apparatus for crystallization from liquid or supercritical state having means for producing a moving solid-liquid-solid zone
- Y10T117/108—Including a solid member other than seed or product contacting the liquid [e.g., crucible, immersed heating element]
Landscapes
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physics & Mathematics (AREA)
- Inorganic Chemistry (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| DE102004003829A DE102004003829A1 (de) | 2004-01-26 | 2004-01-26 | Verfahren zum Reinigen von Kristallmaterial und zum Herstellen von Kristallen, eine Vorrichtung hierzu sowie die Verwendung der so erhaltenen Kristalle |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2005213141A JP2005213141A (ja) | 2005-08-11 |
| JP2005213141A5 JP2005213141A5 (enExample) | 2006-06-15 |
| JP4194565B2 true JP4194565B2 (ja) | 2008-12-10 |
Family
ID=34801012
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2005017804A Expired - Fee Related JP4194565B2 (ja) | 2004-01-26 | 2005-01-26 | 結晶材料の精製方法及び装置、結晶材料からの結晶製造方法及び装置、及び結晶使用方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US7344595B2 (enExample) |
| EP (1) | EP1683896A3 (enExample) |
| JP (1) | JP4194565B2 (enExample) |
| DE (1) | DE102004003829A1 (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US8101020B2 (en) * | 2005-10-14 | 2012-01-24 | Ricoh Company, Ltd. | Crystal growth apparatus and manufacturing method of group III nitride crystal |
| DE102006038902A1 (de) | 2006-08-18 | 2008-02-21 | Schott Ag | Verfahren zur Bestimmung der Laserstabilität von optischen Material sowie damit erhaltene Kristalle und deren Verwendung |
| US20090280050A1 (en) * | 2008-04-25 | 2009-11-12 | Applied Materials, Inc. | Apparatus and Methods for Casting Multi-Crystalline Silicon Ingots |
| DE102008054148B9 (de) | 2008-10-31 | 2021-12-30 | Hellma Materials Gmbh & Co. Kg | Verfahren zur Bestimmung der Laserstabilität von optischem Material sowie damit erhaltene Kristalle und deren Verwendung |
| CN103409789B (zh) * | 2013-06-19 | 2016-03-30 | 青岛隆盛晶硅科技有限公司 | 一种多晶硅定向凝固装置 |
| US9845549B2 (en) * | 2014-10-31 | 2017-12-19 | Sumitomo Electric Industries, Ltd. | Method of manufacturing silicon carbide single crystal |
| JP6881365B2 (ja) * | 2018-03-16 | 2021-06-02 | 信越半導体株式会社 | 炭化珪素単結晶の製造方法及び製造装置 |
Family Cites Families (13)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US2149076A (en) * | 1935-10-18 | 1939-02-28 | Massachusetts Inst Technology | Method for the manufacture of crystalline bodies |
| DE10010484A1 (de) | 2000-03-03 | 2001-09-13 | Schott Glas | Verfahren und Vorrichtung zur Züchtung von großvolumigen orientierten Einkristallen |
| US6342312B2 (en) | 1996-03-22 | 2002-01-29 | Canon Kabushiki Kaisha | Calcium fluoride crystal, optical article and exposure apparatus for photo-lithography using the same |
| JP3475407B2 (ja) | 1997-03-31 | 2003-12-08 | キヤノン株式会社 | フッ化物結晶の製造装置及び製造法並びにルツボ |
| JP2004002196A (ja) * | 1997-03-31 | 2004-01-08 | Canon Inc | フッ化物結晶の製造装置及び製造法並びにルツボ |
| JP3631063B2 (ja) * | 1998-10-21 | 2005-03-23 | キヤノン株式会社 | フッ化物の精製方法及びフッ化物結晶の製造方法 |
| DE10010485C2 (de) | 2000-03-03 | 2002-10-02 | Schott Glas | Verfahren zur Herstellung von hochhomogenen, grossformatigen Einkristallen aus Calciumfluorid sowie deren Verwendung |
| JP2002326811A (ja) * | 2001-02-27 | 2002-11-12 | Canon Inc | 弗化物結晶の製造方法及び装置 |
| DE10142651C5 (de) * | 2001-08-31 | 2009-04-23 | Schott Ag | Verfahren zur Herstellung von hoch homogenen strahlenbeständigen streufreien Einkristallen, eines damit erhaltenen Ingots sowie deren Verwendung |
| US20030070606A1 (en) * | 2001-10-05 | 2003-04-17 | Leblond Nicolas | Preparation of feedstock of alkaline earth and alkali metal fluorides |
| US6669920B2 (en) * | 2001-11-20 | 2003-12-30 | Corning Incorporated | Below 160NM optical lithography crystal materials and methods of making |
| DE10347430B4 (de) | 2003-10-13 | 2006-04-27 | Schott Ag | Ofen zur Züchtung von Einkristallen aus geschmolzener Kristallrohmasse |
| US6982001B2 (en) * | 2004-05-28 | 2006-01-03 | Corning Incorporated | Dehydroxylation and purification of calcium fluoride materials using a halogen containing plasma |
-
2004
- 2004-01-26 DE DE102004003829A patent/DE102004003829A1/de not_active Ceased
-
2005
- 2005-01-24 US US11/042,286 patent/US7344595B2/en not_active Expired - Fee Related
- 2005-01-26 EP EP05001576A patent/EP1683896A3/de not_active Withdrawn
- 2005-01-26 JP JP2005017804A patent/JP4194565B2/ja not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2005213141A (ja) | 2005-08-11 |
| US20050178316A1 (en) | 2005-08-18 |
| EP1683896A2 (de) | 2006-07-26 |
| EP1683896A3 (de) | 2008-12-31 |
| DE102004003829A1 (de) | 2005-08-18 |
| US7344595B2 (en) | 2008-03-18 |
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